DLA SMD-5962-90997-1991 MICROCIRCUIT DIGITAL CHMOS BUS CONTROLLER MONOLITHIC SILICON《硅单块 互补高性能金属氧化物半导体结构 数字微型电路》.pdf

《DLA SMD-5962-90997-1991 MICROCIRCUIT DIGITAL CHMOS BUS CONTROLLER MONOLITHIC SILICON《硅单块 互补高性能金属氧化物半导体结构 数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-90997-1991 MICROCIRCUIT DIGITAL CHMOS BUS CONTROLLER MONOLITHIC SILICON《硅单块 互补高性能金属氧化物半导体结构 数字微型电路》.pdf（28页珍藏版）》请在麦多课文档分享上搜索。

1、kr:+22T SMD-5962-90997 59 9999996 0007001 1 LTR REVISIONS DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHEET REV SHEET 22 23 24 25 SHEET REV STATUS OF SHEETS PMIC N/A STANDARDIZED MILITARY DRAWING THIS DRAWING IS AVAILABLE -OR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC NIA DES

2、C FORM 193 SEP 87 PREPAREDBY CG distribution Is unlimiled. 5962-EO59 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-i SMD-5962-90997 59 W 9999996 0007002 3 W! 1. SCOPE 1.1 Scope. This drawing forms a part of a one part - one part number documentatio

3、n system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN), repre

4、sent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices1. hardness assurance (RHA) levels are reflected in the PIN. Device class M microcircuits When available, a choice of radiation 1.2 m. The P

5、IN shall be as shown in the following example: - o1 M R X I 5962 90997 - I I I - I - I I I I l II Federal RHA i Lead i Case i Devi ce i Device stock class designator type class out li ne finish designator (See 1.2.1) (See 1.2-2) designator (See 1.2.4) (See 1.2.5) / (See 1.2.3) / Drawing number 1.2.1

6、 Radiation hardness assurance (RHA) designator. Device classes M, E, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-1-38535 specified RHA levels and shall b

7、e marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s-1. The device type(s) shall identify the circuit function as follows: Devi ce type Generic number Circuit function Speed o1 02 03 M82C288-6 Bus controller 6 MHz M82C288-8 Bus controller 8 MHz M82

8、C288-10 Bus controller 10 MHz 1.2.3 Device class desiqnator. product assurance level as follows: The device class designator shall be a single letter identifying the Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in ac

9、cordance with 1.2.1 Certification and qualification to MIL-M-38510 Certification and qua tif i cation to MIL-1-38535 of MIL-STD-883 B or S Q or V 1.2.4 gase outline(s). For device classes M, E, and S, case outLineCs) shall meet the requirements in appendix C of MIL-M-38510 and as listed below. the r

10、equirements of MIL-1-38535, appendix C of MIL-M-38510, and as listed below. For device classes Q and V, case outline(s) shall meet Outline letter case outline R 0-8 (20-leadr 1.060 x .310“ x .200t1) dual-in-line package 1.2.5 Lead finish. The lead finish shall be as specified in MIL-M-38510 for clas

11、ses M, B, and S or MIL-1-38535 for classes Q and V. Finish letter “X“ shall not be marked on the microcircuit or its packaging. considered acceptable and interchangeable without preference. The “XI designation is for use in specifications when lead finishes A, B, and C are STANDARDIZED SIZE 5962-909

12、97 A 2 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CEPITEA MViSiN LEVEL SHEET DAMON, OHIO 45444 CU S OOVERUMlNl CIiiulIHo OCWL IW-LWo.Y? DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-i :*- SMD-5962-90997 59 9999996 0007003 5 1

13、.3 Absolute maximum ratings. I/ Storage temperature range - - - - - - - - - - - - - - - - -65OC to +15OoC -0.5 v to +7 v 1.0 w See MIL-M-38510, appendix C 15OOC Voltage on any pin with respect to ground - - - - - - - - Power dissipation (P ) - - - - - - - - - - - - - - - - - Lead temperature (sovder

14、ing, 10 seconds) - - - - - - - - 3OOOC . Thermal resistance, junction-to-case (eJc) - - - - - - - Junction temperature (TJ) - - - - - - - - - - - - - - - - 1.4 Recommended operating conditions. Case operating temperature range Supply voltage (Vcc) -55OC to +125“C - - - - - - - - - - - - - - - - - -

15、- - - - - - - - - - - - 4.75 V dc to 5.25 V dc 2/ 1.5 Digital loaic testing for device classes Q and V. Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - - - - XX percent 31 2. APPLICABLE DOCUMENTS 2.1 Government specifications, standards, bulletin, and ha

16、ndbook. Unless otherwise specified, the following specifications, standards, bulletin, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFIC

17、ATIONS MILITARY MIL-M-38510 - MIL-1-38535 - STANDARDS MILITARY MIL-STD-480 - MIL-STD-883 - BULLETIN MILITARY MIL-BUL-103 - Microcircuits, General Specification for. Integrated Circuits, Manufacturing, General Specification for. Configuration ControL-Engineering Changes, Deviations and Waivers. Test

