ECA RS-162-1956 Ceramic Based Printed Circuits Test Standards for《陶瓷基印刷电路用测试标准》.pdf

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1、EIA STANDARD Test Standard for Ceramic Based Printed Circuits - RS-162 (Reaffirmed February 1970) August 1956 Engineering Department ELECTRONIC INDUSTRIES ASSOCIATION *Y -7 EIA lb2 56 m 3234bOO 0028440 3 m NOTICE EIA engineering standards are designed to serve the public interest through eliminating

2、 mis- understandings between manufacturers and purchasers, facilitating interchangeability and improve- ment of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such standards shall not in any respect pre- cl

3、ude any member or non-member of EIA from manufacturing or selling products not conforming to such standards, nor shall the existence of such standards preclude their voluntary use by those other than EIA members whether the standard is to be used either domestically or internationally. Recommended s

4、tandards are adopted by EIA without regard to whether or not their adoption may involve patents on articles, materials, or processes. By such action, EIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the recommended standards. Publi

5、shed by ELECTRONIC INDUSTRIES ASSOCIATION Engineering Department 2001 Eye Street, N.W., Washington, D. C. 20006 Electronic Industries Association 1970 All rights reserved PRICE 6Oc Printed in U.S.A. EIA lb2 56 3234600 0028443 5 RS-162 Page 1 TEST STANDARD FOR CERAMIC BASED PRINTED CIRCUITS (Reaffirm

6、ation of RS-1621 1. SCOPE This standard describes the standard test procedures to be used for ceramic based printed circuits. It specifically covers the type A unit, but may be used as far as applicable for type B units, as defined below. Unit Standards for Ceramic Based Printed Circuits may be foun

7、d in EIA Standard RS-16 1. 2. TYPES 2.1 the terminations for individual measurement. Type A is a combination in which the components are separably and individually accessible at 2.2 Type B is a combination in which some of the components are not separably and individually accessible at the terminati

8、ons for individual measurement, and which, in part or whole, must be considered as circuits. 3. MARKING Marking will include a symbol which designates the number of lead wires and the type of circuit. It shall also include manufacturers identification on the same side of the unit. Where specified in

9、 the unit standards, numbering of lead wires shall be on the same face. 3.1 The part number consists of four parts: 3.1.1 A number designating the number of lead wires, 3.1.2 The letters PZ which designate a printed circuit, 3.1.3 A number which indicates the circuit within the family of printed cir

10、cuits with the same number of lead wires and, 3.1.4 A letter indicating a revision, for example, 3PZ2A indicates a printed circuit with three lead wires. It is the second of the family of printed circuits with three lead wires and has been revised once. 4. INITIAL TESTS Test conditions, unless other

11、wise specified, shall be made at or referred to 25C. and a relative humidity no greater than 70%. 4.1 Resistance Measurement Resistance shall be measured by appiication of dc voltage in accordance with the following table in a RS-162 Page 2 EIA Lb2 5b 323Ltb00 00284Lt2 7 M E. i Wheatstone bridge cir

12、cuit of at least .5% accuracy, Voltage shall be applied for as short a time as is practicable in order that the temperature of the resistor shall not rise appreciably during the measurement. 4 Resistance-Test Voltage Resistance (nominal ohms) 1-10“ 1 o- 100“ 100-1,000“ 1,000-10,000“ 10,000-100,000“

13、100,000 and over Test Potential (volts) 0.3 1 .o 3.0 10 30 1 00 *but not including 4.2 Capacitance Measurement Capacitance shall be measured with an RMS voltage between 0.5 and 5.0 volts at a frequency of 1 kHz. Values of 1,000 PF or less shall be read at either 1 kHz or 1 MHz. 1 MHz shall be used w

14、here it is needed to exclude the effect of shunting resistors. 4.3 Q or power factor measurements shall be made under the same conditions as capacitance measurement. Q or Power Factor Measurement 4 4.4 Measurement of Insulation Resistance Between Capacitor Terminals Or Any Pair of Non-Con- nected Te

15、rminals Insulation resistance between capacitor terminals shall be measured one minute after application of dc test voltage not to exceed rated or 500 volts whichever is less. A protective resistor shall be used to limit the current to a maximum of .O50 ampere. 4.5 Dielectric Test of Capacitors Capa

