EN 55017-2011 en Methods of measurement of the suppression characteristics of passive EMC filtering devices《无源电磁兼容性(EMC)滤波装置抑制特性的测定方法》.pdf

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1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationBS EN 55017:2011Methods of measurement ofthe suppression characteristicsof passive EMC filtering devicesBS EN 55017:2011 BRITISH STANDARDNational forewordThis British Standard is

2、 the UK implementation of EN 55017:2011. It is identical to CISPR 17:2011. It supersedes BS 6299:1982 which will bewithdrawn on 15 July 2014.The UK participation in its preparation was entrusted to TechnicalCommittee GEL/210/12, EMC basic, generic and low frequencyphenomena Standardization.A list of

3、 organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. BSI 2011ISBN 978 0 580 60082 1ICS 33.100.01Compliance with a British St

4、andard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of theStandards Policy and Strategy Committee on 31 October 2011.Amendments issued since publicationDate Text affectedBS EN 55017:2011EUROPEAN STANDARD EN 55017 NORME EUROPENNE EUROPISCHE NORM

5、 September 2011 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2011 CENELEC - All rights of exploitation in any form and by any mea

6、ns reserved worldwide for CENELEC members. Ref. No. EN 55017:2011 E ICS 33.100.01 English version Methods of measurement of the suppression characteristics of passive EMC filtering devices (CISPR 17:2011) Mthodes de mesure des caractristiques dantiparasitage des dispositifs de filtrage CEM passifs (

7、CISPR 17:2011) Verfahren zur Messung der Entstreigenschaften von passiven EMV-Filtern (CISPR 17:2011) This European Standard was approved by CENELEC on 2011-07-15. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European St

8、andard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (

9、English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committee

10、s of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the

11、 United Kingdom. BS EN 55017:2011EN 55017:2011 - 2 - Foreword The text of document CISPR/A/941/FDIS, future edition 2 of CISPR 17, prepared by CISPR SC A, “Radio-interference measurements and statistical methods“, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 55017

12、 on 2011-07-15. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent rights. The following dates were fixed: latest date by which the EN has to be imp

13、lemented at national level by publication of an identical national standard or by endorsement (dop) 2012-04-15 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2014-07-15 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the Internatio

14、nal Standard CISPR 17:2011 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following note has to be added for the standard indicated: CISPR 12:2007 NOTE Harmonized as EN 55012:2007 (not modified). _ BS EN 55017:2011- 3 - EN 5501

15、7:2011 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the l

16、atest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60050-161 - International Electrotechnical Vocabulary (

17、IEV) - Chapter 161: Electromagnetic compatibility - - 2 CISPR 17 IEC:2011 CONTENTS FOREWORD . 6 INTRODUCTION . 8 1 Scope . 9 2 Normative references . 9 3 Terms, definitions and abbreviations 9 3.1 Terms and definitions 9 3.2 Abbreviations 12 4 Classification of EMC filtering devices 12 4.1 Insertion

18、 loss . 14 4.1.1 Insertion loss calculation . 14 4.1.2 Asymmetrical (common) mode . 14 4.1.3 Symmetrical (differential) mode . 14 4.1.4 Unsymmetrical mode . 14 4.2 Impedance 14 4.3 S-parameters . 15 4.3.1 General . 15 4.3.2 Two-port S-parameters 15 4.3.3 Four-port S-parameters 16 5 Insertion loss me

19、asurement 17 5.1 General . 17 5.2 Measurement set-up 18 5.2.1 General . 18 5.2.2 Test equipment 18 5.2.3 Asymmetrical (common mode) test circuit 19 5.2.4 Symmetrical (differential mode) test circuit 19 5.2.5 Unsymmetrical test circuit 20 5.3 Measurement methods (procedure) . 21 5.3.1 General . 21 5.

20、3.2 Measurement without bias . 22 5.3.3 Measurement with bias 22 5.4 Calibration and verification 23 5.4.1 General . 23 5.4.2 Validation of test set-up without bias . 23 5.4.3 Validation of test set-up with bias 24 5.5 Uncertainty 26 6 Impedance measurement . 26 6.1 General . 26 6.2 Direct method 26

21、 6.2.1 Measurement set-up and procedure 26 6.2.2 Calibrations of the test set-up 27 6.2.3 Measurement uncertainty 27 6.3 Indirect method . 27 6.3.1 Measurement set-up and procedure 27 6.3.2 Calibration of the test set-up 29 6.3.3 Measurement uncertainty 29 7 S-parameter measurement 30 CISPR 17 IEC:2

22、011 3 7.1 Measurement set-up and procedure 30 7.1.1 General . 30 7.1.2 Test fixture 31 7.2 Calibration of test set-up . 36 7.3 Measurement uncertainties . 36 8 Presentation of results 36 8.1 General . 36 8.2 Insertion loss . 37 8.3 Impedance 37 8.4 S-parameters . 37 Annex A (normative) Uncertainty e

23、stimation for the measurement of the suppression characteristics of EMC filtering devices 38 Annex B (informative) Examples of test boxes for insertion loss measurement . 43 Annex C (informative) Insertion loss test methods with non-50 systems . 47 Annex D (informative) Realization of the buffer-net

