BS ISO 10934-1-2003 Optics and optical instruments - Vocabulary for microscopy - Light microscopy《光学和光学仪器 显微镜词汇 光学显微镜》.pdf

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1、BRITISH STANDARD BS ISO 10934-1:2002 Optics and optical instruments Vocabulary for microscopy Part 1: Light microscopy ICS 01.040.37; 37.020 BS ISO 10934-1:2002 This British Standard, having been prepared under the direction of the Materials and Chemicals Sector Policy and Strategy Committee, was pu

2、blished under the authority of the Standards Policy and Strategy Committee on 8 January 2003 BSI 8 January 2003 ISBN 0 580 41061 7 National foreword This British Standard reproduces verbatim ISO 10934-1:2002 and implements it as the UK national standard. The UK participation in its preparation was e

3、ntrusted to Technical Committee LBI/33, Microscopes, which has the responsibility to: A list of organizations represented on this committee can be obtained on request to its secretary. Cross-references The British Standards which implement international publications referred to in this document may

4、be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users ar

5、e responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and

6、 keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document comprises a front cover, an inside front cover, the ISO title page, pages ii to ix, a blank page, pages 1 to 95 and a back cover. The BSI copyright d

7、ate displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date Comments Reference number Numro de rfrence ISO 10934- 1:2002(E/F/R)INTERNATIONAL STANDARD NORME INTERNATIONALE ISO 10934-1 First edition Premire dition 2002- 12- 15 Optics an

8、d optical instruments Vocabulary for microscopy Part 1: Light microscopy Optique et instruments doptique Vocabulaire relatif la microscopie Partie 1: Microscopie optique a 1: BSISO109341:2002BSISO109341:2002iiBSISO109341:2002iii Contents Page Foreword . vii 1 Scope 1 2 Terms and definitions . 1 Bibl

9、iography 84 Alphabetical index 86 BSISO109341:2002iv Sommaire Page Avant-propos . viii 1 Domaine dapplication 1 2 Termes et dfinitions 1 Bibliographie. 84 Index alphabtique. 89 BSISO109341:2002v . ix 1 1 2 1 . 84 . 92 BSISO109341:2002vi Foreword ISO (the International Organization for Standardizatio

10、n) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be rep

11、resented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. International Standards a

12、re drafted in accordance with the rules given in the ISO/IEC Directives, Part 3. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting

13、a vote. Attention is drawn to the possibility that some of the elements of this part of ISO 10934 may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. International Standard ISO 10934- 1 was prepared by Technical Committee ISO/TC 172,

14、Optics and optical instruments, Subcommittee SC 5, Microscopes and endoscopes. ISO 10934 consists of the following parts, under the general title Optics and optical instruments Vocabulary for microscopy: Part 1: Light microscopy Part 2: Confocal microscopy Part 3: Digital and electronic imaging BSIS

15、O109341:2002vii Avant-propos LISO (Organisation internationale de normalisation) est une fdration mondiale dorganismes nationaux de normalisation (comits membres de lISO). Llaboration des Normes internationales est en gnral confie aux comits techniques de lISO. Chaque comit membre intress par une tu

16、de a le droit de faire partie du comit technique cr cet effet. Les organisations internationales, gouvernementales et non gouvernementales, en liaison avec lISO, participent galement aux travaux. LISO collabore troitement avec la Commission lectrotechnique internationale (CEI) en ce qui concerne la

17、normalisation lectrotechnique. Les Normes internationales sont rdiges conformment aux rgles donnes dans les Directives ISO/CEI, Partie 3. Les projets de Normes internationales adopts par les comits techniques sont soumis aux comits membres pour vote. Leur publication comme Normes internationales req

18、uiert lapprobation de 75 % au moins des comits membres votants. Lattention est appele sur le fait que certains des lments de la prsente partie de lISO 10934 peuvent faire lobjet de droits de proprit intellectuelle ou de droits analogues. LISO ne saurait tre tenue pour responsable de ne pas avoir ide

19、ntifi de tels droits de proprit et averti de leur existence. La Norme internationale ISO 10934- 1 a t labore par le comit technique ISO/TC 172, Optique et instruments doptique, sous-comit SC 5, Microscopes et endoscopes. LISO 10934 comprend les parties suivantes, prsentes sous le titre gnral Optique

20、 et instruments doptique Vocabulaire relatif la microscopie: Partie 1: Microscopie optique Partie 2: Microscopie confocale Partie 3: Imagerie lectronique et numrique BSISO109341:2002viii ( ) ( - ). . - . , , . ( ) . , / , 3. , , - . 75 % - . , . . ISO 10934- 1 ISO/TC 172, , SC 5, . ISO 10934 : 1: 2:

