DLA SMD-5962-08227 REV B-2009 MICROCIRCUIT HYBRID HIGH GAIN 3 3V OPTOCOUPLER.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHET REV SHET 15 REV STATUS REV OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Steve L. Duncan CHECKED BY Greg Cecil DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil/ APPROVED BY Joseph D. R

2、odenbeck STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 09-04-28 MICROCIRCUIT, HYBRID, HIGH GAIN 3.3V OPTOCOUPLER AMSC N/A REVISION LEVEL SIZE A CAGE CODE 67268 5962-08227 SHEET 1 OF 15 DSCC FORM 2233

3、 APR 97 5962-E232-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08227 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawin

4、g documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the

5、PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 08227 01 H X X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness ass

6、urance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number

7、Circuit function 01 ACPL-5701L, ACPL-570KL Low input current, high gain single channel optocoupler 02 ACPL-5731L, ACPL-573KL Low input current, high gain dual channel optocoupler 03 ACPL-1772L, ACPL-177KL Low input current, high gain four channel optocoupler 1.2.3 Device class designator. This devic

8、e class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Dev

9、ice class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing ver

10、sion of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D)

11、. E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s)

12、taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without lice

13、nse from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08227 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Te

14、rminals Package style E CDIP2-T16 16 Dual-in-line P CDIP2-T8 8 Dual-in-line T See figure 1 16 Dual-in-line U See figure 1 16 Dual-in-line X See figure 1 8 Dual-in-line Y See figure 1 8 Dual-in-line 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum rating

15、s . 1/ Supply voltage (VCC) . -0.5 V dc to +20 V dc 2/ Peak forward input current (IF(PEAK) (each channel, t 1 ms) 20 mA Average input forward current (IFAVG) (each channel) 10 mA 3/ Reverse input voltage (VR) (each channel) 5.0 V Output current (IO) (each channel) . 40 mA Output voltage (VO) (each

16、channel) . -0.5 V dc to +20 V dc 2/ Output power dissipation (PO) (each channel) . 50 mW 4/ Lead temperature (soldering, 10 seconds). +260C (1.6 mm below seating plane) Storage temperature range -65C to +150C Junction temperature (TJ) +175C Case temperature (TC). +170C 1.4 Recommended operating cond

17、itions. Supply voltage range (VCC) 3.0 V to 7.0 V Low level input current (IFL) (each channel) . 2.0 A max High level input current range (IFH) (each channel) 0.5 mA to 5 mA Output Voltage (VO). 3.0 V to 7.0 V Operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government sp

18、ecification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL

19、-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. _ 1/ Stresses above the absolute maximum ratings may cause permanent damage to the

20、 device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Ground pin should be the most negative voltage at the detector side. Keeping VCCas low as possible, but greater than 2.0 volts, will provide the lowest IOHover temperature. 3/ Derate IFat 0.33 mA/C a

21、bove +110C. 4/ Output power is collector output power plus total supply power for device type 01. For device type 02, output power is the collector output power plus one half the total supply power. For device type 03, output power is collector output power plus one fourth of total supply power. Der

22、ate at 1.66 mW/C above 110C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08227 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE H

23、ANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA

24、19111-5094.) 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturer

25、s Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modifi

26、cation in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case out

27、line(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Switching test circuit and waveform(s). The test circuit and waveform(s) shall be as specified on figure 3. 3.3 Electrical performance characte

28、ristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The

29、 electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addit

30、ion to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should inclu

31、de a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of

32、 compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certi

33、ficate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality

34、Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08227 DEFENSE SUPPLY CENTER COLUMBUS COLU

35、MBUS, OHIO 43218-3990 REVISION LEVEL SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TC+125C unless otherwise specified Group A subgroupsDevice type Min Max Unit IOH100 Logic high output current IOHXIF= 2 A, VCC= 7 V, VO= 7 V 1/ 2/ 1,

36、2,3 All 100 A IF= 0.5 mA, IOL= 1.5 mA, VCC= 3.0 V 1/ 0.4 IF= 1.6 mA, IOL= 4.8 mA, VCC= 3.0 V 1/ 0.4 Logic low output voltage VOLIF= 5.0 mA, IOL= 10 mA, VCC= 3.0 V 1/ 1,2,3 All 0.4 V IF= 0.5 mA, VO= 0.4 V, VCC= 3.0 V 1/ 3/ 300 IF= 1.6 mA, VO= 0.4 V, VCC= 3.0 V 1/ 3/ 300 Current transfer ratio CTR IF=

