1、 IEEE Guide for Slip and Pull-OutStrength Testing of Bolted Dead End Strain Clamps Sponsored by the Transmission and Distribution Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 8 June 2012 IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for education
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9、ee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by
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12、g to obtain such licenses. Copyright 2012 IEEE. All rights reserved. vEssential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the le
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14、ion of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2012 IEEE. All rights reserved. viParticipants At the time this IEEE guide was completed, th
15、e Overhead Line Structural, Materials, and Hardware Working Group had the following membership: Keith E. Lindsey, Chair Thomas McCarthy, Vice Chair Dick Aichinger Mehmet Arslan Gordon Baker Tony Baker Yair Berenstein Allen Bernstorf Nelson G. Bingel, III Tom Bozeman Derrick Bradstreet Michael Brucat
16、o Dave Bryant Bill Calhoun Steve Casteel John Chan Neal Chapman Jerry Cheeks Allen Clapp Eric Cleckley Mike Clodfelder Rich Collins Len Consalvo Lena Cordell Glenn Davidson Mike DellaVecchia Nicholas DeSantis Tony DiGioia Corrine Dimnik Keith E. Dinsmore Seydou Diop Doug Dodson Michael Dolan Dennis
17、Doss Michael Fick Alan Fleissner Bruce Freimark Ross Gableman Michael Garrels Jeff Giffen Kyle Gilbreath Erich Gnandt Waymon Goch Tom Grisham Asim Haldar Joe Hallman Bryan Hanft Doug Harms Linda Harrison Steve Harrison Ibrahim Hathout Jennifer Havel Donald G. Heald Randy Hopkins Michael Hudgens Magd
18、i F. Ishac Mark Isom Arjan Jagtiani Doug Jones Jacob Joplin Mark Jurgemeyer Peter Kapinos Tim Kautz Kenneth Keller Robert Kluge Samy Krishnasamy Brian Lacoursiere Hong-To Lam Ling Lan-Ping Jim Larkey Ming Lu Otto Lynch Gary McAllister Ray McCoy Casey Miller Steven Miller May Millies Robert J. Millie
19、s Scott Monroe Roger Montambo George B. Niles Juan Nuo John J. Olenik Carl Orde Bob Oswald Mohammad Pasha Jason Payne Chad Pederson Robert Peters Douglas Proctor Brian Reed Rafael Rios Jack Roughan Karen Rowe Ron Rowland Robert Santarsiero Brian Share David Shibilia Ross Smith Steve Smith Brent Smol
20、arek Paul Springer Eric Stemshorn Andrew H. Stewart Carl R. Tamm Phu Trac Vinh N. Tran Larry Vandergriend Jack Varner Bruce Vaughn Jeff Wang Nathan Washburn Ed West Bob Whophom Dan Wycklendt Nancy Zhu The following members of the individual balloting committee voted on this guide. Balloters may have
21、 voted for approval, disapproval, or abstention. Saleman Alibhay Harvey Bowles William Byrd James Chapman Robert Christman Glenn Davidson Gary Donner Randall Dotson Gary Engmann Fredric Friend David Gilmer Waymon Goch Edwin Goodwin Randall Groves Jeffery Helzer Lee Herron Werner Hoelzl Magdi F. Isha
22、c Gael Kennedy Robert Kluge Joseph L. Koepfinger Copyright 2012 IEEE. All rights reserved. viiJim Kulchisky Chung-Yiu Lam Keith E. Lindsey William McBride Thomas McCarthy Arthur Neubauer Michael S. Newman Carl Orde Lorraine Padden Bansi Patel Robert Peters Douglas Proctor Keith Reese Michael Roberts
23、 Stephen Rodick Bartien Sayogo Jerry Smith Gary Stoedter John Toth John Vergis When the IEEE-SA Standards Board approved this guide on 14 May 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past President Satish Aggarwal Masayuki Ariyoshi Peter
24、 Balma William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosdahl Mike Seavey Yatin Trivedi Phil Winston Yu Yua
25、n *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Julie Alessi IEEE Standards Program Manager, Document Development Erin Spiewak IEEE Standards Program Manager, Technical Program De
26、velopment Copyright 2012 IEEE. All rights reserved. viiiIntroduction This introduction is not part of IEEE Std C135.64-2012, IEEE Guide for Slip and Pull-Out Strength Testing of Bolted Dead End Strain Clamps. The purpose of this guide is to provide a repeatable and standardized methodology for perfo
27、rming mechanical slip and pull-out strength testing for a bolted dead end clamp and a conductor combination. A bolted dead end clamp and a conductor combination tested in accordance with this guide should give reasonable assurance to the user that the clamp and conductor combination will perform in
28、a satisfactory manner, provided they have been installed in accordance with the manufacturers recommendations. Copyright 2012 IEEE. All rights reserved. ixContents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 1.3 Application 2 2. Normative references 2 3. Definitions 2 4. Performance criteria . 3 5. Te
29、st preparation 3 5.1 Sample size 3 5.2 Sample preparation 3 5.3 Test procedure . 4 5.4 Suspension clamp slip testing 4 6. Test and test reports 5 7. Modifications 6 Copyright 2012 IEEE. All rights reserved. 1IEEE Guide for Slip and Pull-Out Strength Testing of Bolted Dead End Strain Clamps IMPORTANT
30、 NOTICE: IEEE Standards documents are not intended to ensure safety, health, or environmental protection, or ensure against interference with or from other devices or networks. Implementers of IEEE Standards documents are responsible for determining and complying with all appropriate safety, securit
31、y, environmental, health, and interference protection practices and all applicable laws and regulations. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found
