ANSI IEEE 1560-2005 Methods of Measurement of Radio-Frequency Power-Line Interference Filter in the Range of 100 Hz to 10 GHz《100赫兹到10千兆赫范围内射频电力线路抗干扰滤波器的测量方法标准》.pdf

《ANSI IEEE 1560-2005 Methods of Measurement of Radio-Frequency Power-Line Interference Filter in the Range of 100 Hz to 10 GHz《100赫兹到10千兆赫范围内射频电力线路抗干扰滤波器的测量方法标准》.pdf》由会员分享，可在线阅读，更多相关《ANSI IEEE 1560-2005 Methods of Measurement of Radio-Frequency Power-Line Interference Filter in the Range of 100 Hz to 10 GHz《100赫兹到10千兆赫范围内射频电力线路抗干扰滤波器的测量方法标准》.pdf（93页珍藏版）》请在麦多课文档分享上搜索。

1、IEEE Std 1560-2005IEEE Standard for Methods ofMeasurement of Radio-FrequencyPower-Line Interference Filter in theRange of 100 Hz to 10 GHzI E E E3 Park Avenue New York, NY 10016-5997, USA24 February 2006IEEE Electromagnetic Compatibility SocietyRecognized as anAmerican National Standard (ANSI)The In

2、stitute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2006 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 24 February 2006. Printed in the United States of America.IEEE is a registered trademark in the

3、U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educationalclassroom use can also be obtained through the Copyright Clearance Center.NOTEAttention is called to the possibility that implementation of this standard may require use of subjectmatter covered b

4、y patent rights. By publication of this standard, no position is taken with respect to theexistence or validity of any patent rights in connection therewith. The IEEE shall not be responsible foridentifying patents for which a license may be required by an IEEE standard or for conducting inquiries i

5、nto thelegal validity or scope of those patents that are brought to its attention.Copyright 2006 IEEE. All rights reserved.iiiIntroductionThe interest in low-voltage ac/dc radio interference filters has grown due to strict conducted emissionsrequirements of many end-use equipment, appliances, and me

6、dical equipment standards. However, tests thatpredict the performance of these filters in realistic situations have not been forthcoming. Until recently,general design considerations were based on filter performance as a result of matched-impedance testmethods. The popular test specification for the

7、 measurement of electrical filter insertion loss is MIL-STD-220A-1978 B14,anow MIL-STD-220B,bwhich also uses the matched-impedance method. The testmethods found in MIL-STD-220B are best suited for quality control during quantity production of power-line filters. The specified matched-impedance test

8、conditions are satisfactory for quality-control purposesbut do not represent conditions that exist in actual circuits or installations. The power source impedances inactual installations are typically much lower than 50 ohms at frequencies in the filter stop band. Thesemethods should be the last ste

9、p in the filter design and specification process. All too often, matched-impedance method specifications are improperly used as the initial and primary design specification. Theinsertion loss measurement results may bear little or no resemblance to the actual performance of the filter asinstalled.Be

10、cause the nature of end-use loads and conducted emissions has changed significantly since the concept ofinterference filters was developed, manufacturers of filters have put forth many efforts in the past few yearsto enhance filter design and performance. Characterization of filters from the field a

11、nd on-site investigationsindicated that many filters were operating in electrical environments where filter performance wassubstantially degraded because of very low source and load impedances. Laboratory tests and research tounderstand fully the performance of power-line filters in these realistic

12、environments were conducted withthe cooperation of the respective manufacturers. As a part of the research, existing filter standards werereviewed and studied in a laboratory environment. These studies indicated that improved standardized testmethods were needed to permit the manufacturer to describ

13、e, and the end user to understand and predict,how a given filter would perform in the users environment. With participation from filter manufacturersand a need to develop a new filter standard to support the filter industry, efforts were initiated by theindividuals in the Working Group to develop a

14、new standard.Notice to usersErrataErrata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL forerrata periodically.InterpretationsCurrent interpretations can be access

15、ed at the following URL: http:/standards.ieee.org/reading/ieee/interp/index.html.aThe numbers in brackets correspond to those of the bibliography in Annex A.bInformation on references can be found in Clause 2.This introduction is not part of IEEE Std 1560-2005, IEEE Standard for Methods of Measureme

16、nt of Radio-FrequencyPower-Line Interference Filter in the Range of 100 Hz to 10 GHz. ivCopyright 2006 IEEE. All rights reserved.PatentsAttention is called to the possibility that implementation of this standard may require use of subject mattercovered by patent rights. By publication of this standa

17、rd, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEEE shall not be responsible for identifyingpatents or patent applications for which a license may be required to implement an IEEE standard or forconducting inquiries into the legal

18、validity or scope of those patents that are brought to its attention.ParticipantsAt the time this standard was completed, the IEEE EMC SDCom, TC-4 P1560 Standard for Methods ofMeasurement of Radio-Frequency Power-Line Interference Filter in the Range of 100 Hz to 10 GHzWorking Group had the followin

