JEDEC JESD50C-2018 Special Requirements for Maverick Product Elimination and Outlier Management.pdf

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1、JEDEC STANDARD Special Requirements for Maverick Product Elimination and Outlier Management JESD50C (Revision of JESD50B.01, November 2008) January 2018 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and publications contain material that has been prepared, reviewed, and approved th

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9、olid State Technology Association 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 or refer to www.jedec.org under Standards-Documents/Copyright Information. JEDEC Standard No. 50C -i- SPECIAL REQUIREMENTS FOR MAVERICK PRODUCT ELIMINATION AND OUTLIER MANAGEMENT Contents Page Foreword

10、ii Introduction ii 1 Scope 1 2 References 1 3 Terms and definitions 2 4 General requirements 4 4.1 Prerequisites 4 4.2 Documentation 4 4.3 Maverick and Outlier identification and management system 5 4.4 MPE alerts and corrective actions 7 5 Self audit 7 Annex A Guidelines for outlier identification

11、and removal 8 Annex B Differences between JESD50B.01 and JESD50B 11 JEDEC Standard No. 50C -ii- SPECIAL REQUIREMENTS FOR MAVERICK PRODUCT ELIMINATION AND OUTLIER MANAGEMENT Foreword This standard replaces both JESD50A and JESD62A. Introduction The component quality and reliability performance curren

12、tly being achieved by the electronic component industry has improved to a level where product anomalies have become a major impact to the end user. These situations have been called “Maverick Product” problems. These problems can occur in any commodity and the different performance of Maverick Produ

13、ct can significantly impact the expected performance of the commodity. Causes of Maverick Product can vary across the entire spectrum of processes including, but not limited to, fabrication, assembly, test, packing, and shipping operations. Maverick Product can result in one or more populations of m

14、aterial having an actual or potential problem that may go undetected until its use in the final application. The impact of this product on user quality, functionality and field reliability is costly, in terms of replacement costs, loss of business, and user satisfaction. The primary consideration is

15、 to protect the user from the potential impact of processing variation anomalies. Problem prevention is accomplished by eliminating atypical product and by using failure mechanism-based product monitors, process controls, and user data. Yield improvement programs do not necessarily provide this prot

16、ection. Maverick products are often eliminated using statistical quality control techniques including lot acceptance inspections. Due to inadequate, incomplete, or impossible to characterize device performance possibilities, some device characteristics or parameters ma y be incompletely tested or in

17、spected or not tested or inspected at all; thus, cannot be eliminated by standard statistical quality control based on manufacturer determined data only. Mavericks may occur within either specification or statistical control limits but are not part of the normal distribution that describes the popul

18、ation or process. Outliers are a subset of mavericks that are within specification but unusual compared to the prevailing distribution. JEDEC Standard No. 50C Page 1 SPECIAL REQUIREMENTS FOR MAVERICK PRODUCT ELIMINATION AND OUTLIER MANAGEMENT (From JEDEC Board Ballot JCB-17-49, formulated under the

19、cognizance of JC-14.3 Committee on Silicon Devices Reliability Qualification and Monitoring) 1 Scope The Maverick Product Elimination (MPE) and Outlier Management Standard was created to identify supplier requirements to improve the delivered quality and reliability of electronic components, and to

20、develop the programs and discipline required to minimize the probability of the user of electronic components receiving Maverick Product. This standard applies to the identification, control, and disposition of Maverick Product that can occur during fabrication, assembly, test, packing, or shipping

21、of any electronic component. It can be implemented for an entire product line or to segregate product that has a higher probability of adversely impacting quality or reliability. These activities may require special effort and, therefore can only be activated by mutual agreement between the user and

22、 the supplier. This system is known as an Outlier (or otherwise Maverick) Identification and Management System (OIMS) Outlier Identification and Management System (OIMS) is to identify process and defect anomalies, improve process controls, and improve end-user quality and reliability and to identif

23、y the root cause of the Outlier product. This procedure is also known as Part Average Testing per AEC Q001 Guidelines for Part Average Testing (PAT). 2 References JEP121, Requirements for Microelectronic Screening and Test Optimization. JEP131, Potential Failure Mode and Effects Analysis (FMEA). JEP

24、132, Process Characterization Guideline. JESD659, Failure-Mechanism-Driven Reliability Monitoring. JESD46, Customer Notification of Product/Process Changes by Solid-State Suppliers. JESD671, Component Quality Problem Analysis and Corrective Action Requirements (Including Administrative Quality Probl

25、ems). JESD557, Statistical Process Control Systems. JESD16, Assessment of Average Outgoing Quality Levels in Parts Per Million (PPM). ISO9000 Quality Management Systems Requirements. AEC Q001, Guidelines for Part Average Testing. JEDEC Standard No. 50C Page 2 3 Terms and definitions lower specificat

26、ion limit (LSL): The lower specification limit as defined in the component specification. maverick product: Product that exhibits significant anomalous characteristics that may cause a higher-than-normal level of failure anywhere in the users application or users manufacturing line. NOTE 1 In this d

27、efinition, “product” includes the electronic component, the first level packing (e.g., tray, tube, and tape and reel), the shipping container, labeling, and paperwork. NOTE 2 These significant anomalous characteristics can include initial quality defects, time-dependent reliability defects, defects

28、that affect next level of manufacturing, defects in product delivery process (such as labeling or shipping media), and defects in business process (such as shipping information). The characteristics may or may not be part of an existing product or process monitor, test, or inspection activity. NOTE

