GEIA EIA 557-B-2006 STATISTICAL PROCESS CONTROL SYSTEMS [Replaced JEDEC EIA-557-A]《统计过程控制系统》.pdf
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1、GEIA STANDARD STATISTICAL PROCESS CONTROL SYSTEMS EIA 557-B FEBRUARY 2006 GOVERNMENT ELECTRONICS AND INFORMATION TECHNOLOGY ASSOCIATION A Sector of the Electronic Industries Alliunc Copyright Government Electronics classification: excellent, good, poor), nominal data (i.e., unordered groupings such
2、as defect type), or pass/fail data. AUDIT: The periodic observation of procedures and performed activities to evaluate compliance with requirements. AVERAGE: The sum of the sample values divided by the number of sample values. A measure of location used to estimate the population mean. BINOMIAL DIST
3、RIBUTION: A specific discrete probability distribution for attributes data. CAPABILITY: The natural variation of the process due to common causes. CAPABILITY INDEX: A measure of the relationship between the specification limits and the capability. See EIA-738, I Guideline on the Use and Application
4、of Cpk“ and “The Use and Abuse of Cpk“ by Berton H. Gunter. CAUSE AND EFFECT DIAGRAM: A tool for individual or group problem-solving that uses a graphic description of the various process elements to analyze potential sources of process variation. Also called a Fishbone Diagram (after its appearance
5、) or Ishikawa Diagram (after its developer). cluster in the absence of a special cause. It is usually set at the average, median, or mode of the points being plotted, or (for a tunable process) at an achievable target value (to detect deviations from the value thought most desirable). attributes dat
6、a can be collected. CENTERLINE: A reference line on a control chart about which the chart points are expected to CHARACTERISTIC: A distinguishing feature of a process or its output on which variables or CHARACTERIZATION: A description of the characteristics of a product or process by CHECKLIST: A li
7、sting of the specified criteria that may be observed and checked off during an CHECK SHEET: A form for data collection. COMMON CAUSE: A source of natural variation that affects all the individual values of the process output being studied. In control chart analysis it appears as part of the random p
8、rocess variation. CONTROL CHART: A graphic representation of a process characteristic showing plotted values of some statistic gathered from that characteristic; a central line and one or two statistically derived control limits. Two basic uses are to determine whether a process has been operating i
9、n statistical control and to aid in maintaining statistical control. causes alone. Variation beyond a control limit may be evidence that special causes are affecting the process. Control limits are calculated from process data and are usually represented as a line (or lines) on a control chart. They
10、 are not to be confused with engineering specification limits. mathematical modeling, design of experiments or statistical data evaluation. audit or inspection. CONTROL LIMITS: The maximum allowable variation of a process characteristic due to common 6 Copyright Government Electronics about 95.44% l
11、ie within plus or minus two standard deviation units of the mean; and about 99.73% of all individuals lie within plus or minus three standard deviation units of the mean. PARAMETER: A numerical characteristic of a population. 7 Copyright Government Electronics the property of being in statistical co
12、ntrol. STABLE PROCESS: A process that is in statistical control. STANDARD DEVIATION: A measure of the spread or variation in a probability distribution (population standard deviation) or in a sample of values measured on the output from a process (sample standard deviation). parameter of the populat
13、ion from which the sample came. variation have been eliminated and only common causes remain. statistical techniques to document, correct and improve process performance. and ensure compliance with requirements. STATISTIC: A value calculated from or based upon sample data used to make inferences abo
14、ut a STATISTICAL CONTROL: The conditions describing a process from which all special causes of STATISTICAL PROCESS CONTROL (SPC): The conversion of data to information using STATISTICAL QUALITY CONTROL (SQC): Statistical methods and procedures used to document TARGET: The desired value for a statist
15、ic of a characteristic or parameter of a process node. TREND: The movement of a process in an increasing or decreasing direction. VARIABLES DATA: A measure of a characteristic where every value within a given interval is VARIATION: The difference among individual outputs of a process. The sources of
16、 variation can be YIELD: The number of units that pass some inspection criteria divided by the number submitted. possible. grouped into two major classes: common causes and special causes. 9 Copyright Government Electronics Republished ASQ, 1980. SHEWHART, WALTER A., From the Viewpoint of Quality Co
17、ntrol, Dover Publications, Inc., New York, 1986. TAGUCHI, GENICHI, Introduction to Quality Engineering, Asian Productivity Organization, Unipub-Kraus International Publications, White Plains, New York, 1986. VAUGHN, RICHARD C., Introduction to Industrial Engineering, Iowa State University Press, Ame
18、s, Iowa, 1967. WALPOLE, RONALD E., .U) Does the SPC system include requirements for determining and characterizing critical process nodes? (3.0) Does the SPC system include requirements for determining gage characteristics and capability? (.3.0) Does the SPC system include requirements for determini
19、ng process characteristics and capability? (33) Does the SPC system include requirements for documenting the process control system? (3.0) Does the SPC system include requirements to utilize appropriate on-line and off-line process control methods? (3.0) Does the SPC system include requirements for
20、determining SPC training needs and ensuring that those needs are fulfilled? (34) Does the SPC system include requirements for suppliers to implement and maintain SPC systems? (20) Does the SPC system include requirements to calibrate all inspection, measuring and test equipment used to measure proce
21、ss/product parameters? (XU) Does the SPC system include requirements for determining what preventive maintenance is needed and how frequently it must be performed? (3.0) Does the SPC system include requirements to perform periodic self audits? (3.0) Is the quality management system documented and ca
22、pable of being audited? (u) 14 Copyright Government Electronics .%.) Have the personnel performing product related SPC activities received adequate and appropriate training to perform those activities? (6.9) NOTE: The training program shall provide the necessary training to management, engineering,
23、technical personnel, production supervisors, operators, and support personnel. Has the training been tailored to individual functions and responsibilities within the organization? (6.9) NOTE: Suggested training topics are presented in Anxex D. Does the training include all of the SPC techniques that
24、 are being utilized? (0) Does the manufacturer have a documented program to encourage suppliers to use Are the SPC methods that suppliers are encouraged to use consistent with this standard? (u) NOTE: suppliers materials and components, criticality to the manufacturers processes, and resources of th
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