IEEE 1226-1998 en Trial-Use Standard for a Broad-Based Environment for Test (ABBET) (Overview and Architecture)《测试的宽底环境试行标准 总论和建筑学》.pdf

《IEEE 1226-1998 en Trial-Use Standard for a Broad-Based Environment for Test (ABBET) (Overview and Architecture)《测试的宽底环境试行标准 总论和建筑学》.pdf》由会员分享，可在线阅读，更多相关《IEEE 1226-1998 en Trial-Use Standard for a Broad-Based Environment for Test (ABBET) (Overview and Architecture)《测试的宽底环境试行标准 总论和建筑学》.pdf（57页珍藏版）》请在麦多课文档分享上搜索。

1、 The Institute of Electrical and Electronics Engineers, Inc.345 East 47th Street, New York, NY 10017-2394, USACopyright 1999 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 24 June 1999. Printed in the United States of America.Print:ISBN 0-7381-1545-2 SH9

2、4721PDF:ISBN 0-7381-1546-0 SS94721No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.IEEE Std 1226-1998(Revision ofIEEE Std 1226-1993)IEEE ABBETIEEE Trial-Use Standard for A Broad-Based Envi

3、ronment for Test (ABBET)Overview and ArchitectureSponsorIEEE Standards Coordinating Committee 20Abbreviated Test Language for All Systems (ATLAS)Approved 8 December 1998IEEE-SA Standards BoardAbstract:The overall concept of A Broad-Based Environment for Test (ABBET)TMis defined, andmandatory require

4、ments for implementation of ABBET are specified. The elements of ABBET andtheir interrelationships are described. Guidelines and requirements governing the elements of theABBET set of standards and guides are established, and common terms to be used throughout theset are defined.Keywords:ABBETTM, pr

5、oduct test, diagnostics, software frameworkIEEE Standardsdocuments are developed within the IEEE Societies and the Standards Coordinating Com-mittees of the IEEE Standards Association (IEEE-SA) Standards Board. Members of the committees servevoluntarily and without compensation. They are not necessa

6、rily members of the Institute. The standardsdeveloped within IEEE represent a consensus of the broad expertise on the subject within the Institute aswell as those activities outside of IEEE that have expressed an interest in participating in the development ofthe standard.Use of an IEEE Standard is

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13、on standards and requests for interpretations should be addressed to:Secretary, IEEE-SA Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAAuthorization to photocopy portions of any individual standard for internal or personal use is granted by theInstitute of Electrical and Electr

14、onics Engineers, Inc., provided that the appropriate fee is paid to CopyrightClearance Center. To arrange for payment of licensing fee, please contact Copyright Clearance Center, Cus-tomer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; (978) 750-8400. Permission to photocopyportions of any indi

15、vidual standard for educational classroom use can also be obtained through the Copy-right Clearance Center.Note: Attention is called to the possibility that implementation of this standard mayrequire use of subject matter covered by patent rights. By publication of this standard,no position is taken

16、 with respect to the existence or validity of any patent rights inconnection therewith. The IEEE shall not be responsible for identifying patents forwhich a license may be required by an IEEE standard or for conducting inquiries intothe legal validity or scope of those patents that are brought to it

17、s attention.Copyright 1999 IEEE. All rights reserved.iiiIntroductionThis introduction is not part of IEEE Std 1226-1998, IEEE Trial-Use Standard for A Broad-Based Environment for Test(ABBET), Overview and Architecture.The benefits of using standards in test-related applications have long been recogn

18、ized. The scope for stan-dardization extends from low-level standards associated with test instrument control to high-level standardsassociated with specifying tests in an implementation-independent manner.In the 1960s, Aeronautical Radio, Incorporated (ARINC) started the development of the Abbrevia

19、ted TestLanguage for Avionics Systems (ATLAS). In 1976, management of the ATLAS standard was passed to theIEEE, and the ATLAS acronym was changed to Abbreviated Test Language for All Systems to reflect itsbroader field of applications.Within the IEEE, development of ATLAS and ATLAS-related standards

20、 was vested in an ad hoc committee,which later became the IEEE Standards Coordinating Committee 20 (SCC20). In the mid-1980s, SCC20broadened the scope of its activities to embrace other standards projects related to test and diagnosis, includ-ing Automatic Test Program Generation (ATPG), Test Equipm

21、ent Description Language (TEDL), ArtificialIntelligence Exchange and Service Tie to All Test Environments (AI-ESTATE), and A Broad Based Environ-ment for Test (ABBET).This standard provides the framework for a family of standards providing software interface specificationsfor test-related applicatio

22、ns and environments. This family incorporates object-oriented technology andinformation modeling to specify programming language-independent interfaces between elements within awide variety of test environments, including built-in test systems (BIT), automatic test systems (ATS), andmanual test envi

