BS PD IEC TS 62129-3-2014 Calibration of wavelength optical frequency measurement instruments Optical frequency meters using optical frequency combs《波长 光频测量仪器的校准 使用光学频率梳的光学频率计》.pdf
《BS PD IEC TS 62129-3-2014 Calibration of wavelength optical frequency measurement instruments Optical frequency meters using optical frequency combs《波长 光频测量仪器的校准 使用光学频率梳的光学频率计》.pdf》由会员分享,可在线阅读,更多相关《BS PD IEC TS 62129-3-2014 Calibration of wavelength optical frequency measurement instruments Optical frequency meters using optical frequency combs《波长 光频测量仪器的校准 使用光学频率梳的光学频率计》.pdf(24页珍藏版)》请在麦多课文档分享上搜索。
1、BSI Standards PublicationCalibration of wavelength/optical frequency measurement instrumentsPart 3: Optical frequency meters using optical frequency combsPD IEC/TS 62129-3:2014National forewordThis Published Document is the UK implementation of IEC/TS 62129-3:2014.The UK participation in its prepara
2、tion was entrusted to TechnicalCommittee GEL/86, Fibre optics.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions ofa contract. Users are responsible for its correct application. Th
3、e British Standards Institution 2014.Published by BSI Standards Limited 2014ISBN 978 0 580 84250 4ICS 33.180.30Compliance with a British Standard cannot confer immunity fromlegal obligations.This Published Document was published under the authority of theStandards Policy and Strategy Committee on 31
4、 August 2014.Amendments/corrigenda issued since publicationDate Text affectedPUBLISHED DOCUMENTPD IEC/TS 62129-3:2014IEC TS 62129-3 Edition 1.0 2014-02 TECHNICAL SPECIFICATION Calibration of wavelength/optical frequency measurement instruments Part 3: Optical frequency meters using optical frequency
5、 combs INTERNATIONAL ELECTROTECHNICAL COMMISSION R ICS 33.180.30 PRICE CODE ISBN 978-2-8322-1421-3 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. colourinsidePD IEC/TS 62129-3:2014 2 TS 62129
6、-3 IEC:2014(E) CONTENTS FOREWORD . 3 INTRODUCTION . 5 1 Scope 6 2 Normative references 6 3 Terms and definitions 6 4 Calibration test requirements . 7 4.1 Preparation . 7 4.2 Reference test conditions . 8 4.3 Traceability . 8 4.3.1 General . 8 4.3.2 National standard 8 4.3.3 Transfer standard 9 4.3.
7、4 Working standard 9 5 Optical frequency calibration . 9 5.1 General . 9 5.2 Establishing the calibration conditions 11 5.3 Calibration procedure 11 5.3.1 General . 11 5.3.2 Measurement configuration . 11 5.3.3 Detailed procedure 13 5.4 Calibration uncertainty 13 5.5 Reporting the results . 13 Annex
8、 A (normative) Mathematical basis . 14 A.1 General . 14 A.2 Type A evaluation of uncertainty . 14 A.3 Type B evaluation of uncertainty . 15 A.4 Determining the combined standard uncertainty 15 A.5 Reporting 16 Annex B (informative) References of optical frequency comb source . 17 B.1 Method A (mode-
9、locked fibre laser + carrier-envelope phase lock) 17 B.2 Method B (stabilized laser + electro-optical modulator) . 17 B.3 Method C (stabilized laser + supercontinuum source) . 18 Annex C (informative) Frequency-dependence of uncertainty . 19 Bibliography 20 Figure 1 Traceability chain using optical
10、frequency measurement scheme . 9 Figure 2 Schematic configuration of optical frequency measurement technique that uses optical comb . 10 Figure 3 Optical spectra of lasers and optical frequency combs . 11 Figure 4 Optical frequency meter measurement using a reference source 12 Figure 5 Optical frequ
11、ency meter measurement using a reference optical frequency meter 12 Figure B.1 Mode-locked laser + nonlinear optical effect . 17 Figure B.2 Electro-optical modulator type comb source 18 Figure B.3 Supercontinuum source 18 PD IEC/TS 62129-3:2014TS 62129-3 IEC:2014(E) 3 INTERNATIONAL ELECTROTECHNICAL
12、COMMISSION _ CALIBRATION OF WAVELENGTH/OPTICAL FREQUENCY MEASUREMENT INSTRUMENTS Part 3: Optical frequency meters using optical frequency combs FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical com
13、mittees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technic
14、al Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmenta
15、l and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agre
16、ements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use
17、and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promot
18、e international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicat
19、ed in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) A
20、ll users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage
21、or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publica
22、tion. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such
23、 patent rights. The main task of IEC technical committees is to prepare International Standards. In exceptional circumstances, a technical committee may propose the publication of a technical specification when the required support cannot be obtained for the publication of an International Standard,
24、 despite repeated efforts, or the subject is still under technical development or where, for any other reason, there is the future but no immediate possibility of an agreement on an International Standard. Technical specifications are subject to review within three years of publication to decide whe
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