BS DD IEC PAS 62596-2009 Electrotechnical products - Determination of restricted substances - Sampling procedure - Guidelines《机电产品 受限物的测定 取样程序 导则》.pdf

《BS DD IEC PAS 62596-2009 Electrotechnical products - Determination of restricted substances - Sampling procedure - Guidelines《机电产品 受限物的测定 取样程序 导则》.pdf》由会员分享，可在线阅读，更多相关《BS DD IEC PAS 62596-2009 Electrotechnical products - Determination of restricted substances - Sampling procedure - Guidelines《机电产品 受限物的测定 取样程序 导则》.pdf（58页珍藏版）》请在麦多课文档分享上搜索。

1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI British StandardsWB9423_BSI_StandardColCov_noK_AW:BSI FRONT COVERS 5/9/08 12:55 Page 1Electrotechnical products Determination of restricted substances Sampling procedure GuidelinesDD IEC/PAS 62596:20

2、09National forewordThis Draft for Development is the UK implementation of IEC/PAS 62596:2009.This publication is not to be regarded as a British Standard.It is being issued in the Draft for Development series of publications and is ofa provisional nature. It should be applied on this provisional bas

3、is, so thatinformation and experience of its practical application can be obtained.A PAS is a Technical Specification not fulfilling the requirements for a standard, but made available to the public and established in an organizationoperating under a given procedure.A review of this Draft for Develo

4、pment will be carried out not later than threeyears after its publication.Notification of the start of the review period, with a request for the submission of comments from users of this Draft for Development, will bemade in an announcement in the appropriate issue of Update Standards.According to t

5、he replies received, the responsible BSI Committee will judgewhether the validity of the PAS should be extended for a further three yearsor what other action should be taken and pass their comments on to the relevant international committee.Observations which it is felt should receive attention befo

6、re the official callfor comments will be welcomed. These should be sent to the Secretary of theresponsible BSI Technical Committee at British Standards House, 389 ChiswickHigh Road, London W4 4AL.The UK participation in its preparation was entrusted to Technical CommitteeGEL/111, Electrotechnical en

7、vironment committee.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions of acontract. Users are responsible for its correct application. BSI 2009ISBN 978 0 580 65112 0ICS 13.020.01;

8、 43.040.10Compliance with a British Standard cannot confer immunity fromlegal obligations.This Draft for Development was published under the authority of theStandards Policy and Strategy Committee on 31 July 2009Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDDD IEC/PAS

9、 62596:2009IEC/PAS 62596Edition 1.0 2009-01PUBLICLY AVAILABLE SPECIFICATIONPRE-STANDARD Electrotechnical products Determination of restricted substances Sampling procedure Guidelines INTERNATIONAL ELECTROTECHNICAL COMMISSION XAICS13.020, 43.040.10 PRICE CODEISBN 2-8318-1019-4 Registered trademark of

10、 the International Electrotechnical Commission DD IEC/PAS 62596:2009 2 PAS 62596 IEC:2009(E) CONTENTS FOREWORD.4 INTRODUCTION.5 1 Scope.6 2 Normative references .6 3 Terms, definitions and abbreviations 6 3.1 Terms and definitions 6 3.2 Abbreviations 8 4 Introduction to sampling .9 4.1 Introductory

11、remark .9 4.2 Requirements and concerns for restricted substances.9 4.3 Complexity of electrotechnical products and related challenges 10 4.4 Strategies for sampling11 5 Sampling 13 5.1 Introductory remark .13 5.2 Partial disassembly .13 5.2.1 Example 1: Cell phone type A Disassembly without tools14

12、 5.2.2 Example 2: Cell phone type B Partial disassembly.15 5.3 Complete disassembly.16 5.4 Partial disjointment18 5.4.1 Introductory remark .18 5.5 Complete disjointment.20 5.5.1 Introductory remark .20 5.5.2 Typical examples of disjointment at the component level .20 5.5.3 Examples of disjointment

