BS EN 140102-1996 Harmonized system of quality assessment for electronic components - Blank detail specification fixed low power non-wirewound resistors (assessment level M)《电子元器件质.pdf

《BS EN 140102-1996 Harmonized system of quality assessment for electronic components - Blank detail specification fixed low power non-wirewound resistors (assessment level M)《电子元器件质.pdf》由会员分享，可在线阅读，更多相关《BS EN 140102-1996 Harmonized system of quality assessment for electronic components - Blank detail specification fixed low power non-wirewound resistors (assessment level M)《电子元器件质.pdf（18页珍藏版）》请在麦多课文档分享上搜索。

1、BRITISH STANDARD BS EN 140102:1996 Harmonized system of quality assessment for electronic components Blank detail specification: Fixed low power non-wirewound resistors (Assessment level M) The European Standard EN 140102:1996 has the status of a British Standard ICS 31.040.10BS EN140102:1996 This B

2、ritish Standard, having been prepared under the directionof the Electrotechnical Sector Board, was published underthe authority of the Standards Board and comes intoeffect on 15September1996 BSI 01-1999 The following BSI references relate to the work on this standard: Committee reference EPL/40/2 Dr

3、aft announced in BSI News Update April 1996 ISBN 0 580 26060 7 Committees responsible for this British Standard The preparation of this British Standard was entrusted by Technical Committee EPL/40, Capacitors and Resistors for Electronic Equipment, to Subcommittee EPL/40/2, Resistors, upon which the

4、 following bodies were represented: BEAMA Ltd. Federation of the Electronics Industry Ministry of Defence National Supervising Inspectorate (BSI-PC) Amendments issued since publication Amd. No. Date CommentsBSEN 140102:1996 BSI 01-1999 i Contents Page Committees responsible Inside front cover Nation

5、al foreword ii Foreword 2 Text of EN 140102 3 List of references Inside back coverBSEN 140102:1996 ii BSI 01-1999 National foreword This British Standard has been prepared by Subcommittee EPL/40/2 and is the English language version of EN140102:1996 Blank detail specification: Fixed low power non-wi

6、rewound resistors (Assessment level M), published by the Electronic Components Committee (CECC) of the European Committee for Electrotechnical Standardization (CENELEC). This standard supersedes BSCECC40102:1981 which is withdrawn. This standard lists the requirements to be included in any detail sp

7、ecification for this type of resistor. The requirements of this blank detail specification and BSCECC00111 Rule of Procedure11. Specifications Part4:1991 Regulations for CECC detail specifications apply to detail specifications. The British Standard which implements the CECC Rules of Procedure is BS

8、 9000 General requirements for a system for electronic components of assessed quality Part2:1996 Specification for the national implementation of the CECC system. Copyright BSI copyright (see back cover) does not preclude the reproduction and free use of the pro forma pages in the course of preparin

9、g detail specifications. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references

10、 Publication referred to Corresponding British Standard EN140000:1993 BS EN140000:1995 Harmonized system of quality assessment for electronic components. Generic specification: fixed resistors EN100014:1991 (CECC00014:1986) BS EN100014:1992 Harmonized system of quality assessment for electronic comp

11、onents. Basic specification: CECC assessed process average procedure (60% confidence limit) Summary of pages This document comprises of front cover, an inside front cover, pages i to ii, theENtitle page, page 2 to 12, an inside back cover and a back cover. This standard has been updated (see copyrig

12、ht date) and may have had amendments incorporated. This will be indicated in the amendment table on theinside front cover.EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 140102 February 1996 UDC 31.040.10 Supersedes CECC 40 102:1981 Descriptors: Electronic components, fixed low power resistors,

13、 non-wirewound resistors, blank detail specification, assessment level M English version Blank Detail Specification: Fixed low power non-wirewound resistors (Assessment level M) Spcification particulire cadre: Rsistances fixes non-bobines faible dissipation (Niveau dassurance de la qualit M) Vordruc

14、k fr Bauartspezification: Nichtdrahtgewickelte Festwiderstnde kleiner Belastbarkeit (Bewertungsstufe M) This European Standard was approved by CENELEC on 1995-11-28. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European

15、Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English,

16、 French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belg

17、ium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr El

18、ektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1996 Copyright reserved to CENELEC members Ref. No. EN 140102:1996 EEN140102:1996 BSI 01-1999 2 Foreword This European Standard was prepared by CENELEC/TC CECC/SC 40XB, Fixed resistors. The text of the draft was submitt

19、ed to the Unique Acceptance Procedure and was approved by CENELEC as EN 140102 on 1995-11-28. This European Standard supersedes CECC40102:1981. The following dates were fixed: Contents Page Foreword 2 1 Ratings and characteristics 3 2 Marking 4 3 Related documents 4 4 Ordering information 4 5 Certif

