欢迎来到麦多课文档分享! | 帮助中心 海量文档,免费浏览,给你所需,享你所想!
麦多课文档分享
全部分类
  • 标准规范>
  • 教学课件>
  • 考试资料>
  • 办公文档>
  • 学术论文>
  • 行业资料>
  • 易语言源码>
  • ImageVerifierCode 换一换
    首页 麦多课文档分享 > 资源分类 > PDF文档下载
    分享到微信 分享到微博 分享到QQ空间

    IEC 62539-2007 Guide for the statistical analysis of electrical insulation breakdown data《电气绝缘击穿数据的统计分析用指南》.pdf

    • 资源ID:1237586       资源大小:2MB        全文页数:52页
    • 资源格式: PDF        下载积分:10000积分
    快捷下载 游客一键下载
    账号登录下载
    微信登录下载
    二维码
    微信扫一扫登录
    下载资源需要10000积分(如需开发票,请勿充值!)
    邮箱/手机:
    温馨提示:
    如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
    如需开发票,请勿充值!如填写123,账号就是123,密码也是123。
    支付方式: 支付宝扫码支付    微信扫码支付   
    验证码:   换一换

    加入VIP,交流精品资源
     
    账号:
    密码:
    验证码:   换一换
      忘记密码?
        
    友情提示
    2、PDF文件下载后,可能会被浏览器默认打开,此种情况可以点击浏览器菜单,保存网页到桌面,就可以正常下载了。
    3、本站不支持迅雷下载,请使用电脑自带的IE浏览器,或者360浏览器、谷歌浏览器下载即可。
    4、本站资源下载后的文档和图纸-无水印,预览文档经过压缩,下载后原文更清晰。
    5、试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。

    IEC 62539-2007 Guide for the statistical analysis of electrical insulation breakdown data《电气绝缘击穿数据的统计分析用指南》.pdf

    1、 INTERNATIONAL STANDARD IEC 62539First edition 2007-07IEEE 930 Guide for the statistical analysis of electrical insulation breakdown data Reference number IEC 62539(E):2007 IEEE Std 930-2004 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEEE All rights reserved. IEEE is a registered tradema

    2、rk in the U.S. Patent any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International O

    3、rganization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each techn

    4、ical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publi

    5、cations is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their nati

    6、onal and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to b

    7、e in conformity with an IEC Publication. 6) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC/IEEE 62539 has been pro

    8、cessed through Technical Committee 112: Evaluation and qualification of electrical insulating materials and systems. The text of this standard is based on the following documents: IEEE Std FDIS Report on voting 930 (2004) 112/59/FDIS 112/69A/RVD Full information on the voting for the approval of thi

    9、s standard can be found in the report on voting indicated in the above table. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific public

    10、ation. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. Published by IEC under licence from IEEE. 2004 IEEE. All rights reserved. IEC 62539:2007(E) IEEE 930-2004(E) 4 IEC/IEEE Dual Logo International Standards This Dual Logo International Stand

    11、ard is the result of an agreement between the IEC and the Institute of Electrical and Electronics Engineers, Inc. (IEEE). The original IEEE Standard was submitted to the IEC for consideration under the agreement, and the resulting IEC/IEEE Dual Logo International Standard has been published in accor

    12、dance with the ISO/IEC Directives. IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. The IEEE develops its standards through a consensus development process, approved by the American

    13、 National Standards Institute, which brings together volunteers representing varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of the Institute and serve without compensation. While the IEEE administers the process and establishes rules to promote f

    14、airness in the consensus development process, the IEEE does not independently evaluate, test, or verify the accuracy of any of the information contained in its standards. Use of an IEC/IEEE Dual Logo International Standard is wholly voluntary. The IEC and IEEE disclaim liability for any personal inj

    15、ury, property or other damage, of any nature whatsoever, whether special, indirect, consequential, or compensatory, directly or indirectly resulting from the publication, use of, or reliance upon this, or any other IEC or IEEE Standard document. The IEC and IEEE do not warrant or represent the accur

    16、acy or content of the material contained herein, and expressly disclaim any express or implied warranty, including any implied warranty of merchantability or fitness for a specific purpose, or that the use of the material contained herein is free from patent infringement. IEC/IEEE Dual Logo Internat

    17、ional Standards documents are supplied “AS IS”. The existence of an IEC/IEEE Dual Logo International Standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEC/IEEE Dual Logo International Stan

    18、dard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. Every IEEE Standard is subjected to review at least every five years for revision

    19、 or reaffirmation. When a document is more than five years old and has not been reaffirmed, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of

    20、 any IEEE Standard. In publishing and making this document available, the IEC and IEEE are not suggesting or rendering professional or other services for, or on behalf of, any person or entity. Neither the IEC nor IEEE is undertaking to perform any duty owed by any other person or entity to another.