23、ronments. These interfaces are specified using the ISO 10303-11:1994 EXPRESS informa-tion modeling language and the Object Management Group (OMG) Interface Definition Language (IDL).This standard defines the ABBET architecture primarily through the definition of a Core Test InformationModel (CTIM) a

24、nd a test foundation framework (TFF). The CTIM defines the basic information entitiesrequired in any test application and provides a vehicle for formally modeling behavior within a test environ-ment. The TFF defines a class hierarchy corresponding to these basic information entities and provides sev

25、-eral methods within each class to enable basic operations to be performed on these entities. Componentstandards within the ABBET architecture define subclasses from the TFF specific to particular requirementswithin the test environment.ivCopyright 1999 IEEE. All rights reserved.At the time this sta

26、ndard was completed, the ABBET Subcommittee had the following membership.Gary L. Hardenburg,ChairGayle Matysek,SecretaryKirk Thompson,Architecture Working Group ChairIn addition, the following persons made significant contributions to this standard:Guy AdamJames D. BakerBrad BalfourJean-Yves Barbier

27、Darrel BartzAnne BautistaAldo BernalMichael BlairStephen M. BowenGreg BowmanAlan L. BridgesDavid M. BrooksRon BrooksDale BrownTheodor CalinLarry CarpenterE. Elaine CasharRichard D. ChurcherGeorge ClariusChristopher ConnellyJames CottrellBob CramKent CrossRobert J. CurryDavid DahlbackaBernard DathyDa

28、nny C. DavisJake DawsonJeff DeanSomnath DebGerald DePasqualeBernd DinklageKeith EllisMichael T. EllisHorst EyRob FletcherStephen FortierKen FoxWilliam Brit FrankJoe GileRoger GoldbergJerry GrassoArnold M. GreenspanGreg GriffesJohn HalperArthur HannRobert G. HayesLeonard HaynesBob HillmanAshley M. B.

29、 HulmeUlla JacobssonAndrew M. JoskowskiFrank X. KearnsDavid KiddLars-Olov LarssonHans LecluyseRobert LeifJames L. LewisTerry LindemannAlfred LowensteinRichard J. MaguireMichael MalesichMichael MartinHarry McGuckinDoug McNabbMartin MethJames M. MillsJames MooreCharlie MorrisDavid S. MorrisWilliam P.

30、NeblettTom NewtonDavid L. NicholsNick NicholsonHans ObermeierChuck OliverioLeslie A. OrlidgeDave PawsonEdward G. PerkinsJean PouillyJohn PowellWilliam PritchettJeffrey RajhelNarayanan RamachanranWilliam E. ReevesJohn RileyWilliam RodriguezDavid RoggendorffRobert RolfeEric SacherEric SaenzHoward Sava

31、geMichael ScaliseHelmut ScheibenzuberRickey SchippangMichael L. SeaveyJohn W. SheppardLee A. ShombertRandy SimpsonPhilip T. SmithButch SneadeJoseph J. StancoJoseph L. StautbergRichard TarzaiskiJack TaylorJ. Richard WegerDaniel H. WeissWilliam A. WhitakerDavid WilliamsonWill W. YoungTak YuenJehuda Zi

32、eglerDan ZimmermannMaria BosticTerry CampbellDez CassJack CrossChristine FisherAl GilmanJohn GoddardSharon GoodallChris GorringeT. Winston GriffinJames HannaGary L. HinkleGlenn LaflinJohn LeuthePeter LordJohn OdakRoy OishiCatherine OzenfantRichard PatrickJames ReederWilliam RusselDavid SmithMark Thu

33、llenRoger L. WilliamsCopyright 1999 IEEE. All rights reserved.vThe following members of the balloting committee voted on this standard:When the IEEE-SA Standards Board approved this standard on 8 December 1998, it had the followingmembership:Richard J. Holleman,ChairDonald N. Heirman,Vice ChairJudit

34、h Gorman,Secretary*Member EmeritusKim BreitfelderIEEE Standards Project EditorGuy AdamJames D. BakerJean-Yves BarbierJeffrey S. BarkleyAldo BernalStephen M. BowenGreg BowmanAlan L. BridgesDavid M. BrooksE. Elaine CasharRichard D. ChurcherWilliam ColmerRobert J. CurryDavid DahlbackaBernard DathyDanny

35、 C. DavisJames Allen DawsonSomnath DebBernd DinklageMichael T. EllisAnthony FitzpatrickWilliam Brit FrankArnold M. GreenspanGary L. HardenburgVance HarwoodRaymond L. HasenstabRobert G. HayesMike HeilmanJohn E. HeiserWesley HigakiGary L. HinkleCatherine HogansAshley M. B. HulmeGary M. JenkinsAndrew M

