DLA DSCC-VID-V62 13612-2013 MICROCIRCUIT LINEAR 2 AMP FAST TRANSIENT LOW DROPOUT VOLTAGE REGULATOR MONOLITHIC SILICON.pdf
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1、 REVISIONS LTR DESCRIPTION DATE APPROVED Prepared in accordance with ASME Y14.24 Vendor item drawing REV PAGE REV PAGE REV STATUS OF PAGES REV PAGE 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY RICK OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ Origi
2、nal date of drawing YY-MM-DD CHECKED BY RAJESH PITHADIA TITLE MICROCIRCUIT, LINEAR, 2 AMP, FAST TRANSIENT, LOW DROPOUT VOLTAGE REGULATOR, MONOLITHIC SILICON 13-06-12 APPROVED BY CHARLES F. SAFFLE SIZE A CODE IDENT. NO. 16236 DWG NO. V62/13612 REV PAGE 1 OF 13 AMSC N/A 5962-V050-13 Provided by IHSNot
3、 for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/13612 REV PAGE 2 1. SCOPE 1.1 Scope. This drawing documents the general requirements of a high performance 2 amp, fast transient, low dropout v
4、oltage regulator microcircuit, with an operating temperature range of -40C to +125C. 1.2 Vendor Item Drawing Administrative Control Number. The manufacturers PIN is the item of identification. The vendor item drawing establishes an administrative control number for identifying the item on the engine
5、ering documentation: V62/13612 - 01 X E Drawing Device type Case outline Lead finish number (See 1.2.1) (See 1.2.2) (See 1.2.3) 1.2.1 Device type(s). Device type Generic Circuit function 01 TPS7A7200-EP 2 amp, fast transient, low dropout voltage regulator 1.2.2 Case outline(s). The case outline(s) a
6、re as specified herein. Outline letter Number of pins JEDEC PUB 95 Package style X 20 MO-220 Plastic quad leadless flat pack 1.2.3 Lead finishes. The lead finishes are as specified below or other lead finishes as provided by the device manufacturer: Finish designator Material A Hot solder dip B Tin-
7、lead plate C Gold plate D Palladium E Gold flash palladium Z Other Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/13612 REV PAGE 3 1.3 Absolute maximum ratings. 1/ Supply v
8、oltage range: Supply voltage (IN), Power good (PG), Enable (EN) -0.3 V to +7.0 V Soft start (SS), Feedback (FB), Output voltage sense input (SNS), Regulated output (OUT) . -0.3 V to VIN+ 0.3 V 2/ 50 mV, 100 mV, 200 mV, 400 mV, 800 mV, 1.6 V . -0.3 V to VOUT+ 0.3 V Current supply: OUT . Internally li
9、mited PG (sink current into integrated circuit) 5 mA maximum Junction temperature range (TJ) -40C to +150C Storage temperature range (TSTG) -40C to +150C Electrostatic discharge (ESD): 3/ Human body model (HBM) . 2 kV Charged device model (CDM) 500 V 1.4 Recommended operating conditions. 4/ Operatin
10、g free-air temperature range (TA) -40C to +125C 1/ Stresses beyond those listed under “absolute maximum rating” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended o
11、perating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2/ The absolute maximum rating is VIN+ 0.3 V or +7.0 V, whichever is smaller. 3/ ESD testing is performed according to the respective JESD22 JEDEC standard. 4/ Use o
12、f this product beyond the manufacturers design rules or stated parameters is done at the users risk. The manufacturer and/or distributor maintain no responsibility or liability for product used beyond the stated limits. Provided by IHSNot for ResaleNo reproduction or networking permitted without lic
13、ense from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/13612 REV PAGE 4 1.5 Thermal characteristics. Thermal metric Symbol Case X Unit Thermal resistance, junction-to-ambient 5/ JA35.7 C/W Thermal resistance, junction-to-case (top) 6/ JC(TOP)33.6 C/W Thermal r
14、esistance, junction-to-board 7/ JB15.2 C/W Characterization parameter, junction-to-top 8/ JT0.4 C/W Characterization parameter, junction-to-board 9/ JB15.4 C/W Thermal resistance, junction-to-case (bottom) 10/ JC(BOTTOM)3.8 C/W 5/ The thermal resistance, junction-to-ambient under natural convection
15、is obtained in a simulation on a JEDEC standard, High-K board, as specified in JESD51-7, in an environment described in JESD51-2a. 6/ The thermal resistance, junction-to-case (top) is obtained by simulating a cold plate test on the package top. No specific JEDEC standard test exists, but a close des
16、cription can be found in the ANSI SEMI standard G30-88. 7/ The thermal resistance, junction-to-board is obtained by simulating in an environment with a ring cold plate fixture to control the printed circuit board (PCB) temperature, as described in JESD51-8. 8/ Characterization parameter, junction-to
17、-top (JT) estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining JA, using a procedure described in JESD51-2a (sections 6 and 7). 9/ Characterization parameter, junction-to-board (JB) estimates the junction temperature of a device in a
18、 real system and is extracted from the simulation data for obtaining JA, using a procedure described in JESD51-2a (sections 6 and 7). 10/ The thermal resistance, junction-to-case (bottom) is obtained by simulating a cold plate test on the exposed thermal pad. No specific JEDEC standard test exists,
19、but a close description can be found in the ANSI SEMI standard G30-88. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/13612 REV PAGE 5 2. APPLICABLE DOCUMENTS AMERICAN NATI
20、ONAL STANDARDS INSTITUTE ANSI SEMI STANDARD G30-88 - Test Method for Junction-to-Case Thermal Resistance Measurements for Ceramic Packages (Applications for copies should be addressed to the American National Standards Institute, Semiconductor Equipment and Materials International, 1819 L Street, NW
21、, 6 th floor, Washington, DC 20036 or online at http:/www.ansi.org) JEDEC Solid State Technology Association EIA/JESD51-2a - Integrated Circuits Thermal Test Method Environment Conditions Natural Convection (Still Air) EIA/JEDEC 51-7 - High Effective Thermal Conductivity Test Board for Leaded Surfac
22、e Mount Packages EIA/JESD51-8 - Integrated Circuits Thermal Test Method Environment Conditions Junction-to-Board JEDEC PUB 95 - Registered and Standard Outlines for Semiconductor Devices (Applications for copies should be addressed to the Electronic Industries Alliance, 2500 Wilson Boulevard, Arling
23、ton, VA 22201-3834 or online at http:/www.jedec.org) 3. REQUIREMENTS 3.1 Marking. Parts shall be permanently and legibly marked with the manufacturers part number as shown in 6.3 herein and as follows: A. Manufacturers name, CAGE code, or logo B. Pin 1 identifier C. ESDS identification (optional) 3.
24、2 Unit container. The unit container shall be marked with the manufacturers part number and with items A and C (if applicable) above. 3.3 Electrical characteristics. The maximum and recommended operating conditions and electrical performance characteristics are as specified in 1.3, 1.4, and table I
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