ECA 483-1981 Standard Method of Test for Effective Series Resistance (ESR) and Capacitance of Multilayer Ceramic Capacitors at High Frequencies (Editorially Corrected - February 19_1.pdf
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1、ACCEPTANCE IJOTICE istuck Point. NeVal Publicntlons and Forms Center, Philatlelphia, PA 19120, for : :;:;tic CO 1100 ric.i.tvi.ti;i-cs only. Contriictors iiri( iririustry groups iiiust ol)tain coli .;i*ctiy s“-oii Electronic Industries Association, 2001 Eye Street N. W. , Washing Jc 2OOQfi. : .- . -
2、it1 c of llocuiiicrnt: Staniiwd Method of Test for a EfPac.t;l vc Saries Rcsi stnncc (I:. . iind Ciilcr trinco of Mu1 tY 1 ayor Ceraniic Capacitors at Hi gh F re qir c iic i o s teicncfiig nrltistry Groups: Electronic Industrles Associal :JACE: klliari rcasli riiiati oii , uiiiendiiieiit, rev SI o11
3、 , or caiicei 1 at$ an OP th* s stand i i*it* al ly- proposed the i iiclustry group responsi bl e for thi s standard shall i nf .- iiii 5tniy coQrdi nati ng ncti vity of the proposed chatigs and request parti ci pati Iqilitwy Coordination Activity . ( Pro3 act fi9 10 - 1432 ) Ariiiy - ER THIS DOCUME
4、NT CONTAINS PAGES. - - - -=- PROBLEM HARD COPY / _c_ EIA 483 81 M 2575532 0055355 5 ANSI/EIA RC-483-19P1 APPROVED DECEMBER 7, 1981 EIA STANDARD STANDARD METHOD OF TEST FOR EFFECTIVE SERIES RESISTANCE (ECR) AND CAPACITANCE OF MULTILAYER CERAMIC CAPACITORS AT HIGH FREQUENCIES RS-483 DECEMBER 19J. (Edi
5、torially corrected: February, 1 YU2: Engineering Deportment ELECTRONIC INDUSTRIES ASSOCIATION NOTICE EIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers- and purchasers, facilitating interchangeability and i
6、mprovement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Pub- lications shall not in any respect preclude any member or non-member of EIA from manufacturing or selling products not co
7、nforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than EIA members, whether the standard is to be used either domestically or internationally. Recommended Standards and Publications are adopted by EIA w
8、ithout regard to whether or not their adoption may involve patents on articles, materials, or processes, By such action, EIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Recom- mended Standard or Publication. This EIA Recommend
9、ed Standard is considered to have international stan- dardization implications, but the IEC (or ISO) activity has not progressed to the point where a valid comparison between the EIA Recommended Standard and the IEC (or ISO) Recommendation can be made. Published by ELECTRONIC INDUSTRIES ASSOCIATION
10、Engineering Department 2001 Eye Street, N.W. Washington, D.C. 20006 . Copyright 1981 ELECTRONIC INDUSTRIES ASSOCIATION All rights reserved PRICE: $10.00 Printed in U.S.A. Paraqraph 1.0 2.0 3.0 4.0 5.0 6.0 7.0 8.0 9.0 . -. 10.0 11.0 12.0 EIA 483 BL 2575532 0055357 7 W RS-483 STANDARD METHOD OF TEST F
11、OR EFFECTNE SERIES RESISTANCE (ESR) AND CAPACITANCE . OF MULTILAYER CERAMIC CAPACITORS AT HIGH FREQUENCIES TABLE OF CONTENTS SCOPE SUMMARY OF METHOD Paqe 1 2 SIGNIFICANCE AND USE 2 SYMBOLS 3-4 APPARATUS 4-6 PRECAUTIONS 6 TEST SPECIMENS CALIBRATION 6-7 7-9 PROCEDURE ? 9 -19 CALCULATIONS PRECISION AND
12、 ACCURACY COMPUTER PROGRAM 19 -25 26 27 - 28 ,- EIA 483 81 m 2575532 0055358 O RS-483 Page 1 STANDARD METHOD OF TEST FOR EFFECTIVE SERIES RESISTANCE (ESR) AND CAPACITANCE OF MULTILAYER CERAMIC CAPACITORS AT HIGH FREQUENCIES (From EIA Standards Proposal No. 1381, formulated under the cognizance of EI
