BS ISO 17987-7-2016 Road vehicles Local Interconnect Network (LIN) Electrical Physical Layer (EPL) conformance test specification《道路车辆 局域互连网络(LIN) 电气物理层(EPL)一致性试验规格》.pdf
《BS ISO 17987-7-2016 Road vehicles Local Interconnect Network (LIN) Electrical Physical Layer (EPL) conformance test specification《道路车辆 局域互连网络(LIN) 电气物理层(EPL)一致性试验规格》.pdf》由会员分享,可在线阅读,更多相关《BS ISO 17987-7-2016 Road vehicles Local Interconnect Network (LIN) Electrical Physical Layer (EPL) conformance test specification《道路车辆 局域互连网络(LIN) 电气物理层(EPL)一致性试验规格》.pdf(186页珍藏版)》请在麦多课文档分享上搜索。
1、BS ISO 17987-7:2016Road vehicles LocalInterconnect Network (LIN)Part 7: Electrical Physical Layer (EPL)conformance test specificationBSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06BS ISO 17987-7:2016 BRITISH STANDARDNational forewordThis British Standard is the UK i
2、mplementation of ISO 17987-7:2016. The UK participation in its preparation was entrusted to TechnicalCommittee AUE/16, Data Communication (Road Vehicles).A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all
3、 the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2016.Published by BSI Standards Limited 2016ISBN 978 0 580 81734 2 ICS 43.040.15 Compliance with a British Standard cannot confer immunity from legal obligations.This British
4、 Standard was published under the authority of the Standards Policy and Strategy Committee on 31 December 2016.Amendments/corrigenda issued since publicationDate T e x t a f f e c t e dBS ISO 17987-7:2016 ISO 2016Road vehicles Local Interconnect Network (LIN) Part 7: Electrical Physical Layer (EPL)
5、conformance test specificationVhicules routiers Rseau Internet local (LIN) Partie 7: Spcification dessai de conformit de la couche lectrique physique (EPL)INTERNATIONAL STANDARDISO17987-7First edition2016-12-01Reference numberISO 17987-7:2016(E)BS ISO 17987-7:2016ISO 17987-7:2016(E)ii ISO 2016 All r
6、ights reservedCOPYRIGHT PROTECTED DOCUMENT ISO 2016, Published in SwitzerlandAll rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet
7、or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISOs member body in the country of the requester.ISO copyright officeCh. de Blandonnet 8 CP 401CH-1214 Vernier, Geneva, SwitzerlandTel. +41 22 749 01 11Fax +41 22 749 09 47copyrighti
8、so.orgwww.iso.orgBS ISO 17987-7:2016ISO 17987-7:2016(E)Foreword vIntroduction vi1 Scope . 12 Normative references 13 Terms, definitions, symbols and abbreviated terms . 13.1 Terms and definitions . 13.2 Symbols . 13.3 Abbreviated terms . 44 Conventions . 55 EPL 12 V LIN devices with RX and TX access
9、 . 55.1 Test specification overview 55.1.1 Test case organization . 55.1.2 Measurement and signal generation requirements 65.2 Operational conditions Calibration 75.2.1 Electrical input/output, LIN protocol 75.2.2 EPLCT 1 Operating voltage range 75.2.3 Threshold voltages . 85.2.4 EPLCT 5 Variation o
10、f VSUP_NON_OP125.2.5 IBUSunder several conditions 135.2.6 Slope control . 165.2.7 Propagation delay 195.2.8 Supply voltage offset215.2.9 Failure 285.2.10 EPLCT 22 Verifying internal capacitance and dynamic interference IUT as slave 305.3 Operation mode termination . 325.3.1 General. 325.3.2 EPLCT 23
11、 Measuring internal resistor IUT as slave .335.3.3 EPLCT 24 Measuring internal resistor IUT as master 345.4 Static test cases 346 EPL 12 V LIN devices without RX and TX access .386.1 Test specification overview . 386.2 Communication scheme . 386.2.1 General. 386.2.2 IUT as slave 386.2.3 IUT as maste
12、r .396.2.4 IUT class C device .406.3 Test case organization . 426.4 Measurement and signal generation Requirements 436.4.1 Data generation 436.4.2 Various requirements .456.5 Operational conditions Calibration . 456.5.1 Electrical input/output, LIN protocol .456.5.2 EPLCT 25 Operating voltage range
13、456.5.3 Threshold voltages 476.5.4 EPLCT 29 Variation of VSUP_NON_OP 0,3 V to 7,0 V, 18 V to 40 V .516.5.5 IBUSunder several conditions 526.5.6 Slope control . 556.5.7 EPLCT 35 Propagation delay . 596.5.8 Supply voltage offset656.5.9 Failure 74 ISO 2016 All rights reserved iiiContents PageBS ISO 179
14、87-7:2016ISO 17987-7:2016(E)6.5.10 EPLCT 48 Verifying internal capacitance and dynamic interference IUT as slave 766.6 Operation mode termination . 786.6.1 General. 786.6.2 EPLCT 49 Measuring internal resistor IUT as slave .796.6.3 EPLCT 50 Measuring internal resistor IUT as master 796.7 Static test
15、 cases 797 EPL 24 V LIN devices with RX and TX access 827.1 Test specification overview . 837.1.1 Test case organization 837.1.2 Measurement and signal generation Requirements .837.2 Operational conditions Calibration . 847.2.1 Electrical input/output, LIN protocol .847.2.2 EPLCT 51 Operating voltag
16、e range 847.2.3 Threshold voltages 867.2.4 EPLCT 55 Variation of VSUP_NON_OP907.2.5 IBUSunder several conditions 917.2.6 Slope control . 947.2.7 Propagation delay 977.2.8 Supply voltage offset987.2.9 Failure .1127.2.10 EPLCT 80 Verifying internal capacitance and dynamic interference IUT as slave .11
17、47.3 Operation mode termination 1167.3.1 General1167.3.2 EPLCT 81 Measuring internal resistor IUT as slave 1177.3.3 EPLCT 82 Measuring internal resistor IUT as master .1177.4 Static test cases .1188 EPL 24 V LIN devices without RX and TX access . 1218.1 Test specification overview 1218.2 Communicati
18、on scheme 1218.2.1 Overview .1218.2.2 IUT as slave .1228.2.3 IUT as master 1228.2.4 IUT Class C device .1238.3 Test case organization 1258.4 Measurement and signal generation Requirements .1268.4.1 Data generation .1268.4.2 Various requirements 1288.5 Operational conditions Calibration 1288.5.1 Elec
19、trical input/output, LIN protocol 1288.5.2 EPLCT 83 Operating voltage range .1288.5.3 Threshold voltages .1308.5.4 EPLCT 87 Variation of VSUP_NON_OP 0,3 V to 7,0 V, 18 V to 58 V 1358.5.5 IBUSunder several conditions .1378.5.6 Slope control 1418.5.7 EPLCT 93 Propagation delay 1468.5.8 Supply voltage
20、offset.1518.5.9 Failure .1648.5.10 EPLCT 106 Verifying internal capacitance and dynamic interference IUT as slave .1668.6 Operation mode termination 1678.6.1 General1678.6.2 EPLCT 107 Measuring internal resistor IUT as slave 1688.6.3 EPLCT 108 Measuring internal resistor IUT as master .1688.7 Static
21、 test cases .169Bibliography . 172iv ISO 2016 All rights reservedBS ISO 17987-7:2016ISO 17987-7:2016(E)ForewordISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normall
22、y carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the
23、work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the di
24、fferent approval criteria needed for the different types of ISO documents should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).Attention is drawn to the possibility that some of the elements of this document
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