BS PD CLC TR 50484-2009 Recommendations for nshielded enclosures《屏蔽室操作建议》.pdf

《BS PD CLC TR 50484-2009 Recommendations for nshielded enclosures《屏蔽室操作建议》.pdf》由会员分享，可在线阅读，更多相关《BS PD CLC TR 50484-2009 Recommendations for nshielded enclosures《屏蔽室操作建议》.pdf（20页珍藏版）》请在麦多课文档分享上搜索。

1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationRecommendations for shielded enclosuresPD CLC/TR 50484:2009Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/10/2010 08:22, Uncontrolled Copy, (c) BSINational forewordThi

2、s Published Document is the UK implementation of CLC/TR 50484:2009.The UK participation in its preparation was entrusted by Technical CommitteeGEL/210, EMC - Policy committee, to Subcommittee GEL/210/12, EMC basic,generic and low frequency phenomena Standardization.A list of organizations represente

3、d on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions of acontract. Users are responsible for its correct application. BSI 2010ISBN 978 0 580 64295 1ICS 17.220.01; 31.240Compliance with a British Standard cannot confe

4、r immunity fromlegal obligations.This Published Document was published under the authority of theStandards Policy and Strategy Committee on 31 July 2010.Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDPD CLC/TR 50484:2009Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STAND

5、ARDS, 26/10/2010 08:22, Uncontrolled Copy, (c) BSITECHNICAL REPORT CLC/TR 50484 RAPPORT TECHNIQUE TECHNISCHER BERICHT April 2009 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Se

6、cretariat: avenue Marnix 17, B - 1000 Brussels 2009 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. CLC/TR 50484:2009 E ICS 17.220.01; 31.240 Supersedes R210-005:1999English version Recommendations for shielded enclosures This Techni

7、cal Report was approved by CENELEC on 2009-03-20. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Ne

8、therlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. PD CLC/TR 50484:2009Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/10/2010 08:22, Uncontrolled Copy, (c) BSICLC/TR 50484:2009 2 Foreword This Technical Report was prepared

9、by the Technical Committee CENELEC TC 210, Electromagnetic compatibility (EMC). The text of the draft was submitted to vote in accordance with the Internal Regulations, Part 2, Subclause 11.4.3.2 (simple majority) and was approved by CENELEC as CLC/TR 50484 on 2009-03-20. This document supersedes R2

10、10-005:1999. _ PD CLC/TR 50484:2009Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/10/2010 08:22, Uncontrolled Copy, (c) BSI 3 CLC/TR 50484:2009 Contents 1 Scope 4 2 Normative references 4 3 Definitions 4 4 General .4 5 Shielding 5 5.1 Shielding attenuation.6 5.2 Evaluation of shielding ef

11、fectiveness . 10 5.3 Shielding components and selection of materials 11 5.4 Shielding attenuation values (see Figure 8 measured according to EN 50147-1) 14 Bibliography . 16 Figures Figure 1 Illustrated set-up for shielding .4 Figure 2 Wave impedance versus distance of the field source .5 Figure 3 S

12、chematic diagram of the partial reflections (subscript R) and transmissions (subscript T) at the two surfaces of a shield .6 Figure 4 S results calculated for a low-impedance magnetic field source .9 Figure 5 Calculated S results for a low-impedance magnetic field source 9 Figure 6 Shielding attenua

13、tion measurement. 11 Figure 7 Examples of door contacts . 13 Figure 8 Shows typical performance values. 14 Table Table 1 Summary SE aspects . 10 PD CLC/TR 50484:2009Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/10/2010 08:22, Uncontrolled Copy, (c) BSICLC/TR 50484:2009 4 1 Scope This Tec

14、hnical Report applies to shielded enclosures used for EMC testing which are to be validated according to the EN 50147 series of standards and the corresponding international standards. The object of this report is to give guidance to the selection of the shielding materials and components. The frequ

15、ency range for this document is 10 kHz to 40 GHz. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including a

16、ny amendments) applies. EN 50147-1:1996, Anechoic chambers Part 1: Shield attenuation measurement EN 50147-2, Anechoic chambers Part 2: Alternative test site suitability with respect to site attenuation EN 55011, Industrial, scientific and medical (ISM) radio-frequency equipment Electromagnetic dist

17、urbance characteristics Limits and methods of measurement (CISPR 11, mod.) EN 55022, Information technology equipment Radio disturbance characteristics Limits and methods of measurement (CISPR 22, mod.) IEC 60050(161), International Electrotechnical Vocabulary (IEV) Chapter 161: Electromagnetic comp