13、at the base materials level Disjointment of integrated circuit (IC) chips22 5.6 Considerations of sampling and disjointment.25 5.6.1 Introductory remark .25 5.6.2 Sample size required.25 5.6.3 Sample size v. detection limit 26 5.6.4 Composite testing of disjointable samples .27 5.6.5 Non-uniform “ho

14、mogeneous materials” 28 5.6.6 Determination of sampling position of homogeneous materials 29 6 Conclusions and recommendations 29 Annex A (informative) Examples of procedures for sampling and disjointment .30 Annex B (informative) Probability of presence of restricted substances40 Annex C (informati

15、ve) Composite testing and sampling42 Annex D (informative) Tools used in sampling .44 Annex E (informative) Use of XRF screening techniques in sampling.45 Bibliography54 Figure 1 Generic iterative procedure for sampling11 Figure 2 Cell phone with battery charger and camera lens cap.14 Figure 3 Cell

16、Phone with battery and back cover removed .15 Figure 4 Partial disassembly of a cell phone (type B) into its major components 16 DD IEC/PAS 62596:2009PAS 62596 IEC:2009(E) 3 Figure 5 Complete disassembly of the key pad 17 Figure 6 Complete disassembly of the bottom housing.17 Figure 7 Complete disas

17、sembly of the other housing/frame .18 Figure 8 Components of the TFT display of the cell phone after partial disjointment.19 Figure 9 Components of the main PWB of the cell phone after partial disjointment 19 Figure 10 Disjointment of lead frame component22 Figure 11 BGA package prior to disjointmen

18、t .23 Figure 12 BGA package disjointed by the hand removal procedure 23 Figure 13 Solder ball material collected from BGA using a hand removal procedure 24 Figure 14 BGA solder ball removal using the ball shear procedure.24 Figure 15 Cross-section of a 900 m wide lead oxide-based resistor (SMD) 28 F

19、igure A.1 Example of methodology for sampling and disjointment 31 Figure A.2 Methodology for sampling and disjointment.32 Figure A.3 Sampling of DVD player33 Figure A.4 Sampling of CRT 34 Figure A.5 Sampling of LCD TV .35 Figure A.6 Sampling of PDA/phone36 Figure A.7 Sampling of desk fan 37 Figure A

20、.8 Compoments Example 1 thick film resistor 38 Figure D.1 Hot gas gun for removing the electronic components44 Figure D.2 Vacuum pin to remove the target electronic devices .44 Figure E.1 AC power cord, X-ray spectra of sampled sections .47 Figure E.2 RS232 cable and its X-ray spectra48 Figure E.3 C

21、ell phone charger shown partially disassembled. 48 Figure E.4 PWB and cable of cell phone charger .49 Figure E.5 Spots from 1,27 mm and 0,3 mm collimaters.50 Figure E.6 Examples of substance mapping on PWBs .52 Figure E.7 SEM-EDX image of Pb free solder with small intrusions of Pb (size = 30 m).53 T

22、able 1 Possible restricted or screening substances from a cell phone 15 Table 2 Possible restricted substances in major components of the cell phone 16 Table 3 Examples of disjointment for typical small electronic components .21 Table 4 Minimum number of lead frame samples required for analytical te

23、sting .26 Table 5 Levels of a restricted substance in a composite sample 27 Table B.1 Probability of presence of restricted substances in materials and components used in electrotechnical products 40 Table C.1 Calculated maximum concentration for a composite sample based on detection limit .43 Table

24、 C.2 Required detection limit for a composite sample based on the maximum allowable concentration 43 Table E.1 Selection of samples for analysis of AC power cord .46 Table E.2 Selection of samples (testing locations) for analysis after visual inspection Cell phone charger49 Table E.3 Results of XRF

