DLA SMD-5962-93163 REV E-2007 MICROCIRCUIT HYBRID LINEAR 5 VOLT SINGLE CHANNEL DC-DC CONVERTER《5伏特单通道直流 直流转变器 线性混合微型电路》.pdf

《DLA SMD-5962-93163 REV E-2007 MICROCIRCUIT HYBRID LINEAR 5 VOLT SINGLE CHANNEL DC-DC CONVERTER《5伏特单通道直流 直流转变器 线性混合微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-93163 REV E-2007 MICROCIRCUIT HYBRID LINEAR 5 VOLT SINGLE CHANNEL DC-DC CONVERTER《5伏特单通道直流 直流转变器 线性混合微型电路》.pdf（20页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R247-94. 94-07-25 K. A. Cottongim B Add case outlines T, U, Y, and Z. 98-02-23 K. A. Cottongim C Added device type 02. Updated table I for the addition of RadHard limits for the device type 02. Updated paragrap

2、h 4.3.5 to add the RadHard requirements. Redrew entire document. -sld. 02-06-21 Raymond Monnin D Added paragraph 1.5 and note 2. Added paragraph 3.2.3. Table I, add note for enhanced low dose rate effects. Paragraph 4.3.5.a, correct paragraph to add component tested dose rate. -sld 07-02-02 Joseph R

3、odenbeck E Added radiation hardened level P. Table I; For the Vout load regulation test change the IOUT= 0 to 5 A to IOUT= 0 to 10 A. Table I; Removed the Short circuit current test. Table I; For the VOUTstep load transient test change the device type 02 min and max limits from -500 and +500 to -350

4、 and +350 mV pk. Table I; Change the min and max limit from -1200 and +1200 for device type 02 post irradiation to -350 and +350 mV pk. gc 07-07-11 Robert M. Heber REV SHEET REV E E E SHEET 15 16 17 REV STATUS REV E E E E E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A

5、PREPARED BY Steve Duncan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 5 VOLT, SINGLE CHANNE

6、L, DC-DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94-05-25 AMSC N/A REVISION LEVEL E SIZE A CAGE CODE 67268 5962-93163 SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E492-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-S

7、TANDARD MICROCIRCUIT DRAWING SIZE A 5962-93163 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines

8、and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 93163 01 H X X Federal RHA Device Device Case

9、 Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked wi

10、th the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MFL2805S DC-DC converter, 50 W, +5 V output 02 SMFL2805S DC-DC converter, 50 W, +5 V output 1.2.

11、3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product

12、 assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability device

13、s are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conforma

14、nce inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be revi

15、ewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction

16、 or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93163 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: O

17、utline letter Descriptive designator Terminals Package style T See figure 1 12 Tabbed flange mount, lead formed up U See figure 1 12 Flange mount, lead formed down X See figure 1 12 Flange mount, short lead Y See figure 1 12 Tabbed flange mount, short lead Z See figure 1 12 Tabbed flange mount, lead

18、 formed down 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage range 2/ . -0.5 V dc to +50 V dc Power dissipation (PD): Device types 01and 02 (non-RHA) . 18 W Device type 02 (RHA levels P, L and R). 20 W Lead soldering temperatu

19、re (10 seconds) +300C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Input voltage range (VIN) +16 V dc to +40 V dc Output power . 50 W Case operating temperature range (TC). -55C to +125C 1.5 Radiation features. Maximum total dose available (dose rate = 9 rad(Si)/s):

20、Device type 02 (RHA levels P, L and R) 100 krad (Si) 3/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these do

21、cuments are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component C

22、ase Outlines. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ An undervoltage lockout circuit shuts the unit off when the input voltage drops to approximately 12 volts

23、. Operation of the unit between 12 volts and 16 volts is nondestructive at reduced output power, but performance is not guaranteed. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters

24、 are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition C, tested at 9 rad(Si)/s. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93163 DEFENSE SUPPLY CENTER COLUMBUS COLUM

