IESNA LM-85-2014 Approved Method for Electrical and Photometric Measurements of High-Power LEDs.pdf
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1、IES LM-85-14Approved Method: Electrical and Photometric Measurements of High-Power LEDsIES LM-85-14IES Approved Method for the Electrical and Photometric Measurements of High-Power LEDsPublication of this reporthas been approved by IES.Suggestions for revisionsshould be directed to IES.Prepared by:T
2、he Subcommittee on Solid-State Lighting ofthe IES Testing Procedures CommitteeIES LM-85-14Copyright 2014 by the Illuminating Engineering Society of North America.Approved by the IES Board of Directors, April 16, 2014, as a Transaction of the Illuminating Engineering Society of North America.All righ
3、ts reserved. No part of this publication may be reproduced in any form, in any electronic retrieval system or otherwise, without prior written permission of the IES.Published by the Illuminating Engineering Society of North America, 120 Wall Street, New York, New York 10005.IES Standards and Guides
4、are developed through committee consensus and produced by the IES Office in New York. Careful attention is given to style and accuracy. If any errors are noted in this document, please forward them to Rita Harrold, Director of Technology, at the above address for verification and correction. The IES
5、 welcomes and urges feedback and comments. ISBN # 978-0-87995-289-1Printed in the United States of America.DISCLAIMERIES publications are developed through the consensus standards development process approved by the American National Standards Institute. This process brings together volunteers repre
6、sent-ing varied viewpoints and interests to achieve consensus on lighting recommendations. While the IES administers the process and establishes policies and procedures to promote fairness in the development of consensus, it makes no guaranty or warranty as to the accuracy or completeness of any inf
7、ormation published herein. The IES disclaims liability for any injury to persons or property or other damages of any nature whatsoever, whether special, indirect, consequential or compensatory, directly or indirectly result-ing from the publication, use of, or reliance on this documentIn issuing and
8、 making this document available, the IES is not undertaking to render professional or other services for or on behalf of any person or entity. Nor is the IES undertaking to perform any duty owed by any person or entity to someone else. Anyone using this document should rely on his or her own indepen
9、dent judgment or, as appropriate, seek the advice of a competent professional in determining the exercise of reasonable care in any given circumstances.The IES has no power, nor does it undertake, to police or enforce compliance with the contents of this document. Nor does the IES list, certify, tes
10、t or inspect products, designs, or installations for compliance with this document. Any certification or statement of compliance with the require-ments of this document shall not be attributable to the IES and is solely the responsibility of the certifier or maker of the statement.IES LM-85-14Prepar
11、ed by the Subcommittee on Solid-State Lighting of the IES Testing Procedures CommitteeLM-85 Working GroupYoshi Ohno, Technical CoordinatorSubcommittee on Solid State LightingEmil Radkov, ChairDave EllisKei HaraguchiMark HodappJeff HulettJianzhong JiaoRand LeeGreg McKeeEmil RadkovEric RichmanRalph Tu
12、ttleYuqin ZongJohn Adinolfi*Carl Andersen*Alex BakerPeter Behnke*Robert BergerRolf BergmanBarry Besmanoff*Carl Bloomfield*Dennis Bradley*Eric BretschneiderKevin Broughton*Jennifer Burns*Michael Buzard*David Chan*Gigi ChanXiaolu Chen*Jason Chesley*Jeonghyeon Choi*Pei-Ting Chou*Ashfaqul Chowdhury*Zane
