DLA SMD-5962-90984 REV A-2006 MICROCIRCUIT DIGITAL HIGH-SPEED CMOS DUAL DECADE RIPPLE COUNTER TTL COMPATIBLE INPUTS MONOLITHIC SILICON《硅单块 晶体管-晶体管逻辑电路兼容输入 双十进制波纹计数器 高速互补金属氧化物半导体 数字.pdf

《DLA SMD-5962-90984 REV A-2006 MICROCIRCUIT DIGITAL HIGH-SPEED CMOS DUAL DECADE RIPPLE COUNTER TTL COMPATIBLE INPUTS MONOLITHIC SILICON《硅单块 晶体管-晶体管逻辑电路兼容输入 双十进制波纹计数器 高速互补金属氧化物半导体 数字.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-90984 REV A-2006 MICROCIRCUIT DIGITAL HIGH-SPEED CMOS DUAL DECADE RIPPLE COUNTER TTL COMPATIBLE INPUTS MONOLITHIC SILICON《硅单块 晶体管-晶体管逻辑电路兼容输入 双十进制波纹计数器 高速互补金属氧化物半导体 数字.pdf（17页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Redraw switching waveforms in figure 4, switching waveforms and test circuit. Update the boilerplate to current requirements as specified in MIL-PRF-38535. Editorial changes throughout. jak 06-12-21 Thomas M. Hess REV SHET REV A A SHET 15 16 REV

2、STATUS REV A A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Wanda L. Meadows STANDARD MICROCIRCUIT DRAWING CHECKED BY Thomas J. Ricciuti DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE

3、BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-03-08 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, DUAL DECADE RIPPLE COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AMSC N/A SIZE A CAGE CODE 67268 5962-90984 REVISION LEVEL A SHEET 1

4、 OF 16 DSCC FORM 2233 APR 97 5962-E608-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90984 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE

5、 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a

6、 choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 90984 01 M E A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see

7、 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are mar

8、ked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54HCT390 Dual decade ripple counter, TTL compatible inputs 1.2.3 Device class designator.

9、The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

10、A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line 1.2.5 Lead finish. The lead finish is as speci

11、fied in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90984 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990

12、 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc DC input voltage range (VIN) . -0.5 V dc to VCC + 0.5 V dc DC output voltage range (VOUT) -0.5 V dc to VCC+ 0.5 V dc DC input clamp current (IIK) (VINVCC+ 0.5 V

13、dc) 20 mA DC output clamp current (IOK) (VOUTVCC+ 0.5 V dc) . 20 mA DC drain current (per pin) (IOUT) (-0.5 V VOUT VCC+ 0.5 V) . 25 mA DC VCCor GND current (ICC, IGND) 50 mA Storage temperature range (TSTG) -65C to +150C Maximum power dissipation (PD) 500 mW 4/ Lead temperature (soldering, 10 second

14、s) +265C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature (TJ) . +175C 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) . +4.5 V dc to +5.5 V dc Input voltage range (VIN) . 0.0 V dc to VCCOutput voltage range (VOUT) 0.0 V dc to VCCMinimum high lev

15、el input voltage (VIH) 2.0 V dc Maximum low level input voltage (VIL). 0.8 V dc Case operating temperature range (TC) -55C to +125C Input rise or fall time (tr, tf): (0.1VCCto 0.9VCC; 0.9VCCto 0.1VCC) 0 to 500 ns Maximum high level input current (IOH) . -4.0 mA Maximum low level input current (IOL)

16、. +4.0 mA 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise specified, all voltages are referenced to ground. 3/ The limits for the parameters specified

17、herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ For TC= +100C to +125C, derate linearly at 8 mW/C to 300 mW. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962

18、-90984 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified her

19、ein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microc

20、ircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearc

21、h/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Non-Government publications. The following document(s) form a part of this document to the extent specified herein. Unless otherwise specified, the issu

22、es of these documents are those cited in the solicitation or contract. ELECTRONIC INDUSTRIES ALLIANCE (EIA) JEDEC Standard No. 7-A - Standard for Description of 54/74HCXXXX and 54/74HCTXXXX High-Speed CMOS Devices. (Copies of these documents are available online at http:/www.eia.org/ or from the Ele

