DLA SMD-5962-86854-1987 MICROCIRCUITS DIGITAL HIGH-SPEED CMOS BINARY COUNTER FOUR BIT MONOLITHIC SILICON《硅单块 4比特二进制计数器 高速互补金属氧化物半导体 数字微型电路》.pdf

《DLA SMD-5962-86854-1987 MICROCIRCUITS DIGITAL HIGH-SPEED CMOS BINARY COUNTER FOUR BIT MONOLITHIC SILICON《硅单块 4比特二进制计数器 高速互补金属氧化物半导体 数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-86854-1987 MICROCIRCUITS DIGITAL HIGH-SPEED CMOS BINARY COUNTER FOUR BIT MONOLITHIC SILICON《硅单块 4比特二进制计数器 高速互补金属氧化物半导体 数字微型电路》.pdf（13页珍藏版）》请在麦多课文档分享上搜索。

1、t - DESC-DWG-Bb854 57 W 7797775 0007174 7 U REV PAGE REVSTATUS I REV OF PAGES I PAGES 1 2 3 4 5 6 7 8 9 10 t T-45-23 11 12 13 =r I. . REVISIONS SIZE A DESCRIPTION 5962-86854 CODE IDENT. NO. DWG NO. 14933 Defense Electronics Supply Center Dayton, Ohio Original date f drawing: 15 January 1987 AMSC NIA

2、 PREPARED BY x A JA I MILITARY DRAWING This drawing is available for use by all Departments and Agencies of the Department of Defense TITLE: CMOS, BINARY COUNTER, FOUR BIT, MICROCIRCUITS, DIGITAL, HIGH-SPEEC MONOLITHIC SIL ICON REV I PAGE 1 OF 13 I 5962-E138-3 DISTRIBUTION STATEMENT A. Approved for

3、public release; disfribution is unlimited. DESC FORM 193 MAY 86 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE CODE IDENT. NO. A 14933 MILITARY DRAWING DWG NO. 5962-86854 REV DAYTON, OHIO PAGE 2 Provided by IHSNot for ResaleNo reproduction or n

4、etworking permitted without license from IHS-,-,-SIZE CODE IDENT. NO. A 14933* MILITARY DRAWING 1.4 Recommended operating conditions. Supply voltage (VCC)- - - - - - - - - - - - - - - - - - Case operating temperature range (TC) - - - - - - - - - Input rise or fall time: vcc = 4.5 v- - - - - - - - -

5、- - - - - - - - - - - - Maximum clock frequency (fmx): t4.5 V dc to t5.5 V dc -55C to +125DC O to 500 ns 20 MHz TC = +25“C: Vcc = 4.5 y- - - - - - - - - - - - - - - - - - - 13 MHz f4ininum Dulse width. clock, clear or load: DWG NO. 5962-86854 Mininum setup time, clear, load, enable or data to clock:

6、 TC = +25“C: TC = - 5 C to +125“CZ VCE 4.5 y- - - - - - - - - - - - - - - - - - - vcc = 4.5 y- - - 1 - - - - - - - - - - - - - - - 40 ns 60 ns . Mininum hold time, data from clock: REV DAYTON, OHIO Mininum removal time, clear to clock: PAGE 3 2. APPLICABLE DOCUMENTS 2.1 Government specification and

7、standard. Unless otherwise specified, the following specification lid staiiddrd, of tile issue listed in that issue of the Department of Defense Index of Specifications nd Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFICATION MILITARY MI L

8、-M-38510 - Microcircuits, General Specification for. STANDARD MILITARY MIL-STO-883 - Test Methods and Procedures for Microelectronics. (Copies of the specification and standard required by manufacturers in connection with specific cquicition functions should be obtained from the contracting activity

9、 or as directed by the ontracting activity. 1 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DESC-DWG-b54 57 M 7777975 0007377 E TALE I. Electrical performance characteristics. - Test High level output voltage Low level output voltage High level inp

10、ut voltage Low level input voltage Input leakage current Qu i escent current Additional quiescent current Input capacitance I I Func tio na1 tests 1 Propagation delay time, clock to ripple carry I output I H VIL IIN Icc Jcc CIN rPHL1, .PLU1 I I ItpLHz . I ropayation delay time, ItpHL2, clock to any

