ISO TS 17444-2-2017 Electronic fee collection - Charging performance - Part 2 Examination framework《电子收费 充值性能 第2部分 检查框架》.pdf
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1、 ISO 2017 Electronic fee collection Charging performance Part 2: Examination framework Perception du tlpage Performance dimputation Partie 2: Cadre dexamen TECHNICAL SPECIFICATION ISO/TS 17444-2 Reference number ISO/TS 17444-2:2017(E) Second edition 2017-09 ISO/TS 17444-2:2017(E)ii ISO 2017 All righ
2、ts reserved COPYRIGHT PROTECTED DOCUMENT ISO 2017, Published in Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet o
3、r an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Ch. de Blandonnet 8 CP 401 CH-1214 Vernier, Geneva, Switzerland Tel. +41 22 749 01 11 Fax +41 22 749 09 47 copyr
4、ightiso.org www.iso.org ISO/TS 17444-2:2017(E)Foreword vi Introduction vii 1 Scope . 1 2 Normative references 1 3 T erms and definitions . 2 4 Symbols and abbreviated terms . 6 5 Examination Framework . 7 5.1 General . 7 5.2 Method for defining a Specific Examination Framework . 8 5.2.1 General 8 5.
5、2.2 Selection of metrics to be evaluated . 9 5.2.3 Definition of environmental conditions and associated performance requirements . 9 5.2.4 Determination of Required Sample Sizes . 9 5.2.5 Selection of methods for generating Charging Input and Reference Data 10 5.2.6 Determination of Test Routes/Sub
6、set of Charged Network for generating representative trips 10 5.2.7 Documentation of the Specific Examination Framework 10 5.3 Sources of data .10 5.4 Methods of generating charging input 13 5.4.1 General.13 5.4.2 Predefined routes (identifier: “PVP”) .14 5.4.3 Reference System (used in combination
7、with identifiers: “PVR” and “UVR”) 15 5.4.4 Simulated OBE/FE (identifier: “SO”) .16 5.4.5 Dedicated OBE Testing (identifier: “DO”) 17 5.5 Applicability of metrics scheme types .17 5.6 Charging Metric Selection Tables .22 5.6.1 General.22 5.6.2 DSRC Discrete 22 5.6.3 Autonomous Discrete .23 5.6.4 Aut
8、onomous Continuous .24 6 Examination Tests 26 6.1 Common (and DSRC Discrete) Examination Tests 26 6.1.1 General.26 6.1.2 ET-CM-E2E-1 E2E Correct Charging Rate 26 6.1.3 ET-CM-E2E-2 E2E Overcharging Rate .27 6.1.4 ET-CM-E2E-3 E2E Undercharging Rate27 6.1.5 ET-CM-E2E-4 E2E Late Charging Rate 28 6.1.6 E
9、T-CM-UA-1 UA Correct Charging Rate 29 6.1.7 ET-CM-UA-2 UA Overcharging Rate .29 6.1.8 ET-CM-UA-3 UA Undercharging Rate .30 6.1.9 ET-CM-UA-4 UA Accurate application of Payments and Refunds 31 6.1.10 ET-CM-UA-5 UA Accurate Personalisation of OBUs .31 6.1.11 ET-CM-PC-1 PC Correct Charging Rate .32 6.1.
