IEEE C57 17-2012 en Requirements for Arc Furnace Transformers《电弧炉变压器用IEEE标准要求》.pdf
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1、 IEEE Standard Requirements for Arc Furnace Transformers Sponsored by the Transformers Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 7 February 2013 IEEE Power and Energy Society IEEE Std C57.17-2012 IEEE Std C57.17-2012 IEEE Standard Requirements for Arc Furnace Transformers Sponsor Tran
2、sformers Committee of the IEEE Power and Energy Society Approved 5 December 2012 IEEE-SA Standards Board Abstract: The electrical characteristics and mechanical features of liquid-immersed transformers 69 kV or less (but not limited to 69 kV), used for supplying electric power to direct arc-melting
3、furnaces are covered in this standard. Keywords: capacitors, electric arc furnace transformer, IEEE C57.17, low voltage terminal construction, RC circuits, reignitions, restrikes, supplementary reactor (use of) The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 1
4、0016-5997, USA Copyright 2013 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 7 February 2013. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual
5、standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright 2013 IEEE. All rights reserved. iv Notice to users Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions o
6、f any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not
7、in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private se
8、lf-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE Standards
9、 documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document
10、together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/standards.ieee.org/index.html or con
11、tact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be accessed at the following
12、URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Copyright 2013 IEEE. All rights reserved. v Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by paten
13、t rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is lis
14、ted on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are d
15、emonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducti
16、ng inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly
17、 advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2013 IEEE. All rights reserved. viParticipants At the time this IEEE
18、 standard was completed, the Power Transformers Arc Furnace Transformer Requirements Working Group had the following membership: Robert G. Ganser, Sr., Chair Dominic Corsi, Past Chair Robert G. Ganser, Jr., Secretary William Bartley William Boettger Frank DiAmico Dieter Dohnal Eduardo Garcia Peter H
19、einzig Sheldon Kennedy Thomas Lundquist Ugo Piovan Joe Rachford Dave Wiegand The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Peter Balma Wallace Binder Thomas Blackburn W Boettger Paul Boman Willia
20、m Bush Paul Cardinal Bill Chiu John Crouse Dieter Dohnal Gary Donner Gary Engmann Jorge Fernandez Daher Joseph Foldi Marcel Fortin Robert Ganser David Gilmer Jalal Gohari Randall Groves David Harris Timothy Hayden Roger Hayes Jeffrey Helzer Gary Heuston Gael Kennedy Sheldon Kennedy Joseph L. Koepfin
21、ger Jim Kulchisky Saumen Kundu John Lackey Chung-Yiu Lam Stephen Lambert Thomas Lundquist Greg Luri Richard Marek J.Dennis Marlow Daniel Mulkey Ryan Musgrove K. R. M. Nair Michael S. Newman Lorraine Padden Bansi Patel Ugo Piovan Alvaro Portillo Reynaldo Ramos John Roach Michael Roberts Oleg Roizman
22、Marnie Roussell Dinesh Sankarakurup Bartien Sayogo Hyeong Sim James Smith Jerry Smith Gary Stoedter David Tepen John Vergis Jane Verner Kenneth White Matthew Wilkowski James Wilson Jian Yu Copyright 2013 IEEE. All rights reserved. vii When the IEEE-SA Standards Board approved this standard on 5 Dece
23、mber 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past Chair Konstantinos Karachalios, Secretary Satish Aggarwal Masayuki Ariyoshi Peter Balma William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz J
24、im Hughes Joseph L. Koepfinger* David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosdahl Sam Sciacca Mike Seavey Yatin Trivedi Phil Winston Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE
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