    21、 Any person utilizing this, and any other IEC/IEEE Dual Logo International Standards or IEEE Standards document, should rely upon the advice of a competent professional in determining the exercise of reasonable care in any given circumstances. Interpretations Occasionally questions may arise regardi

    22、ng the meaning of portions of standards as they relate to specific applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiate action to prepare appropriate responses. Since IEEE Standards represent a consensus of concerned interests, it is import

    23、ant to ensure that any interpretation has also received the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to interpretation requests except in those cases where the matte

    24、r has previously received formal consideration. Comments for revision of IEC/IEEE Dual Logo International Standards are welcome from any interested party, regardless of membership affiliation with the IEC or IEEE. Suggestions for changes in documents should be in the form of a proposed change of tex

    25、t, together with appropriate supporting comments. Comments on standards and requests for interpretations should be addressed to: Secretary, IEEE-SA Standards Board, 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331, USA and/or General Secretary, IEC, 3, rue de Varemb, PO Box 131, 1211 Geneva 2

    26、0, Switzerland. Authorization to photocopy portions of any individual standard for internal or personal use is granted by the Institute of Electrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to Copyright Clearance Center. To arrange for payment of licensing fee, ple

    27、ase contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. NOTE Attention is called to the

    28、 possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifyin

    29、g patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Published by IEC under licence from IEEE. 2004 IEEE. All rights reserved. IEC 62539:2007(E) IEEE 930-2004(E) 5 IEEE Guide

    30、 for the Statistical Analysis of Electrical Insulation Breakdown Data Sponsor Statistical Technical Committee of the IEEE Dielectrics and Electrical Insulation Society Approved 29 March 2005 American National Standards Institute Approved 23 September 2004 IEEE-SA Standards Board Abstract: This guide

    31、 describes, with examples, statistical methods to analyze times to break down and breakdown voltage data obtained from electrical testing of solid insulating materials, for purposes including characterization of the system, comparison with another insulator system, and prediction of the probability

    32、of breakdown at given times or voltages. Keywords: breakdown voltage and time, Gumbel, Lognormal distributions, statistical methods, statistical confidence limits, WeibullPublished by IEC under licence from IEEE. 2004 IEEE. All rights reserved. IEC 62539:2007(E) IEEE 930-2004(E) 6 IEEE Introduction

    33、Endurance and strength of insulation systems and materials subjected to electrical stress may be tested using constant stress tests in which times to breakdown are measured for a number of test specimens, and progressive stress tests in which breakdown voltages may be measured. In either case it wil

    34、l be found that a different result is obtained for each specimen and that, for given test conditions, the data obtained may be represented by a statistical distribution. Failure of solid insulation can be mostly described by extreme-value statistics, such as the Weibull and Gumbel distributions, but

    35、, historically, also the lognormal function has been used. Methods for determining whether data fit to either of these distributions, graphical and computer-based techniques for estimating the most likely parameters of the distributions, computer-based techniques for estimating statistical confidenc

    36、e intervals, and techniques for comparing data sets and some case studies are addressed in this guide. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged

    37、to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter cov

    38、ered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement an IE

    39、EE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. This introduction in not part of IEEE Std 930-2004, IEEE Guide for the Statistical Analysis of Electrical Insulation Breakdown Data.Published by IEC under licence from IEEE. 2004 IEEE. All rights reserved. IEC 62539:2007(E) IEEE 930-2004(E) 7


    注意事项

    本文(IEC 62539-2007 Guide for the statistical analysis of electrical insulation breakdown data《电气绝缘击穿数据的统计分析用指南》.pdf)为本站会员(deputyduring120)主动上传,麦多课文档分享仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文档分享(点击联系客服),我们立即给予删除!




    关于我们 - 网站声明 - 网站地图 - 资源地图 - 友情链接 - 网站客服 - 联系我们

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1 

    收起
    展开