IEEE C135 64-2012 en Guide for Slip and Pull-Out Strength Testing of Bolted Dead End Strain Clamps《用螺栓栓至尽头的应变夹的滑动和拔出强度测试用IEEE指南》.pdf
《IEEE C135 64-2012 en Guide for Slip and Pull-Out Strength Testing of Bolted Dead End Strain Clamps《用螺栓栓至尽头的应变夹的滑动和拔出强度测试用IEEE指南》.pdf》由会员分享,可在线阅读,更多相关《IEEE C135 64-2012 en Guide for Slip and Pull-Out Strength Testing of Bolted Dead End Strain Clamps《用螺栓栓至尽头的应变夹的滑动和拔出强度测试用IEEE指南》.pdf(18页珍藏版)》请在麦多课文档分享上搜索。
1、 IEEE Guide for Slip and Pull-OutStrength Testing of Bolted Dead End Strain Clamps Sponsored by the Transmission and Distribution Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 8 June 2012 IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for education
2、al classroom use can also be obtained through the Copyright Clearance Center. Copyright 2012 IEEE. All rights reserved. ivNotice to users Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards do
3、cument does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with appl
4、icable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standard
5、ization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE Standards documents should be aw
6、are that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amend
7、ments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/standards.ieee.org/index.html or contact the IEEE at the ad
8、dress listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ie
9、ee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by
10、the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/p
11、atcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desirin
12、g to obtain such licenses. Copyright 2012 IEEE. All rights reserved. vEssential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the le
13、gal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determinat
14、ion of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2012 IEEE. All rights reserved. viParticipants At the time this IEEE guide was completed, th
15、e Overhead Line Structural, Materials, and Hardware Working Group had the following membership: Keith E. Lindsey, Chair Thomas McCarthy, Vice Chair Dick Aichinger Mehmet Arslan Gordon Baker Tony Baker Yair Berenstein Allen Bernstorf Nelson G. Bingel, III Tom Bozeman Derrick Bradstreet Michael Brucat
16、o Dave Bryant Bill Calhoun Steve Casteel John Chan Neal Chapman Jerry Cheeks Allen Clapp Eric Cleckley Mike Clodfelder Rich Collins Len Consalvo Lena Cordell Glenn Davidson Mike DellaVecchia Nicholas DeSantis Tony DiGioia Corrine Dimnik Keith E. Dinsmore Seydou Diop Doug Dodson Michael Dolan Dennis
17、Doss Michael Fick Alan Fleissner Bruce Freimark Ross Gableman Michael Garrels Jeff Giffen Kyle Gilbreath Erich Gnandt Waymon Goch Tom Grisham Asim Haldar Joe Hallman Bryan Hanft Doug Harms Linda Harrison Steve Harrison Ibrahim Hathout Jennifer Havel Donald G. Heald Randy Hopkins Michael Hudgens Magd
18、i F. Ishac Mark Isom Arjan Jagtiani Doug Jones Jacob Joplin Mark Jurgemeyer Peter Kapinos Tim Kautz Kenneth Keller Robert Kluge Samy Krishnasamy Brian Lacoursiere Hong-To Lam Ling Lan-Ping Jim Larkey Ming Lu Otto Lynch Gary McAllister Ray McCoy Casey Miller Steven Miller May Millies Robert J. Millie
19、s Scott Monroe Roger Montambo George B. Niles Juan Nuo John J. Olenik Carl Orde Bob Oswald Mohammad Pasha Jason Payne Chad Pederson Robert Peters Douglas Proctor Brian Reed Rafael Rios Jack Roughan Karen Rowe Ron Rowland Robert Santarsiero Brian Share David Shibilia Ross Smith Steve Smith Brent Smol
20、arek Paul Springer Eric Stemshorn Andrew H. Stewart Carl R. Tamm Phu Trac Vinh N. Tran Larry Vandergriend Jack Varner Bruce Vaughn Jeff Wang Nathan Washburn Ed West Bob Whophom Dan Wycklendt Nancy Zhu The following members of the individual balloting committee voted on this guide. Balloters may have
21、 voted for approval, disapproval, or abstention. Saleman Alibhay Harvey Bowles William Byrd James Chapman Robert Christman Glenn Davidson Gary Donner Randall Dotson Gary Engmann Fredric Friend David Gilmer Waymon Goch Edwin Goodwin Randall Groves Jeffery Helzer Lee Herron Werner Hoelzl Magdi F. Isha
22、c Gael Kennedy Robert Kluge Joseph L. Koepfinger Copyright 2012 IEEE. All rights reserved. viiJim Kulchisky Chung-Yiu Lam Keith E. Lindsey William McBride Thomas McCarthy Arthur Neubauer Michael S. Newman Carl Orde Lorraine Padden Bansi Patel Robert Peters Douglas Proctor Keith Reese Michael Roberts
23、 Stephen Rodick Bartien Sayogo Jerry Smith Gary Stoedter John Toth John Vergis When the IEEE-SA Standards Board approved this guide on 14 May 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past President Satish Aggarwal Masayuki Ariyoshi Peter
24、 Balma William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosdahl Mike Seavey Yatin Trivedi Phil Winston Yu Yua
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