IESNA LM-85-2014 Approved Method for Electrical and Photometric Measurements of High-Power LEDs.pdf

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1、IES LM-85-14Approved Method: Electrical and Photometric Measurements of High-Power LEDsIES LM-85-14IES Approved Method for the Electrical and Photometric Measurements of High-Power LEDsPublication of this reporthas been approved by IES.Suggestions for revisionsshould be directed to IES.Prepared by:T

2、he Subcommittee on Solid-State Lighting ofthe IES Testing Procedures CommitteeIES LM-85-14Copyright 2014 by the Illuminating Engineering Society of North America.Approved by the IES Board of Directors, April 16, 2014, as a Transaction of the Illuminating Engineering Society of North America.All righ

3、ts reserved. No part of this publication may be reproduced in any form, in any electronic retrieval system or otherwise, without prior written permission of the IES.Published by the Illuminating Engineering Society of North America, 120 Wall Street, New York, New York 10005.IES Standards and Guides

4、are developed through committee consensus and produced by the IES Office in New York. Careful attention is given to style and accuracy. If any errors are noted in this document, please forward them to Rita Harrold, Director of Technology, at the above address for verification and correction. The IES

5、 welcomes and urges feedback and comments. ISBN # 978-0-87995-289-1Printed in the United States of America.DISCLAIMERIES publications are developed through the consensus standards development process approved by the American National Standards Institute. This process brings together volunteers repre

6、sent-ing varied viewpoints and interests to achieve consensus on lighting recommendations. While the IES administers the process and establishes policies and procedures to promote fairness in the development of consensus, it makes no guaranty or warranty as to the accuracy or completeness of any inf

7、ormation published herein. The IES disclaims liability for any injury to persons or property or other damages of any nature whatsoever, whether special, indirect, consequential or compensatory, directly or indirectly result-ing from the publication, use of, or reliance on this documentIn issuing and

8、 making this document available, the IES is not undertaking to render professional or other services for or on behalf of any person or entity. Nor is the IES undertaking to perform any duty owed by any person or entity to someone else. Anyone using this document should rely on his or her own indepen

9、dent judgment or, as appropriate, seek the advice of a competent professional in determining the exercise of reasonable care in any given circumstances.The IES has no power, nor does it undertake, to police or enforce compliance with the contents of this document. Nor does the IES list, certify, tes

10、t or inspect products, designs, or installations for compliance with this document. Any certification or statement of compliance with the require-ments of this document shall not be attributable to the IES and is solely the responsibility of the certifier or maker of the statement.IES LM-85-14Prepar

11、ed by the Subcommittee on Solid-State Lighting of the IES Testing Procedures CommitteeLM-85 Working GroupYoshi Ohno, Technical CoordinatorSubcommittee on Solid State LightingEmil Radkov, ChairDave EllisKei HaraguchiMark HodappJeff HulettJianzhong JiaoRand LeeGreg McKeeEmil RadkovEric RichmanRalph Tu

12、ttleYuqin ZongJohn Adinolfi*Carl Andersen*Alex BakerPeter Behnke*Robert BergerRolf BergmanBarry Besmanoff*Carl Bloomfield*Dennis Bradley*Eric BretschneiderKevin Broughton*Jennifer Burns*Michael Buzard*David Chan*Gigi ChanXiaolu Chen*Jason Chesley*Jeonghyeon Choi*Pei-Ting Chou*Ashfaqul Chowdhury*Zane

13、 Coleman*Grace Connelly*Keith Cook*Steven Coyne*James Creveling*James Dakin*Ronald Daubach*Lynn Davis*Marc Dyble*David Eckel*Phil Elizondo*Steven Ellersick*David EllisCaryl Kinsey Fox*Calvin Galberth*Austin Gelder*David Grandin*Michael GratherYongfeng Guan*Kei HaraguchiRudi Hechfellner*Kyle Hemmi*Ti

