BS EN 60679-5-1-1998 Quartz crystal controlled oscillators of assessed quality - Blank detail specification - Qualification approval《经质量评估的石英晶体受控振荡器 空白详细规范 合格鉴定》.pdf

《BS EN 60679-5-1-1998 Quartz crystal controlled oscillators of assessed quality - Blank detail specification - Qualification approval《经质量评估的石英晶体受控振荡器 空白详细规范 合格鉴定》.pdf》由会员分享，可在线阅读，更多相关《BS EN 60679-5-1-1998 Quartz crystal controlled oscillators of assessed quality - Blank detail specification - Qualification approval《经质量评估的石英晶体受控振荡器 空白详细规范 合格鉴定》.pdf（14页珍藏版）》请在麦多课文档分享上搜索。

1、BRITISH STANDARD BS EN 60679-5-1:1998 IEC 60679-5-1:1998 Quartz crystal controlled oscillators of assessed quality Part 5-1: Blank detail specification Qualification approval The European Standard EN 60679-5-1:1998 has the status of a British Standard ICS 31.140BSEN60679-5-1:1998 This British Standa

2、rd, having been prepared under the directionof the Electrotechnical Sector Board, was published underthe authority of the Standards Board and comes intoeffect on 15 November 1998 BSI 05-1999 ISBN 0 580 30405 1 National foreword This British Standard is the English language version of EN60679-5-1:199

3、8. It is identical with IEC60679-5-1:1998. It supersedes BS EN169201:1996 which will be withdrawn on 2001-05-01. The UK participation in its preparation was entrusted to Technical Committee EPL/49, Piezoelectric devices for frequency control and selection, which has the responsibility to: aid enquir

4、ers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. A list of organizations rep

5、resented on this committee can be obtained on request to its secretary. From 1 January 1997, all IEC publications have the number 60000 added to the old number. For instance, IEC27-1 has been renumbered as IEC60027-1. For a period of time during the change over from one numbering system to the other

6、, publications may contain identifiers from both systems. Cross-references Attention is drawn to the fact that CEN and CENELEC standards normally include an annex which lists normative references to international publications with their corresponding European publications. The British Standards whic

7、h implement these international or European publications may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Find” facility of the BSI Standards Electronic Catalogue. A British Standard does not purport to include al

8、l the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pagesi and

9、ii, theENtitle page, pages2 to 8 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Amendments issued since publication Amd. No. Date CommentsBSEN60679-5-1:1998 BSI 0

10、5-1999 i Contents Page National foreword Inside front cover Foreword 2 Text of EN 60679-5-1 3ii blankEUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN60679-5-1 August1998 ICS31.140 English version Quartz crystal controlled oscillators of assessed quality Part 5-1: Blank detail specification Quali

11、fication approval (IEC 60679-5-1:1998) Oscillateurs pilots par quartz sous assurancede la qualit Partie 5-1: Spcification particulire cadre Homologation (CEI 60679-5-1:1998) Quarzoszillatoren mit bewerteter Qualitt Teil 5-1: Vordruck fr Bauartspezifikation Bauartanerkennung (IEC 60679-5-1:1998) This

12、 European Standard was approved by CENELEC on 1998-08-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical refe

13、rences concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC

14、member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, CzechRepublic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherla

15、nds, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1998 CENELEC

16、 All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60679-5-1:1998 EEN60679-5-1:1998 BSI 05-1999 2 Foreword The text of document 49/403/FDIS, future edition1 of IEC60679-5-1, prepared by IEC TC49, Piezoelectric and dielectric devices for frequ

17、ency control and selection, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN60679-5-1 on 1998-08-01. The following dates were fixed: This European Standard is to be used in conjunction with: EN 60679-1: Quartz crystal controlled oscillators of assessd quality Part 1:

18、Generic specification EN 60679-5: Quartz crystal controlled oscillators of assessed quality Part 5: Sectional specification Qualification approval Endorsement notice The text of the International Standard IEC 60679-5-1:1 998 was approved by CENELEC as a European Standard without any modification. Co

19、ntents Page Foreword 2 Introduction 3 1 Ratings 4 2 Characteristics 4 3 Marking 4 4 Ordering information 4 5 Certified test records 4 6 Additional information 4 7 Inspection requirements 4 Table 1 5 latest date by which the EN has to be implemented at national level by publication of an identical na

20、tional standard or by endorsement (dop) 1999-05-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2001-05-01EN60679-5-1:1998 BSI 05-1999 3 Introduction Blank detail specification A blank detail specification is a supplementary document to the sectional

