ECA TEP 170-1972 X-Radiation Detection and Measurements for Microwave Tubes Recommended Practice on《微波电子管X射线探测和测量的推荐做法》.pdf
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1、EIA TEPL70 72 m 3234600 O008476 I m _ _- July 1972 RECOMMENDED PRACTICE ON X - RADIATION DETECTION AND MEASUREMENTS FOR MICROWAVE TUBES FORMULATED BY JEDEC ELECTRON TUBE COUNCIL Y - _- .JEDE PUBLICATION NO. 70-A ii EIA TEP170 72 W 3234b00 0008477 3 W Published by ELECTRONIC INDUSTRIES ASSOCIATION En
2、gineering Department 2001 Eye Street, N. W., Wlshington, D, C. 20006 -. P a - i- ,a EIA TEP170 72 - 3234600 0008478 5 - JEDEC PUBLICATION NO. 70 -A ON X-RADIATION DETECTION AND MEASUREMENTS FOR MICRWAVE TUBES Formulated by JEDEC Electron Tube Council July 1972 Electronic Industries Association Engin
3、eering Department 2001 Eye Street, N.W. Washington, D.C. 20006 -i- EIA TEP170 72 3234600 0008479 7 FOREWORD The material in this Publication was formulated under the cogni- zance of the JT-13 Committee on Microwave Devices and approved by the JEDEC Electron Tube Coun- cil. - ii - r -J f 1.1 1.2 1.3
4、1.4 EIA TEPL70 72 m 3234600 0008480 3 m RECOMMENDED PRACTICE ON X-RADIATION DETECTION AND MEASUREMENTS FOR MICROWAVE TUBES A. X-RADIATION FROM MICROWAVE TUBES 1.0 Introduction The demand for higher power output from microwave tubes has lead the tube designer to the use of higher voltages and current
5、s to achieve these demands. and currents makes it possible for the device to generate unwanted x-radiation. The use of high voltages The user, test personnel, equipment technicians, and maintenance personnel may be over-exposed to the radiation if adequate protection is not provided and if adequate
6、precaution is not observed. likelihood of over-exposure to the general public arising from these devices. In-plant personnel are not likely to be over-exposed because, (I) the design engineers will have established the magnitude of the problem, and (2) state and local statutes and insurance regulati
7、ons provide adequate controls. There is normally little Linear beam devices, such as traveling wave tubes and klystrons, can have x-radiation emission generally from the gun and collector ends of the tube. Linear beam amplifier devices generally show greater x-radiation generation with RF drive appl
8、ied than the FU? off. High power versions of magnetrons, klystrons, TWTs, and crossed field amplifiers can have x-radiation emitting from the cathode bushing and rf output window. also been detected coming through the anode walls on some high power devices. X-radiation has X-radiation arises from el
9、ectron bombardment of a target. The x-radiation intensity is proportional to average tube current, accelerating voltage quared, and the atomic number of the target element. The energy, or “hardness“ of x-radiation is usually specified in terms of electron volts. X-rays can penetrate solid matter. Th
10、e penetrating power is proportional to the energy of radiation Since it is generally accepted that peak voltages in excess of 15 kilovolts can cause significant x-radiation, measurements should be made of its intensity. EIA TEP170 72 m 3234b00 000848L 5 m B. MEASUREMENT OF X-RADIATION FROM MICROWAVE
11、 TUBES 1.0 Purpose and Scope 1.1 Purpose - To obtain the x-radiation characteristics of micro- wave tubes in order to determine the levels emitted by the tubes when they are operated at high voltages with integral tube shielding in place but without external shielding. 1.2 Scope - This test method a
12、pplies to the measurement of x-radiation emitted from microwave tubes. 2. O Apparatus Survey Meter - A dose-rate meter (electrostatically shielded) for probing or rapid surveying of a radiation field (Victoreen Model 440 RF/C, or equivalent.) This meter is intended to be the principal measuring inst
13、rument. Note: Other detectors of low energy x-radiation may also be used; such as Geiger-Mueller counters, proportional counters, scintillation counters, or solid-state counters, provided the calibration is known over the energy ranges being measured. 2.2 Ionization Chamber - 4k inch (11.43 cm) dime
14、ter and 4 inch (10.6 cm) length cylindrical ionization chamber (Victoreen 208A, or equivalent),used in combination with minometer. This chamber is meant ta be a secondary measuring instrument, but can be utilized as a reference standard. 2.3 Minometer - A device for charging the ionization chamber a
15、nd reading the residual charge after exposure (Victoreen II: Model 687C, or equivalent). 2.4 Timer - A stop-watch or equivalent device for measuring or controlling exposure time to an accuracy of at least 51.0%. 2.5 Test Equipment - To provide normal operation of the tube. Note: Test equipment shall
16、 be so designed as to shield operators to well below acceptable personnel safety levels. 2.6 Ionization Chamber Support - A holder for supporting the ionization chamber during exposure. of wood or plastic and shall not lie. the tube. It shall be constructed between the chamber and EIA TEP170 72 m 32
17、34600 0008482 7 2.7 Film Mount - A holder for x-ray sensitive film which has been from exposure to light (and heat designed to shield the film if necessary). Note: The mount often includes a series oftthicknesses of aluminum so that an expert (usually a film reader service)using a densitometer can d
18、etermine both energy and intensity. 3. O Calibra tion 3.1 The survey meter and/or ionization chamber and minometer combination must be calibrated by exposure to sources which bracket the intensity and energy to be measured. These standard source(s) shall be traceable to the National Bureau of Standa
19、rds. Note 1: Calibration shall be made in accordance with the three reading techniques f Section 5.2.4. Note 2: A large variety of microwave tubes emit x-rays with an effective energy between 7 keV and 21 keV, so these levels are recommended for calibration purposes when beam energy is in this range
20、. layers of alumm are 0.1 mm and 0.9 mm. For higher energy levels, the half value layers are as follows: Corresponding half value keV (effective) mJ; keV (effective) HVL J; 35 40 80 3.5 mm Al 1.0 mm Cu 4.8 mm AI 100 0.24 mm Pb 125 0.27 mm Pb 15 O 0.30 mm Pb half value layer Note 3 : To insure accura
21、te instrumentation, consideration should be given to correction factors for extreme variations in tempe rature and barometric pressur e. Note 4: If two or more individual laboratories require comparative radiation measurements, it is suggested that all chambers and minometers be calibrated by using
22、a common standard and by using the same standards laboratory (Victoreen instruments Company, or equivalent). 3.2 Stability of the calibration may be checked periodically by using an appropriate radioactive source. 4.0 Test Conditions 4.1 The tube under test shall be in a position to receive to the t
23、est The tube shall be operated at all equipment so that measurements will be made at the point where maximum radiati0n.s observed. conditions specified in the Tube Specification Sheet, - - EIA TEPL70 72 9 3234600 0008483 9 9 4.2 A warm-up period to minimize drift shall be provided for both the tube
24、and test equipment before proceeding with measurements. 4.3 It is recommended a group of tubes be measured to obtain worst condition data. It is also recommended that tubes nearing the end of life test also be measured as x-radiation may increase with life. 4,4 It is recommended that tubesbe measure
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