14、mothy Henning*Sylvia Herman*Tanya Hernandez*John Hickman*Yoelit Hiebert*Mark Hodapp*James HospodarskyBin Hou*Shuming Hua*Jeff HulettPo-Chieh Hung*Andrew JacksonJe Jang*David JenkinsAndrew (Sangkyoo) Jeon*Jianzhong JiaoJim KahnDemetrios KarambelasHamid Kashani*Tokihisa Kawabata*Philip Keebler*Shawn K

15、eeney*Tae Yeon Koo*Mihaly KotrebaiBecky KueblerJaekwang Lee*Rand LeeSunghee Lee*Michael Lehman*James Leland*Richard Li*Kurt Liepmann*Joseph Linquata*Steven LongoMin-Hao Lu*Jeremy Ludyjan*Ruiqing Ma*Vikrant Mahajan*Joseph MarellaMark McClear*Greg McKeeJonathan Melman*C. Cameron MillerMaria Nadal*Rona

16、ld Naus*Dante Nava*David Neal*Brandon Neale*Paul Nie*Andy Nishida*Michael OBoyle*Dan OHare*Yoshihiro Ohno*Michael ORegan*Marcel Pabst*Doosung Park*Sagar Patel*Michael Piscitelli*Michael Poplawski*Bruno Primerano*Emil RadkovSid Rane*Bipin Rao*Irina Rasputnis*Eric RichmanKelvin Rong*Ronald Rykowski*Ev

17、elyn Sahaja*Mark SapcoeJason SchutzKeith ScottFrank Shum*Scot Solimine*Lloyd Stafford*Gregory Staples*Gary SteinbergHeidi Steward*Jacki Swiernik*David Szombatfalvy*Ted Tomonaga*Ralph TuttleTatsukiyo Uchida*Venkat Venkataramanan*Yaqi Wang*Joseph Welch*Kurt Wilcox*Brienne Willcock*Vivian Wu*Wensheng X

18、u*Jeremy YonRichard Young*William Young*Gary Yu*John ZhangYuqin Zong* Advisory Member* Honorary MemberIES LM-85-14IES Testing Procedures CommitteeCameron Miller, ChairC. AndersenL. Ayers*A. Baker*R. BergerR. Bergin*R. BergmanE. BretschneiderD. Brooks*K. Broughton*D. Chan*P-T Chou*R. Collins*K. Curry

19、*R. Daubach*D. EllisP. Franck*R. Heinisch*K. Hemmi*T. Hernandez*R. HoranJ. HospodarskyS. Hua*P-C. Hung*D. Husby*S. Hutton*A. JacksonD. Jenkins*J. JiaoHS. JungM. KalkasD. KarambelasH. Kashani*R. Kelley*M. KotrebaiB. KueblerJ. Lawton*L. Leetzow*K. Lerbs*R. Levin*I. Lewin*R. Li*R. Low*J. MarellaP. McCa

20、rthyG. McKeeC. MillerB. MosherW. NewlandY. Ohno*G. Plank*E. RadkovD. RandolphE. Richman*M. SapcoeJ. Schutz*A. Smith*D. Smith*J K. Son*R. Speck*L. Stafford*G. SteinbergR. TuttleK. Wagner*J. Walker*H. Waugh*J. Welch*K. Wilcox*J. Yon*J. Zhang* Advisory Member* Honorary MemberIES LM-85-14ContentsIntrodu

21、ction.11.0 Scope .12.0 Normative References 23.0 Definitions23.1 Device Under Test (DUT) 23.2 Duv .23.3 Goniophotometer23.4 Gonio-Colorimeter .23.5 Gonio-Spectroradiometer .23.6 Heat Sink 23.7 High-Power LED.23.8 National Metrology Institute (NMI) 23.9 Photometer Head23.10 Remote Phosphor LED Packag

22、e .23.11 Settling Time .23.12 Sphere-Photometer 23.13 Sphere-Spectroradiometer 23.14 Temperature-Controlled Platform (TCP)23.15 Thermal Chamber .34.0 Preparation for Measurements .34.1 Seasoning .34.2 Operating Orientation 34.3 Thermal Conditions34.3.1 Junction Temperature 3 4.3.2 Temperature Contro