21、 specification and contains requirements for style, layout and minimum content of detail specifications. In the preparation of detail specifications the content of clause 2 of IEC60679-5 shall be taken into account. This specification may be inappropriate for small batch production of quartz crystal

22、 controlled oscillators in which case the capability approval approach is recommended. (See IEC 60679-4.) Identification of the detail specification (DS) and of the component The first page of the DS should have the layout recommended below. The numbers between the square brackets on the front page

23、correspond to the following information which should be given in the appropriate boxes. 1 The name of the National Standards Organization under whose authority the DS is published and, if applicable, that of the organization from which the DS is available. 2 The IECQ number allotted to the DS. 3 The

24、 number and issue number of the IEC generic or sectional specification as relevant as well as the national reference if different. 4 If different from the IECQ number, the national number of the DS, date of issue and any further information required by the national system, together with any amendmen

25、t numbers. 5 A brief description of the quartz crystal controlled oscillator or range of oscillators (for example, SPXO and output frequency). 6 Information on typical construction (where applicable) (for example, resistance welded, cold welded). For 5 and 6 the text to be given in the DS should be

26、suitable for entry in IECQC001005 and IECQC001004. 7 An outline drawing with the main dimensions which are of importance for interchangeability as demanded in IEC60679-3 and/or reference to the appropriate national or international document for outlines. Alternatively, this drawing may be given in a

27、n annex to the DS, but 7 should always contain an illustration of the general outer appearance of the component. 8 The level(s) of quality assessment covered by the DS. 9 Reference data giving information on the most important properties of the component which allow comparison between the various co

28、mponent types intended for the same, or similar, applications. Specification available from: 1 IECQ Edition . Date Page 1 of . QC 690201 2 ELECTRONIC COMPONENTS OF ASSESSEDQUALITY BY QUALIFICATION APPROVAL IN ACCORDANCE WITH: Generic specification: Publication IEC 60679-1/QC 690000 Sectional specifi

29、cation: Publication IEC 60679-5/QC 690200 3 4 Outline and dimensions (third-angle projection): 7 TYPE OF OSCILLATOR 5 ENCLOSURE 6 Dimensions in millimetres Assessment level 8 9EN60679-5-1:1998 4 BSI 05-1999 1 Ratings (see 2.3 of IEC 60679-1 for preferred ratings) Operating temperature range Climatic

30、 category Mechanical test severities 2 Characteristics (see 2.2 of IEC 60679-1) NOTE 1Information on the above characteristics may be given in tabular form, if necessary. NOTE 2“if VCXO” means “if oscillator is voltage controlled” “if TCXO” means “if oscillator is temperature compensated” “if OCXO”

31、means “if oscillator is oven controlled” 3 Marking The marking of the quartz crystal oscillator and the primary package shall be in accordance with the requirements of 2.4 of IEC 60679-1. Full details shall be given in the detail specification. 4 Ordering information The following ordering informati

32、on shall be specified: a) quantity; b) IECQ number or customer detail specification number, issue number and date; and where applicable c) nominal frequency expressed in kilohertz (kHz) or megahertz (MHz); d) product code; e) frequency tolerance(s) and operating temperature range; f) full descriptio

33、n of any additional requirements. 5 Certified test records The detail specification shall state whether certified test records are required/not required in accordance with 3.12 of IEC 60679-1. 6 Additional information (not for inspection purposes) The detail specification may include additional info

34、rmation (which is not normally required to be verified by the inspection procedure) such as circuit diagrams, curves, drawings and notes for the clarification of the detail specification. 7 Inspection requirements Clause numbers of tests and performance requirements refer to IEC60679-1. The ILs and

35、AQLs given in Table 1 are the minimum quality levels required and selected from IEC 60410. In this table: Information about manufacturers who have components qualified to this detail specification is available in IEC QC001005. Nominal output frequency/range Reference temperature Frequency tolerance(

36、s) Input Conditions (as applicable) Voltage: Current: Power: Output conditions (as applicable) Voltage: Power: Waveform: Load: Ageing The following characteristics shall be stated as applicable: control voltage if VCXO pulling sensitivity if VCXO linearity if VCXO modulation details if VCXO oven sup

37、ply if OCXO Voltage: Current: or Power: stabilization time if OCXO or TCXO retraceability if OCXO In addition other characteristics may be stated. p = periodicity (in months); n = sample size; c = acceptance criterion (permitted number of defectives); D = destructive; ND = non-destructive; IL = insp

38、ection level; AQL = acceptable quality level.EN60679-5-1:1998 BSI 05-1999 5 Table 1 Clause number and test D or ND Test conditions IL AQL % Performance requirements 100 % inspection ND 4.3.1 4.6.2.1 4.5.4 4.5.5.1 4.5.11 4.5.23 Visual test A Gross leak test (for hermetically sealed enclosures only) O