13、A P-2.1 Working Group on Ceramic Capacitors.) 1.0 SCOPE 1.1 This method provides procedures for the measurement of effective series re- sistance (esr) and capacitance of multilayer ceramic capacitors from frequencies of 25 MHz to 1.25 GHz. A series connection permits the measurement of capacitance f
14、rom below 1 pF to over 1 nF between frequencies of 130 MHz and 1.25 GHz. There is no maximum value of capacitance for series measurements of esr, but the determination of large values of capacitance at high frequencies suffers from inaccuracy. The esr of capacitors can be measured with this method a
15、t frequencies that exceed the self-resonant frequency of the test capacitor. A shunt connection allows the measurement of capacitance from O to 200 pF at frequencies from 25 to 910 MHz. Resonant Mode Frequency Ranqe Measurable Capacitance Series Mode 14 130 to 250 MHz 1 nf to. r= esr = effective ser
16、ies resistance of the test specimen, Q= Q-factor of the test specimen. Q = X,/r = l/qCr. L= series inductance of the test specimen. self-resonant frequency of test s ecimen, owing to series capacitance and self inductance. fr = 1/2a s- LCo series capacitance of the test specimen at a frequency suffi
17、ciently tow to exclude the effect of the series inducatance: fr = Co = generally at 1 MHz. 5.0 APPARATUS 5.1 Measuring Instruments In addition to the resonant coaxial-line, the system is comprised of a stable signal generator and a sensitive rf millivoltmeter. The generator should have the following
18、 salient features: 1. Nominal 50-ohm impedance. 2. Continuously adjustable output level with a maximum of at least +13 dBm. 3. Frequency coverage of 25 to 1250 MHz, with frequency doublers, if necessary. 4. Frequency accuracy of - i 5 ppm, and stability of 0.1 ppm/hr. 5. Frequency resolution of 100
19、Hz. 6. Harmonic content: 30 dB or more below carrier. -1 EIA 483 83 W 2575532 O055362 2 E RS-483 Page 5 5.1 Measuring Instruments (continued) The rf millivoltmeter should have the following characteristics: 1. Full-scale ranges of 1 and 3 mV. 2. . 3. Frequency coverage of 25 to 1250 MHz. Accuracy of
20、 - + 1.0% at 1.5 mV, relative to 3 mV, f.s. 4. Probe Input: For use at 25 - 500 MHz: Capacitance - Conductance - (2.5 pF at 3 mV. (200 pS at 100 MHz and 3 mV. (2 mS at 500 MHz and 3 mV. For use at 25 - 1250 MHz: r: - Capacitance - Conductance - (1.5 pF at 3 mV. 450 p S at 500 MHz and 3 mV. (1 mS at
21、1250 MHz and 3 mV. 5.2 Resonant Coaxial-Line This test method specifies four frequency bands for shunt connected measure- ments, and five bands for series connected measurements. The frequency of measurement within each band is a function of the impedance and length of the line, and the effective va
22、lue of the capacitance of the test specimen at that frequency. In the interest of reproducibility it is imperative that a common line impedance and length be used for all measurements so that common test frequencies resut.2 The Model 34A Resonant Coaxial-Line, designed for this method of testing mul
23、tilayer ceramic capacitors, is available from Boonton Electronics Corp., Parsippany, NJ The Model 34A, or its equivalent, is recommended for these measurements. 07054. XI EIA 483 81 W 2595532 00553b3 4 W RS-483 Page 6 6.0 PRECAUTIONS 6.1 In addition to the obvious need for the accurate presentation
24、of generator fre- quency and rf millivoltmeter indications, the validity of this method of test depends upon a linear rise of line attentuation with frequency (on a log-log plot). This is achieved if the line loss is series loss, only (conductor loss). This is true at .frequencies below four or five
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