11、Q output Conditions 1 -55C 5 TC 5 f125OC .-I t4.5 V dc Vcc 55.5 V dc (unless otherwise specified) I IIIdI = 20 PA I I III01 = 4.0 IIA I vIii VIH Or VIL vcc 5 4.5 v I I I I I l 1 Limits I Group A I I Unit subgroups1 Nin I lax -+- II 1,2,3 I 4.4 I I I IV III 3.7 I I I I II II I 0.4 I II 11 2.0 I I I I

12、 II t Ool I 1 - -1.0 I 1.0 I VA II II I o*8 I /IV = 2.4 V or 0.5 Y, any i I input; VIM = VCC or GND, I ither pins; Vcc = 5.5 Y; I ,OUT = 0 PA I cc = 4.5 Y; TC = +25C i4 ;ee 4.3.1 1 I ;ee 4.3.ld 17 I ee figure 4 i TC = -55“C, i 10,11 I +125C I I i TC = +25OC i 9 1 I I I i TC = -55C, i 10,ll I +125OC

13、I i 45 i ns II II II il I43 I I I I1 163 I 165 I II iee footnote at end of table. SIZE CODE IDENT. NO. DWG NO. A 14933 5962-86854 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER I I I REV I PAGE 4 DAYTON, OHIO I I I DESC FORM 193A FEE 86 Provided by IHSNot for ResaleNo reproduction or networking

14、permitted without license from IHS-,-,-3 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DESC-DWG-b5Y 57 m 7777775 0007378 Li SIZE CODE IDENT. NO. DWG NO. A 14933 5962-86854 I i TABLE 1. Electrical performance characteristics - Cantinued. I I Condi tioiis i/ I I Liiiiits I Isubgroupsl idin I Max

15、I I I (unless oterwise specified) 1 II I -55C TC 5 +125C - Group A I I Unit I 4.5 V dC-Vcc.5.5 V Clc Test 1 1 1 I I I I I I I 1 I Propayation delay time, Itpli4 I ITc = +25C I 9 I i 50 I clear to any Q output I I II 1 I I I I I I fTc = +25OC 1 9 f I 15 I I I II I I I Propa ation delay time, ItpHL3,

16、IVcc = 4.5 V ITc = +21iC enaijie T to ripple carry itpLHj ICL = 50 PF *io% I I C125“C I I ITc = -55“C, I 1U,11 output I ISee figure 4 I IT = -55“C, I 10,11 I I I I I I I I I I +125C I Transistion times :/ ITLH. I ITHL I I I I I I I l/ For a power supply of 5 V * lo%, the worst case output voltages (

17、V 1 arid VOL) occur for HCT - at 4.5 V. Thus, the 4.5 V values should be used when designiiiy wi?h tiiis supply. VIH and VIL occur at Vcc = 5.5 V and 4.5 V, respectively. durst case I REV DAYTON, OHIO - 2/ Transitlon times (tTHL, tTLH), if not tested, shall be guaranteed to the specified parameters.

18、 2.2 Order of precedence. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of In the event of a conflict between the text of this drawing and the references cited herein, tile text of this drawing shall take precedence. YIL-STD-883, “Provision

19、s for the use of MIL-STD-883 in conjunction with compl iant non-JAN devices“ and is specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical iimensions shall be as specified in MIL-M-38510 and herein. 3.2.1 Terminal connections. The terminal connect

20、ions shall be as specified on figure 1. . 3.2.2 Truth table. The truth table shall be as specified on figure 2. 3.2.3 Logic diagram. The logic diagram shdll be as specified on figure 3. 3.2.4 Case outline. The case outline shall be in accordance with 1.2.2 herein. PAGE 5 3.3 Electrical performance c

21、haracteristics. Un1 esc otherwise specified, the electrical performance :haracteristics are as specified in table I and apply over tne full recommended case operating iemperature range. arked vrithe part number listed iii 1.2 herein. )e marked as listed in 6.4 herein. 3.4 Marking. Marking shall be i

