EN 172-1994 en Personal Eye Protection - Sunglare Filters for Industrial Use (Incorporates Amendments A1 2000 and A2 2001)《人眼防护 工业用遮光过滤镜 包含修改件A1-2000和A2-2001》.pdf

《EN 172-1994 en Personal Eye Protection - Sunglare Filters for Industrial Use (Incorporates Amendments A1 2000 and A2 2001)《人眼防护 工业用遮光过滤镜 包含修改件A1-2000和A2-2001》.pdf》由会员分享，可在线阅读，更多相关《EN 172-1994 en Personal Eye Protection - Sunglare Filters for Industrial Use (Incorporates Amendments A1 2000 and A2 2001)《人眼防护 工业用遮光过滤镜 包含修改件A1-2000和A2-2001》.pdf（20页珍藏版）》请在麦多课文档分享上搜索。

1、BRITISH STANDARD Personal eye protection Sunglare filters for industrial use The European Standard EN 172:1994, with the incorporation of amendments A1:2000 and A2:2001, has the status of a British Standard ICs 13.340.20 BS EN 17211995 Incorporating Amendment Nos. I and 2 Wk is the spectral distribu

2、tion of radiation of CIE standard illuminant D65; is the spectral visibility function for daylight vision; is the spectral transmittance of the signal lens; is the spectral transmittance of the sunglare filter. B.3 Infra-red transmittance The transmittance 71% is obtained by integration between the

3、limits 780 nm and 2 O00 nm based on the solar spectral distribution of radiation 2000 nm Eh x T(A) x dA J780 nm SIR = ,2000 nm The values ofE2 are given in Annex A ofprEN 165. 11 O BSI 30 January 2002 EN 172:1994 Totals a The blue flashing Annex C (normative) Standard illuminant D 100.000 o 100.000

4、o light is not based on standard illuminan The product ofthe spectral radiation distribution ofsignal lights and standard illuminant D, and spectral brightness sensitivity for daylight vision as specified in CIE Publication 15 (1971). Wavelength nm 3 80 390 400 410 420 43 O 440 450 460 470 480 490 5

5、00 510 520 530 540 550 560 570 580 590 600 610 620 63 O 640 650 660 670 680 690 700 710 720 73 O 740 750 760 770 780 SA(A) x V(A) x T,(A) in relative values Red 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.0

6、00 o 0.000 o 0.000 o 0.428 9 6.628 9 18.238 2 20.382 6 17.654 4 13.291 9 9.384 3 6.069 8 3.646 4 2.005 8 1.114 9 0.559 O 0.290 2 0.153 3 0.074 2 0.038 6 0.023 2 0.007 7 0.004 5 0.002 2 0.001 o Yellow 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.00

7、0 o 0.000 o o. 1 0.951 5 3.279 4 7.518 7 10.734 2 12.053 6 12.263 4 11.660 1 10.521 7 8.965 4 7.254 9 5.353 2 3.735 2 2.406 4 1.441 8 0.789 2 0.437 6 0.219 1 0.113 7 0.060 1 0.029 O 0.015 2 0.008 9 0.003 O 0.001 7 0.000 9 0.000 4 Green 0.000 o 0.000 o 0.001 4 0.004 7 0.017 1 0.056 9 O. 128 4 0.252 2

8、 0.485 2 0.902 1 1.671 8 2.997 6 5.355 3 9.083 2 13.018 O 14.908 5 14.762 4 12.468 7 9.406 1 6.328 1 3.896 7 2.164 O 1.127 6 0.619 4 0.296 5 0.048 1 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 0.000 o 100.000 o 4, but on the distrib

9、 Blue“ 0.000 1 0.000 8 0.004 2 0.019 4 0.088 7 0.352 8 0.867 1 1.596 1 2.638 O 4.040 5 4.902 5 7.886 2 10.156 6 13.056 O 12.836 3 9.663 7 7.206 1 5.780 6 3.254 3 1.397 5 0.848 9 1.015 5 1.002 o 0.639 6 0.325 3 0.335 8 0.969 5 2.245 4 1.359 9 0.630 8 1.216 6 1.149 3 0.712 O 0.391 8 0.205 5 0.104 9 0.