18、atibility 3 Definitions Void. 4 General Depending on the particular circumstances, it may be necessary to shield a room from the electromagnetic environment. Conversely it may be necessary to protect the environment from electromagnetic energy generated within the room. Figure 1 illustrates this. Fi

19、gure 1 Illustrated set-up for shielding PD CLC/TR 50484:2009Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/10/2010 08:22, Uncontrolled Copy, (c) BSI 5 CLC/TR 50484:2009 5 Shielding The shielding effectiveness ( SE ) of a shielded enclosure can be measured, e.g. as described in EN 50147-1,

20、 or calculated, e.g. as in 5.1. In general, the SE of a shielded enclosure can only be calculated for simple cases. To do this a number of assumptions are made. The most important of these assumptions is that the envelope formed by the enclosure is homogeneous and consists of material whose properti

21、es such as thickness ( t ), conductivity ( ) and permeability ( ) are well defined. Another assumption is that the shielded enclosure has a simple geometric structure. Normally, steel, copper or aluminium sheets are used to meet the SE requirements. The SE not only depends on the shield material par

22、ameters but also on the wave impedance of the field to be shielded. Consequently, the SE depends on the distance ( r ) between source and shield, relative to the wavelength 0of the field, normally expressed in the quantity r = 00/2/2 cfrr = , where f is the frequency and smc /10380= the propagation

23、velocity of the field. Then, three regions are distinguished: Figure 2 Wave impedance versus distance of the field source In the far-field (plane wave, free space) the wave impedance is a constant 0= 377 . In the near-field, the wave impedance depends on r and, consequently, on the type of source. T

24、he two most important types of source are: 1) the magnetic dipole having a wave impedance ZwH 0, and therefore normally called a low-impedance source. In the near-field ZwHis proportional to r; 2) the electric dipole having a wave impedance ZwE 0, and therefore normally called a high-impedance sourc

25、e. In the near-field ZwEis in inversely proportional to r. In the near-field region (normally the lower frequency range, say up to 10 MHz) the minimum SE of an enclosure is determined by the SE for the magnetic field component of a low-impedance source. A high SE value is then achieved by using a sh

26、ield of an adequate thickness with a high value of the relative permeability. In the higher frequency range (normally f larger than 10 MHz) and in the case that r I a shield with a good conductivity is important. In this range constructional details of the enclosure, such as joints/seems, doors, ins

27、erts and resonance effects will limit the final SE of the enclosure, in particular when the largest dimensions of slits and openings in the enclosure are smaller than 0. The cable feed-throughs are another source of limitation of the SE . PD CLC/TR 50484:2009Licensed Copy: Wang Bin, ISO/EXCHANGE CHI

28、NA STANDARDS, 26/10/2010 08:22, Uncontrolled Copy, (c) BSICLC/TR 50484:2009 6 5.1 Shielding attenuation In many SE calculations, SE is considered to be equal to the attenuation S of the amplitude of the electric or magnetic component of the EM field as caused by an infinitely large planar shield. In

29、 general, this is not correct. For example, in S calculations resonance effects in the field distribution inside a shielded enclosure which will affect the SE are not taken into account. However, S calculations allow a good estimate of SE when considering shielded enclosure requirements. In these ca

30、lculations the direction of propagation of the EM wave to be shielded is generally taken perpendicular to the shield. The major basic theories and concepts of shielding were established by Schelkunoff 1 and Kaden 2. More condensed and detailed practical information can be found in EMC textbooks 3. T

31、he incoming field wave is represented by 1H . Figure 3 Schematic diagram of the partial reflections (subscript R) and transmissions (subscript T) at the two surfaces of a shield According to the Schelkunoff theory, the total attenuation TS provided by a shield results from three mechanisms, their re

32、lation being given by (see Figure 3): =RRTITITMRRATHHHHHHHHHHSSSS33322212(1)where H represents the amplitude of the field component to be shielded. When expressed in dB MRRASSSS +=(dB) (2)These terms are elucidated in 5.1.1 to 5.1.3, and numerical examples are given in 5.1.4. PD CLC/TR 50484:2009Lic

33、ensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/10/2010 08:22, Uncontrolled Copy, (c) BSI 7 CLC/TR 50484:2009 5.1.1 The absorption loss term 21/ HHSTA= i.e. the contribution to RS as a result of the energy absorption when the field passes once through the shield. AS can be calculated from tAe

34、S =(3)where is the skin depth of the shielding material, given by 2= (4)and f 2= . NOTE 1 The conductivity can be written as = r cu, where cu= 5,8 107S/m is the conductivity of copper and rthe conductivity of the shield material relative to copper. Similarly, can be written as = ro, where 0= 4 10-7S