29、3 Maverick product may come from known noncompliant product, from compliant product that has a significant difference when compared to “typical“ product (but is still within specification limits), or from “normal“ product due to some previously unknown or unmonitored cause. noncompliant product: Pro

30、duct that fails to comply with user requirements, manufacturers specifications, or statistical process control levels that the supplier has deemed critical to reliability. outlier product: Product that meets manufacturer specifications and user requirements but exhibits anomalous characteristics wit

31、h respect to a normal population (an example of which is depicted by the histogram in the figure) and may be subject to a higher-than-normal level of failures in the users application. L SL U SL Sta ti stical T es t L i mi ts Ou tl i ers Ou tl i ers Figure 1 Depiction of eight outliers, seven of whi

32、ch are outlier products JEDEC Standard No. 50C Page 3 3 Terms and definitions (contd) product traceability: A methodology for tracing products, forward or backward, through the manufacturing flow to isolate materials that could be similar to product identified as having quality or reliability proble

33、ms. NOTE 1 For forward traceability, all products associated with a process step must be identifiable. NOTE 2 Backward traceability is the identification of the product at all stages from shipped product through raw material. rework: (1) The repetition of any operation or process step or sequence th

34、at creates or changes a portion of the devices structure, assembly, testing, or packing. (2) The intentional execution of operations not normally part of the manufacture of the item. robust mean robust variance: A mean variance calculated using a robust estimation procedure. robust estimation: A pro

35、cedure for estimating statistics, e.g., mean and variance, that performs well when there are departures (outliers) from the ideal conditions that have been postulated for the model. NOTE The estimate of the sample mean and/or variance is often made robust by a rejection-of-outliers procedure or the

36、use of a trimmed mean. upper specification limit (USL): The upper specification limit as defined in the component specification. JEDEC Standard No. 50C Page 4 4 General requirements 4.1 Prerequisites 4.1.1 Statistical process control (SPC) program Each supplier shall define and implement a Statistic

37、al Process Control (SPC) system involving all critical process nodes. Other useful references to correlate product characteristics and parameters, where applicable, to process controls include JEP121, JEP132, and JEP131. 4.1.2 Failure mechanism driven reliability monitoring program Each supplier sha

38、ll have a failure mechanism-driven reliability-monitoring program for design and control of processes and products. (Ref. JESD659 or equivalent.) 4.1.3 Product change notification (PCN) program Each supplier shall have a PCN (Product Change Notification) Program in place. (Ref. JESD46 or equivalent.

39、) 4.1.4 Outlier Identification and Management System for Electronic Components Each supplier shall have an outlier identification and management system in place for setting yield cut limits. 4.2 Documentation 4.2.1 MPE documentation requirements Each supplier shall maintain documentation (per ISO900

40、0 Quality Records requirements) supporting the following items to ensure program consistency through time. a) The details of the suppliers implementation of MPE. b) Records of all cases of suspected Outlier (or otherwise Maverick) Product. The results of investigative activity shall be recorded. Any

41、 corrective action taken as a result shall be documented. c) Records of all significantly higher fallout as reported by customers. This fallout could be at board assembly, at system assembly, or in the field. A summary of the suppliers investigative activity shall be recorded. If the higher fallout

42、was verified to be an MPE incident, then the supplier must document the following: 1) Action taken because of the incident to resolve the users problem. 2) Root cause of the Outlier (or otherwise Maverick) Product. 3) Corrective action taken by the supplier or user to eliminate recurrence. (Ref. JES

43、D671 or equivalent.) NOTE These records may be shared with the user at the discretion of the supplier. JEDEC Standard No. 50C Page 5 4.2 Documentation (contd) 4.2.2 Record retention All incidences recorded in 3.2.1 b) and 3.2.1 c) shall be retained for a minimum of 2 years. Where practical, retentio

44、n of these records for five years is recommended. 4.3 Maverick and outlier identification and management system OIMS test limits represent the application of statistical techniques for the removal of abnormal parts during part level testing (see Figure 2.4.1). A component specification usually defin

45、es the requirements needed for the part to work properly in the application. Every part (part as used here refers to a supplier part number) is built with a particular design and process that, if processed correctly, shall yield a certain consistent set of characteristic test results. OIMS uses stat

46、istical techniques to establish the limits on these test results. OIMS test limits are set up to remove these outliers (parts whose parameters are statistically different from the typical part) and should have minimal yield impact on correctly processed parts from a well-controlled process. The test

47、 limits may represent test data having either a symmetrical or skewed distribution. This test methodology is not limited to the standard component specification tests, but may also include extended operating tests (tests beyond the component specification requirements) to improve the ability to dete

48、ct special abnormal conditions and increase the sensitivity of this testing technique. The only restriction on extended operating tests is that the test shall not reduce the reliability of the parts that pass the test, and test data must be obtained under the same test conditions. The following sect

49、ion establishes the minimum implementation requirements for this standard 4.3.1 Test Limits The supplier shall establish a minimum and maximum acceptable yield at critical process steps (at least one) by product or product family (Ref. JESD557 or equivalent). Any product above the maximum acceptable yield must be evaluated to determine whether the product was tested properly. Generally accepted statistical methods shall be used to set minimum and maximum yield limits. NOTE small lot sizes may be exempted from the maximum yield calculation. In addition, the supplier shal