20、ied test records 4 6 Additional information 4 7 Inspection requirements 4 8 Assessed process average procedures 5 Table 1 3 Table 2 5 latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 1996-06-01 latest date by

21、 which the national standards conflicting with the EN have to be withdrawn (dow) 1996-12-01EN140102:1996 BSI 01-1999 3 Table 1 1 Ratings and characteristics Temperature characteristic of resistance DR : # . % R (D R/R D T: # . ppm/K) ( 20 to 70 C) (1) Specification available from: (2) CECC 40102-XXX

22、 (3) ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: (4) (7) Outline and dimensions (see Table 1) (First angle projection) (5) FIXED LOW POWER NON-WIREWOUND RESISTORS (6) (8) ASSESSMENT LEVEL “M” NOTE 1Other shapes are permitted within the dimensions given. NOTE 2These resistors are (n

23、ot) suitable for printed wiring applications. Style Rated Dissipation (W at 70 C) Limiting element voltage (V d.c. or a.c. rms.) Isolation voltage (V d.c. or a.c. peak) Maximum d L D min nom All dimensions are in millimeters a Resistance range W to W Standard selection tolerances % Climatic category

24、 / / a The preferred values are those of the E , series of IEC 63. Where the use of intermediate values is essential, they should, wherever possible, be chosen from a series in that document. See the relevant Qualified Products List for the availability of components qualified to this detail specifi

25、cation. Vibration severity Hz to Hz; 0,75mm or 98m/s 2(whichever is the less severe) Low air pressure 8,5 kPa (85 mbar) Limits of resistance change after 1 000 h endurance test ( % R + W)EN140102:1996 4 BSI 01-1999 1.1 Derating Resistors covered by this specification are derated according to the cur

26、ve: NOTEVarious parameters have been precisely specified for this component. It should not be assumed that any parameter not specified will remain unchanged from one component to another. Should, for any reason, it be necessary for further parameter(s) to be controlled, then a more detailed specific

27、ation should be used. The additional test method(s) shall be fully described, and appropriate limits, AQLs and Inspection Levels specified. 2 Marking The marking of the component and package shall be in accordance with the requirements of 2.4 ofEN140000. 3 Related documents National Authorised Insti

28、tutions will complete this section, making reference to any documents, recommendations or specifications directly referred to in their national equivalent of this document. 4 Ordering information Orders for resistors covered by this specification shall contain the following information: Resistance v

29、alue Tolerance Style and national specification number of this detail specification 5 Certified test records National Authorised Institutions shall indicate in this clause whether certified test records shall be prepared in accordance with 3.9 of EN140 000. 6 Additional information (Not for inspecti

30、on purposes) The detail specification may include information (which is not required to be verified by the inspection procedure), such as circuit diagrams, curves, drawings and notes needed for clarification of the detail specification. 7 Inspection requirements (SeeTable 2) 7.1 When drying is calle

31、d for, Procedure I of 4.3 of EN 140000 shall be used. 7.2 When the manufacturer desires to obtain qualification approval by adopting the fixed sample size procedure (See3.5.3 of EN140000) use shall be made of the test schedule given in AnnexA.1 or A.2 to EN140000. The conditions of test and the perf

32、ormance requirements shall be identical to those prescribed for the quality conformance inspection in the detail specification.EN140102:1996 BSI 01-1999 5 8 Assessed process average procedures When the assessed process average procedure as specified in CECC 000 14 is used, the detailed specification

33、 shall give the limits as required in clause3.12 of EN140000. The detail specification shall prescribe at relevant places that non-operatives have to be recorded. Table 2 (See Notes1 and 2) Clause number and test Condition of test I L AQ L Performance requirements GROUP A INSPECTION To be conducted

34、on a sampling basis, lot-by-lot Sub-Group A1 (Non-destructive) S-3 1,5 % 4.4.1 Visual Examination As in 4.4.1 4.4.2 Marking As in 4.4.1 Sub-group A2 (Non-destructive) S-4 1,5 % 4.5 Resistance As in 4.5.2 GROUP B INSPECTION To be conducted on a sampling basis, lot-by-lot Sub-Group B1 (Destructive) S-

35、2 1,0 % 4.17.1 Soldering-Solderability Method 1 (The detail specification shall state whether the terminations are suitable for printed wiring) See Note5 As in 4.17 4.13 Overload Not applicableEN140102:1996 6 BSI 01-1999 (See Notes1 and 2) Clause number and test Conditions of test Sample size & crit