36、. JoskowskiFrank X. KearnsPaul B. KneseJames L. LewisAlfred LowensteinRichard J. MaguireMichael A. MalesichGayle MatysekRobert L. McGarveyJames M. MillsMukund U. ModiDavid S. MorrisWilliam P. NeblettRichard E. NeeseDavid L. NicholsHans ObermeierRoy OishiLeslie A. OrlidgeEdward G. PerkinsDennis C. Pe

37、tersonAlain PlassartJeffrey RajhelWilliam E. ReevesWilliam RodriguezDavid RoggendorffDavid E. RolinceEric SacherHelmut ScheibenzuberWarren M. ScheininMichael L. SeaveyJohn W. SheppardLee A. ShombertWilliam R. SimpsonPhilip T. SmithJoseph J. StancoRobert StasonisJoseph L. StautbergKirk D. ThompsonRon

38、ald WaxmanJ. Richard WegerDaniel H. WeissLynn WheelwrightWilliam A. WhitakerRoger L. WilliamsWill W. YoungSatish K. AggarwalClyde R. CampJames T. CarloGary R. EngmannHarold E. EpsteinJay Forster*Thomas F. GarrityRuben D. GarzonJames H. GurneyJim D. IsaakLowell G. JohnsonRobert KennellyE. G. “Al” Kie

39、nerJoseph L. Koepfinger*Stephen R. LambertJim LogothetisDonald C. LoughryL. Bruce McClungLouis-Franois PauRonald C. PetersenGerald H. PetersonJohn B. PoseyGary S. RobinsonHans E. WeinrichDonald W. ZipseviCopyright 1999 IEEE. All rights reserved.Contents1. Overview 11.1 Scope 11.2 Purpose. 11.3 Appli

40、cation. 22. References 23. Definitions, acronyms, and abbreviations 33.1 Definitions 33.2 Acronyms. 84. ABBET overview. 84.1 Background 84.2 Purpose. 94.3 ABBET and the product life cycle. 94.4 ABBET framework 144.5 Specification techniques 154.6 ABBET component standards175. ABBET architecture. 175

41、.1 Scope 175.2 Fundamental concepts 185.3 Architecture levels . 195.4 Relation to other ABBET standards 216. Conformance 226.1 Interfaces 226.2 Implementation 237. CTIM 237.1 CTIM scope . 237.2 Overview 247.3 CTIM outline . 257.4 Applying the CTIM 257.5 CTIM and the ABBET domain 277.6 Relationship t

42、o the TFF . 287.7 EXPRESS source. 288. TFF. 298.1 Overview 298.2 TFF structure 308.3 TFF architecture. 328.4 TestObject management. 36Copyright 1999 IEEE. All rights reserved.viiAnnex A (normative) TFF interface definition file listings 38Annex B (normative) CTIM schema. 41Annex C (informative) Bibl

43、iography 50Copyright 1999 IEEE. All rights reserved.1IEEE ABBETIEEE Trial-Use Standard for A Broad-Based Environment for Test (ABBET)Overview and Architecture1. OverviewThe set of A Broad-Based Environment for Test (ABBET) standards and guides was developed by theABBET Subcommittee of the IEEE Stand

44、ards Coordinating Committee 20 (SCC20) to serve as standardsfor product test. ABBET specifies a comprehensive environment for integrating design data, test strategiesand requirements, test procedures, test results management, and test system implementations. The ABBETstandards consist of this base s

45、tandard and a series of component standards. A number of guides are associ-ated with the ABBET standards.1.1 ScopeThis standard defines the overall concept of ABBET and specifies mandatory requirements for its implemen-tation. This standard is the base document for the set of standards and guides th

46、at together comprise ABBET,and, as such, spans its complete capability.The scope includes various test-related activities over a products total life cycle and the key information thatis produced and used by these activities. ABBET supports a general test methodology that can be applied tovarious typ

47、es of products (electronic, mechanical, etc.), various levels of integration (system, subsystem,module, etc.), and various test applications (design verification test, manufacturing test, maintenance test,etc.).1.2 PurposeABBET is a set of software interface standards for the product test domain tha

48、t are intended to facilitate thetransition of test information and test implementation. These software interface standards are defined toIEEEStd 1226-1998 IEEE TRIAL-USE STANDARD FOR A BROAD-BASED ENVIRONMENT2Copyright 1999 IEEE. All rights reserved.support software component portability, reusabilit

49、y, exchangeability, and interoperability, and to serve astargets for test-related software development tools. This standard describes the elements of ABBET and their interrelationships and defines common terms to beused throughout the set. The purpose of this standard is to ensure that the elements in the ABBET set ofstandards and guides fit together as a cohesive whole.1.3 ApplicationThis standard provides an overview of the ABBET set of standards and guides for developing the following: ABBET-conformant test systems ABBET-based test program sets (TPSs) and test object