10、051 6 0.025 4 0.012 9 0.006 5 0.003 3 0.000 o 0.000 5 0.003 1 0.010 4 0.035 4 0.095 2 0.228 3 0.420 7 0.668 8 0.989 4 1.524 5 2.141 5 3.343 8 5.131 1 7.041 2 8.785 1 9.424 8 9.792 2 9.415 6 8.675 4 7.887 O 6.354 O 5.374 o 4.264 8 3.161 9 2.088 9 1.386 1 0.810 O 0.462 9 0.249 2 0.126 O 0.054 1 0.027

11、8 0.014 8 0.005 8 0.003 3 0.001 4 0.000 6 0.000 4 0.000 o 0.000 o 100.000 o ion for 3 200 K. .oo.ooo o 12 O BSI 30 January 2002 EN 172: 1994 1 Axis scales / 1 -I Bottom I register bar Split field polanzers Split field rotation I- levers Figure D.l -Apparatus for determination of axis polarization An

12、nex D (normative) Test for determining the axis of polarization D.l Apparatus Apair of individually mountedsplitJieldpolarizers. These polarizem are cut to give a +3“ to -3“ angle about the horizontal. The top and bottom halves of the polarizem are then butt jointed together and glass mounted. The p

13、olarizem are capable ofbeing rotated by means of a lever carrying a corresponding pointer. The pointer transverses a scale calibrated in degrees left or right ofzero. The split fields are illuminated from behind by a diffused light source (see Figure D. 1). D.2 Procedure Mount the sunglasses (as wor

14、n) on the apparatus, i.e. the front towards the split fields on a horizontal register bar and ensure that the split field appears in the centre of the lens by means ofvertical adjusters. For the left hand lens, move the lever from side to side until the top and bottom halves of the illuminated split

15、 field appears of equal density when viewed through the lens. Read off the pointer position to give the deviation in degrees (plus or minus) of the polarizing axis of the lens from the vertical. Repeat the procedures for the right hand lens. 13 O BSI 30 January 2002 EN 172:1994 Annex E (informative)

16、 Test for determination of fatigue of photochromic materials E.l Apparatus The source is intended to reproduce as closely as possible the spectral energy distribution ofsolar radiation defined as air mass m = 2 P. Moon, Journal ofFranklin Institute, Vol. 230 (1940), pages 583-6171 with an intensity

17、of 60 O00 lux. At present this is best realized in practice with a xenon high pressure arc lamp combined with a heat absorbing filter as indicated in Annex F. E.2 Preparation of samples Samples ofworking thickness are stored in the dark at 65 “C for one hour. The samples are subjected to tenclear-da

18、rkcycles at (23 f 5) “C. Eachcycle consists of 15 min exposure as describedin 5.3.1 and 30 min storage in the dark. The samples are then stored at (23 f 5) “C in the dark for a minimum of 48 h and not more than 96 h. The clear and dark conditions are then determined in accordance with 5.3.1. E.3 Pro

19、cedure The samples are subjected to 500 clear-dark cycles at (23 f 5) “C. Each cycle consists ofa 15 min exposure as described in 5.3.1 and a 30 min storage period in the dark. The samples are then stored in the dark for not less than 48 h and not more than 96 h at (23 f 5) “C. E.4 Evaluation Clear

20、and dark conditions are determined once again in accordance with 5.3.1. The relative change in luminous transmittance shall not be more than f5 %in the clear condition and not more than f20 %in the dark condition. The thickness of the sample shall be mentioned in the test report. Annex F (informativ

21、e) Spectral transmittance of the heat absorbing filter as specified in 5.3.1 and Annex E. This transmittance curve can be achieved using, for example, a Schott KG 2 of 3 mm thick heat absorbing filter or a Pittsburg 2043,2 mm thick heat absorbing filter. 2 m c .- E v c 0,5 - to a c O al cl3 O Wavele

22、ngth , nm Figure F. 1 14 O BSI 30 January 2002 EN 172: 1994 Annex ZA (informative) Clauses of this European Standard addressing essential requirements or other provisions of EU Directives This European Standard has been prepared under a mandate given to CEN by the European Commission and the Europea

23、n Free Trade Association and supports essential requirements of EU Directive 8 9/686/EEC. WARNING: Other requirements and other EU Directives may be applicable to the product(s) falling within the scope of this standard. The following clauses ofEN 172: 1994 and its amendment Al are likely to support

24、 requirements ofDirective 89/686/EEC, Annex II. Compliance with the clauses ofEN 172: 1994 and its amendment Al provides one with means ofconforming with the specific essential requirements of the Directive concerned and associated EFTA regulations. Table ZA. 1 EU-Directive 89/686/EEC, Annex II I Cl

25、auses of this standard 14 1.1.2 Levels and classes of protection 14 1.1.2.1 Highest level ofprotection possible 1.1.2.2 Classes ofprotection appropriate to different levels ofrisk 14.1.1, 4.1.2 1.2.1 Absence of risks and other “inherent“ nuisance factors 14.2.3 14 3.9.1 Non-ionizing radiation 15 O B

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