ANSI IEEE C63 22-2004 American National Standard Guide for Automated Electromagnetic Interference Measurements《电磁干扰自动测量美国国家标准指南》.pdf
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1、ANSI C63.22-2004IEEE StandardsC63.22American National StandardGuide for Automated ElectromagneticInterference Measurements3 Park Avenue, New York, NY 10016-5997, USAAccredited by the American National Standards InstituteSponsored by theAccredited Standards Committee on Electromagnetic Compatibility,
2、 C63IEEE Standards22 December 2004Print: SH95290PDF: SS95290ANSI C63.22-2004 American National Standard Guide for Automated Electromagnetic Interference Measurements Accredited Standards Committee on Electromagnetic Compatibility, C63 accredited by the American National Standards Institute Secretari
3、at Institute of Electrical and Electronics Engineers, Inc. Approved 24 June 2004 American National Standards Institute Reaffirmed 22 October 2012 American National Standards InstituteAbstract: U.S. consensus guideline for automation of conducted and radiated EMI compliance measurements is provided i
4、n this guide. This document does not include mandatory specifications for automation tools (i.e., application software, automated test equipment, computers and periph- erals). Where possible, the guidance provided herein is harmonized with other national and inter- national standards used for simila
5、r purposes. Keywords: conducted emissions, data analysis tools, data handling, exploratory measurements, facility integrity, final measurements, prescans, probability of signal intercept, radiated emissions, sweep times, scan rates The Institute of Electrical and Electronics Engineers, Inc. 3 Park A
6、venue, New York, NY 10016-5997, USA Copyright 2004 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 22 December 2004. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1-978-750-8400. Permission tophotocopy portio
7、ns of any individual standard for educational classroom use can also be obtained throughthe Copyright Clearance Center.iiiCopyright 2004 IEEE. All rights reserved.IntroductionThis introduction provides some background on the rationale used to develop this guide. This information ismeant to aid in th
8、e understanding and usage of this guide.This guide describes, in general terms, the use of automatic test equipment and the automation of measure-ments of electromagnetic emissions. It is intended for the following: Individuals or organizations who plan on automating Electromagnetic Interference (EM
9、I) measure-ments and acquire that application software from a supplier. Individuals or organizations who acquire EMI application software from a developer for resale toother individuals or organizations. Individuals or organizations who determine the feature set for EMI application software. Individ
10、uals or organizations who perform automated EMI measurements. Software suppliers interested in providing high-quality software to acquirers.This guide is designed to help individuals or organizations: Determine the appropriate feature set of EMI automation software Validate the settings of software
11、parameter used to perform measurements Determine requirements for test equipment to be used in an automated system Determine characteristics of automated test systems for a given test environmentThis guide is intended to satisfy the following objectives: Promote consistency within organizations in a
12、cquiring third-party software from software suppliers Provide useful guidelines for the implementation of automated test systems Provide useful practices on the determination of necessary software features to automate specifictests Provide useful practices on the use of software tools for data acqui
13、sition and data analysis purposes Assisting individuals and organizations judging the quality and adequacy of supplier softwareThe following individuals contributed to the preparation of this guide:Werner Schaefer, ChairEd ChadwickRobert Crawhall Robert HofmannChris Kendall Art LightSiegfried Linkwi
14、tz Dean PaulusPatrick RichardsonWilliam ScrivnerPaul Sikora Roger SouthwickBarry Wallen Norman WehlingMichael Windler John WyncottStan XavierThis introduction is not part of ANSI C63.22-2004, Guide for Automated Electromagnetic InterferenceMeasurements.ivCopyright 2004 IEEE. All rights reserved.At t
15、he time that the Accredited Standards Committee on Electromagnetic Compatibility, C63, approved thisguide, it had the following membership:Ralph M. Showers, ChairDonald N. Heirman, Vice-ChairRobert L. Pritchard, SecretaryOrganization Represented RepresentativeAlliance for Telecommunications Industry
16、 Solutions (ATIS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . C. Chrysanthou J. TurnerAmerican Council of Independent Laboratories (ACIL) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M. VioletteW. StumpfAmerican Radio Relay League (ARRL). . . . . . . . . .
17、. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . D. BodsonE. HareCurtis-Straus LLC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J. CurtisJ. StewartDell, Inc. . . . . . . . . . . . . . . . .
18、 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E. BronaughR. B. WallenETS-Lindgren . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . M. FoegelleZ. C
19、henFederal Communication Commission (FCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . W. HurstA. WallFood and Drug Administration (FDA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J. CasamentoJ. L. Silb
20、ergergHewlett-Packard . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . K. HallInformation Technology Industry Council (ITIC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J. HirvelaJ.
21、 RosenbergIEEE (Institute of Electrical and Electronics Engineers, Inc.) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . D. N. HeirmanIEEE Electromagnetic Compatibility Society . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . S. BergerD. SweeneyLuce
22、nt Technologies Bell Labs Innovations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . D. MoogilanNational Institute of Standards it includes the ground plane, weatherprotection, shielding, absorbers, support structures, and surroundings as well as ambient sign
23、als.3.16 sweep time: The time required by the measuring instrument to electronically tune across a selected frequency span.4. General guidelines for automated measurementsCare should be taken by the automated test system designer in obtaining a thorough understanding of all elements of the measureme
24、nt process, as well as of the measurement system to be used in the datacollection process. The performance of a measurement with a lack of such knowledge may result in theacquisition of erroneous and/or invalid data.The general automated test system can be divided into four distinct sections. These
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