IEEE C95 1A-2010 en Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields 3 kHz to 300 GHz Amendment 1 Specifies Ceiling Limits.pdf
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5、82g80g68g74g81g72g87g76g70g3g54g68g73g72g87g92g44g40g40g40g22g3g51g68g85g78g3g36g89g72g81g88g72g3g49g72g90g3g60g82g85g78g15g3g49g60g3g20g19g19g20g25g16g24g28g28g26g15g3g56g54g36g3g3g20g25g3g48g68g85g70g75g3g21g19g20g19g38g28g24g17g20g68g55g48IEEE Std C95.1a-2010 (Amendment to IEEE Std C95.1-2005) IE
6、EE Standard for Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields, 3 kHz to 300 GHz Amendment 1: Specifies Ceiling Limits for Induced and Contact Current, Clarifies Distinctions between Localized Exposure and Spatial Peak Power Density Sponsor IEEE International
7、Committee on Electromagnetic Safety Approved 2 February 2010 IEEE-SA Standards Board Abstract: Ceiling values for induced and contact current requirements are specified, and distinctions between localized exposure and spatial peak power density are clarified in this amendment. Keywords: human exposu
8、re RF energy, localized exposure, spatial peak power density, radio frequency (RF) safety levels, RF induced and contact current g120The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2010 by the Institute of Electrical and Electronics E
9、ngineers, Inc. All rights reserved. Published 16 March 2010. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyrigh
10、t Clearance Center. Introduction This introduction is not part of IEEE Std C95.1a-2010, IEEE Standard for Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields, 3 kHz to 300 GHzAmendment 1: Specifies Ceiling Limits for Induced and Contact Current, Clarifies Distincti
11、ons between Localized Exposure and Spatial Peak Power Density. IEEE Std C95.1-2005 was approved by the IEEE-SA Standards Board on 3 October 2005. During final pre-publication review, questions were raised by the TC95/SC4 Editorial Working Group regarding possible confusion by readers, concerning use
12、 of the terms localized exposure and spatial peak power density, which could not be clarified by simple editorial changes. Moreover, after publication it was discovered that ceiling values for induced and contact currents that appeared in the 1999 edition of IEEE Std C95.1 were inadvertently not inc
13、luded in IEEE Std C95.1-2005. This amendment clarifies the distinctions between localized exposure and spatial peak power density, specifies ceiling values for induced and contact currents, and clarifies other technical issues identified subsequent to publication of IEEE Std C95.1-2005. Notice to us
14、ers Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the ap
15、plicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide varie
16、ty of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private use
17、rs, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigen
18、da, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance
19、 of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IE
20、EE-SA web site at http:/standards.ieee.org. iv Copyright 2010 IEEE. All rights reserved. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata pe
21、riodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publi
22、cation of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of
23、Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any
24、 patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. v Copyright 2010 IEEE. All rights reserved. vi Copyright 2010 IEEE. All rights reserved. Participants At the time this amendment
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