DLA SMD-5962-38128 REV F-2011 MICROCIRCUIT LINEAR RADIATION HARDENED PROGRAMMABLE VOLTAGE REFERENCE MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add device types 03 and 04. Add case outlines G and P. Technical and editorial changes throughout. 93-10-20 M. A. FRYE B Add vendor CAGE 06665 for class V. Editorial and technical changes throughout. 96-11-27 R. MONNIN C Add radiation hardness as

2、surance requirements. - ro 98-06-17 R. MONNIN D Changes to section 1.5 and to the quiescent current, output voltage, and output voltage temperature coefficient test in table I. Removed accelerated aging and dose rate burnout paragraphs in section 4. Update boilerplate to reflect current requirements

3、. -rrp 02-09-06 R. MONNIN E Make correction to Load regulation and Output short circuit current tests as specified under Table I. - ro 05-01-18 R. MONNIN F Add device type 05 tested at low dose rate. Add paragraph 3.2.3. Make changes to 1.2.2, 1.5, Table I, figure 1, Table IIB, and 4.4.4.1. - ro 11-

4、11-29 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV F F F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY DAN WONNELL DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD

5、MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY CHARLES E. BESORE APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, RADIATION HARDENED, PROGRAMMABLE VOLTAGE REFERENCE, MONOLITHIC SILICON DRAWING APPROVAL DATE 92-06-17 AMS

6、C N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-38128 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E533-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-38128 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990

7、REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in

8、the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 R 38128 01 V G A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device cl

9、ass designatorCase outline (see 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-

10、PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 AD584S Pin programmable voltage refe

11、rence 02 AD584T Pin programmable voltage reference 03 MX584S Pin programmable voltage reference 04 MX584T Pin programmable voltage reference 05 AD584T Radiation hardened pin programmable voltage reference 1.2.3 Device class designator. The device class designator is a single letter identifying the p

12、roduct assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4

13、Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified i

14、n MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-38128 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL

15、 F SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage (VIN) 40 V Power dissipation at +25C (PD) 600 mW Junction temperature (TJ) . +175C Storage temperature range . -65C to +175C Lead temperature (soldering, 10 seconds) 300C Thermal resistance, junction-to-case (JC) . See

16、MIL-STD-1835 Thermal resistance, junction-to-ambient (JA) 120C/W 1.4 Recommended operating conditions. Supply voltage range (VIN) . 4.5 V minimum to 30 V maximum Ambient operating temperature range (TA) . -55C to +125C 1.5 Radiation features. Device types 01 and 02: Maximum total dose available (dos

17、e rate = 50 300 rads(Si)/s) 100 krads(Si) 2/ Device type 05: Maximum total dose available (dose rate 10 mrads(Si)/s) 50 krads (Si) 3/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to t

18、he extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test

19、 Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist

20、.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and af

21、fect reliability. 2/ Device types 01 and 02 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A. 3/ For devi

22、ce type 05, radiation end point limits for the noted parameters are guaranteed for the conditions specified in MIL-STD-883, method 1019, condition D. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-38128 DLA

23、LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes ap

24、plicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management

25、 (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction,

26、and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 T

27、erminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon req

28、uest. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4

29、 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked

30、. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in ac

31、cordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be

32、a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate o

33、f compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the man

34、ufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or

35、for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to

36、 this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required docum

37、entation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 59 (see MIL-PRF-38535, appendix A). Provided by IHSNot for Resal

38、eNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-38128 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125

39、C VIN= 15 V, IL= 0 mA unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Quiescent current ICCVIN= 38 V, VO= 10 V, 1 All 0 1 mA TA= 25C M,D,P,L,R 3/ 1 01,02 0 1 M,D,P,L 05 0 1 Output voltage VOUT1VO= 10 V, TA= 25C 1 01, 03 9.97 10.03 V 02, 04, 05 9.99 10.01 M,D,P,L,R 3/

40、01, 02 9.90 10.10 M,D,P,L 05 9.90 10.10 VOUT2VO= 7.5 V, TA= 25C 01, 03 7.478 7.522 02, 04, 05 7.492 7.508 M,D,P,L,R 3/ 01, 02 7.425 7.575 M,D,P,L 05 7.425 7.575 VOUT3VO= 5.0 V, TA= 25C 01, 03 4.985 5.015 02, 04, 05 4.994 5.006 M,D,P,L,R 3/ 01, 02 4.95 5.05 M,D,P,L 05 4.95 5.05 VOUT4VO= 2.5 V, TA= 25

41、C 01, 03 2.493 2.508 02, 04, 05 2.497 2.504 M,D,P,L,R 3/ 01, 02 2.475 2.525 M,D,P,L 05 2.475 2.525 Line regulation 4/ VRLINE112.5 V VIN 15 V, 1 All .005 %/V VO= 10 V 2, 3 .010 VRLINE215 V VIN 30 V, 1 .002 VO= 10 V 2, 3 .005 Load regulation 4/ 0 mA IL 5 mA, 1 All 50 PPM / VRLOAD1VO= 10 V mA VRLOAD2VO

42、= 7.5 V VRLOAD3VO= 5.0 V VRLOAD4VO= 2.5 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-38128 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 6 DSCC FOR

43、M 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C VIN= 15 V, IL= 0 mA Group A subgroups Device type Limits 2/ Unit unless otherwise specified Min Max Load regulation 4/ 0 mA IL 5 mA, 2, 3 All 100 PPM / VRLOAD1VO= 10 V mA VRLOAD2VO= 7.5 V

44、 VRLOAD3VO= 5.0 V VRLOAD4VO= 2.5 V Output short circuit 4/ current IOSVO= 10 V 1,2,3 All 55 mA Output voltage 4/ 5/ temperature DVOUT1/DT VO= 10 V 2, 3 01, 03 0.3 %FS coefficient DVOUT2/DT VO= 7.5 V DVOUT3/DT VO= 5.0 V DVOUT4/DT VO= 2.5 V DVOUT1/DT VO= 10 V 02, 04, 0.15 DVOUT2/DT VO= 7.5 V 05 DVOUT3

45、/DT VO= 5.0 V DVOUT4/DT VO= 2.5 V 0.2 Output noise 4/ NOVO= 10 V, TA= +25C, 0.1 Hz BW 10 Hz 4 All 50 Vp-p VO= 10 V, TA= +25C, 10 Hz BW 100 kHz 150 V rms See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRC

46、UIT DRAWING SIZE A 5962-38128 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C VIN= 15 V, IL= 0 mA unless otherwise specified Group A subgroups Device type

47、 Limits 2/ Unit Min Max Settling time 4/ 0.1% of final value (power up) ts(p) (power) VO= 10 V, IL= 0 mA, TA= +25C 9 01, 02, 500 s 05VO= 10 V, IL= -5 mA, TA= +25C 500 VO= 10 V, 6/ IL= 0 mA, TA= +25C 03, 04 1000 VO= 10 V, 6/ IL= -5 mA, TA= +25C 1000 1/ Device types 01 and 02 supplied to this drawing

48、have been characterized through all levels M, D, P, L, and R of irradiation. Device type 05 supplied to this drawing has been characterized through all levels M, D, P, L of irradiation. However, device types 01 and 02 are only tested at the “R“ level and device type 05 is only tested at the “L” level. Pre and Post irradiation values are identical unless otherwise specified in table I. When performing post irradiation electrical measurements for any RHA level, TA= +25C. 2/ The limiting terms “min“ (minimum) and “max“ (ma