BS QC 790202-1991 Specification for harmonized system of quality assessment for electronic components Semiconductor devices Integrated circuits Blank detail specification Monolithi.pdf

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1、BRITISH STANDARD BS QC790202: 1991 IEC748-3-1: 1991 Specification for Harmonized system of quality assessment for electronic components Semiconductor devices Integratedcircuits Blank detail specification Monolithic integrated operational amplifiersBSQC790202:1991 BSI 02-2000 ISBN 0 580 35527 6 Amend

2、ments issued since publication Amd. No. Date CommentsBSQC790202:1991 BSI 02-2000 i Contents Page National foreword ii Introduction 1 1 Marking and ordering information 3 2 Application related description 3 3 Specification of the function 3 4 Limiting values (absolute maximum rating system) 3 5 Opera

3、ting conditions (within the specified operating temperature range) 4 6 Electrical characteristics 4 7 Programming 6 8 Mechanical and environmental ratings, characteristics and data 6 9 Additional information 6 10 Screening 6 11 Quality assessment procedures 6 12 Structural similarity procedures 7 13

4、 Test conditions and inspection requirements 7 14 Additional measurement method 13BSQC790202:1991 ii BSI 02-2000 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee, ECL/-. It is identical with IEC Publication748-3-1 Q

5、C790202 “Semiconductor devices.Integrated circuits. Part3: Analogue integrated circuits. Section1: Blank detail specification for monolithic integrated operational amplifiers” published by the International Electrotechnical Commission IEC and is a harmonized specification with the IECQ system of qua

6、lity assessment for electronic components. This blank detail specification is one of a series of blank detail specifications for semiconductor devices and to be used with BS QC700000 “Generic specification for discrete devices and integrated circuits”. A related British Standard to QC001002 is BS900

7、0 “General requirements for a system for electronic components of assessed quality Part3:1987 Specification for national implementation of IECQ basic rules and rules of procedures.” A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards

8、are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references International Standard Corresponding British Standard IEC68-2-17:1978 BS2011: Environmental testing Part2.1 Q:1981 Test Q. Sealing Identical I

9、EC747-1:1983 BS6493: Semiconductor devices Part1. Discrete devices Section1.1:1984 General Identical IEC747-10:1991 BS QC700000:1991 Harmonized system of quality assessment for electronic components. Semiconductor devices. Generic specification for discrete devices and integrated circuits Identical

10、IEC748-1:1984 BS6493: Semiconductor devices Part2. Integrated circuits Section2.1:1985 General Identical IEC748-11:1990 BS QC790100:1991 Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for semiconductor integrated circuits excluding h

11、ybrid circuits Identical IEC749:1984 BS6493: Semiconductor devices Part3:1985 Mechanical and climatic tests methods Identical Summary of pages This document comprises a front cover, an inside front cover, pagesi andii, pages1 to13 and a back cover. This standard has been updated (see copyright date)

12、 and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.BSQC790202:1991 BSI 02-2000 1 Introduction The IEC Quality Assessment System Electronic Components is operated in accordance with the statutes of the IEC and under the authority of the

13、IEC. The object of this system is to define quality assessment procedures in such a manner that electronic components released by one participating country as conforming with the requirements of an applicable specification are equally acceptable in all other participating countries without the need

14、for further testing. This blank detail specification is one of a series of blank detail specifications for semiconductor devices and shall be used with the following IEC Publication: 747-10/QC700000:1991: Semiconductor devices. Part10: Generic specification for discrete devices and integrated circui

15、ts. Required information Numbers shown in brackets on this and the following pages correspond to the following items of required information, which shall be entered in the spaces provided. Identification of the detail specification The clauses given in square brackets on the following pages of this

16、standard are intended for guidance to the specification writer and shall not be included in the detail specification. When confusion may arise as to whether a paragraph is only meant as an instruction to the writer or not, it shall be given in brackets. 1 The name of the National Standards Organizat

17、ion under whose authority the detail specification is issued. 2 The IECQ number of the detail specification. 3 The numbers and issue numbers of the Generic and Sectional specifications. 4 The national number of the detail specification, date of issue and any further information, if required by the n

18、ational system. Identification of the component 5 Main function and type number, e.g.microprocessor integrated circuit68000. 6 Information on typical construction (materials, main technology) and the package. If the device has several kinds of derivative products, the differences should be indicated