37、 5.0 mA, VO= 0.4 V, VCC= 3.0 V 1/ 3/ 1,2,3 All 200 % IF= 0 mA 01 20 IF1= IF2= 0 mA 02 40 Logic high supply current ICCHVCC= 7 V IF1= IF2= IF3= IF4= 0 mA 1,2,3 03 40 A IF= 1.6 mA 01 2 IF1= IF2= 1.6 mA 02 4 Logic low supply current ICCLVCC= 7 V IF1= IF2= IF3= IF4= 1.6 mA 1,2,3 03 4 mA Input forward vo

38、ltage VFIF= 1.6 mA 1/ 1,2,3 All 1.0 1.8 V Input reverse breakdown voltage BVRIR= 10 A 1/ 1,2,3 All 5 V Input-output leakage current II-OVI-O= 1500 V, relative humidity 65%, TA= 25C, t = 5 seconds4/ 6/ 1 All 1.0 A Capacitance between input/output CI-Of = 1 MHz, TA= 25C 1/ 5/ 7/ 4 All 4.0 pF IF= 0.5 m

39、A, RL= 2.2k , VCC= 3.3 V 1/ 9,10,11 All 60 IF= 1.6 mA, RL= 680 , VCC= 3.3 V 1/ 9,10,11 All 50 9 20 Propagation delay time to high output level tPLHIF= 5 mA, RL= 330 , VCC= 3.3 V 1/ 10,11 All 30 s See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted with

40、out license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08227 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TC+125C unless otherwise spec

41、ified Group A subgroupsDevice type Min Max Unit IF= 0.5 mA, RL= 2.2k , VCC= 3.3 V 1/ 9,10,11 All 100 IF= 1.6 mA, RL= 680 , VCC= 3.3 V 1/ 9,10,11 All 30 9 5 Propagation delay time to low output level tPHLIF= 5 mA, RL= 330 , VCC= 3.3 V 1/ 10,11 All 10 s Common mode transient immunity at high output le

42、vel |CMH| VCM= 50 V (peak), VCC= 3.3 V, IF= 0 mA, RL= 680 1/ 7/ 8/ 9/ 9,10,11 All 500 V/s Common mode transient immunity at low output level |CML| VCM= 50 V (peak), VCC= 3.3 V, IF= 1.6 mA, RL= 680 1/ 7/ 8/ 9/ 9,10,11 All 500 V/s 1/ Each channel. 2/ IOHXis the leakage current resulting from channel t

43、o channel optical crosstalk. IF= 2 A for channel under test. For all other channels, IF= 10 mA. 3/ Current Transfer Ratio is defined as the ratio of output collector current, IO, to the forward LED input current, IF, times 100%. 4/ All devices are considered two terminal devices; II-Ois measured bet

44、ween all input leads shorted together and all output leads shorted together. 5/ Measured between each input pair shorted together and all output connections for that channel shorted together. 6/ This is a momentary withstand test, not an operating condition. 7/ Parameters are tested as part of devic

45、e initial characterization and after design and process changes. Parameters are guaranteed to limits specified for all lots not specifically tested. 8/ CMLis the maximum rate of the rise of the common mode voltage that can be sustained with the output voltage in the logic low state (VO2.0 V). 9/ In

46、applications where dV/dt may exceed 50,000 V/s (such as a static discharge a series resistor, RCC, should be included to protect the detector IC from destructively high surge currents). The recommended value is: Device type 01, Single channel: k)mA(I15.0)V(1RFCC Device type 02, Dual channel: k)mA(I3

47、.0)V(1RFCC Device type 03, Four channel: k)mA(I6.0)V(1RFCC Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08227 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 7 DSCC FORM 2234

48、APR 97 Case outline T. Millimeters InchesSymbol Min Max Min MaxA 4.57 .180A1 1.40 1.65 .055 .065b 0.41 0.51 .016 .020c 0.18 0.33 .007 .013D 20.07 20.83 .790 .820e 2.29 2.79 .090 .110E 9.65 9.91 .380 .390E1 8.13 .320L 1.07 1.32 .042 .052R 0.89 1.52 .035 .060NOTES: 1. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound shall rule. 2. Pin 1 is indicat