BS ISO 17901-1-2015 Optics and photonics Holography Methods of measuring diffraction efficiency and associated optical characteristics of holograms《光学和光子学 全息摄影术 全息图衍射效率和其相关光学特性的测量方.pdf

《BS ISO 17901-1-2015 Optics and photonics Holography Methods of measuring diffraction efficiency and associated optical characteristics of holograms《光学和光子学 全息摄影术 全息图衍射效率和其相关光学特性的测量方.pdf》由会员分享，可在线阅读，更多相关《BS ISO 17901-1-2015 Optics and photonics Holography Methods of measuring diffraction efficiency and associated optical characteristics of holograms《光学和光子学 全息摄影术 全息图衍射效率和其相关光学特性的测量方.pdf（26页珍藏版）》请在麦多课文档分享上搜索。

1、BSI Standards PublicationBS ISO 17901-1:2015Optics and photonics HolographyPart 1: Methods of measuring diffractionefficiency and associated opticalcharacteristics of hologramsBS ISO 17901-1:2015 BRITISH STANDARDNational forewordThis British Standard is the UK implementation of ISO 17901-1:2015. The

2、 UK participation in its preparation was entrusted to TechnicalCommittee CPW/172, Optics and Photonics.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are

3、responsible for its correct application. The British Standards Institution 2015.Published by BSI Standards Limited 2015ISBN 978 0 580 81127 2 ICS 31.020 Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Sta

4、ndards Policy and Strategy Committee on 31 July 2015.Amendments/corrigenda issued since publicationDate T e x t a f f e c t e d ISO 2015Optics and photonics Holography Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of hologramsOptique et photonique Hologra

5、phie Partie 1: Mthodes de mesurage de lefficacit de diffraction etcaractristiques optiques associes aux hologrammesINTERNATIONAL STANDARDISO 17901-1First edition 2015-07-01Reference number ISO 17901-1:2015(E)BS ISO 17901-1:2015ISO 17901-1:2015(E)ii ISO 2015 All rights reservedCOPYRIGHT PROTECTED DOC

6、UMENT ISO 2015, Published in SwitzerlandAll rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written

7、 permission. Permission can be requested from either ISO at the address below or ISOs member body in the country of the requester.ISO copyright officeCh. de Blandonnet 8 CP 401CH-1214 Vernier, Geneva, SwitzerlandTel. +41 22 749 01 11Fax +41 22 749 09 47copyrightiso.orgwww.iso.orgBS ISO 17901-1:2015I

8、SO 17901-1:2015(E)Foreword ivIntroduction v1 Scope . 12 Normative references 13 Terms and definitions . 14 Symbols and abbreviated terms . 35 Principles . 36 Measurement methods 36.1 General . 36.2 Definition of the coordinate system 46.3 Hologram measurement environment . 46.4 Measurement device an

9、d measures . 56.5 Diffraction efficiency measurement method 56.5.1 General 56.5.2 Absolute diffraction efficiency measurement method 66.5.3 Relative diffraction efficiency measurement method 76.5.4 Spectral diffraction efficiency by transmittance measurement for volume holograms 86.5.5 Spectral diff

10、raction efficiency by reflectance measurement for volume holograms 96.6 Angular selectivity measurement method . 116.7 Wavelength selectivity measurement method . 117 Description of measurement results 127.1 General 127.2 Description of the diffraction efficiency measurement results 127.3 Descriptio

11、n of the angular selectivity measurement results .127.4 Description of the wavelength selectivity measurement method .12Bibliography .14 ISO 2015 All rights reserved iiiContents PageBS ISO 17901-1:2015ISO 17901-1:2015(E)ForewordISO (the International Organization for Standardization) is a worldwide

12、federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that c

13、ommittee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.The procedures used to develop this document

14、 and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the different types of ISO documents should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives,

15、Part 2 (see www.iso.org/directives).Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of any patent rights identified during the development of

16、 the document will be in the Introduction and/or on the ISO list of patent declarations received (see www.iso.org/patents).Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement.For an explanation on the meaning of ISO specific t

17、erms and expressions related to conformity assessment, as well as information about ISOs adherence to the WTO principles in the Technical Barriers to Trade (TBT) see the following URL: Foreword - Supplementary information.The committee responsible for this document is ISO/TC 172, Optics and Photonic