19、, e.g.features of the characteristics in the comparison table. If the device is electrostatic sensitive, a caution statement shall be added in the detail specification. 7 Outline drawing, terminal identification, marking and/or reference to the relevant document for outlines. 8 Category of assessed

20、quality according to subclause 2.6 of the generic specification. 9 Reference data.BSQC790202:1991 2 BSI 02-2000 Name (address) of responsible NAI (and possibly of body from which specification is available). 1 Number of IECQ detail specification, plus issue number and/or date. QC790202-. 2 ELECTRONI

21、C COMPONENT OF ASSESSED QUALITY IN ACCORDANCE WITH: Generic specification: Publication747-10/QC700000 Sectional specification: Publication748-11/QC790100 and national references if different. 3 National number of detail specification. This box need not be used if the national number repeats the IECQ

22、 number. 4 DETAIL SPECIFICATION FOR MONOLITHIC INTEGRATED OPERATIONAL AMPLIFIERS Type number(s) of the relevant device(s). Ordering information: see subclause 1.2 of this standard. 5 MECHANICAL DESCRIPTION Outline references: Standard package reference should be given, IEC number (mandatory if avail

23、able) and/or national number. 7 SHORT DESCRIPTION Application: see clause6 of this standard Function: see clause3 of this standard Typical construction: Si, monolithic, bipolar, MOS. Encapsulation: cavity or non-cavity. Comparison table of characteristics for variant products. CAUTION: Electrostatic

24、 sensitive devices. 6 Outline drawing may be transferred to or given with more details in clause8 of this standard. Terminal identification drawing showing pin assignments, including graphical symbols. CATEGORIES OF ASSESSED QUALITY from subclause 2.6 of the generic specification. 8 Marking: letters

25、 and figures, or colour code. The detail specification shall prescribe the information to be marked on the device, if any. See subclause 2.5 of the generic specification and/or subclause1.1 of this standard. REFERENCE DATA Reference data on the most important properties to permit comparison between

26、types. 9 Information about manufacturers who have components qualified to this detail specification is available in the current Qualified Products List.BSQC790202:1991 BSI 02-2000 3 1 Marking and ordering information 1.1 Marking See subclause 2.5 of generic specification. The detail specification sh

27、all prescribe the information to be given for the relevant types, such as letters, figures and/or codes. When the marking contains information other than that specified in subclause 2.5 of the generic specification, e.g., details for the manufacturers internal use, these details should be distinguis

28、hed. If all the information has already been given in box7 on page2, this shall be indicated. 1.2 Ordering information The following minimum information is necessary to order a specific device, unless otherwise specified: precise type reference (and nominal voltage value, if required); IECQ referenc

29、e of detail specification with issue number and/or date when relevant; category of assessed quality as defined in clause 9 of the sectional specification and, if required, screening sequence as defined in clause 8 of the sectional specification; package for delivery; any other particulars. 2 Applica

30、tion related description Information on application in equipment or circuits and its relation to the associated devices shall be given here. The content will depend on the function to be described. 3 Specification of the function A detailed block diagram or equivalent circuit information of the inte

31、grated circuit shall be given, if necessary. 4 Limiting values (absolute maximum rating system) These values apply over the operating temperature range, unless otherwise specified. Repeat only subclause numbers used, with title. Any additional values shall be given at the appropriate place, but with

32、out subclause number(s). Curves shall preferably be given under clause9 of the detail specification. Subclause Parameters Symbol Value min. max. unit 4.1 4.2 4.3 4.4 4.5 4.6 4.7 4.8 Supply voltage (Note1) Differential-mode input d.c. voltage (Note1) Common-mode input d.c. voltage (Note1) Power dissi

33、pation Operating temperature Storage temperature Output current Short-circuit output current If applicable: short-circuit duration V CC V EE V ID V IC P tot T amb T stg I O I OS t OS V V V V W C C mA mA s NOTE 1A voltage reference shall be defined.BSQC790202:1991 4 BSI 02-2000 5 Operating conditions

34、 (within the specified operating temperature range) Operating conditions are specified in the relevant measuring methods. See subclause13.2 of this standard for inspection requirements. 5.1 Power supply voltage 5.2 Input voltage(s) 5.3 Output current(s) 5.4 Voltage and/or current at other terminal(s