19、g membership: Kermit Phipps,ChairBob Scully,Co-ChairFrank Eliot,SecretaryPhilip Keebler, EditorNanette Jones, Graphics DesignerThe following members of the individual balloting committee voted on this standard. Balloters may havevoted for approval, disapproval, or abstention. Frdric BroydEvelyne Cla

20、velierWilliam CroisantAwerkamp DwaynePaul EwingTerry ForsytheNissen IsakovThomas S. KeyJohn KraemerDavid LarrabeeBill LilesArshad MansoorFranois D. MartzloffMichael McInerneyJames MuccioliRichard OzenbaughDale SvetanoffRafik StephanianRomesh RajputWerner SchaeferMarcos AndradeDavid ArmitageMark Bush

21、nellJohan Catrysse Keith ChowByron DavenportHugh DennyDr. Guru Dutt DhingraAndrew DrozdFrank EliotDaniel HoolihanYuri Khersonsky John Kraemer Edward McCall Michael McInerneyCharles Ngethe Iulian Profir Michael Roberts Werner Schaefer Jacob SchankerVaughn ShelineThomas Starai Dale Svetanoff David Tra

22、ver Jim Walker Copyright 2006 IEEE. All rights reserved.vWhen the IEEE-SA Standards Board approved this standard on 22 September 2005, it had the followingmembership:Steve M. Mills,ChairRichard H. Hulett, Vice ChairDon Wright, Past ChairJudith Gorman,Secretary*Member EmeritusAlso included are the fo

23、llowing nonvoting IEEE-SA Standards Board liaisons:Satish K. Aggarwal, NRC RepresentativeRichard DeBlasio, DOE RepresentativeAlan H. Cookson, NIST RepresentativeMichael D. FisherIEEE Standards Project EditorMark D. BowmanDennis B. BrophyJoseph BruderRichard CoxBob DavisJulian Forster*Joanna N. Gueni

24、nMark S. HalpinRaymond HapemanWilliam B. HopfLowell G. JohnsonHerman KochJoseph L. Koepfinger*David J. LawDaleep C. MohlaPaul NikolichT. W. OlsenGlenn ParsonsRonald C. PetersenGary S. RobinsonFrank StoneMalcolm V. ThadenRichard L. TownsendJoe D. WatsonHoward L. WolfmanviCopyright 2006 IEEE. All righ

25、ts reserved.Contents1. Overview 11.1 Scope 11.2 Purpose. 11.3 Application of test methods and use of this document 12. Normative references. 43. Definitions 54. Safety . 84.1 Stored capacitor energy 84.2 RF hazards . 84.3 Voltages and currents. 85. Measurement instrumentation 95.1 General. 95.2 Cali

26、bration of measuring equipment 95.3 Measurement tolerances. 96. Measurement uncertainty. 96.1 General. 96.2 Calculation of measurement uncertainty . 97. Test equipment and minimum specifications 107.1 AC power source 107.2 Alternating current source 107.3 DC power source 107.4 Direct current source

27、107.5 Ammeter 107.6 Buffer networks . 107.7 Differential voltage probes 117.8 Dynamic range. 117.9 Ground plane 117.10 Impedance-transforming networks 117.11 Line-impedance stabilization network. 117.12 Linear load . 127.13 Nonlinear load 127.14 Oscilloscope. 127.15 Power amplifier 137.16 Power anal

28、yzer. 137.17 Attenuators, 100 dB . 137.18 RF matching network. 137.19 RF bulk current injection probe . 137.20 RF current transformers . 137.21 RF injector . 137.22 Shielded enclosure . 13Copyright 2006 IEEE. All rights reserved.vii7.23 Spectrum analyzer or network analyzer. 147.24 S-parameter test

29、set 147.25 Tracking generator. 148. Test facilities 148.1 Standard testing conditions 148.2 General operating conditions . 148.3 Grounding 158.4 Regulatory agency restrictions. 158.5 Screened equipment and shielding requirements. 158.6 RF test fixture and mounting requirements . 158.7 Source impedan

30、ce 158.8 Test equipment noise floor level 158.9 Attenuators, phase splitters, power splitters, and network matching pads 168.10 Lead dress 169. Divisions of frequency ranges and recommended sensitivity 1610. Required measurement methods 1710.1 Quality assurance testingNo load (10 kHz to 1 GHz) 1810.

