FORD ESF-M99G150-A-2006 ELECTROGRAPHITE BRUSH MATERIAL 2500-6500 MICRO OHM CM SPECIFIC RESISTANCE TO BE USED WITH FORD WSS-M99P1111-A 《2500-6500 MICRO OHM CM比电阻石墨电刷材料 与标准FORD WS.pdf
《FORD ESF-M99G150-A-2006 ELECTROGRAPHITE BRUSH MATERIAL 2500-6500 MICRO OHM CM SPECIFIC RESISTANCE TO BE USED WITH FORD WSS-M99P1111-A 《2500-6500 MICRO OHM CM比电阻石墨电刷材料 与标准FORD WS.pdf》由会员分享,可在线阅读,更多相关《FORD ESF-M99G150-A-2006 ELECTROGRAPHITE BRUSH MATERIAL 2500-6500 MICRO OHM CM SPECIFIC RESISTANCE TO BE USED WITH FORD WSS-M99P1111-A 《2500-6500 MICRO OHM CM比电阻石墨电刷材料 与标准FORD WS.pdf(3页珍藏版)》请在麦多课文档分享上搜索。
1、 ENGINEERING MATERIAL SPECIFICATION Date Action Revisions 2006 09 26 Revised Inserted 3.0; Deleted 3.1, 3.6 & 4 2000 09 25 Revised Updated A. Cockman 1987 12 01 Released CF4R RD 107002-87 Printed copies are uncontrolled Copyright 2006, Ford Global Technologies, LLC Page 1 of 3 ELECTROGRAPHITE BRUSH
2、MATERIAL, 2500 - 6500 micro ohm.cm ESF-M99G150-A SPECIFIC RESISTANCE 1. SCOPE The material defined by this specification is an electrographite brush. 2. APPLICATION This specification was released originally for material used as an electrographite brush in alternators for long life trucks. 3. REQUIR
3、EMENTS Material specification requirements are to be used for initial qualification of materials. 3.0 STANDARD REQUIREMENTS FOR PRODUCTION MATERIALS Material suppliers and part producers must conform to the Companys Standard Requirements For Production Materials (WSS-M99P1111-A). 3.2 SPECIFIC RESIST
4、ANCE 2500 - 6500 micro ohm.cm Test Method: The apparatus consists of 2 jaws which can be closed firmly against the ends of the test specimen. The jaws should be faced with silver-plated copper gauze, backed with resilient pads to insure uniform current distribution into the ends of the piece. The si
5、ze of the test specimen is immaterial, providing it fulfills the following requirement for accurate results. The length should be at least 4 times the width and thickness dimensions and the spacing between pointers should be no more than 1/2 the length of the specimen. For a test specimen the specif
6、ic resistance is defined as follows: E x A r = - x 1000 I x L where: r = specific resistance in micro ohm.cm E = millivolt drop between pointers A = cross-sectional area, cm2 I = current in amperes L = pointer spacing, cm ENGINEERING MATERIAL SPECIFICATION ESF-M99G150-A Printed copies are uncontroll
7、ed Copyright 2006, Ford Global Technologies, LLC Page 2 of 3 The convenient method for obtaining readings of specific resistance that are a multiplier of the potential drop in millivolts is to proceed as follows: For SI units, use voltmeter (or millivoltmeter) pointers that are accurately spaced 2 c
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