BS QC 790132-1992 Specification for harmonized system of quality assessment for electronic components - Semiconductor devices - Integrated circuits - Blank detail specification - Be.pdf
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1、BRITISH STANDARD BS QC 790132:1992 Specification for Harmonized system of quality assessment for electronic components Semiconductor devices Integratedcircuits Blank detail specification Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)BSQC790132:1992 BSI09-199
2、9 ISBN 0 580 35528 4 Amendments issued since publication Amd. No. Date CommentsBSQC790132:1992 BSI 09-1999 i Contents Page National foreword ii Introduction 1 1 Marking and ordering information 2 2 Application related description 3 3 Specification of the function 3 4 Limiting values (absolute maximu
3、m rating system) 3 5 Operating conditions (within the specified operating temperature range) 4 6 Electrical characteristics 4 7 Programming 6 8 Mechanical and climate ratings, characteristics and data 6 9 Additional information 6 10 Screening (if required) 7 11 Quality assessment procedures 7 12 Str
4、uctural similarity procedures 7 13 Test conditionS and inspection requirements 7 4Additional measurement method 11 Table I Group A (see note6) Lot-by-lot 8 Table II Group B Lot-by-lot 9 Table III Group C Periodic 10 Table IV Group D Qualification approval tests 11BSQC790132:1992 ii BSI 09-1999 Natio
5、nal foreword This British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee, ECL/-. It is identical with IEC Publication748-2-1 QC790132 Semiconductor devices. Integrated circuits. Part2: Digital integrated circuits. Section 1: Blank detail specif
6、ication for bipolar monolithic digital integrated circuit gates excluding uncommitted logic arrays published by the International Electrotechnical Commission IEC and is a harmonized specification with the IECQ system of quality assessment for electronic components. This blank detail specification is
7、 one of a series of blank detail specifications for semiconductor devices to be used with BS QC700000 “Generic specification for discrete devices and integrated circuits”. Cross-references International Standard a Corresponding British Standard IEC68-2-17 BS2011 Environmental testing Part2.1 Q:1981
8、Test Q. Sealing Identical IEC617-12 BS3939 Guide for graphical symbols for electrical power, telecommunications and electronics diagrams Part12:1985 Binary logic elements Identical IEC747-10 BSQC700000:1991 Harmonized system of quality assessment for electronic components. Semiconductor devices. Gen
9、eric specification for discrete devices and integrated circuits Identical BS6493 Semiconductor devices Part2: Integrated circuits IEC748-1 Section2.1:1985 General Identical IEC748-2 Section2.2:1986 Recommendations for digital integrated circuits Identical IEC748-11 BS QC790100:1991 Harmonized system
10、 of quality assessment for electronic components. Semiconductor devices. Sectional specification for semiconductor integrated circuits excluding hybrid circuits Identical IEC749 BS6493 Semiconductor devices Part3:1985 Mechanical and climatic tests methods Identical QC001002 BS QC001002: Rules of Pro
11、cedure of the IEC Quality Assessment System for Electronic Components IECQ Identical a Undated in the textBSQC790132:1992 BSI 09-1999 iii A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct applicatio
12、n. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pagesi to iv, pages1to11 and a back cover. This standard has been updated (see copyright date) and may have had amendments i
13、ncorporated. This will be indicated in the amendment table on the inside front cover.iv blankBSQC790132:1992 BSI 09-1999 1 Introduction The IEC Quality Assessment System for Electronic Components is operated in accordance with the statutes of the IEC and under the authority of the IEC. The object of
14、 this system is to define quality assessment procedures in such a manner that electronic components released by one participating country as conforming with the requirements of an applicable specification are equally acceptable in all other participating countries without the need for further testin
15、g. This blank detail specification is one of a series of blank detail specifications for semiconductor devices and shall be used with the following IEC Publication: 747-10/QC700000, Semiconductor devices. Part 10: Generic specification for discrete devices and integrated circuits. Required informati
16、on Numbers shown in brackets on this and the following pages correspond to the following items of required information, which should be entered in the spaces provided. Identification of the detail specification The clauses given in square brackets on the next page of this standard, which forms the f
17、ront page of the detail specification, are intended for guidance to the specification writer and shall not be included in the detail specification. When confusion may arise as to whether a paragraph is only instruction to the writer or not, the paragraph shall be indicated between brackets. 1 The na
18、me of the National Standards Organization under whose authority the detail specification is issued. 2 The IECQ number of the detail specification. 3 The numbers and issue numbers of the generic and sectional specifications. 4 The national number of the detail specification, date of issue and any fur
19、ther information, if required by the national system. Identification of the component 5 Main function and type number. 6 Information on typical construction (materials, the main technology) and the package. If the device has several kinds of derivative products, those differences shall be indicated,
20、 e.g.feature of characteristics in a comparison table. If the device is sensitive to electrostatic charges, a caution statement shall be added in the detail specification. 7 Outline drawing, terminal identification, marking and/or reference to the relevant document for outlines. 8 Category of assess
21、ed quality according to subclause 2.6 of the generic specification. 9 Reference data.BSQC790132:1992 2 BSI 09-1999 1 Marking and ordering Information 1.1 Marking Any particular information other than that given in box7 and/or subclause 2.5 of the generic specification. 1.2 Ordering information The f
22、ollowing minimum information is necessary to order a specific device, unless otherwise specified: precise type reference (and nominal voltage value, if required); IECQ reference of detail specification with issue number and/or date when relevant; category of assessed quality as defined in subclause
23、2.6 of the generic specification and in clause9 of the sectional specification and, if required, screening sequence as defined in clause8 of the sectional specification; any other particulars. Name (address) of responsible NAI 1 Number of IECQ detail specification, plus issue number and/or date. QC7
24、90132-. 2 (and possibly of body from which specification is available). ELECTRONIC COMPONENT OF ASSESSED QUALITY IN ACCORDANCE WITH: Generic specification: Publication747-10/QC700000 Sectional specification: Publication748-11/QC790100 and national references if different. 3 National number of detail
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