25、BUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www.d

26、odssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in t

27、his document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF

28、-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements

29、 as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical

30、 dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuit. The radiation exp

31、osure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are

32、as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marki

33、ng of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the devic

34、e described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed

35、. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The c

36、ertificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of micro

37、circuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or fu

38、nction as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93163 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical pe

39、rformance characteristics. Limits Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V no external sync unless otherwise specified Group A subgroups Device types Min Max Unit 1 4.95 5.05 IOUT= 10 A dc 2,3 01,02 4.875 5.125 Output voltage VOUT P,L,R 1,2,3 02 4.70 5.30 V VIN= 16 V dc to 40V d

40、c 1,2,3 01,02 0.0 10 A Output current IOUT P,L,R 1,2,3 02 0.0 10 1 35 IOUT= 10 A, B.W. = 10 kHz to 2 MHz 2,3 01,02 50 mVp-p VOUTripple voltage VRIPP,L,R 1,2,3 02 75 IOUT= 10 A, VIN =16V dc to 40V dc 1,2,3 01,02 20 VOUTline regulation VRLINEP,L,R 1,2,3 02 30 mV IOUT= 0 to 10 A 1,2,3 01,02 20 VOUTload

41、 regulation VRLOADP,L,R 1,2,3 02 30 mV IOUT= 0 A, Inhibit (pin 4 and pin 12) = open 1,2,3 01,02 120 P,L,R 1,2,3 02 150 IOUT= 0 A, Inhibit 1(pin4) tied to input return (pin 2) 1,2,3 01,02 14 P,L,R 1,2,3 02 17 IOUT= 0 A, Inhibit 2 (pin 12) tied to output return (pin 8) 1,2,3 01,02 70 Input current IIN

42、P,L,R 1,2,3 02 90 mA See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93163 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 9

43、7 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V no external sync unless otherwise specified Group A subgroups Device types Min Max Unit 1 45 IOUT= 10 A, B.W. = 10 kHz to 10 MHz 2,3 01,02 50 IINripple current IRIPP,L,

44、R 1,2,3 02 75 mAp-p 01 77 1 02 75 01 75 IOUT= 10 A 2,3 02 73 Efficiency Eff P,L,R 1,2,3 02 72 % Input to output or any pin to case at 500 V dc, TC= +25C 1 01,02 100 Isolation ISO P,L,R 1 02 100 M No effect on dc performance, TC= +25C 4 01,02 1000 Capacitive load 3/ 4/ CL P,L,R 4 02 1000 F 1 16 Short

45、 circuit 2,3 01,02 18 Power dissipation load fault PDP,L,R 1,2,3 02 20 W 4 550 650 IOUT= 10 A 5,6 01,02 525 675 Switching frequency FS P,L,R 4,5,6 02 500 700 kHz IOUT= 10 A, TTL level to pin 6 4,5,6 01,02 525 675 External sync range 5/ FSYNCP,L,R 4,5,6 02 525 675 kHz See footnotes at end of table. P

46、rovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93163 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - C

47、ontinued. Limits Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V no external sync unless otherwise specified Group A subgroups Device types Min Max Unit IOUT= 5 A to 10 A01,02 -350 +350 IOUT = 10 A to 5 A 4,5,6 01,02 -350 +350 IOUT = 5 A to 10 A VOUTstep load transient 6/ VTLOADIOUT =

48、10 A to 5 A P,L,R 4,5,6 02 -350 +350 mV pk IOUT= 5 A to 10 A 4,5,6 01,02 3.0 P,L,R 4,5,6 02 4.0 IOUT= 10 A to 5 A 4,5,6 01,02 3.0 VOUTstep load transient recovery 4/ 6/ 7/ TTLOADP,L,R 4,5,6 02 4.0 ms IOUT= 10 A, Input step 16 V dc to 40 V dc 4,5,6 01,02 300 P,L,R 4,5,6 02 400 IOUT= 10 A, Input step 40 V dc to 16 V dc 4,5,6 01,02 300 VOUTstep line transient 4/ 8/ VTLINEP,L,R 4,5,6 02 400 mV pk IOUT= 10 A, Input step 16 V dc to 40 V dc 4,5,6 01,02 300 P,L,R 4,5,6 02 4