24、work for insertion loss measurement . 49 Annex E (informative) Insertion loss measurement General discussion . 51 Annex F (informative) Set-up for impedance measurement 54 Annex G (informative) S-parameter measurement of common-mode choke coils 59 Annex H (informative) Measurement set-up for S-param

25、eters of a DUT without wire leads 64 Bibliography 66 Figure 1 Measurement arrangement for S-parameters of a two-terminal device 15 Figure 2 Measurement arrangement for S-parameters of a three-terminal device . 15 Figure 3 Measurement arrangement for four-port S-parameters 16 Figure 4 Test circuit fo

26、r insertion loss measurement (example: 4-line-filter) . 18 Figure 5 Test circuit for asymmetrical insertion loss measurement (example: 4-line-filter) . 19 Figure 6 Test circuit for symmetrical insertion loss measurement (example: 4-line-filter) . 20 Figure 7 Test circuit for unsymmetrical insertion

27、loss measurement (example: 4-line filter) . 21 Figure 8 Test circuit for insertion loss measurement without bias . 22 Figure 9 Test circuit for insertion loss measurement with bias 22 Figure 10 Test circuit for verification of measurement circuit without bias 23 Figure 11 Test circuit for verificati

28、on of measurement circuit with bias . 25 Figure 12 One-port measurement of a two-terminal device 28 Figure 13 S-parameter measurements for evaluating the impedance of a device in a series connection 28 Figure 14 S-parameter measurements for evaluating the impedance of a device in a shunt connection.

29、 28 Figure 15 Two-port S-parameter measurement set-up 30 Figure 16 An alternative measurement system specifically for the insertion loss of a DUT (using a combination of tracking generator and measuring receiver) 31 Figure 17 Symbolic expressions . 32 Figure 18 Test fixture for a two-terminal device

30、 (series connection) . 32 4 CISPR 17 IEC:2011 Figure 19 Test fixture for a two-terminal device (shunt connection) 33 Figure 20 Test fixture for a three-terminal filter 33 Figure 21 Test fixture for a two-terminal device with leads . 34 Figure 22 Test fixture for a three-terminal filter with leads 35

31、 Figure 23 Test fixture for a core device 35 Figure 24 Example of the standards for TRL calibration . 36 Figure B.1 Design of typical test box for general-purpose filters . 43 Figure B.2 3D view of typical test box for general purpose filters . 44 Figure B.3 Design of typical test box for feedthroug

32、h components . 45 Figure B.4 3D view of typical test box for feedthrough components 45 Figure C.1 Test circuit 47 Figure D.1 Example of connecting buffer-networks for test with bias 49 Figure E.1 Test circuit for insertion loss measurement, reference measurement (filter replaced by a short circuit)

33、. 51 Figure E.2 Test circuit for insertion loss measurement, measurement of filter under test . 52 Figure F.1 Measurement set-up for a leaded device (DUT) 54 Figure F.2 Four-terminal test fixture for a leaded device (DUT) 55 Figure F.3 Measurement set-up for an SMD . 55 Figure F.4 Clamp-type test fi

34、xture 56 Figure F.5 Coaxial test fixture for an SMD . 56 Figure F.6 Press-type test fixture for an SMD. 57 Figure F.7 Connection for CMCC measurement . 57 Figure F.8 Test fixture and measurement set-up for an SMD common-mode choke coil 58 Figure G.1 Common-mode choke coil 59 Figure G.2 Set-up for me

35、asurements of common-mode characteristics 59 Figure G.3 Test fixture for an SMD. 60 Figure G.4 Test fixture for a leaded device 60 Figure G.5 Set-up for measurements of differential-mode characteristics . 61 Figure G.6 Test fixture for an SMD. 61 Figure G.7 Test fixture for a leaded device . 61 Figu

36、re G.8 Set-up for measurement of four-port S-parameters . 62 Figure G.9 Test fixture for the four-port S-parameters of an SMD . 62 Figure G.10 Test fixture for the four-port S-parameters of a leaded device . 63 Figure H.1 S-parameters measurement of a DUT without leads 64 Figure H.2 Procedure for TR

37、L calibration . 65 Table 1 Examples of EMC filtering devices 13 Table 2 Conditions and target values for validation of test set-up without bias . 24 Table 3 Conditions and target values for validation of test set-up with bias 25 Table A.1 Measurement uncertainty of insertion loss (example) . 40 Tabl

38、e A.2 Measurement uncertainty of impedance (example) . 41 Table A.3 Measurement uncertainties of |S21| and |S12| (example) 41 Table A.4 Measurement uncertainties of |S11| and |S22| (example) 41 CISPR 17 IEC:2011 5 Table D.1 Specifications of the elements of buffer-networks 50 6 CISPR 17 IEC:2011 INT

39、ERNATIONAL ELECTROTECHNICAL COMMISSION _ METHODS OF MEASUREMENT OF THE SUPPRESSION CHARACTERISTICS OF PASSIVE EMC FILTERING DEVICES FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC

40、 National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,

41、Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-go

42、vernmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IE

43、C on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are acce

44、pted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote internatio

45、nal uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the la

46、tter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users sho

47、uld ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other dam

48、age of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of

49、 the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard CISPR 17 has been prepared by CISPR subcommittee A: Radio interference