BS IEC 60748-2-20-2008 Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits《半导体器件 集成电路 数字集成电路 类规范 低压集成.pdf
《BS IEC 60748-2-20-2008 Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits《半导体器件 集成电路 数字集成电路 类规范 低压集成.pdf》由会员分享,可在线阅读,更多相关《BS IEC 60748-2-20-2008 Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits《半导体器件 集成电路 数字集成电路 类规范 低压集成.pdf(22页珍藏版)》请在麦多课文档分享上搜索。
1、BRITISH STANDARDBS IEC 60748-2-20:2008Semiconductor devices Integrated circuits Part 2-20: Digital integrated circuits Family specification Low voltage integrated circuitsICS 31.200g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g3
2、6g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58BS IEC 60748-2-20:2008This British Standard was published under the authority of the Standards Policy and Strategy Committee on 30 September 2008 BSI 2008ISBN 978 0 580 57380 4National forewordThis British Standard is t
3、he UK implementation of IEC 60748-2-20:2008. It supersedes BS IEC 60748-2-20:2000 which is withdrawn. The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors.A list of organizations represented on this committee can be obtained on request to its secretary.
4、This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application.Compliance with a British Standard cannot confer immunity from legal obligations.Amendments/corrigenda issued since publicationDate CommentsIEC 60748-2-20Edition
5、 2.0 2008-02INTERNATIONAL STANDARD Semiconductor devices Integrated circuits Part 2-20: Digital integrated circuits Family specification Low voltage integrated circuits BS EN ISO 60748-2-20:2008CONTENTS INTRODUCTION.4 1 Scope.5 2 Normative references .5 3 Terms and definitions .5 4 Interface specifi
6、cations for low supply voltage below 3,3 V.6 4.1 Specifications for 3,3 V nominal power supply voltage.6 4.1.1 General .6 4.1.2 Absolute maximum continuous ratings.6 4.1.3 Normal range of operating supply voltage6 4.1.4 Wide range of operating supply voltage .7 4.2 Specifications for 2,5 V nominal p
7、ower supply voltage.8 4.2.1 General .8 4.2.2 Absolute maximum continuous ratings.8 4.2.3 Normal range of operating supply voltage8 4.2.4 Wide range of operating supply voltage .9 4.3 Specifications for 1,8 V nominal power supply voltage.10 4.3.1 General .10 4.3.2 Absolute maximum continuous ratings.
8、10 4.3.3 Normal range of operating supply voltage10 4.3.4 Wide range of operating supply voltage .11 4.4 Specifications for 1,5 V nominal power supply voltage.11 4.4.1 General .11 4.4.2 Absolute maximum continuous ratings.11 4.4.3 Normal range of operating supply voltage12 4.4.4 Wide range of operat
9、ing supply voltage .12 4.5 Specifications for 1,2 V nominal power supply voltage.13 4.5.1 General .13 4.5.2 Absolute maximum continuous ratings.13 4.5.3 Normal range of operating supply voltage14 4.5.4 Wide range of operating supply voltage .14 4.6 Specifications for 1,0 V nominal power supply volta
10、ge.15 4.6.1 General .15 4.6.2 Absolute maximum continuous ratings.15 4.6.3 Normal range of operating supply voltage16 4.6.4 Wide range of operating supply voltage .17 Annex A (informative) Threshold voltage test conditions of Schmitt trigger operation18 Bibliography19 Figure A.1 DC characteristic me
11、asurement circuit of Schmitt-trigger input18 BS EN ISO 60748-2-20:2008 2 Table 1 Absolute maximum continuous ratings for nominal 3,3 V .6 Table 2 Operating conditions for 3,3 V normal range6 Table 3 Output characteristics for 3,3 V normal range7 Table 4 Operating conditions for 3,3 V wide range .7 T
12、able 5 Output characteristics for 3,3 V wide range .7 Table 6 Absolute maximum continuous ratings for nominal 2,5 V .8 Table 7 Operating conditions for 2,5 V normal range8 Table 8 Output characteristics for 2,5 V normal range9 Table 9 Operating conditions for 2,5 V wide range .9 Table 10 Output char
13、acteristics for 2,5 V wide range .9 Table 11 Absolute maximum continuous ratings for nominal 1,8 V .10 Table 12 Operating conditions for 1,8 V normal range10 Table 13 Output characteristics for 1,8 V normal range11 Table 14 Operating conditions for 1,8 V wide range .11 Table 15 Output characteristic
14、s for 1,8 V wide range .11 Table 16 Absolute maximum continuous ratings for nominal 1,5 V .12 Table 17 Operating conditions for 1,5 V normal range12 Table 18 Output characteristics for 1,5 V normal range12 Table 19 Operating conditions for 1,5 V wide range .13 Table 20 Output characteristics for 1,5
15、 V wide range .13 Table 21 Absolute maximum continuous ratings for nominal 1,2 V .13 Table 22 Operating conditions for 1,2 V normal range14 Table 23 Output characteristics for 1,2 V normal range14 Table 24 Operating conditions for 1,2 V wide range .15 Table 25 Output characteristics for 1,2 V wide r
16、ange .15 Table 26 Absolute maximum continuous ratings for nominal 1,0 V .16 Table 27 Operating conditions for 1,0 V normal range16 Table 28 Output characteristics for 1,0 V normal range16 Table 29 Operating conditions for 1,0 V wide range .17 Table 30 Output characteristics for 1,0 V wide range .17
17、BS EN ISO 60748-2-20:2008 3 INTRODUCTION The dimensions of integrated circuit devices are continuing to be reduced, both vertically and horizontally, to obtain better performance and higher density. However, if the supply voltages and interface levels are not reduced, the electric fields within the
18、die (chip) will increase, which leads to reduced reliability. These increased fields will also, together with the higher system-clock rate, lead to increased electromagnetic interference and noise induced on the supply leads and the ground plane, which leads to lower noise immunity and a higher prob
19、ability of malfunction. To continue this trend of scaling down the size of semiconductor devices, lower power supply voltages are essential. For systems operating at lower supply voltage, the tolerances on the supply voltage and the input and output voltages must be specified more closely. Also, sin
20、ce the market for battery-operated equipment is expected to grow considerably, it is important to include specifications that cover this field. By setting standard values at this stage, manufacturing costs can be reduced and users can design systems more economically. After the publication of first
21、edition of this standard, scaling of digital ICs has still been drastically proceeding, and nowadays, state-of-the art digital ICs are operated at 1,2 V, and Schmitt trigger interface is widely used. In light of the situation, this second edition expands the specification of nominal power supply vol
22、tage down to 1,0 V and includes specifications of Schmitt trigger interface. BS EN ISO 60748-2-20:2008 4 SEMICONDUCTOR DEVICES INTEGRATED CIRCUITS Part 2-20: Digital integrated circuits Family specification Low voltage integrated circuits 1 Scope This standard aims at giving DC interface specificati
23、ons for various sets of values, where each comprises the nominal value of power supply voltage, its tolerance, and the worst-case limit values of the input and output voltages for low voltage integrated circuits. It also provides two categories of interface specification for each nominal supply volt
24、age normal range and wide range. The normal range is based on the nominal industry standard with typical tolerance of about 10 %. The wide range covers battery operation that extends the lower limit to a practical value at which the battery will continue to operate. 2 Normative references The follow
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