18、Methods and Procedures for Microelectronics. List of Standardized Military Drawings (SMDs). - I/ - 2/ Stresses above the absolute maximum rating may cause permanent damage to the device. operation at the maximum levels may degrade performance and affect reliability. The approved source of supply is

19、unable to furnish devices with a supply voltage range (Ves) of 4.5 V minimum to 5.5 V maximum, which is desirable for system applications, when the desired Vcc range is available it will be incorporated into the next action of the document. Values will be added when they become available. Extended -

20、 3/ MILITARY DRAWING jC FORM 193A :P a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-HANDBOOK MILITARY MIL-HDBK-780 - Standardized Hi litary Drawings. (Copies of the specifications, standards, bulletin, and handbook required by manufacturers in co

21、nnection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing shall take precede

22、nce. 3. REQUIREMENTS 3.1 Item requirements. with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as specified herein. The individual item requirements for device classes B and S shall be in accordance with MIL-M-38510 and as specified h

23、erein. characterization table for each device type shall be included in this SMD. requirements for device classes Q and V shall be in accordance with MIL-1-38535, the device manufacturers Quality Management (QM) plan, and as specified herein. The individual item requirements for device class M shall

24、 be in accordance For device classes B and S, a full electrical The individual item 3.2 Desiqn, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-M-38510 for device classes M, B, and S and MIL-1-38535 for device classes Q and V and

25、herein. 3.2.1 3.2.2 Terminal connections. Case outline(s). The case outlinek) shall be in accordance with 1.2.4 herein. The terminal connections shall be as specified on figure 1. 3.2.3 Functional block diauram. 3.2.4 Radiation exposure circuit. The functional block diagram shal be as specified on f

26、igure 2. The radiation exposure circuit shall be as specified when available. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table

27、I and shall apply over the full case operating temperature range. in table IIA. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified The electrical tests for each subgroup are defined in table I. The part shall be marked with the PIN listed in 1.2 herei

28、n. 3.5 Marking. Marking for device class M In addition, the manufacturers PIN may also shall be in accordance with MIL-STD-883 (see 3.1 herein). be marked as listed in MIL-BUL-103. MIL-M-38510. Marking for device classes B and S shall be in accordance with Marking for device classes Q and V shall be

29、 in accordance with MIL-1-38535. 3.5.1 Certification/compliance mark. The compliance mark for device class M shall be a “C“ as required in MIL-STD-883 (see 3.1 herein). “J“ or “JAN“ as required in MIL-M-38510. “QML“ as required in MIL-1-38535. The certification mark for device classes E and S shall

30、be a The certification mark for device classes Q and V shall be a 3.6 Certificate of compliance. For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-EUL-103 (see 6.7.3 herein). For device classes Q and V,

31、a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.7.2 herein). of compliance submitted to DESC-ECC prior to listing as an approved source of supply for this drawing shall affirm that the manufacturerls pro

32、duct meets, for device class M the requirements of MIL-STD-883 (see 3.1 herein), or for device classes Q and V, the requirements of MIL-1-38535 and the requirements herein. The certificate MILITARY DRAWING DEFENSE ELECTRONICS SOPPLY CENTER DAYIDN. OHIO 45444 I I DESC FORM 193A *U 6 OOVEUfNl11*I WICC

33、 lW-600.!U7 SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-C c SMD-59b2-90997 59 9999996 0007005 9 I TABLE I. Electrical performance characteristics. Test Symbol I Conditions i-/ IGroup A I -55OC 5 TC +125OC 1 subgroups I I unless otherwise s

34、pecified I I I I I 4.75 V 5 Vcc 5.25 V I I I input tow voltage I vIL i I I I Input high voltage I VIH I I l I I CLK input low I VILC I voltage I II I I CLK input high I VIHC 1 voltage I I I l I I Output tow voltage I VOL ICommand outputs - 3/ - 2/ I I IoL = 32 mA I ! I i I I I Controt outputs - 4/ i

35、 I I I I I I I I I I I I I I I I I I IIOH = -1 mA I I - 4/ I I I I I I I I IIL1 IVIN 2 0.0 v I I I I I IoL = 16 mA ICommand outputs - -5 mA Output high voltage I VOH 12; i -1 mA 31 I I Controt outputs I IIOH = -0.2 mA Input leakage current I IL2 !IN 5 CC I I IL01 lOUT 2 i Output leakage I I I I curr

36、ent I IL02 IVOUT 5 vcc i I I current I I Power supply Power supply I Ices I s/ ! current (static) I l I See footnotes at end of table. Limits I I I I I I I Min I Max -0.5 I 0.8 2.0 I IVcc+0.5 3.8 I IVcc+0.5 -0.5 I 0.6 I I i 2.4 I Vcc-0.5 I I I I 2.4 I tcc-o. 5 I I I -10 I I I -10 I -.-A- I i +IO L I

