JEDEC JESD12-1985 Standard for Gate Array Benchmark Set《门阵列基准电设置标准》.pdf
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1、EIA JESDL2 85 3234600 0004777 b ,Y. - JEDECSTANDARD No. 12 STANDARD - FOR. GATEARRAY BENCHMARK SET JEDEC Solid state Products Engineering Counul I EIA JESDL2 85 m 3234b00 0004778 8 m NOTICE EDEC Standards and Publications contain material that has been prepared, progressively reviewed, and approved
2、through the JEDEC Cwncil level and subsequently reviewed and approved by the EIA General Counsel. JEDEC Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating inter- changeability and improvement o
3、f products, and assisting the purchaser in selecting and obtainng with minimum delay the proper product for his particular need. Existence of such standards shall not in any respect preclude any member or nonmember of JEDEC from manufacturing or selling products not conforming to such standards, nor
4、 shall the existence of such standards preclude their voluntary use by those other than EIA members whether the standard is to be used either domestically or internationally. Recommended Standards and Publications are adopted by JEDEC without regard to whether or not their adoption may involve paten
5、ts or articles, materials, or processes. By such action JEDEC does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the JEDEC Standards or Publications. The information included in JEDEC Standards and Publications represents a sound approac
6、h to product specification and application, principally from the solid state device manufacturer viewpoint. Within the JEDEC organization there are procedures whereby a JEDEC Standard or Publication may be further processed and ultimately become an EIA Standard. . Inquiries, comments, and suggestion
7、s relative to the content of this JEDEC Standard or Publication should be addressed .to the JEDEC Executive Secretary at EIA Headquarters, 2001 Eye Street, N.W., Washington, D.C. 20006. I Published by ELECTRONIC INDUSTRIES ASSOCIATION Engineering Department 2001 Eye Street, N.W. Washington, D.C. 200
8、06 Copyright 1985 ELECTRONIC INDUSTRIES ASSOCIATION PRICE: $8.00 Printed in U.S.A. JEDEC Standard No. 12 e STANDARD FOR GATE ARRAY BENCHMARK SET . TABLE OF CONTENTS Paraqraph 1.0 PURPOSE 2.0 REASON FOR REQUIREMENT 3.0 VENDOR PRESENTATION OF DATA 3.1 Performance Data 3.2 Performance Results Paqe 1 1
9、1 1 1 3.3 Specified Parameters 2 BENCHMARK 1 - 4 Bit ALU BENCHMARK 2 - 16 Bit ALU BENCHMARK 3 - 4 Bit Rotator BENCHMARK 4 - 16 Bit Rotator BENCHMARK 5 - 8 Bit Register BENCHMARK 6 - 8 Up/Down Counter BENCHMARK 7 - 3 to 8 Decoder BENCHMARK 8 - 16 x 4 RAM 10 BENCHMARK 9 - 9 Bit Parity Generator 11 4 *
10、 EIA JESDLZ 85 3234600 0004780 b JEDEC Standard No. 12 Page 1 STANDARD FOR GATE ARRAY BENCHMARK SET (From JEDEC Council Ballot JCB-83-29, formulated under the cognizance of JC-44 Committee on Gate Arrays.) 1.0 PURPOSE The purpose of these benchmarks is to provide a common set of high level functions
11、 which serve as vehicles for comparing the performance of gate arrays implemented in any technology using any internal structure. These benchmarks effectively provide an unbiased measure of gate array vendors ability to implement a desired complex function on a particular gate array at a known level
12、 of performance 2.0 REASON FOR REQUIREMENT Users of gate array technology encounter a great deal of difficulty in coming up with estimates of realistic performance measures for potential designs. This is because most performance data currently specified by industry vendors exists at SCI level (viz N
13、AND, NOR, INVERTER). Users need to know in advance of beginning a design, the estimated performance of some commonly used MSI functions such as counters, decoders, octal flip-flops, small ALUS etc. From this data they are able to construct an estimate of performance of critical portions of their res
14、pective designs and check the feasibility of building that circuit using a specified gate array technology. 3.0 VENDOR PRESENTATION OF DATA e While it is by no means mandatory that gate array vendors provide this data, a JEDEC standard benchmark inherently provides more consistency and structure in
15、the gate array marketplace which is advantageous to both vendors and users. 3.1 Performance Data Vendors may choose to provide their customers with such performance data based purely on simulated designs or alternatively choose to implement such macro elements as portions of test chips which they ma
16、y make available to customers for evaluation. 3.2 Performance Results . In all cases these performance results and parameters must specify the con- ditions and methods under which they are derived. include not only all they array elements that are used to implement the function, but also those that
17、have been made inaccessible or unusable due to routing constraints. Wherever multiple ac paths are possible from an input to an output, the vendor will specify the longest path. Array utilization should EIA JESDLZ! 85 m 3234600 0004781 8 m JEDEC Standard No. 12 Page 2 3.3 Specified Parameters Parame
18、ters specified should include but are not limited to: (1) (2) (3) DC static power, Total array elements used to implement each logic macro. Worst case dynamic power at vendor specified frequencies. I / EIA JESDL2 85 3234600 0004782 T JEDEC Standard No. 12 Page 3 Carry Propagate Carry Generate Carry
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