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    IEEE C95 1A-2010 en Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields 3 kHz to 300 GHz Amendment 1 Specifies Ceiling Limits.pdf

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    IEEE C95 1A-2010 en Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields 3 kHz to 300 GHz Amendment 1 Specifies Ceiling Limits.pdf

    1、g44g40g40g40g3g54g87g71g3g38g28g24g17g20g68g140g16g21g19g20g19g3g11g36g80g72g81g71g80g72g81g87g3g87g82g44g40g40g40g3g54g87g71g3g38g28g24g17g20g140g16g21g19g19g24g12g44g40g40g40g3g54g87g68g81g71g68g85g71g3g73g82g85g3g54g68g73g72g87g92g3g47g72g89g72g79g86g3g90g76g87g75g53g72g86g83g72g70g87g3g87g82g3g4

    2、3g88g80g68g81g3g40g91g83g82g86g88g85g72g3g87g82g3g53g68g71g76g82g41g85g72g84g88g72g81g70g92g3g40g79g72g70g87g85g82g80g68g74g81g72g87g76g70g3g41g76g72g79g71g86g15g22g3g78g43g93g3g87g82g3g22g19g19g3g42g43g93g36g80g72g81g71g80g72g81g87g3g20g29g3g54g83g72g70g76g191g72g86g3g38g72g76g79g76g81g74g47g76g80g

    3、76g87g86g3g73g82g85g3g44g81g71g88g70g72g71g3g68g81g71g3g38g82g81g87g68g70g87g38g88g85g85g72g81g87g15g3g38g79g68g85g76g191g72g86g3g39g76g86g87g76g81g70g87g76g82g81g86g69g72g87g90g72g72g81g3g47g82g70g68g79g76g93g72g71g3g40g91g83g82g86g88g85g72g3g68g81g71g54g83g68g87g76g68g79g3g51g72g68g78g3g51g82g90g7

    4、2g85g3g39g72g81g86g76g87g92g44g40g40g40g3g54g87g68g81g71g68g85g71g86g3g38g82g82g85g71g76g81g68g87g76g81g74g3g38g82g80g80g76g87g87g72g72g3g22g28g54g83g82g81g86g82g85g72g71g3g69g92g3g87g75g72g44g40g40g40g3g44g81g87g72g85g81g68g87g76g82g81g68g79g3g38g82g80g80g76g87g87g72g72g3g82g81g3g40g79g72g70g87g85g

    5、82g80g68g74g81g72g87g76g70g3g54g68g73g72g87g92g44g40g40g40g22g3g51g68g85g78g3g36g89g72g81g88g72g3g49g72g90g3g60g82g85g78g15g3g49g60g3g20g19g19g20g25g16g24g28g28g26g15g3g56g54g36g3g3g20g25g3g48g68g85g70g75g3g21g19g20g19g38g28g24g17g20g68g55g48IEEE Std C95.1a-2010 (Amendment to IEEE Std C95.1-2005) IE

    6、EE Standard for Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields, 3 kHz to 300 GHz Amendment 1: Specifies Ceiling Limits for Induced and Contact Current, Clarifies Distinctions between Localized Exposure and Spatial Peak Power Density Sponsor IEEE International

    7、Committee on Electromagnetic Safety Approved 2 February 2010 IEEE-SA Standards Board Abstract: Ceiling values for induced and contact current requirements are specified, and distinctions between localized exposure and spatial peak power density are clarified in this amendment. Keywords: human exposu

    8、re RF energy, localized exposure, spatial peak power density, radio frequency (RF) safety levels, RF induced and contact current g120The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2010 by the Institute of Electrical and Electronics E

    9、ngineers, Inc. All rights reserved. Published 16 March 2010. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyrigh

    10、t Clearance Center. Introduction This introduction is not part of IEEE Std C95.1a-2010, IEEE Standard for Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields, 3 kHz to 300 GHzAmendment 1: Specifies Ceiling Limits for Induced and Contact Current, Clarifies Distincti

    11、ons between Localized Exposure and Spatial Peak Power Density. IEEE Std C95.1-2005 was approved by the IEEE-SA Standards Board on 3 October 2005. During final pre-publication review, questions were raised by the TC95/SC4 Editorial Working Group regarding possible confusion by readers, concerning use