35、/m and r the relative permittivity of the shield. Expressing the frequency in MHz, can be written as rrMHzf )(66=(m) (5)NOTE 2 SAdoes not depend on the distance between source and shield, it only depends on the shield material parameters t, , and the frequency f. From Equation (3) it follows that SA

36、 8 t/ (dB). 5.1.2 The reflection loss term )/)(/(2211 TTRHHHHS =, i.e. the contributions to TS as a result of the reflection of the field when entering and leaving the shield. This contribution is proportional to the wave impedance of the field and, hence, in the near field RS depends on the type of

37、 source via the factor r as indicated in Clause 5. a) Near field ()Ir : In the far-field the wave impedance is a constant independent of the type of source, and RS can be estimated from 024=RS(8)5.1.3 The multiple reflection factor )./)(/(3332 RRMRHHHHS = i.e. the reduction factor of the reflection

38、loss )(RHRERSorSorS due to multiple reflections of the waves inside the shield. This term is only of importance when AS is small. MRS can be estimated from /21tMReS=(9)NOTE 3 The product of the reflection loss term and the multiple reflection factor reducing the effective reflection loss is always 1

39、. This consideration is of importance in the case Equation (6) applies. Therefore, in the aforementioned estimates the following additional condition shall be used: 1 . At frequencies f 1 MHz ST 150 dB, being completely determined by AS , which in praxis means that at those frequencies the SE is det

40、ermined by imperfections of the enclosure, see 5.3.1. The values of TS in Figure 4 just comply with curve 2, the standard performance curve in Figure 8 in 5.4. PD CLC/TR 50484:2009Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/10/2010 08:22, Uncontrolled Copy, (c) BSI 9 CLC/TR 50484:2009

41、The curve labelled conv allows conversion of a frequency value into a r value, taking r = 0,3 m. Figure 4 S results calculated for a low-impedance magnetic field source Assuming a much large value of r , say r = 5 m, r = 1 at f = 10 MHz. An example of results of )( fS , assuming additionally that t

42、= 1 mm, r= 0,6 (e.g. aluminium), and r= 1, is given in Figure 5. RES (high impedance electric field source) is also indicated. In the far field RRERHSSS = . The curve “Conv” assumes r = 5,0 m. Figure 5 Calculated S results for a low-impedance magnetic field source PD CLC/TR 50484:2009Licensed Copy:

43、Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/10/2010 08:22, Uncontrolled Copy, (c) BSICLC/TR 50484:2009 10 In this example RHS clearly contributes to TS . The curve TS complies with Curve 1, the high performance curve, in 5.4, Figure 8. This example illustrates a consideration often met in SE discussi

44、ons, in which three frequency ranges are considered, see Table 1 containing a summary of various SE aspects. Table 1 Summary SE aspects Frequency range I f 100 MHz 0 30 m 30 m 3 m 1 GHz is caused by imperfections and not by property of the shield material. In certain cases, i.e. high ambient field s

45、trengths caused by transmitters or the generation of very high field strengths within the shielded room, higher values are required. Figure 8 Shows typical performance values PD CLC/TR 50484:2009Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/10/2010 08:22, Uncontrolled Copy, (c) BSI 15 CL

46、C/TR 50484:2009 CALCULATION EXAMPLE (only showing the tendency): Outside: Allowed field strength limit 30 dB V/m at ambient field strength between 30 MHz and 230 MHz (EN 55011 and EN 55022) Inside: Produced field strength 140 dB V/m (10 V/m) Immunity test for industrial environment Required shieldin

47、g attenuation = 110 dB (10 dB to 20 dB shielding attenuation may be achieved by concrete walls of a building, also anechoic material on enclosure walls may reduce the electromagnetic field going through) PD CLC/TR 50484:2009Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/10/2010 08:22, Unc

48、ontrolled Copy, (c) BSICLC/TR 50484:2009 16 Bibliography 1 S.A. Schelkunoff, Elektromagnetic Waves. Princeton, N.J.: Van Nostrand, 1943 2 Kaden, H.: Die elektromagnetische Schirmung in der Fernmelde- und Hochfrequenztechnik. Berlin, Gttingen, Heidelberg: Springer-Verlag 1950 3 EMC textbooks, EMC Jou

49、rnals and EMC Conference Proceedings PD CLC/TR 50484:2009Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/10/2010 08:22, Uncontrolled Copy, (c) BSIThis page deliberately left blankLicensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/10/2010 08:22, Uncontrolled Copy, (c) BSIBSI is the independent national body respon