ISO IEC 16022 CORR 1-2008 Information technology - Automatic identification and data capture techniques - Data Matrix bar code symbology specification Technical.pdf
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1、ICS 01.080.50; 35.040 Ref. No. ISO/IEC 16022:2006/Cor.1:2008(E) ISO/IEC 2008 All rights reserved Published in Switzerland INTERNATIONAL STANDARD ISO/IEC 16022:2006 TECHNICAL CORRIGENDUM 1 Published 2008-10-01 INTERNATIONAL ORGANIZATION FOR STANDARDIZATION ORGANISATION INTERNATIONALE DE NORMALISATION
2、 INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION LECTROTECHNIQUE INTERNATIONALEInformation technology Automatic identification and data capture techniques Data Matrix bar code symbology specification TECHNICAL CORRIGENDUM 1 Technologies de linformation Techniques automatiques didentification et
3、 de capture des donnes Spcification de symbologie de code barres Data Matrix RECTIFICATIF TECHNIQUE 1 Technical Corrigendum 1 to ISO/IEC 16022:2006 was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology, Subcommittee SC 31, Automatic identification and data capture technique
4、s. Page 106, M.1.2 Replace list items b) to e) with the following: b) For each modulation grade level apply the parameter grade overlay technique described in ISO/IEC 15415: 1) For each side of the L (L1 and L2 in Figure M.1) and each quiet zone area (QZL1 and QZL2, adjacent to L1 and L2 respectivel
5、y in Figure M.1), assume that all modules not achieving that grade or a higher grade are module errors, and derive a notional damage grade based on the grade thresholds shown in Table M.1. Take the lower of the modulation grade level and the notional damage grade. 2) The grade for each segment shall
6、 be the highest resulting grade for all modulation grade levels. ISO/IEC 16022:2006/Cor.1:2008(E) 2 ISO/IEC 2008 All rights reservedc) Additionally, for both square and rectangular symbols with more than one data region, repeat steps a) and b) above where L1 and L2 start with the module in the quiet
7、 zone and end at the module in the clock track area of the same data region and QZL1 and QZL2 consist of the quiet zone adjacent to these L1 and L2 segments as defined like Figure M.1. In other words treat the lower left data region as if it were a symbol with a single data region. If this grade is
8、lower than that obtained from L1, L2, QZL1, and QZL2 in steps a) and b) then replace the grade obtained in steps a) and b) with this grade. d) Additionally, for segments L1 and L2, verify that all gaps are separated by at least four correct modules and that no gaps are wider than three modules; if t
9、his test fails, the grade obtained from the above steps shall be reduced to 0 at that modulation grade level. Page 107, M.1.3 Replace the first paragraph with the following: This section defines the measurement of damage to the internal alignment patterns (when present) and also external clock track
10、s and associated quiet zone areas. These tests are applied separately to each segment of the internal alignment patterns, the clock tracks, and associated quiet zone areas that bound the data region, or individual data regions of larger symbols. Each segment consists of a clock track portion and a s
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