32、 under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This guide defines testing procedures for the slip and pull-out str
33、ength testing of bolted dead end strain clamps for use on transmission and distribution lines. This guide covers initial certification testing. For routine acceptance testing, refer to IEEE Std C135.61TM.11.2 Purpose The purpose of this guide is to provide a repeatable and standardized methodology f
34、or performing mechanical slip and pull-out strength testing for a bolted dead end clamp and conductor combination. A bolted dead end clamp and conductor combination tested in accordance with this guide should give reasonable assurance to the user that the clamp and conductor combination will perform
35、 in a satisfactory manner, provided they have been installed in accordance with the manufacturers recommendations. 1Information on references can be found in Clause 2. IEEE Std C135.64-2012 IEEE Guide for Slip and Pull-Out Strength Testing of Bolted Dead End Strain Clamps Copyright 2012 IEEE. All ri
36、ghts reserved. 21.3 Application Due to the large variety of transmission and distribution conductors (i.e., ACSR, ACSS, AAAC, AAC, Smooth Bodied Compacted Conductor, Greased Conductor, etc. galvanized or aluminum clad steel earthwire), it is not prudent to expect a bolted dead end clamp designed and
37、 tested to hold a certain percentage of ultimate tensile strength (UTS) of one type and stranding of conductor, to be capable of holding the same percent UTS of another conductor, even though the conductor fits within the clamp diameter range. On transmission or distribution lines where a bolted dea
38、d end clamp may be expected to hold close to the UTS of the conductor (e.g., 95%), the user may wish to certify the combination of clamp and conductor. On high ampacity distribution lines where the UTS of a larger conductor may greatly exceed design strength requirements, the user may only need, or
39、have room for, a smaller or in-line dead end clamp (e.g., with a 60% UTS). Again, the user may wish to certify the combination of clamp and conductor meets this requirement. This guide can also be used to certify the minimum slip strength of suspension clamps. It is expected that the user will selec
40、t and use suitable safety factors in applying these clamps based on experience and knowledge of applicable codes, standards, and the environment and materials involved. 2. Normative references The following referenced documents are indispensable for the application of this document (i.e., they must
41、be understood and used, so each referenced document is cited in text and its relationship to this document is explained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. ANSI
42、 C119.4, American National Standard for Electric Connectors, Connectors to Use Between Aluminum-to-Aluminum or Aluminum-to-Copper Bare Overhead Conductors.2IEEE Std C135.61, Standard for Testing of Overhead Transmission and Distribution Line Hardware.33. Definitions For the purposes of this document
43、, the following terms and definitions apply. The IEEE Standards Dictionary: Glossary of Terms and Definitions4should be consulted for terms not defined in this clause. non-conforming part: Any unit of product which falls below its specified rated strength (ultimate tensile, slip, or pull-out) during
44、 testing. pull-out strength: The applied tensile load at which strand breakage occurs or the conductor slides freely through the clamp with no further increase in applied tensile load. sample: Specimens are selected by the manufacturer as being representative of a homogeneous population and are repr
45、esentative of those which will be in production. 2ANSI publications are available from the Sales Department, American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA (http:/www.ansi.org/). 3IEEE publications are available from The Institute of Electrical and Ele
46、ctronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards.ieee.org/). 4IEEE Standards Dictionary: Glossary of Terms and Definitions is available at http:/shop.ieee.org. IEEE Std C135.64-2012 IEEE Guide for Slip and Pull-Out Strength Testing of Bolted Dead End Strain Clamps Copyri
47、ght 2012 IEEE. All rights reserved. 3sample size: A minimum number of three conductor specimens and six dead end clamps are required for each test, although the manufacturer may elect to perform additional tests. slip strength: The applied tensile load that results in movement of the outer conductor
48、 strands from its original clamped position at the mouth of the clamp to the maximum allowable slip distance. The maximum slip distance shall not exceed one diameter of the conductor under test. ultimate body strength: The threshold load at which a component part of the bolted dead end strain clamp
49、fractures or otherwise fails when tested in a manner simulating the recommended application in service. 4. Performance criteria The slip and pull-out rating shall be evaluated per ANSI C119.4 and classified in accordance with a Class 1, 2, or 3. In addition, a Class 1A value of 60% of the conductor rated strength is to be used for clamps so designated by the manufacturer. See Table 1. Table 1 Nominal slip strength designation for bolted dead end strain clamp Class Slip strength % Designation 1 95% Full tension 1A 60% Normal tension 2 40% Partial tension 3 5%