21、 3: - BSISO109341:2002ixNITERNATNOIAL STANDARD ONMRI ENTENRATIONALE IS-43901 O1:2002(E/F/R)Optics and optical instruments Vocabulary for microscopy Part 1: Light microscopy Optique et instruments doptique Vocabulaire relatif la microscopie Partie 1: Microscopie optique a 1: 1 Scope This part of ISO

22、10934 specifies terms and definitions to be used in the field of light microscopy. 1 Domaine dapplication La prsente partie de lISO 10934 prescrit les termes et dfinitions utiliser dans le domaine de la microscopie optique. 1 O 10934 - - , e o o . 2 Terms and definitions NOTE Terms shown in bold wit

23、hin a definition or a note are defined else- where within this part of ISO 10934. An alphabetial index is provided at the end of this part of ISO 10934. 2 Termes et dfinitions NOTE Les termes indiqus en gras dans une dfinition ou une note sont dfinis ailleurs dans la prsente partie de lISO 10934. Un

24、 index alphabtique est donn la fin de la prsente partie de lISO 10934. 2 , - o o e e e- e a , - O 10934. oe a o e a O 10934 a aa a a e e o .2.1 Abbe test plate device for testing the chromatic and spherical aberration of microscope objectives NOTE When testing for spherical aberration, the cover gla

25、ss thickness for which the objective is best corrected is also found. The test plate consists of a slide on which is deposited an opaque metal layer in the form of par- allel strips arranged in groups of differ- ent width. The edges of these strips are irregularly serrated to allow the aberra- tions

26、 to be judged more easily. In its original and most common form, the slide is covered with a wedge-shaped 2.1 lame-test dAbbe dispositif utilis pour tester laberra- tion chromatique et sphrique des objectifs de microscopes NOTE Durant les tests daberration sphrique, on trouve galement lpais- seur de

27、s lamelles couvre-objet pour laquelle lobjectif est le mieux corrig. La lame-test consiste en une lame porte-objet sur laquelle est dpose une couche mtallique opaque en forme de bandes parallles disposes en groupes de diffrente largeur. Les bords de ces bandes sont irrgulire- ment stris pour permett

28、re de juger plus facilement les aberrations. Sous sa 2.1 - - , . - , - - , BSISO109341:20021 cover glass, the increasing thickness of which is marked on the slide. Additional versions without the cover glass and/or with reflective stripes are also in use. forme originale et la plus commune, la lame

29、porte-objet est recouverte dune lamelle couvre-objet de forme en coin, dont lpaisseur croissante est marque sur la lame porte-objet. Dautres versions sans la lamelle couvre-objet et/ou avec bandes rflchissantes sont galement utilises. . , . - , - . / 2.2 Abbe theory of image formation explanation of

30、 the mechanism by which the microscope image is formed NOTE It assumes coherent illumina- tion and is based on a three-step proc- ess involving diffraction. a) First step: the object diffracts light coming from the source. b) Second step: the objective collects some of the diffracted beams and focus

31、es them, according to the laws of geometrical optics, in the back focal plane of the objective to form the primary diffraction pattern of the object. c) Third step: the diffracted beams continue on their way and are reunited; the result of their inter- ference is called the primary image of the micr

32、oscope. This explains the necessity for the maximum number of rays diffracted by the object to be collected by the objec- tive, so that they may contribute to the image. Fine detail will not be resolved if the rays it diffracts are not allowed to contribute to the image. 2.2 thorie de la formation d

33、e limage selon Abbe explication du mcanisme par lequel limage du microscope se forme NOTE Cette thorie suppose un clairage cohrent et repose sur un procd en trois stades impliquant la diffraction. a) Premier stade: lobjet diffracte la lumire provenant de la source. b) Deuxime stade: lobjectif recuei

34、lle certains des faisceaux diffracts et les met au point, selon les lois de loptique gomtrique, sur le foyer- image de lobjectif pour former la figure de diffraction primaire de lobjet. c) Troisime stade: les faisceaux dif- fracts continuent leur trajet et se runissent; le rsultat de leur interfrenc

35、e est appel limage primaire du microscope. Ceci explique quil est ncessaire que le nombre maximal de rayons diffracts par lobjet soient recueillis par lobjectif, afin quils puissent contribuer limage. Le dtail fin nest pas rsolu si les rayons quil diffracte ne peuvent pas contribuer limage. 2.2 - - , . a) : - , .