23、ctronic Industries Alliance, 2500 Wilson Boulevard, Arlington, VA 22201-3834.) 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable law

24、s and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) pla

25、n. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Provided by IHSNot for ResaleNo rep

26、roduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90984 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The design, construction, and phys

27、ical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as spe

28、cified on figure 1. 3.2.3 Truth tables. The truth tables shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 4. 3.3 Electrical

29、 performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requir

30、ements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where mar

31、king of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38

32、535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL

33、-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be re

34、quired from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device clas

35、ses Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appe

36、ndix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this

37、drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewe

38、r. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 40 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DR

39、AWING SIZE A 5962-90984 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Unit Test and MIL-STD-883 test method Symbol Test conditions -55C TC +125C 4.5 V VCC 5.5 V unless otherwise specifie

40、d Device type VCCGroup A subgroups Min Max High level output voltage 3006 VOH11/ For all inputs affecting output under test VIN= VIHor VILVIH= 2.0 V VIL= 0.8 V For all other inputs VIN= VCCor GND IOH= -20 A All 4.5 V 1, 2, 3 4.4 V 1 3.98 VOH21/ For all inputs affecting output under test VIN= VIHor V

41、ILVIH= 2.0 V VIL= 0.8 V For all other inputs VIN= VCCor GND IOH= -4 mA All 4.5 V 2, 3 3.70 Low level output voltage 3007 VOL11/ For all inputs affecting output under test VIN= VIHor VILVIH= 2.0 V VIL= 0.8 V For all other inputs VIN= VCCor GND IOL= 20 A All 4.5 V 1, 2, 3 0.1 V 1 0.26 VOL21/ For all i

42、nputs affecting output under test VIN= VIHor VILVIH= 2.0 V VIL= 0.8 V For all other inputs VIN= VCCor GND IOL= 4 mA All 4.5 V 2, 3 0.4 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A

43、 5962-90984 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Unit Test and MIL-STD-883 test method Symbol Test conditions -55C TC +125C 4.5 V VCC 5.5 V unless otherwise specifie

44、d Device type VCCGroup A subgroups Min Max 1 -0.1 Input current low 3009 IILFor input under test VIN= GND For all other inputs VIN= VCCor GND All 5.5 V 2, 3 -1.0 A 1 0.1 Input current high 3010 IIHFor input under test VIN= VCCFor all other inputs VIN= VCCor GND All 5.5 V 2, 3 1.0 A 1 8.0 Quiescent s

45、upply current, output high 3005 ICCHFor all inputs VIN= VCCor GND All 5.5 V 2, 3 160.0A 1 8.0 Quiescent supply current, output low 3005 ICCLFor all inputs VIN= VCCor GND All 5.5 V 160 A Additional quiescent supply current ICC2/ For input under test VIN= 2.4 V For all other inputs VIN= VCCor GND All

46、5.5 V 1, 2, 3 3.0 mA Input capacitance 3012 CINVIN= 0 V See 4.4.1c TC= +25C All GND 4 10.0 pF Power dissipation capacitance CPD3/ See 4.4.1c TC= +25C All 4 40.0 pF Functional tests 3014 See 4.4.1b All 7, 8 9 27 Maximum clock frequency fMAX2/ All 4.5 V 10, 11 18 MHz9 19 Low clock pulse width, mCP0, m

47、CP1 tw2/ All 4.5 V 10, 11 29 ns 9 15 Reset removal time tREM2/ CL= 50 pF minimum See figure 4 All 4.5 V 10, 11 22 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90984 DEFENS

48、E SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Unit Test and MIL-STD-883 test method Symbol Test conditions -55C TC +125C 4.5 V VCC 5.5 V unless otherwise specified Device type VCCGroup A subgroups Min Max 9 13 High reset pulse width tw2/ CL= 50 pF minimum See figure 4 All 4.5 V 10, 11 20 ns 9 40 Propagation delay time, mCP0 to mQ0 3003 tPLH1, tPHL1CL= 50 pF minimum See figure 5 All 4.5 V