23、l of DUT 34.3.3 Ambient Temperature 35.0 Methods of Measurement under Pulse-Mode Operation of DUT.35.1 General35.2 Single Pulse Mode.35.2.1 Ambient Temperature Condition 45.2.2 Optical and Electrical Measurement Procedures .4 5.2.3 Estimation of Uncertainty and Correction due to Junction Temperature

24、 Error . . . . . . . . . . . . 45.3 Continuous Pulse Mode 55.3.1 Ambient Temperature Condition 55.3.2 Optical and Electrical Measurement Procedures .65.3.3 Estimation of Uncertainty and Correction due to Junction Temperature Error . . . . . . . . . . . . 66.0 Method of Measurement under DC-Mode Oper

25、ation of DUT 66.1 General66.2 Ambient Temperature Condition66.3 Measurement Procedures .6IES LM-85-147.0 Optical Measurement and Equipment77.1 Total Luminous Flux .77.1.1 Sphere-Spectroradiometer 77.1.2 Sphere-Photometer .87.1.3 Goniophotometer with a Photometer Head87.1.4 Gonio-Spectroradiometer .8

26、7.2 Luminous Efficacy.97.3 Total Radiant Flux .97.3.1 Using Sphere-Spectroradiometer or Gonio-Spectroradiometer .97.3.2 Conversion Method .97.4 Total photon Flux97.5 Luminous Intensity Distribution 97.6 Color Quantities.97.6.1 Sphere-Spectroradiometer .107.6.2 Gonio-Spectroradiometer or Gonio-Colori

27、meter .107.7 Wavelength Characteristics 107.7.1 Dominant Wavelength 107.7.2 Centroid Wavelength .107.7.3 Peak Wavelength 107.8 Uncertainties 108.0 Electrical Measurement and Equipment .108.1 Pulse Current Source and Pulse Current/Voltage Meter 108.2 Uncertainties 119.0 Test Report 11References.12Ann

28、ex A Pulse-Mode and DC-Mode Methods for LED Operation 13Annex B Estimation of TjRise and Correction .13Annex C Caution for Optical Measurement Instruments for Pulse-Mode Methods 15Annex D Integrating Sphere and Goniophotometer .15Annex E Integrating Sphere Geometries and Calibration Methods.16Annex

29、F General Design of Integrating Spheres .18Annex G Self-Absorption Correction .19Annex H Calibration of Sphere-Spectroradiometer .19Annex I Use of Spectroradiometer 20Annex J Other Sources of Error 21Annex K Sphere-Photometer System 21Annex L Goniophotometric Method for Total Luminous Flux .231IES L

30、M-85-14INTRODUCTIONThis document is a guide developed for the mea-surement of high-power light emitting diodes (LEDs), normally in a form of LED packages, used for lighting products. High-power LEDs are those that require a heat sink for their normal operation. The light output of an LED depends str

31、ongly on its thermal conditions, in particular, the junction temperatures Tj. Junction temperature, however, is difficult to mea-sure. Various different methods have been used to operate LEDs for photometric measurements and the results could not be compared. This document provides uniform test meth

32、ods for operation of high-power LEDs and test methods for photometric and colorimetric measurement of high-power LEDs.The photometric measurement of high-power LEDs has been difficult because they are highly sensitive to thermal operating conditions, and there has been a lack of common methods that

33、can be used by both LED manufactures and users to acquire reproduc-ible results. LED manufacturers normally use pulse operation, whereby, LEDs are measured with no heat sink and with the underlying assumption that the junction temperature under these conditions is equal to the room temperature, typi

34、cally 25C. Therefore, published LED specifications are normal-ly at junction temperature of 25C. High-power LEDs in actual lighting products, however, are operating in DC and at much higher temperatures (typically junc-tion temperature is 60C to over 100C), where their photometric and colorimetric v

35、alues tend to deviate significantly from the room temperature condition. To assist users, LED manufacturers make efforts to provide thermal characteristics data for higher operating temperatures; however, because LEDs are usually binned by LED manufacturers for their opti-cal and electrical characte