35、) 5.5 External elements (where appropriate) 5.6 Operating temperature range 6 Electrical characteristics The requirements for these characteristics are based on fundamental integrated operational amplifiers. When several devices are defined in the same detail specification, the relevant values shoul

36、d be given on successive lines, avoiding repeating identical values. Curves should preferably be given under clause9 of the detail specification. The following characteristics apply over the full operating ambient temperature range, unless otherwise stated. Where the stated performance of the circui

37、t varies over the operating ambient temperature range, the values of the appropriate characteristics shall be stated at25 C and at the extremes of the operating temperature range.BSQC790202:1991 BSI 02-2000 5 6.1 Static characteristics Sub-clause Static characteristics Symbol Value min. typ. Note2 m

38、ax. unit 6.1.1 6.1.2 6.1.3 6.1.4 6.1.5 6.1.6 6.1.7 6.1.8 6.1.9 6.1.10 6.1.11 6.1.12 6.1.13 6.1.14 Input offset voltage Input offset current Input bias current Differential-mode voltage amplification Output voltage swing Power supply current Common-mode rejection ratio Supply voltage rejection ratio

39、or Supply voltage sensitivity Short circuit output current Common-mode input d.c. voltage range Mean temperature coefficient of input offset voltage Mean temperature coefficient of input offset current Small signal input impedance (differentialmode) Output impedance (single-ended) V IO I IO I IB A V

40、D V OPP I S k CMR(+) k SVR(+) k SVR() or k SVS(+) k SVS() I OS(+) I OS() Note3 V IC(+) V IC() Z Id Z os () () () () () () () () () () () () () () () Note4 () Note4 Note4 Note4 mV mA mA dB or an absolute number V mA dB V/4V or dB V/4V or dB mA mA V V %/K or %/ C %/K or %/ C k7 7 NOTE 2The insertion o

41、f typical values is optional. For operational amplifiers, typical values are recommended. NOTE 3The value of I OS (-) may be specified in the detail specification if necessary. NOTE 4When specified in the detail specification.BSQC790202:1991 6 BSI 02-2000 6.2 Dynamic characteristics As required by t

42、he detail specification in accordance with IEC748-3. 7 Programming Not applicable. 8 Mechanical and environmental ratings, characteristics and data Any specific mechanical and/or environmental ratings applicable should be required here in accordance with subclause 10.8 of IEC748-1, Amendment1, chapt

43、erVI (see also IEC747-1, chapterVI, clause 7). 9 Additional information The information here is not for inspection purposes. The following information is given as minimum design data: 9.1 Block diagram A block diagram or equivalent circuit information for the integrated circuit shall be given. 9.2 O

44、utput loading capability Information on the output loading capability shall be given. 9.3 Effects of temperature and input and/or output loading Variations of input offset voltage, input offset current and input bias current information with temperature shall be given. This information shall also be

45、 given, where appropriate, with respect to input and/or output loading. 9.4 Handling precautions Any limiting mechanical or environmental conditions shall be included, for example, the handling of FET input operational amplifiers. 10 Screening When necessary, technical requirements should be supplem

46、ented by the blank detail specification and refer to clause8 of sectional specification. 11 Quality assessment procedures The blank detail specification should specify whether the qualification approval procedure or capability approval procedure is applicable. 11.1 Qualification approval procedure S

47、ee generic specification, clause3 and sectional specification, subclause5.1. Sub-clause Dynamic characteristics Symbol Value min. typ. max. unit 6.2.1 6.2.2 6.2.3 6.2.4 6.2.5 6.2.6 Unity-gain frequency or Real gain-bandwidth product Upper limiting frequency for full output voltage swing Output noise

48、 voltage Average rate of change of the output voltage Note2 Cross-talk attenuation (where applicable) Response time f 1 or GWR f w V no S voav a x Hz Hz Note1 V/4s dB 4s NOTE 5The unit shall be given in the detail specification. NOTE 6Both positive- and negative- going slow rate to be specified, whe

49、n appropriate.BSQC790202:1991 BSI 02-2000 7 11.2 Capability approval procedure See IEC Publication747-10. 12 Structural similarity procedures See clause6 of the sectional specification. 13 Test conditions and inspection requirements The blank detail specification is used to maintain a uniform prescription of tests in the detail s