10、12 ET-CM-PC-2 PC Overcharging Rate 32 6.1.13 ET-CM-PC-3 PC Undercharging Rate 33 6.1.14 ET-CM-PC-4 PC Latency TC 34 6.1.15 ET-CM-PC-5 PC Late Payment Claims Rate .34 6.1.16 ET-CM-PC-6 PC Rejected Payment Claim Rate .35 6.1.17 ET-CM-BD-1 BD Correct Charging Rate35 6.1.18 ET-CM-BD-2 BD Overcharging Ra
11、te 36 6.1.19 ET-CM-BD-3 BD Undercharging Rate .37 ISO 2017 All rights reserved iii Contents Page ISO/TS 17444-2:2017(E)6.1.20 ET-CM-BD-4 BD Incorrect Charging Rate .37 6.1.21 ET-CM-BD-5 BD Latency TC 38 6.1.22 ET-CM-BD-6 BD Late Billing Details Rate .38 6.1.23 ET-CM-BD-7 BD Rejected Billing Details
12、Rate 39 6.1.24 ET-CM-BD-8 BD Incorrectly rejected Billing Details Rate 39 6.1.25 ET-CM-BD-9 BD Inferred Billing Details Rate .40 6.2 DSRC Discrete Optional DSRC Toll Declaration Metrics 40 6.2.1 General.40 6.2.2 ET-CM-TD-1 TD Correct Toll Declaration Generation Rate .40 6.2.3 ET-CM-TD-2 TD Incorrect
13、 Toll Declaration Generation Rate .41 6.2.4 ET-CM-TD-3 TD Late Toll Declarations Rate 41 6.2.5 ET-CM-TD-4 TD TSP Charge Parameter Change Rate 42 6.2.6 ET-CM-TD-5 TD TSP False Positive Rate 42 6.3 Autonomous Discrete Specific Examination Tests 43 6.3.1 General.43 6.3.2 ET-CM-TD-1 TD Correct Toll Decl
14、aration Generation Rate .43 6.3.3 ET-CM-TD-2 TD Incorrect Toll Declaration Generation Rate .43 6.3.4 ET-CM-TD-3 TD Late Toll Declarations Rate 44 6.3.5 ET-CM-TD-4 TD TSP Charge Parameter Change Rate 44 6.3.6 ET-CM-TD-5 TD TSP False Positive Rate 45 6.3.7 ET-CM-DTD-1 DTD Correct Charging Rate (charge
15、 object detections) 45 6.3.8 ET-CM-DTD-2 DTD Incorrect Charge Event Recognition Rate .46 6.3.9 ET-CM-DTD-3 DTD Missed Charge Object Detection Rate .46 6.3.10 ET-CM-DTD-4 DTD Overcharging Rate 47 6.3.11 ET-CM-CR-1 CR Correct Charge Report Generation Rate .47 6.3.12 ET-CM-CR-2 CR Incorrect Charge Repo
16、rt Generation Rate .48 6.3.13 ET-CM-CR-3 CR Charge Report Latency .48 6.3.14 ET-CM-CR-4 CR TSP Front End Charge Parameter Change Rate 49 6.3.15 ET-CM-CR-5 CR TSP Front End False Positive Rate 49 6.3.16 ET-CM-DCR-1 DCR Correct Charging Rate (charge object detections) .50 6.3.17 ET-CM-DCR-2 DCR Incorr
17、ect Charge Event Recognition Rate 50 6.3.18 ET-CM-DCR-3 DCR Missed Charge Object Detection Rate .51 6.3.19 ET-CM-DCR-4 DCR Overcharging rate (Incorrect false positive Charge Event Recognition) 51 6.4 Autonomous Continuous Specific Examination Tests 52 6.4.1 General.52 6.4.2 ET-CM-TD-1 TD Correct Tol
18、l Declaration Generation Rate .52 6.4.3 ET-CM-TD-2 TD Incorrect Toll Declaration Generation Rate .52 6.4.4 ET-CM-TD-3 TD Late Toll Declarations Rate 53 6.4.5 ET-CM-TD-4 TD TSP Charge Parameter Change Rate 53 6.4.6 ET-CM-TD-5 TD TSP False Positive Rate 54 6.4.7 ET-CM-CTD-1 CTD Correct Charging Rate 5
19、4 6.4.8 ET-CM-CTD-2 CTD Overcharging Rate .55 6.4.9 ET-CM-CTD-3 CTD Accuracy of Distance/Time Measurement .55 6.4.10 ET-CM-CR-1 CR Correct Charge Report Generation Rate .56 6.4.11 ET-CM-CR-2 CR Incorrect Charge Report Generation Rate .56 6.4.12 ET-CM-CR-3 CR Charge Report Latency .57 6.4.13 ET-CM-CR
20、-4 CR TSP Front End Charge Parameter Change Rate 57 6.4.14 ET-CM-CR-5 CR TSP Front End False Positive Rate 58 6.4.15 ET-CM-CCR-1 CCR Correct Charging Rate 58 6.4.16 ET-CM-CCR-2 CCR Overcharging Rate .59 6.4.17 ET-CM-CCR-3 CCR Accuracy of Distance/Time Measurement .59 Annex A (informative) Examinatio
21、n Test documentation template .61 Annex B (informative) Examination Framework considerations 62 Annex C (informative) Statistical considerations .66 iv ISO 2017 All rights reserved ISO/TS 17444-2:2017(E)Annex D (informative) Methods for reducing sample sizes for very high/low probability metrics dur
22、ing the Evaluation Phase .72 Annex E (informative) Ex ample-specific Ex amination F r ame w or ks 76 Bibliography .93 ISO 2017 All rights reserved v ISO/TS 17444-2:2017(E) Foreword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO me
23、mber bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governme
24、ntal and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. The procedures used to develop this document and those intended for its further maintenanc
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