16、citors shall be tested without breakdown or arc-over for not less than one second with a dc test voltage of twice the rated working voltage of the capacitor through a protective resistor to limit charging current to a maximum of .O50 ampere. (Care shall be taken to test only those circuits where res

17、istors will not be damaged by this test.) 4.6 Capacitors shall be tested without breakdown or arc-over for one second at 1300VDC applied between both leads connected together and a metal foil wrapped closely around the body of the unit to within no less than .062“ (1.587 mm) of the lead wires. Volta

18、ge shall be applied through a protective resistor to limit the charging current to a maximum of .O50 ampere. Dielectric Test of Body Insulation a EIA lb2 56 3234600 0028443 7 Ra-162 Page 3 5. QUALIFICATION TESTS 5.1 Resistors 5.1.1 Normal Load Test All resistors shall be simultaneously load tested a

19、t 40C. +3“C. and at their recommended maximum continuous dc working voltage, or at the voltage which results in nominal rated power dissipation, whichever is lower. The test voltage shall be applied for 1% hours on and ?h hour off for a total time of 500 hours. Resistance determinations shall be mad

20、e initially and at the end of the first half-hour off period after 200 and 500 hours of test. 5.1.2 Humidity The humidity test shall consist of exposure for 200 hours to 90% to 95% relative humidity and an ambient temperature of 40C. +3“C. without application of voltage. After humidity exposure, sam

21、ples shall be conditioned for 1 hour at 10% to 50% relative humidity at 25C. +3“C. Resistance values shall be read immediately before humidity exposure and immediately after 1 hour conditioning. 5.1.3 Resistance Temperature Characteristic The resistance temperature characteristic shall be expressed

22、as the average per cent change between 25C. and 85C. 5.1.4 Voltage Coefficient Voltage coefficient shall be expressed as per cent change in resistance per unit of applied voltage between 1/10 rated voltage and maximum rated voltage. Voltage shall be applied for as short a time as is practicable in o

23、rder that the temperature of the resistor shall not rise appreciably during the measurement. 1 ). 100 - Rmax. - R.I ma.)(., R“ ( R.1 max . - E.1 max. 5.2 Capacitors 5.2.1 Temperature Characterstic Capacitance variance with temperature shall be determined in a single run from +lO“C. to +75“C. or -55C

24、. to +85“C. as applicable and shall be expressed as the maximum capacitance increase and maximum capacitance decrease from the value at 25C. 53C. 5.2.2 Humidity Test The humidity test shall consist of exposure for 200 hours to 90% to 95% relative humidity and an ambient temperature of 40C. +3“C. wit

25、hout application of voltage. After humidity exposure test samples shaii be conditioned for 1 hour at 10% to 50% relative humidity and 25C. +3“C. Capacitance, Q, and insulation resistance readings shall be taken immediately before humidity : c_z EIA Lb2 56 W -3234600 0028444 O RS-162 Page 4 a exposur

26、e and immediately after 1 hour conditioning at 10% to 50% relative humidity at 25OC. rr3“c. 5.2.3 Load Life Test All capacitors shall simultaneously be subjected to a dc voltage of twice the rated working value for 250 hours at 85C. +3“C. Capacitors shail be tested immediately before and 24 hours af

27、ter this test for capacitance, Q, and insulation resistance. 6. ORDER OF TESTS 6.1 Tests shall be run in the following order: (all samples) 6.1.1 6.1.2 6.1.3 6.1.4 6.1.5 6.2 Prior Visual and mechanical inspection, etc. Resistance Capacitance Power factor Voltage Breakdown to the next test the sample

28、s shall be divided into three equal groups. Units shall be conditioned for 24 hours at 25C. f 3C. and at 10% to 50% relative humidity. 6.2.1 Group I a. Insulation Resistance b. Resistor and Capacitor Humidity (Oniy one exposure) 6.2.2 Group II a. Dielectric test of body insulation b. Resistor voltage coefficient c. Resistor load life 6.2.3 Group III a. Resistance temperature characteristic b. Capacitor temperature characteristic c. Capacitor load life