31、2 Quality assurance testLoaded (10 kHz to 20 MHz). 2010.3 RF characteristic test, mismatched impedanceNo load (100 kHz to 30 MHz) 2310.4 Variable source impedance attenuation measurement (100 Hz to 100 kHz). 2510.5 Attenuation measurement (100 kHz to 30 MHz). 2810.6 Aperture leak testing by electric

32、 fields (1 GHz to 10 GHz) 3110.7 Voltage drop and waveform quality test (linear/nonlinear loading) 3310.8 S-parameter measurement (100 Hz to 30 MHz) 3511. Record keeping and data handling. 39Annex A (informative) Bibliography. 40Annex B (normative) Filter labeling 42Annex C (informative) Waveform qu

33、ality and harmonic loading-related performance of power-line filters . 44Annex D (informative) S-Parameters 54Annex E (informative) Line-impedance stabilization networks 62Annex F (informative) Frequency response curves. 66Annex G (informative) Designing RFI filters for their worst-case behavior. 70

34、Annex H (informative) Estimating measurement uncertainty. 78Annex I (informative) Glossary. 82Copyright 2006 IEEE. All rights reserved.1IEEE Standard for Methods of Measurement of Radio-Frequency Power-Line Interference Filter in the Range of 100 Hz to 10 GHz1. Overview1.1 ScopeThe scope of this sta

35、ndard is to develop a standard method of measurement for evaluating theelectromagnetic and radio frequency suppression capability of power-line filters in the frequency range of100 Hz to 10 GHz. This will apply to electromagnetic interference/radio-frequency interference (EMI/RFI)filters in general,

36、 i.e., dc, single-phase or polyphase systems rated for 600 V and below 1000 A. The methodof measurement will describe general considerations, such as the method of standardizing source impedancefor nonlinear loads, temperature rise, attenuation measurement, components, and or derating requirementswh

37、en supplying nonsinusoidal load currents and operating in matched- or mismatched-impedanceenvironments.1.2 PurposeThe purpose of this standard is to provide measurements that evaluate the performance of power-lineinterference filters in practical installations involving varying load and source imped

38、ances. These factors arenot usually considered in design and performance verification testing of EMI/RFI filters. Bothmanufacturers and end users should benefit from this standard that defines the ranges and environment,expected effects, and test methods to verify filter attributes.1.3 Application o

39、f test methods and use of this documentClause 10 describes filter performance measuring techniques. Although it might be desirable to characterizeeach production filter in accordance with all the measurement methods described, it is generally noteconomically feasible to do so. Usually, only first-de

40、sign filters will be analyzed through multipleperformance tests. These tests establish a performance baseline for that filter design. Subsequent productionunits of the same design may be tested using matched-impedance techniques to ensure that there is nosignificant deviation from the original due t

41、o component or assembly changes.IEEEStd 1560-2005 IEEE STANDARD FOR METHODS OF MEASUREMENT OF RADIO-FREQUENCY2Copyright 2006 IEEE. All rights reserved.Case design and assembly testing may be required on a need basis to ensure control of radiated emissionsfrom the filter at frequencies above 1 GHz. T

42、here are several methods for observing case integrity that donot employ RF testing to ensure proper case construction. These include the die penetration method.However, it is recommended that radiated field testing be performed at the installation site with the filter inits final configuration on a

43、shielded enclosure for best results at frequencies above 1 GHz. Refer to IEEE Std299.1Where it is not possible to perform the test with the filter in its final configuration, then reasonablescreening or enclosures may be used. Clause 10 is divided into eight test methods (see 10.110.8), alphabetical

44、ly coded in Table B.1. It isdesirable to label all power-line filters in a similar manner in accordance with Annex B. The nameplate datamay be derived from the different tests outlined in Clause 10. Annex F illustrates generic filter curves andpoints of interest such as the 3 dB point, 20 dB point,

45、and the ratio calculations of the shape factor, whichmay be requested to be printed with the filter curves in the original baseline data.1.3.1 Use of test methods1.3.1.1 Quality assurance tests Quality assuranceNo load (10 kHz to 1 GHz) (see 10.1) Quality assuranceLoaded (10 kHz to 20 MHz) (see 10.2

46、)The quality assurance (QA) test follows traditional matched-impedance testing methods currently in practiceby most manufacturers. The frequency ranges are selected based on reproducibility, QA control indicators,and reasonable performance frequencies where the filter might be operating under varyin

47、g loads.1.3.1.2 Mismatched-impedance tests RF characteristics mismatched impedanceNo load (100 kHz to 30 MHz) (see 10.3)The mismatched-impedance subclause finds its origins in the tradition of CISPR 17. Using a set ofmismatched source and load impedance, this low-cost performance indicator may be us

48、ed when currentinjection techniques are not practical or cost-effective. For example, the 0.1 ohm and 100 ohm impedancesused in the no-load test setup result in an apparent insertion loss without the filter of approximately 50 dB,limiting filter dynamic range testing to approximately 60 dB. It may b

49、e necessary to use pre- or post-amplifiers if a larger dynamic range is desired.Other impedances may be used when the source and load impedances are known. Further details may befound in CISPR 17 regarding the construction of the impedance networks.1.3.1.3 RF current injection tests Variable source impedance attenuation measurement (100 Hz to 100 kHz) (see 10.4) Attenuation measurement (100 kHz to 30 MHz) (see 10.5)The current injection method has been described in documents such as MIL-STD-461E-1999 B152forconducted susceptibility testing. This met