36、ristics at Tjequal to 25C, manufacturer data for higher operating temperatures is of limited use. There have been no standard methods for measuring high-power LEDs at high temperatures. This document provides reproducible measurement methods of LEDs at a given junction temperature in pulse or DC mod

37、e and provides the grounds for specification of LEDs at high tempera-ture conditions.Lighting product manufacturers often need to know the performance of LEDs operating in full rated DC current at a thermal equilibrium at much higher temperatures than 25C. To set or measure thermal conditions of the

38、 LED, “case temperature”, “pin tem-perature”, “board temperature”, “solder-point tem-perature”, or “heat sink temperature” are commonly used depending on the type of LED. While these methods are useful to reproduce the same condition for the particular LED, the results using these differ-ent methods

39、 cannot be compared with each other and cannot be reconciled into a universal standard method. Due to the optical characteristics of LEDs and their dependence on junction temperature, the only way to obtain reproducible results universally for all types of LEDs is by setting them to a specified junc

40、tion temperature. The test method described in this document is to set the LED under test to a pre-determined junction temperature, for measure-ment at either pulse mode or DC mode operation. Such a method can establish equivalence of results between the pulse mode tests (normally performed by LED m

41、anufacturers) and the DC mode tests (often preferred by users of LEDs).The photometric and radiometric information typi-cally required for high-power LEDs for lighting prod-ucts is total luminous flux (lumens), total radiant flux (watts), total photon flux (mol/s), and luminous effi-cacy (lm/W). The

42、 colorimetric information includes chromaticity coordinates (for all LEDs); correlated color temperature (CCT), Duv, and color rendering index (CRI) for white LEDs; dominant wavelength, centroid wavelength, and peak wavelengths (for colored LEDs). For the purpose of this document, the determination

43、of these values are referred to as optical measurements.The electrical characteristics typically required for high-power LEDs for lighting products are, input DC current, forward voltage, and input power. For the purpose of this document, the determination of these values are referred to as electric

44、al measurements.For special purposes, it may be useful to determine the characteristics of LEDs when they are oper-ated at conditions other than the nominal conditions described in this approved method. When measure-ments are conducted at conditions other than the nominal conditions, the results are

45、 valid only for the particular conditions under which they were obtained; these conditions shall be stated in the test report.1.0 SCOPEThis document describes the procedures to be fol-lowed and precautions to be observed in performing accurate measurements of total luminous flux, total radiant flux

46、(optical power), total photon flux, electri-cal power, luminous efficacy, color quantities, and wavelength characteristics of high-power light emit-ting diodes (LEDs) including white LEDs as well as single color LEDs. This document covers LED pack-ages (defined in ANSI/IES RP-16-10) including those

47、with multiple chips and remote-phosphor LED pack-2IES LM-85-14ages. This document covers measurement under pulse operation as well as steady DC operation of LEDs, and in all cases, the thermal condition of LEDs refers to their junction temperature. The approved methods apply to laboratory measuremen

48、ts.This document does not cover LED arrays or mod-ules, nor LED lighting products; it does not cover AC driven LEDs, and does not apply to measurements in LED manufacturers production control nor relative measurements of LED thermal characteristics.2.0 NORMATIVE REFERENCES2.1 ANSI/IES RP-16-10, Nome

49、nclature and Definitions for Illuminating Engineering.2.2 CIE S017/E:2011 ILV, International Lighting Vocabulary.2.3 ISO 23539:2005(E)/CIE S 010/E 2004, Photometry - The CIE System of Physical Photometry.2.4 ISO 11664-1:2007(E)/CIE S 014-1/E 2007, Colorimetry Part 1: CIE Standard Colorimetric Observers3.0 DEFINITIONS3.1 Device Under Test (DUT)High-power LED package under test.3.2 DuvThe closest distance from the chromaticity coordi-nate of the light source to the Planckian locus on the CIE (u, 2/3 v) coordinates with “+” sign for above and “-” sign for below the Planckian l