18、s, Subcommittee SC 9, Electro-optical systems.ISO 17901 consists of the following parts, under the general title Optics and photonics Holography: Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of holograms Part 2: Methods for measurement of hologram record

19、ing characteristicsiv ISO 2015 All rights reservedBS ISO 17901-1:2015ISO 17901-1:2015(E)IntroductionThe aim of this part of ISO 17901 is to specify the terms related to holograms and basic measurement methods to characterize them.A hologram is an optical device utilizing interference and diffraction

20、 phenomena and is characterized differently from optical devices based on reflection, refraction, and scattering. By exploiting the characteristics of holograms, they have been successfully applied in numerous applications such as displays, metrology, and anti-counterfeit security.The expanded marke

21、t in holography has generated a need to agree on basic terms and definitions for holograms and measurement methods and this part of ISO 17901 aims to satisfy that need. ISO 2015 All rights reserved vBS ISO 17901-1:2015ISO 17901-1:2015(E)BS ISO 17901-1:2015Optics and photonics Holography Part 1: Meth

22、ods of measuring diffraction efficiency and associated optical characteristics of holograms1 ScopeThis part of ISO 17901 specifies the terms related to optical characteristics of holograms, the method to measure their diffraction efficiency, and the angular and wavelength selectivity measurement met

23、hods. These measurement methods are applicable to any type of hologram if the hologram yields a simple diffraction pattern, which means the reconstructed wave can be clearly separated from other diffracted and non-diffracted waves. In other words, holograms that yield complex diffraction patterns ar

24、e excluded. There are no restrictions on the materials used to form the holograms.2 Normative referencesThe following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undat

25、ed references, the latest edition of the referenced document (including any amendments) applies.ISO 15902, Optics and photonics Diffractive optics Vocabulary3 Terms and definitionsFor the purposes of this document, the terms and definitions given in ISO 15902 and the following apply.3.1holograminter

26、ference pattern formed between the wave emitted from the object and its coherent reference wave, which is recorded in the recording materialNote 1 to entry: The holograms also include those formed through embossed copying of surface relief or those recording the periodic structure spatially by etchi

27、ng or engraving.3.2object waveobject beamwave emitted from an object and entering the recording material in the course of recording the hologram3.3reference wavereference beamwave entering the recording material while forming a certain angle with the object wave in the course of recording the hologr

28、am3.4illuminating waveilluminating beamwave allowed to enter the hologram when reconstructing the image from the hologramINTERNATIONAL STANDARD ISO 17901-1:2015(E) ISO 2015 All rights reserved 1BS ISO 17901-1:2015ISO 17901-1:2015(E)3.5reconstructed wavereconstructed beamwave diffracted by the hologr

29、amNote 1 to entry: Generally, this term indicates either the +first-order diffracted wave or first-order diffracted wave but can indicate second or higher order diffracted waves.3.6specular waveperfectly reflected light waves, to be distinguished from diffuse reflection3.7transmission hologramhologr

30、am using transmission reconstructed wavesNote 1 to entry: A hologram recording the interference pattern between objects and reference waves from the same side of the recording material is a transmission hologram.3.8reflection hologramhologram using reflection reconstructed wavesNote 1 to entry: A re

31、flection hologram recording the interference pattern between an object wave and the reference wave from the mutually opposite sides of the recording material is generally a volume reflection hologram and is also called a Lippmann or Lippmann Denisyuk hologram. Of the surface relief hologram (3.13),

32、the hologram using the wave reflected from the relief surface is a surface relief reflection hologram.3.9phase hologramhologram having a spatially-periodic phase modulation structure3.10amplitude hologramhologram having a spatially-periodic amplitude modulation structure3.11volume hologramhologram c

33、ausing Bragg diffractionNote 1 to entry: A hologram having a sinusoidal refractiveindex distribution is one whose hologram recording layer is sufficiently thicker than the interval of interference fringes. Holograms characterized by a Q-value Qgreatermuch1 are considered to be volume holograms.3.12p