39、utput frequency at referencetemperature Frequency at specified temperature(s) Frequency adjustment range (where applicable) Frequency modulation characteristics tests 1 to 5 (asapplicable) 4.3.1 4.6.2.1 4.5.4 4.5.5.1 4.5.11 4.5.23 Tests1to 5 (asapplicable) 4.3.1 4.6.2.1 Frequency tolerance(s) includ

40、ing offset frequency, where applicable Frequency tolerance(s) Minimum or minimum and maximum frequency change 4.5.23 Group A inspection To be conducted on a sampling basis, lot-by-lot Subgroup A1 ND II 1,5 4.5.13 or 4.5.14 Oscillator output voltage 4.5.13 or 4.5.14 Minimum and maximum voltages 4.5.1

41、5 or 4.5.16 Oscillator output waveform 4.5.15 or 4.5.16 Waveform as specified 4.5.3.1 Oscillator input power 4.5.3.1 Maximum power or current 4.5.3.3 or Oven input power (where applicable) 4.5.3.3 Maximum power at switch on Maximum power after stabilization 4.5.3.2 Oven and oscillator input power (w

42、here applicable) 4.5.3.2 Maximum power at switch on Maximum power after stabilization Subgroup A2 ND I 1,5 4.5.5.1 Frequency at specified temperature(s) (if not tested 100 %) 4.5.5.1 Frequency tolerance(s) Subgroup A3 ND I 1,5 Annex B to IEC 60679-5 Ageing (when applicable) Annex B to IEC60679-5 Slo

43、pe to be specified NOTEIt may be necessary to conduct this test 100 %. Group B inspection To be conducted on a sampling basis, lot-by-lot Subgroup B1 ND S4 4,0 4.4.1 Dimensions Test A 4.4.1 4.4.1 Subgroup B2 ND S4 4,0 For hermetically sealed enclosures only 4.6.2.2 Fine leak test 4.6.2.2 4.6.2.2 4.6

44、.2.1 Gross leak test 4.6.2.1 4.6.2.1EN60679-5-1:1998 6 BSI 05-1999 Table 1 Clause number and test D or ND Test conditions Sample size andcriterion of acceptability Performance requirements p n c Group C inspection To be conducted on a sampling basis, lot-by-lot Subgroup C1 4.4.2 Dimensions Test B 4.

45、4.2 4.4.2 4.6.3.1 Solderability Test A (for wire terminations) 4.6.3.1 Test A 4.6.3.1 Test A Test B (for surface mounted devices) 4.6.3.1 Test B 4.6.3.1 Test B 4.6.1.1 Tensile and thrust on terminations 4.6.1.1 4.6.1.1 4.6.1.2 Flexibiliy of wire terminations 4.6.1.2 4.6.1.2 4.6.1.3 Torque test on mo

46、unting studs 4.6.1.3 4.6.1.3 Final inspection 4.3.2 Visual test B 4.3.2 4.3.2 4.6.2.2 Fine leak test (hermetically sealed enclosures only) 4.6.2.2 4.6.2.2 4.6.2.1 Gross leak test (hermetically sealed enclosures only) 4.6.2.1 4.6.2.1 Subgroup C2 ND 3 8 0 4.5.6 Frequency/load coefficient 4.5.6 Maximum

47、 frequency change 4.5.7 Frequency/voltage coefficient 4.5.7 Maximum frequency change Subgroup C3 D 3 8 0 Initial inspection 4.5.4 Output frequency at reference temperature 4.5.4 Record measurements 4.6.21 Immersion in cleaning solvents 4.6.21 Marking shall be legible 4.6.5 Rapid change of temperatur

48、e: thermal shock in air 4.6.5 4.6.3.2 Resistance to soldering heat Test A (for wire terminations) 4.6.3.2, Test A Test B (for surface mounted devices) 4.6.3.2, Test B Final inspection 4.3.2 Visual test B 4.3.2 4.3.2 4.5.4 Output frequency at reference temperature 4.5.4 Maximum frequency change 4.5.1

49、3 or 4.5.14 Oscillator output voltage 4.5.13 or 4.5.14 Limits to be specifiedEN60679-5-1:1998 BSI 05-1999 7 Table 1 Clause number and test D or ND Test conditions Sample size andcriterion of acceptability Performance requirements p n c Subgroup C4 ND 3 8 0 4.7.1 Ageing 4.7.1 Maximum frequency change NOTEThis test is not required if the test in subgroup A3 has been performed. Subgroup C5 a) D 24 8 0 Initial inspection 4.5.4 Output frequency at reference tempera