ETSI TS 103 254-2017 Methods for Testing and Specification (MTS) TTCN-3 Conformance Test Suite for use of XML schema Test Suite Structure and Test Purposes (TSS & TP) (V1 3 1 Inclu.pdf
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1、 ETSI TS 103 254 V1.3.1 (2017-09) Methods for Testing and Specification (MTS); TTCN-3 Conformance Test Suite for use of XML schema; Test Suite Structure and Test Purposes (TSS Essential, or potentially Essential, IPRs notified to ETSI in respect of ETSI standards“, which is available from the ETSI S
2、ecretariat. Latest updates are available on the ETSI Web server (https:/ipr.etsi.org/). Pursuant to the ETSI IPR Policy, no investigation, including IPR searches, has been carried out by ETSI. No guarantee can be given as to the existence of other IPRs not referenced in ETSI SR 000 314 (or the updat
3、es on the ETSI Web server) which are, or may be, or may become, essential to the present document. Trademarks The present document may include trademarks and/or tradenames which are asserted and/or registered by their owners. ETSI claims no ownership of these except for any which are indicated as be
4、ing the property of ETSI, and conveys no right to use or reproduce any trademark and/or tradename. Mention of those trademarks in the present document does not constitute an endorsement by ETSI of products, services or organizations associated with those trademarks. Foreword This Technical Specifica
5、tion (TS) has been produced by ETSI Technical Committee Methods for Testing and Specification (MTS). Modal verbs terminology In the present document “shall“, “shall not“, “should“, “should not“, “may“, “need not“, “will“, “will not“, “can“ and “cannot“ are to be interpreted as described in clause 3.
6、2 of the ETSI Drafting Rules (Verbal forms for the expression of provisions). “must“ and “must not“ are NOT allowed in ETSI deliverables except when used in direct citation. ETSI ETSI TS 103 254 V1.3.1 (2017-09)5 1 Scope The purpose of the present document is to provide Test Suite Structure and Test
7、 Purposes (TSS The Testing and Test Control Notation version 3; Part 9: Using XML schema with TTCN-3“. 2 ISO/IEC 9646-1 (1992): “Information Technology - Open Systems Interconnection - Conformance Testing Methodology and Framework - Part 1: General concepts“. 3 ISO/IEC 9646-7 (1994): “Conformance te
8、sting methodology and framework - Part 7: Implementation Conformance Statement“. 4 ETSI TS 102 995: “Methods for Testing and Specification (MTS); The Testing and Test Control Notation version 3; Proforma for TTCN-3 reference test suite“. 5 ETSI ES 201 873-1: “Methods for Testing and Specification (M
9、TS); The Testing and Test Control Notation version 3; Part 1: TTCN-3 Core Language“. 2.2 Informative references References are either specific (identified by date of publication and/or edition number or version number) or non-specific. For specific references, only the cited version applies. For non
10、-specific references, the latest version of the referenced document (including any amendments) applies. NOTE: While any hyperlinks included in this clause were valid at the time of publication, ETSI cannot guarantee their long term validity. The following referenced documents are not necessary for t
11、he application of the present document but they assist the user with regard to a particular subject area. i.1 ETSI ES 201 873-1: “Methods for Testing and Specification (MTS); The Testing and Test Control Notation version 3; Part 1: TTCN-3 Core Language“. i.2 ETSI ES 201 873-5: “Methods for Testing a
12、nd Specification (MTS); The Testing and Test Control Notation version 3; Part 5: TTCN-3 Runtime Interface (TRI)“. i.3 ETSI ES 201 873-6: “Methods for Testing and Specification (MTS); The Testing and Test Control Notation version 3; Part 6: TTCN-3 Control Interface (TCI)“. i.4 ETSI ES 201 873-7: “Met
13、hods for Testing and Specification (MTS); The Testing and Test Control Notation version 3; Part 7: Using ASN.1 with TTCN-3“. ETSI ETSI TS 103 254 V1.3.1 (2017-09)6 i.5 ETSI ES 201 873-8: “Methods for Testing and Specification (MTS); The Testing and Test Control Notation version 3; Part 8: The IDL to
14、 TTCN-3 Mapping“. i.6 ETSI ES 202 781: “Methods for Testing and Specification (MTS); The Testing and Test Control Notation version 3; TTCN-3 Language Extensions: Configuration and Deployment Support“. i.7 ETSI ES 202 784: “Methods for Testing and Specification (MTS); The Testing and Test Control Not
15、ation version 3; TTCN-3 Language Extensions: Advanced Parameterization“. i.8 ETSI ES 202 785: “Methods for Testing and Specification (MTS); The Testing and Test Control Notation version 3; TTCN-3 Language Extensions: Behaviour Types“. 3 Definitions and abbreviations 3.1 Definitions For the purposes
16、of the present document, the terms and definitions given in ISO/IEC 9646-1 2, ISO/IEC 9646-7 3, ETSI ES 201 873-1 5 (TTCN-3) and the following apply: Abstract Test Suite (ATS): test suite composed of abstract test cases ICS pro forma: document, in the form of a questionnaire, which when completed fo
17、r an implementation or system becomes an ICS Implementation Conformance Statement (ICS): statement made by the supplier of an implementation claimed to conform to a given specification, stating which capabilities have been implemented Implementation eXtra Information for Testing (IXIT): statement ma
18、de by a supplier or implementor of an IUT which contains or references all of the information related to the IUT and its testing environment, which will enable the test laboratory to run an appropriate test suite against the IUT Implementation Under Test (IUT): implementation of one or more OSI prot
19、ocols in an adjacent user/provider relationship, being part of a real open system which is to be studied by testing IXIT pro forma: document, in the form of a questionnaire, which when completed for the IUT becomes the IXIT 3.2 Abbreviations For the purposes of the present document, the following ab
20、breviations apply: ATS Abstract Test Suite ICS Implementation Conformance Statement IUT Implementation under Test IXIT Implementation eXtra Information for Testing TC Test Case TCI TTCN-3 Control Interface TP Test Purpose TRI TTCN-3 Runtime Interface TS Test System TSS Test Suite Structure TSS b) ne
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