25、analysis at spots 1 and 2 as shown in Figure E.6.52 DD IEC/PAS 62596:2009 4 PAS 62596 IEC:2009(E) INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROTECHNICAL PRODUCTS DETERMINATION OF RESTRICTED SUBSTANCES SAMPLING PROCEDURE GUIDELINES FOREWORD 1) The International Electrotechnical Commission (IEC)

26、 is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition

27、to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested i

28、n the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with cond

29、itions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC Nat

30、ional Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the w

31、ay in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IE

32、C Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should

33、ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage

34、of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the

35、 referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

36、A Publicly Available Specification (PAS) is a technical specification not fulfilling the requirements for a standard, but made available to the public. IEC-PAS 62596 has been processed by IEC technical committee 111: Environmental standardization for electrotechnical products and systems. The text o

37、f this PAS is based on the following document: This PAS was approved for publication by the P-members of the committee concerned as indicated in the following document Draft PAS Report on voting 111/112/PAS 111/126/RVD Following publication of this PAS, which is a pre-standard publication, the techn

38、ical committee or subcommittee concerned may transform it into an International Standard. This PAS shall remain valid for an initial maximum period of 3 years starting from the publication date. The validity may be extended for a single 3-year period, following which it shall be revised to become an

39、other type of normative document, or shall be withdrawn. DD IEC/PAS 62596:2009PAS 62596 IEC:2009(E) 5 INTRODUCTION In the electrotechnical industry, much emphasis has been placed on minimizing the environmental burden of its products. Waste handling, recycling, chemicals and energy consumption are c

40、overed by regulations. Specifically, the use of materials containing lead (Pb), mercury (Hg), cadmium (Cd) and hexavalent chromium (Cr VI), as well as two types of brominated flame retardants (polybrominated biphenyls, PBBs, and polybrominated diphenyl ethers, PBDEs) in electrotechnical equipment is

41、 restricted in current and proposed regional legislation. To demonstrate compliance with these requirements, it may be necessary to analyse electrotechnical products for a variety of reasons: to supplement supply chain material declarations (companies may choose to test products directly to determin

42、e compliance); companies may require their suppliers to perform analysis to support material declarations; companies may perform “spot checks“ of their suppliers to assess compliance enforcement authorities may perform testing as part of their market surveillance activities. IEC 62321 already provid

43、es test methods for the determination of six regulated substances in electrotechnical products. However, the preparatory steps before the analysis are critically important in obtaining accurate, reproducible results. Prior to this PAS, there was virtually no guidance or consensus as to how electrote

44、chnical products should be sampled. The purpose of this PAS is primarily to complement IEC 62321 by providing agreed guidelines on how electrotechnical products, assemblies and components should be sampled to determine the levels of restricted substances present. Please note sampling and analytical

45、testing is not the only way to obtain relevant information on the levels of substances in an electrotechnical product or component. Experience and knowledge of the materials used could remove the need for sampling and testing; for example, flame retardants are never used in metals. Furthermore, anal

46、ytical test reports and material declarations received can be used to demonstrate that the levels of restricted substances are below the required limits. DD IEC/PAS 62596:2009 6 PAS 62596 IEC:2009(E) ELECTROTECHNICAL PRODUCTS DETERMINATION OF RESTRICTED SUBSTANCES SAMPLING PROCEDURE GUIDELINES 1 Sco

47、pe This PAS provides general sampling guidelines and strategies of sampling for electrotechnical products, electronic assemblies, electronic components. In order to obtain samples that can be used for analytical testing to determine the levels of restricted substances as described in the test method

48、s of IEC 62321. Restrictions for substances will vary between geographic regions and from time to time. This PAS describes a generic process for the sampling of any substance which could be restricted. This PAS does not provide: Full guidance on each and every product that could be classified as ele

49、ctrotechnical equipment. Since there is a huge variety of electrotechnical components, with various structures and processes, along with the continuous innovations in the industry, it is unrealistic to attempt to provide procedures for the disjointment of every type of component. Analysis procedures to measure the levels of restricted substances. This is covered by other standards (for example the futu