    12、 of the terms localized exposure and spatial peak power density, which could not be clarified by simple editorial changes. Moreover, after publication it was discovered that ceiling values for induced and contact currents that appeared in the 1999 edition of IEEE Std C95.1 were inadvertently not inc

    13、luded in IEEE Std C95.1-2005. This amendment clarifies the distinctions between localized exposure and spatial peak power density, specifies ceiling values for induced and contact currents, and clarifies other technical issues identified subsequent to publication of IEEE Std C95.1-2005. Notice to us

    14、ers Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the ap

    15、plicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide varie

    16、ty of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private use

    17、rs, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigen

    18、da, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance

    19、 of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IE

    20、EE-SA web site at http:/standards.ieee.org. iv Copyright 2010 IEEE. All rights reserved. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata pe

    21、riodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publi

    22、cation of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of

    23、Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any

    24、 patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. v Copyright 2010 IEEE. All rights reserved. vi Copyright 2010 IEEE. All rights reserved. Participants At the time this amendment

    25、 was submitted to the IEEE-SA Standards Board for approval, the Amendment Working Group of Subcommittee 4 (Safety Levels with Respect to Human Exposure, 3 kHz to 300 GHz), IEEE ICES Technical Committee 95, had the following membership: Artnarong Thansandote, Co-Chair Marvin Ziskin, Co-Chair Ronald C

    26、. Petersen, Secretary David Baron David R. Black Dennis Blick Jerrold T. Bushberg Philip Chadwick Chung-Kwang Chou Robert F. Cleveland Jules Cohen Robert A. Curtis John A. DAndrea John J. DeFrank David Dini Amnon Y. Duvdevany Joe A. Elder Kenneth R. Foster Kenneth Gettman Donald L. Haes, Jr. Wayne H

    27、ammer Tim Harrington Masateru Ikehata Kenneth H. Joyner Efthymios Karabetsos B. Jon Klauenberg Sakari Lang Ed Mantiply Michael R. Murphy Robert I. Needy John M. Osepchuk Malcolm Packer J. Patrick Reilly William Roach Veli Santomaa Asher R. Sheppard Mays L. Swicord Richard A. Tell Thomas Tenforde Pau

    28、l A. Testagrossa Santi Tofani Arthur G. Varanelli Robert D. Weller The following members of the individual balloting committee voted on this amendment. Balloters may have voted for approval, disapproval, or abstention. Max Ammann Ali Al Awazi William Bailey David Baron Howard Bassen H. Stephen Berge

    29、r David R. Black Ralf Bodemann Ian Brooker William Bush William Byrd Chung-Kwang Chou Keith Chow Robert F. Cleveland David Cotton Brian Cramer Robert A. Curtis John A. DAndrea John J. DeFrank David A. Dini Carlo Donati Randall Dotson Thanh Dovan Gregor Durrenberger Linda Erdreich George Filippopoulo

    30、s Kenneth R. Foster Kurt Geber Kenneth Gettman Randall Groves Donald L. Haes, Jr. Konstantinos Halkiotis Edward Hare James Hatfield Werner Hoelzl Masateru Ikehata Kenneth H. Joyner Efthymios Karabetsos B. Jon Klauenberg Joseph L. Koepfinger Sakari Lang William Lumpkins G. Luri Wade Midkiff Noel Mont

    31、gomery Michael R. Murphy Robert I. Needy Michael S. Newman John M. Osepchuk Chris Osterloh Malcolm Packer Allan St. Peter Ronald C. Petersen Percy Pool Robert Resuali Markus Riederer William Roach Brad Roberts Michael Roberts Stephen Rodick Ervin Root Bartien Sayogo Asher R. Sheppard Gil Shultz Jame

    32、s E. Smith Walter Struppler Richard A. Tell Paul A. Testagrossa Artnarong Thansandote Donald Umbdenstock Eric van Rongen Arthur G. Varanelli Robert D. Weller Marvin Ziskin When the IEEE-SA Standards Board approved this amendment on 2 February 2010, it had the following membership: Robert M. Grow, Ch

    33、air Thomas Prevost, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary John Barr Karen Bartleson Victor Berman Ted Burse Richard DeBlasio Andy Drozd Mark Epstein Alexander Gelman Jim Hughes Richard H. Hulett Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Ted Olsen Glenn Pa

