IEC 62539-2007 Guide for the statistical analysis of electrical insulation breakdown data《电气绝缘击穿数据的统计分析用指南》.pdf

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1、 INTERNATIONAL STANDARD IEC 62539First edition 2007-07IEEE 930 Guide for the statistical analysis of electrical insulation breakdown data Reference number IEC 62539(E):2007 IEEE Std 930-2004 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEEE All rights reserved. IEEE is a registered tradema

2、rk in the U.S. Patent any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International O

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8、cessed through Technical Committee 112: Evaluation and qualification of electrical insulating materials and systems. The text of this standard is based on the following documents: IEEE Std FDIS Report on voting 930 (2004) 112/59/FDIS 112/69A/RVD Full information on the voting for the approval of thi

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28、 possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifyin

29、g patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Published by IEC under licence from IEEE. 2004 IEEE. All rights reserved. IEC 62539:2007(E) IEEE 930-2004(E) 5 IEEE Guide

30、 for the Statistical Analysis of Electrical Insulation Breakdown Data Sponsor Statistical Technical Committee of the IEEE Dielectrics and Electrical Insulation Society Approved 29 March 2005 American National Standards Institute Approved 23 September 2004 IEEE-SA Standards Board Abstract: This guide

31、 describes, with examples, statistical methods to analyze times to break down and breakdown voltage data obtained from electrical testing of solid insulating materials, for purposes including characterization of the system, comparison with another insulator system, and prediction of the probability

32、of breakdown at given times or voltages. Keywords: breakdown voltage and time, Gumbel, Lognormal distributions, statistical methods, statistical confidence limits, WeibullPublished by IEC under licence from IEEE. 2004 IEEE. All rights reserved. IEC 62539:2007(E) IEEE 930-2004(E) 6 IEEE Introduction

33、Endurance and strength of insulation systems and materials subjected to electrical stress may be tested using constant stress tests in which times to breakdown are measured for a number of test specimens, and progressive stress tests in which breakdown voltages may be measured. In either case it wil

34、l be found that a different result is obtained for each specimen and that, for given test conditions, the data obtained may be represented by a statistical distribution. Failure of solid insulation can be mostly described by extreme-value statistics, such as the Weibull and Gumbel distributions, but

35、, historically, also the lognormal function has been used. Methods for determining whether data fit to either of these distributions, graphical and computer-based techniques for estimating the most likely parameters of the distributions, computer-based techniques for estimating statistical confidenc

36、e intervals, and techniques for comparing data sets and some case studies are addressed in this guide. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged

37、to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter cov

38、ered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement an IE

39、EE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. This introduction in not part of IEEE Std 930-2004, IEEE Guide for the Statistical Analysis of Electrical Insulation Breakdown Data.Published by IEC under licence from IEEE. 2004 IEEE. All rights reserved. IEC 62539:2007(E) IEEE 930-2004(E) 7