BS EN 60444-8-2017 Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units《石英晶体元件参数的测量 表面安装石英晶体元件用试验装置》.pdf

《BS EN 60444-8-2017 Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units《石英晶体元件参数的测量 表面安装石英晶体元件用试验装置》.pdf》由会员分享，可在线阅读，更多相关《BS EN 60444-8-2017 Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units《石英晶体元件参数的测量 表面安装石英晶体元件用试验装置》.pdf（22页珍藏版）》请在麦多课文档分享上搜索。

1、BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06Measurement of quartz crystal unit parametersPart 8: Test fixture for surface mounted quartz crystal unitsBS EN 60444-8:2017EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 60444-8 April 2017 ICS 31.140 Supersedes E

2、N 60444-8:2003 English Version Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016) Mesure des paramtres des rsonateurs quartz - Partie 8: Dispositif dessai pour les rsonateurs quartz monts en surface (IEC 60444-8:2016) Mes

3、sung von Schwingquarz-Parametern - Teil 8: Prfaufbau fr oberflchenmontierbare Schwingquarze (IEC 60444-8:2016) This European Standard was approved by CENELEC on 2017-01-19. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this Eu

4、ropean Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official v

5、ersions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical

6、committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia

7、, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2

8、017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 60444-8:2017 E National forewordThis British Standard is the UK implementation of EN 60444-8:2017. It is identical to IEC 60444-8:2016. It supersedes BS EN 60444-8:2003, which is w

9、ithdrawn.The UK participation in its preparation was entrusted to Technical Committee EPL/49, Piezoelectric devices for frequency control and selection.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all t

10、he necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2017 Published by BSI Standards Limited 2017ISBN 978 0 580 83114 0ICS 31.140Compliance with a British Standard cannot confer immunity from legal obligations.This British Standa

11、rd was published under the authority of the Standards Policy and Strategy Committee on 31 May 2017.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN 60444-8:2017EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 60444-8 April 2017 ICS 31.140 Supersedes EN 60444-

12、8:2003 English Version Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016) Mesure des paramtres des rsonateurs quartz - Partie 8: Dispositif dessai pour les rsonateurs quartz monts en surface (IEC 60444-8:2016) Messung von

13、 Schwingquarz-Parametern - Teil 8: Prfaufbau fr oberflchenmontierbare Schwingquarze (IEC 60444-8:2016) This European Standard was approved by CENELEC on 2017-01-19. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European S

14、tandard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions

15、(English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committe

16、es of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovak

17、ia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2017 CENE

18、LEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 60444-8:2017 E BS EN 60444-8:2017EN 60444-8:2017 2 European foreword The text of document 49/1126/CDV, future edition 2 of IEC 60444-8, prepared by IEC/TC 49 “Piezoelectric, dielectric and

19、 electrostatic devices and associated materials for frequency control, selection and detection“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 60444-8:2017. The following dates are fixed: latest date by which the document has to be implemented atnational level by public

20、ation of an identical nationalstandard or by endorsement(dop) 2017-10-19 latest date by which the national standards conflicting withthe document have to be withdrawn(dow) 2020-01-19 This document supersedes EN 60444-8:2003. Attention is drawn to the possibility that some of the elements of this doc

21、ument may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. This document has been prepared under a mandate given to CENELEC by the European Commission and the European Free Trade Association. Endorsement notice The text

22、of the International Standard IEC 60444-8:2016 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60122-1 NOTE Harmonized as EN 60122-1. IEC 60444-1:1986 NOTE Harmon

23、ized as EN 60444-1:1997 (not modified). IEC 60444-2 NOTE Harmonized as EN 60444-2. IEC 60444-6 NOTE Harmonized as EN 60444-6. IEC 60444-7 NOTE Harmonized as EN 60444-7. IEC 60444-9 NOTE Harmonized as EN 60444-9. IEC 61837-1 NOTE Harmonized as EN 61837-1. IEC 61837-2 NOTE Harmonized as EN 61837-2. IE

24、C 61837-3 NOTE Harmonized as EN 61837-3. IEC 61837 NOTE Harmonized in EN 61837 series. BS EN 60444-8:2017EN 60444-8:2017 3 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following documents, in whole or in part, are normativ