13、 Coleman*Grace Connelly*Keith Cook*Steven Coyne*James Creveling*James Dakin*Ronald Daubach*Lynn Davis*Marc Dyble*David Eckel*Phil Elizondo*Steven Ellersick*David EllisCaryl Kinsey Fox*Calvin Galberth*Austin Gelder*David Grandin*Michael GratherYongfeng Guan*Kei HaraguchiRudi Hechfellner*Kyle Hemmi*Ti
14、mothy Henning*Sylvia Herman*Tanya Hernandez*John Hickman*Yoelit Hiebert*Mark Hodapp*James HospodarskyBin Hou*Shuming Hua*Jeff HulettPo-Chieh Hung*Andrew JacksonJe Jang*David JenkinsAndrew (Sangkyoo) Jeon*Jianzhong JiaoJim KahnDemetrios KarambelasHamid Kashani*Tokihisa Kawabata*Philip Keebler*Shawn K
15、eeney*Tae Yeon Koo*Mihaly KotrebaiBecky KueblerJaekwang Lee*Rand LeeSunghee Lee*Michael Lehman*James Leland*Richard Li*Kurt Liepmann*Joseph Linquata*Steven LongoMin-Hao Lu*Jeremy Ludyjan*Ruiqing Ma*Vikrant Mahajan*Joseph MarellaMark McClear*Greg McKeeJonathan Melman*C. Cameron MillerMaria Nadal*Rona
16、ld Naus*Dante Nava*David Neal*Brandon Neale*Paul Nie*Andy Nishida*Michael OBoyle*Dan OHare*Yoshihiro Ohno*Michael ORegan*Marcel Pabst*Doosung Park*Sagar Patel*Michael Piscitelli*Michael Poplawski*Bruno Primerano*Emil RadkovSid Rane*Bipin Rao*Irina Rasputnis*Eric RichmanKelvin Rong*Ronald Rykowski*Ev
17、elyn Sahaja*Mark SapcoeJason SchutzKeith ScottFrank Shum*Scot Solimine*Lloyd Stafford*Gregory Staples*Gary SteinbergHeidi Steward*Jacki Swiernik*David Szombatfalvy*Ted Tomonaga*Ralph TuttleTatsukiyo Uchida*Venkat Venkataramanan*Yaqi Wang*Joseph Welch*Kurt Wilcox*Brienne Willcock*Vivian Wu*Wensheng X
18、u*Jeremy YonRichard Young*William Young*Gary Yu*John ZhangYuqin Zong* Advisory Member* Honorary MemberIES LM-85-14IES Testing Procedures CommitteeCameron Miller, ChairC. AndersenL. Ayers*A. Baker*R. BergerR. Bergin*R. BergmanE. BretschneiderD. Brooks*K. Broughton*D. Chan*P-T Chou*R. Collins*K. Curry
19、*R. Daubach*D. EllisP. Franck*R. Heinisch*K. Hemmi*T. Hernandez*R. HoranJ. HospodarskyS. Hua*P-C. Hung*D. Husby*S. Hutton*A. JacksonD. Jenkins*J. JiaoHS. JungM. KalkasD. KarambelasH. Kashani*R. Kelley*M. KotrebaiB. KueblerJ. Lawton*L. Leetzow*K. Lerbs*R. Levin*I. Lewin*R. Li*R. Low*J. MarellaP. McCa
20、rthyG. McKeeC. MillerB. MosherW. NewlandY. Ohno*G. Plank*E. RadkovD. RandolphE. Richman*M. SapcoeJ. Schutz*A. Smith*D. Smith*J K. Son*R. Speck*L. Stafford*G. SteinbergR. TuttleK. Wagner*J. Walker*H. Waugh*J. Welch*K. Wilcox*J. Yon*J. Zhang* Advisory Member* Honorary MemberIES LM-85-14ContentsIntrodu
21、ction.11.0 Scope .12.0 Normative References 23.0 Definitions23.1 Device Under Test (DUT) 23.2 Duv .23.3 Goniophotometer23.4 Gonio-Colorimeter .23.5 Gonio-Spectroradiometer .23.6 Heat Sink 23.7 High-Power LED.23.8 National Metrology Institute (NMI) 23.9 Photometer Head23.10 Remote Phosphor LED Packag
22、e .23.11 Settling Time .23.12 Sphere-Photometer 23.13 Sphere-Spectroradiometer 23.14 Temperature-Controlled Platform (TCP)23.15 Thermal Chamber .34.0 Preparation for Measurements .34.1 Seasoning .34.2 Operating Orientation 34.3 Thermal Conditions34.3.1 Junction Temperature 3 4.3.2 Temperature Contro
23、l of DUT 34.3.3 Ambient Temperature 35.0 Methods of Measurement under Pulse-Mode Operation of DUT.35.1 General35.2 Single Pulse Mode.35.2.1 Ambient Temperature Condition 45.2.2 Optical and Electrical Measurement Procedures .4 5.2.3 Estimation of Uncertainty and Correction due to Junction Temperature
24、 Error . . . . . . . . . . . . 45.3 Continuous Pulse Mode 55.3.1 Ambient Temperature Condition 55.3.2 Optical and Electrical Measurement Procedures .65.3.3 Estimation of Uncertainty and Correction due to Junction Temperature Error . . . . . . . . . . . . 66.0 Method of Measurement under DC-Mode Oper
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