34、lane hologramhologram causing Raman-Nath diffractionNote 1 to entry: This type of hologram is the one whose hologram recording thickness is sufficiently smaller than the interval of interference fringes. Holograms characterized by a Q-value Q ratio of the radiant flux of the reconstructed wave relat

35、ive to the radiant flux of the illuminating waveNote 1 to entry: The diffraction efficiency of holograms is generally expressed as a percentage (%).3.16angular selectivity dependence of the radiant flux of the reconstructed wave on the angle of incidence of the illuminating wave if the hologram is r

36、eproduced while using a monochromatic illuminating wave3.17wavelength selectivitydependence of the radiant flux of the reconstructed wave on the wavelength of the illuminating wave if the hologram is reproduced while keeping the angle of incidence of illuminating wave constant4 Symbols and abbreviat

37、ed terms Diffraction efficiency (%)5 PrinciplesThe diffraction efficiency is determined by measuring the radiant flux of the reconstructed wave or the zero-order diffracted wave while the illuminating wave enters the hologram. The absolute diffraction efficiency, which is the ratio of the radiant fl

38、ux of reconstructed wave relative to that of the illuminating wave, is the basis of the measurement. The relative diffraction efficiency, which is the ratio of the radiant flux of the reconstructed wave relative to that of the sum of the radiant fluxes of all diffraction orders, might be important f

39、or certain applications. There is also a simplified method to determine the diffraction efficiency from the spectral distribution of either the transmittance or reflectance of the hologram. Finally, the angle selectivity of the hologram is determined from diffraction efficiency as a function of the

40、angle of incidence and the wavelength selectivity is determined from the diffraction efficiency as a function of the wavelength.6 Measurement methods6.1 GeneralThis part of ISO 17901 covers the measurement of the diffraction efficiency as well as the angle selectivity and wavelength selectivity as d

41、escribed below. Since for multiple purposes there is more than one definition of diffraction efficiency, its measurement shall be made according to the method appropriate to the purpose. ISO 2015 All rights reserved 3BS ISO 17901-1:2015ISO 17901-1:2015(E)When the hologram to be measured is formed th

42、rough the two-flux interference of reference waves, they are assumed to be plane waves. If the reference waves are not plane waves, the method can be applied by using either the absolute diffraction efficiency or relative diffraction efficiency. If this applies, the fact shall be cited clearly in th

43、e report.This part of ISO 17901 is applicable to holograms formed by the method other than two-flux interference of laser beams, such as the embossed hologram formed by transferring and reproducing the interference pattern, the hologram formed by the electron beam lithography system, and all other e

44、tching or engraving methods. If any alternative method is used, that fact shall be cited clearly in the report.6.2 Definition of the coordinate systemThe axis of coordinates and the angle of waves are defined as follows.a) The recording material (or hologram) plane shall be the xy-plane while the ax

45、is vertical to the plane shall be the z-axis.b) For the z-axis, the advance direction of the object or reconstructed wave shall be positive.c) As shown in Figure 1, the angle of incidence degree () or rad is formed between the z-axis in the positive direction and the extension of the incident wave.

46、The positive symbol indicates a counter-clockwise direction.a) Wave advancing in the +z direction b) Wave advancing in the z directionKey1 incident light wave2 recording material or hologramFigure 1 How to establish the coordinate system and wave angle in measurement of optical characteristics of ho

47、lograms6.3 Hologram measurement environmentMeasurement of the diffraction efficiency shall be made inside a dark room at room temperature and in atmosphere with stable relative humidity (or under conditions designed to prevent entry of stray light into the detector).4 ISO 2015 All rights reservedBS

48、ISO 17901-1:2015ISO 17901-1:2015(E)6.4 Measurement device and measuresThe measurement shall use the following equipment and measures, as required, according to the measurement method.a) Light sourceThe light source for laser should ensure high temporal stability of the output (for example, 5 % or le

49、ss in output fluctuation over 30 min). The white-light illuminating source, if used, should provide a continuous spectrum over the measuring wavelength range concerned.b) MirrorThe surface accuracy of mirrors should be sufficiently high (for example, better than 1/10 of the appropriate wavelength).c) HolderThe holder should be able to move within a movable range equivalent approximately to the test piece size while holding the hologram.d) DetectorThe detector should have sufficient dynamic range and response relative to the i