25、ely referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE 1 When an International Publication has been modified by com

26、mon modifications, indicated by (mod), the relevant EN/HD applies. NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here: www.cenelec.eu. Publication Year Title EN/HD Year IEC 60444-5 - Measurement of quartz crystal unit parameters - Pa

27、rt 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction EN 60444-5 - BS EN 60444-8:2017This page deliberately left blank 2 IEC 60444-8:2016 IEC 2016 CONTENTS FOREWORD . 3 INTRODUCTION . 5 1 Scope 6 2 Normative reference

28、s . 6 3 Specifications 6 4 Leadless surface mounted quartz crystal units . 6 4.1 Enclosure 6 4.2 Overtone and frequency range 7 5 Specifications of measurement method, test fixture 7 5.1 Specifications of measurement method . 7 5.2 Specifications of transmission test fixture 7 5.3 Specifications of

29、reflection test fixture . 10 5.4 Measuring equipment 13 6 Calibration . 13 6.1 Calibration of the transmission test system 13 6.2 Additional calibration of the transmission test system with CLadapter board 13 6.3 Calibration of the reflection measurement system 13 Bibliography 15 Figure 1 Transmissi

30、on -network test fixture: Simplified equivalent circuit diagram, frequency range from 1 MHz to 500 MHz . 7 Figure 2 Transmission -network test Fixture with physical load capacitors: simplified equivalent circuit, frequency range from 1 MHz to 30 MHz . 7 Figure 3 Transmission -network test fixture: T

31、hree-dimensional projection for the test fixture . 8 Figure 4 Transmission -network test fixture: Mechanical design of the test fixture . 9 Figure 5 Transmission -network test fixture with physical load capacitors: Structure of the test fixture . 10 Figure 6 Design of the reflection test fixture 11

32、Figure 7 Mechanical details of the reflection test fixture 13 Figure 8 Calibration technique for the reflection test fixture . 14 2 IEC 60444-8:2016 IEC 2016 CONTENTS FOREWORD . 3 INTRODUCTION . 5 1 Scope 6 2 Normative references . 6 3 Specifications 6 4 Leadless surface mounted quartz crystal units

33、 . 6 4.1 Enclosure 6 4.2 Overtone and frequency range 7 5 Specifications of measurement method, test fixture 7 5.1 Specifications of measurement method . 7 5.2 Specifications of transmission test fixture 7 5.3 Specifications of reflection test fixture . 10 5.4 Measuring equipment 13 6 Calibration .

34、13 6.1 Calibration of the transmission test system 13 6.2 Additional calibration of the transmission test system with CLadapter board 13 6.3 Calibration of the reflection measurement system 13 Bibliography 15 Figure 1 Transmission -network test fixture: Simplified equivalent circuit diagram, frequen

35、cy range from 1 MHz to 500 MHz . 7 Figure 2 Transmission -network test Fixture with physical load capacitors: simplified equivalent circuit, frequency range from 1 MHz to 30 MHz . 7 Figure 3 Transmission -network test fixture: Three-dimensional projection for the test fixture . 8 Figure 4 Transmissi

36、on -network test fixture: Mechanical design of the test fixture . 9 Figure 5 Transmission -network test fixture with physical load capacitors: Structure of the test fixture . 10 Figure 6 Design of the reflection test fixture 11 Figure 7 Mechanical details of the reflection test fixture 13 Figure 8 C

37、alibration technique for the reflection test fixture . 14 BS EN 60444-8:2017IEC 60444-8:2016 IEC 2016 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS Part 8: Test fixture for surface mounted quartz crystal units FOREWORD 1) The International Electrotechnic

38、al Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this e

39、nd and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Com

40、mittee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in a

41、ccordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all

42、 interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held re

43、sponsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any diverg

44、ence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC ma

45、rks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual exper

46、ts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Pu

47、blication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Pu

48、blication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60444-8 has been prepared by IEC technical committee 49: Piezoelectric, dielectric and electrostatic devices and associated materials for frequen

49、cy control, selection and detection. This bilingual version (2017-04) corresponds to the monolingual English version, published in 2016-12. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) modification of Clause 1; b) modification of 5.2; BS EN 60444-8:2017 4 IEC 60444-8:2016 IEC 20