36、erion of acceptability (see Note3) Performance requirements P n c GROUP C INSPECTION To be conducted on a sampling basis at the periodicity given in column “P” Sub-Group C1 (Destructive) 3 20 1 4.25.1 Endurance at 70 C Duration: 1 000 h Visual inspection As in 4.25.1.7 Resistance DR: # ( % R + W) Ex

37、amination at 1000h Insulation resistance (Insulated resistors only) R: $ 1 GW The tests on one sampl each year shall be extended to 8 000 h duration. 12 20 Examination at 2 000, 4 000, and 8 000 h Resistance DR: The results obtain are for information only Sub-Group C2 (Non destructive) 3 20 1 4.4.2

38、Dimensions (Gauging) A gauge plate of mm shall be used. As specified in the detail specificationEN140102:1996 BSI 01-1999 7 (See Notes1 and 2) Clause number and test Conditions of test Sample size & criterion of acceptability (see Note3) Performance requirements P n c GROUP D INSPECTION To be conduc

39、ted on a sampling basis at the periodicity given in column “P” Sub-Group D1 (Destructive) 6 20 1 4.24 Damp heat, steady, state Visual examination As in 4.24.4 Resistance DR: # ( % R + W) Insulation resistance (Insulated resistors only) R: $ 100 MW Sub-Group D2 (Destructive) 36 20 1 Half of the sampl

40、e 4.16 Robustness of terminations Tensile, bending and torsion tests Visual examination As in 4.16.6 Resistance D R: # ( % R + W) 4.18 Soldering Resistance to heat (The detail specification shall state whether Method 1A or Method 1B of test Tb of Test Tb IEC 68-2-20 shall apply) Visual examination A

41、s in 4.18.3 Resistance DR: # ( % R + W) Other half of the sample 4.19 Rapid change of temperature TA: lower category temperature TB: Upper category temperature Visual examination As in 4.19.3 Resistance DR: # ( % R + W)EN140102:1996 8 BSI 01-1999 (See Notes1 and 2) Clause number and test Conditions

42、of test Sample size & criterion of acceptability (see Note3) Performance requirements P n c 4.22 Vibration Procedure: B4 Frequency Range: Hz to Hz Ampltude: 0,75 mm or 98m/s 2(whichever is the less severe) Sweep endurance: Total duration 6h. (see Note 4) Visual examination As in 4.22.4 Resistance DR

43、: # ( % R + W) All of the sample 4.23 Climatic sequence Dry heat Damp heat, cyclic first cycle cold low air pressure 8.5 kPa (85 mbar) Damp heat, cyclic, remaining cycles D.C. load Final measurements Visual examination As in 4.23.8 Resistance DR: # ( % R + W) Insulation resistance (Insulated resisto

44、rs only) R: $ 100 MWEN140102:1996 BSI 01-1999 9 (See Notes1 and 2) Clause number and test Conditions of test Sample size & criterion of acceptability (see Note3) Performance requirements P n c Sub-Group D3 (Destructive) 36 20 1 4.4.3 Dimensions (detail) As specified in the detail specification 4.25.

45、3 Endurance at upper category temperature Duration: 1 000 h Visual examination As in 4.25.1.7 Resistance DR: # ( % R + W) Examination at 1 000 h Insulation resistance (Insulated resistors only) R: $ 1 GW Sub-Group D4 (Destructive) 36 20 1 4.25 Endurance at other temperatures (where applicable) This

46、sub-group is only applicable if a derating curve other than that shown in EN140100 clause2.2.3 is claimed in the detail specification Duration: 1 000 h Visual examination As in 4.25.1.7 Resistance DR: # ( % R + W) Examination at 1 000 h Insulation resistance (Insulated resistors only) R: $ 1 GWEN140

47、102:1996 10 BSI 01-1999 (See Notes1 and 2) Clause number and test Conditions of test Sample size & criterion of acceptability (see Note3) Performance requirements P n c Sub-Group D5 (Non-Destructive) 3 20 1 4.8 Temperature characteristic of LCT/ 20 20/ UCT resistance DR: # % R % R Sub-Group D6 (Non-

48、Destructive) 3 20 1 4.7 Voltage Proof Insulated resistors only As in 4.7.3EN140102:1996 BSI 01-1999 11 NOTE 1Clause numbers of tests and performance requirements refer to EN 140 000 NOTE 2Inspection Levels and AQLs are selected from IEC 410. NOTE 3 NOTE 4Resistors shall be mounted by their normal me

49、ans. Where this is by axial wire termination, the distance between the resistor body and the mounting point on the termination shall be 6 1mm. The design of a resistor may be such that special mounting fixtures are required in its use. In this case, the detail specification shall describe the mounting fixtures and they shall be used in the performance of bump, shock and vibration tests. NOTE 5The solderability test is no