37、 75 i I l3 - Unit V 5962-90997 MILITARY DRAWING DE SEP a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-,SND-5962-90997 59 i 9999996 0007006 O i I 1 DEFENSE ELECTRONICS SUPPLY CEMER DAYION, OHK) 45444 TADLE I. Electrical performance characteristics

38、 - Continued. 6 SHEET REVSON LEVU Test Symbol I I I CLK CLK input capacitance I input capacitance i cIN 1 I Input /output I I I I I capacitance Functional testing I CLK period I I I I I I I t2 I I I I I CLK high time CLK Lou time I i t3 I l CLK rise time i t4 21 I I I Conditions I/ -55C 5 TC 5 i-125

39、C i 4.75 V 5 Vcc 5 5.25 V unless otherwise specified FC = 1 MHz, see 4.4.1 See 4.4.lb See figure 3 roup A ;ubgrou 4 73 9,10,11 02 - 03 - o1 - o2 03 - 1 ,o2 - 03 Limits Unit l I I I I I I 12 I PF I I Min I Max 1 II I I I i 10 I II I I I 20 I I I -1 I I I 50 I 250 I Ai I I 25 I I II l I 20 I I AI l I

40、16 I I II I I 20 I I II l I 15 I I il I I 12 I I II l I I 10 I II I I 181 See footnotes at end of table. CTANDARDIZU) SIZE I 5962-90997 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-90997 59 9999996 0007007 2 = Conditions I/ -55C 5 TC 5 +1

41、25OC 4.75 V 5 Vcc 5 5.25 V unless otherwise specified jee figure 3 L Unit iroup A IDevicel Limits iubgroups I type I I I TABLE I. Electrical performance characteristics - Continued. Test I Symbol I I I I t5 - 21 I I I I setup time I I I I I I I I I I I I l I I I I I I l l I I I I I CLK fall time M/I

42、O and status I t6 MI10 and status I t7 hold time CENL setup time I t8 I tg CENL hold time READY setup time I tI0 READY hold time I tll See footnotes at end of table. I I I I I 01 I 35 I I ILI I I I I 102,03 I 25 1 I STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER SEP a7 Provided by I

43、HSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-90977 59 9999996 0007008 4 W h 6 test CMDLY setup time CMDLY hold time AEN setup time - 6/ AEN hold time b/ ALE, MCE active delay from CLK ALE, MCE inactive delay from CLK DEN (write) inactive from CENL 21

44、TABLE I. Electr.ica1 performance characteristics - Continued. 16 c t17 t18 Conditions I/ 4.75 V 5 Vcc 5 5.25 V unless ,otherwise specified -55C 5 TC 5 t125“C see figure 3 See figure 3, cL = 150 pF See footnotes at end of table, iroup A ;ubgroupc 9,10,11 ievicel Unit Limits. ., . 1 type I I I I I I 1

45、 Min I Max. I - . I I I ns o1 I 25 I -1 I I I 02 i 20 j i LI I I I I I I I Ali I 1 1 I I -I I I I O1 I 25 I I I I I I I 02 I 20 I I I “- .I I I I 03 I 15 I I I I AL1 I O I I LI I I I 011 3 125 I I I I 021 3 120 I -1 I I I -1 I I I 01 I I 35 I -1 I I I 02 I I 25 I -1 l I I L I I I 35 I I 01 I II I I

46、I 02 I I 35 I LI I I I I 23 I 03 I 15 1 031 3 116 I o3 I I 19 1 STANDARDIZED MILITARY DRAWING P 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 3 SMD-5962-90797 57 9799996 O007009 6 I TABLE I. Electrical performance characteristics - Continued. C

47、onditions I/ I I Test ISYmboL I I I I I CLK I I I I I I I I I I I l I -55C 5 TC 1. +125OC I I unless otherwise specified (See figure 3, CL = 150 pF 4.75 V 5 Vcc 5 5.25 V DT/R low from I tI9 I I from DT/R I I DEN (read) active I t20 I - 2/ j i I I I I I I I i I I delay from CLK I I DEN (read) inactiv

48、e I tZ1 I - 2/ i i I I I I I I I I I I I I - 21 I I I I I I I I I I II I I I I I I I I I I I I I DT/R high from DEN I tZ2 I inact ive DEN (write) active I tZ3 I delay from CLK I ;roup A ;ubgroups 9,10,1 I Device1 Limits type I I I 4 I I 01 I I 40 - I I 02 I I 25 I Min I Max I I o3 I I 23 Unit - ns S

49、ee footnotes at end of table. MlklTARY DRAWING Off ENSE ELECTRONICS SUPPLY CENTER Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-U i SMD-59b2-90997 59 W 9979996 00070LO 2 W TABLE I. Electrical performance characteristics - Continued. I I I I Test I Symbol DEN (write) inactive1 t24 delay from CLK I DEN inactive