22、n accordance with MIL-STD-883 (see 3.1 herein). Tne part shall be In addition, the manufacturers pdrt nuinuer iiiay also 4- Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-RIPPLE QA QB QC QD.ENA!I 1 I CARRY II OUTPUT CLK CLR ENP ENT XLXXX X H H L XHL

23、HH X H L L tHXXL +HHHH h CLOCK A B c D ENABLE Load Function Clear Count disabled Load Increment Counter H Count hall apply: a. Burn-in test (method 1015 of MIL-STD-883). (1) Test condition A, 6, C, or D using the circuit submitted with the certificate of (2) TA = +125C, minimum. Interim and final el

24、ectrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. compliance (see 3.5 herein). b. DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO TABLE II. Electrical test requirements. REV

25、 PAGE 11 I MIL-STD-883 test requirements I (Peb,gm“,%id I I . I 5005, table I) I I I l i Interim electrical parameters I I (method 5004) I 1 I I I IFinal electrical test parameters I 1 (method 5004) I 1*,2,3,9 I I 1 I Itiroup A test requirements 1 (method 5005) 1123479 I 1Groups C and D end-point 1

26、electrical parameters I 1,2,3 I I (method 5005) I I I I I )Additional electrical subgroups I I I for group C periodic I I inspections I I I I &il I I - *PDA applies to subgroup 1. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-4.3 Quality conformanc

27、e inspection. quality confor:flance inspection shall be in accordance with ethod SS05 of rm -STD-833 including groups A, 8, Cy and D inspections. The following additional riteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 5, 6, and 8 in tab

28、le I, inethod 5005 of MIL-STD-833 shall be omitted. c. Subgroup 4 (CIN measurement) shall be measired only for the initial test arid after process or design changes which may affect input capacitance. d. Subgroup 7 tests sufficient to verify the truth table. 4.3.2 Groups C arld 0 inspections. a. End

29、-point electrical paraieters sball 5e as specified in table II herein. b. Steady-state life test (aethod 1005 of MIL-STD-833) conditions: (1) Test condition A, 5, Cy or D using the circuit submitted gith the certificate of (2) Tq = +125OC, miniinum. compliance (see 3.5 herein). (3) Test duration: 1,

30、000 hours, except as permitted by appendix 9 Qf MIL-Y-39514 and nethod 1005 Of MIL-STD-833. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-M-39510. 6. JOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use when m

31、ilitary pecifications do not exist and qualified military devices that will perforin the required function are ot available for OEM application. his drawing has been qimlified for listing on QPL-33510, the device specified herein will be nactivated and will not be used for newdesign. 11 applications

32、. overed by a contractor-prepared specification or drawing. When a military specification exists and the product covered by The 1PC-33510 product shall be the preferred itea for 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device 6.3 Comnents. Comaents on t

33、his drawing should be directed to OE%-ECS, Dayton, Obi0 45444, or el ephone 513-295-5375. I SIZE I CODE IDENT. NO. I DWG NO. MILITARY DRAWING A 14933 5962-86854 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO REV PAGE 12 )ESC FORM 193A FEB 86 Provided by IHSNot for ResaleNo reproduction or networking

34、 permitted without license from IHS-,-,- DESC-DWG-Bb85q 57 7777775 0007LBb 3 m SIZE CODE IDENT. NO. MILITARY DRAW IN G A 14933 6.4 Approved source of supply. 4n approved source of supply is listed herein. 4dditional sources Mill be added as they become available. The vendor listed herein has agreed

35、to this drawing and a certificate of compliance (see 3.5 herein) has Seen submitted to MSC-ECS. DWG NO. 5962-86854 T- I Vendor I Vendor I I Military drawing I CAGE I similar part I number lJ I I part number I I 5962-8685401EX I 18714 I CD51!iCT151F/3A I I I I I I number I I DEFENSE ELECTRONICS SUPPL

36、Y CENTER DAYTON, OHIO l/ Caution. 00 not use this number for item - acquisition. not satisfy the perfonnance requirements of this drawing. Item acquired to this number may REV PAGE 13 Vendor CAGE number 18714 Vendor name and address RCA Corporation Route 202 Somerville, WJ 08875 I I I DESC FORM 193A FEB 6 / Y - Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-