    34、rsons Ronald C. Petersen Narayanan Ramachandran Jon Walter Rosdahl Sam Sciacca *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Howard L. Wolfman, TAB Representative Michael Janezic, NIST Representative Satish K. Aggarwal, NRC Representative Lisa Perry IEE

    35、E Standards Program Manager, Document Development Malia Zaman IEEE Standards Program Manager, Technical Program Development vii Copyright 2010 IEEE. All rights reserved. Contents 3. Definitions, acronyms, abbreviations, and letter symbols 2 3.1 Definitions . 2 4. Recommendations 2 4.1 Basic restrict

    36、ions (BRs) and maximum permissible exposures (MPEs) for frequencies between 3 kHz and 5 MHz. 2 4.2 BRs and MPEs for frequencies between 100 kHz and 3 GHz. 3 4.4 MPEs for frequencies between 100 kHz and 300 GHz . 4 4.6 Relaxation of the Spatial peak power density MPEs for localized exposures . 5 Anne

    37、x C (informative) Rationale . 6 Annex D (informative) Practical applicationsexamples . 8 viii Copyright 2010 IEEE. All rights reserved. IEEE Standard for Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields, 3 kHz to 300 GHz Amendment 1: Specifies Ceiling Limits for

    38、 Induced and Contact Current, Clarifies Distinctions between Localized Exposure and Spatial Peak Power Density IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental protection in all circumstances. Implementers of the standard are responsible for determ

    39、ining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found unde

    40、r the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. NOTEThe editing instructions contained in this amendment define how to merge the material cont

    41、ained herein into the existing base standard and its amendments to form the comprehensive standard.1The editing instructions are shown in bold italic. Four editing instructions are used: change, delete, insert, and replace. Change is used to make corrections in existing text or tables. The editing i

    42、nstruction specifies the location of the change and describes what is being changed by using strikethrough (to remove old material) and underscore (to add new material). Delete removes existing material. Insert adds new material without disturbing the existing material. Insertions may require renumb

    43、ering. If so, renumbering instructions are given in the editing instructions. Replace is used to make changes in figures or equations by removing the existing figure or equation and replacing it with a new one. Editing instructions, change markings, and this NOTE will not be carried over into future

    44、 editions because the changes will be incorporated into the base standard. 1Notes in text, tables, and figures are given for information only and do not contain requirements needed to implement the standard. 1 Copyright 2010 IEEE. All rights reserved. IEEE Std C95.1a-2010 IEEE Standard for Safety Le

    45、vels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields, 3 kHz to 300 GHzAmendment 1: Specifies Ceiling Limits for Induced and Contact Current, Clarifies Distinctions between Localized Exposure and Spatial Peak Power Density 2 Copyright 2010 IEEE. All rights reserved. 3. Defini

    46、tions, acronyms, abbreviations, and letter symbols 3.1 Definitions Replace 3.1.33 with the following: 3.1.33 localized exposure: Exposure of only a portion of the body. See also: RF hot spot. Replace 3.1.58 with the following: 3.1.58 RF hot spot: A highly localized area of relatively more intense RF

    47、 energy that manifests itself in two principal ways: 1) Near an unpowered conductive object that becomes a source of intense electric or magnetic fields (often referred to as re-radiation) and is surrounded by ambient fields of lower field strength, 2) From reflections and/or narrow beams produced b

    48、y high-gain radiating antennas or other highly directional sources. In both cases, there are usually rapid changes in field strength over distances that are small with respect to the exposed object (the body or body part) and wavelength. RF hot spots are normally associated with non-uniform exposure

    49、 of the body (localized exposure). Such non-uniformity does not necessarily cause, and is not to be confused with, an actual thermal hot spot within the absorbing body. 4. Recommendations 4.1 Basic restrictions (BRs) and maximum permissible exposures (MPEs) for frequencies between 3 kHz and 5 MHz 4.1.3 MPE for the external electric field Change the heading of 4.1.3.2 as follows: 4.1.3.2 Exposure to Non-uniform non-uniform or localized exposure to sinusoidal electric fields IEEE Std C95.1a-2010 IEEE Standard for Safety Levels with Respect to Human Exposure to Radio


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