IEEE 960-1993 en Standard FASTBUS Modular High-Speed Data Acquisition and Control System (Includes IEEE 1177 1993)《FASTBUS模块化高速数据采集和控制系统》.pdf

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1、IEEE Std 960-1993(Revision of IEEE Std 960-1989)IEEE Std 1177-1993(Revision of IEEE Std 960-1989)960TMIEEE Standard FASTBUS Modular High-Speed Data Acquisition and ControlSystem1177TMIEEE FASTBUS Standard Routines3 Park Avenue, New York, NY 10016-5997, USAIEEE Nuclear and Plasma Sciences SocietySpon

2、sored by theNuclear Instruments and Detectors Committee29 October 2004Print: SH17046PDF: SS17046Recognized as anAmerican National Standard (ANSI)The Institute of Electrical and Electronics Engineers, Inc. 345 E. 47th Street, New York, NY 10017Copyright 1994 by The Institute of Electrical and Electro

3、nics Engineers, Inc. All Rights Reserved. Published 1994. Printed in the United States of America.ISBN 155937-396-2No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the priorwritten permission of the publisher.IEEE Std 960-1993(R2006)(

4、Revision of IEEE 960-1989)IEEE Standard FASTBUS Modular High-Speed Data Acquisition and Control SystemSponsor Nuclear Instruments and Detectors Committeeof theIEEE Nuclear and Plasma Sciences SocietyReaffirmed March 30, 2006Approved December 2, 1993IEEE-SA Standards BoardReaffirmed January 13, 2000A

5、pproved June 3, 1994American National Standards InstituteAbstract: Mechanical, signal electrical, and protocol specifications are given for a modular databus system, which, while allowing equipment designers a wide choice of solutions, ensurecompatibility of all designs that obey the mandatory parts

6、 of the specification. This standard appliesto systems consisting of modular electronic instrument units that process or transfer data or signals,normally in association with computers or other automatic data processors.Keywords: bus system, data acquisition, FASTBUSIEEE Standardsdocuments are devel

7、oped within the Technical Committees of the IEEE Societies and the StandardsCoordinating Committees of the IEEE Standards Board. Members of the committees serve voluntarily and withoutcompensation. They are not necessarily members of the Institute. The standards developed within IEEE represent acons

8、ensus of the broad expertise on the subject within the Institute as well as those activities outside of IEEE that haveexpressed an interest in participating in the development of the standard.Use of an IEEE Standard is wholly voluntary. The existence of an IEEE Standard does not imply that there are

9、 no otherways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEEStandard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to changebrought about through developments in the state of the art a

10、nd comments received from users of the standard. EveryIEEE Standard is subjected to review at least every ve years for revision or reafrmation. When a document is morethan ve years old and has not been reafrmed, it is reasonable to conclude that its contents, although still of somevalue, do not whol

11、ly reect the present state of the art. Users are cautioned to check to determine that they have thelatest edition of any IEEE Standard.Comments for revision of IEEE Standards are welcome from any interested party, regardless of membership afliationwith IEEE. Suggestions for changes in documents shou

12、ld be in the form of a proposed change of text, together withappropriate supporting comments.Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate tospecic applications. When the need for interpretations is brought to the attention of IEEE, t

13、he Institute will initiateaction to prepare appropriate responses. Since IEEE Standards represent a consensus of all concerned interests, it isimportant to ensure that any interpretation has also received the concurrence of a balance of interests. For this reasonIEEE and the members of its technical

14、 committees are not able to provide an instant response to interpretation requestsexcept in those cases where the matter has previously received formal consideration.Comments on standards and requests for interpretations should be addressed to:Secretary, IEEE Standards Board445 Hoes LaneP.O. Box 133

15、1Piscataway, NJ 08855-1331USAIEEE standards documents may involve the use of patented technology. Their approval by the Institute ofElectrical and Electronics Engineers does not mean that using such technology for the purpose of conforming tosuch standards is authorized by the patent owner. It is th

16、e obligation of the user of such technology to obtain allnecessary permissions.iiiIntroduction(This introduction is not part of IEEE Std 960-1993, IEEE Standard FASTBUS Modular High-Speed Data Acquisition and ControlSystem.)This standard is a revision of IEEE Std 960-1989 in that it incorporates the

17、 various addenda and errata that have beenissued based on operating experience. It denes a modular data-bus system for data acquisition and control.Mechanical, signal, electrical, and protocol specications are given that are sufcient to assure compatibility betweenunits from different sources of des

18、ign and production. This standard applies to systems consisting of modularelectronic instrument units that process or transfer data or signals, normally in association with computers or otherautomatic data processors.The system on which this standard is based (U.S. Department of Energy Report DOE/ER

19、-0189, as amended1) wasdeveloped by the NIM Committee2of the U.S. Department of Energy, consisting of representatives of the U.S.National Laboratories and other major laboratories. Representatives of the ESONE Committee of EuropeanLaboratories, as well as of individual European, Canadian, and Japane

20、se laboratories, have also contributed to thedevelopment of this standard.Secretary, IEEE Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAWhen the IEEE Standards Board approved this standard on December 2, 1993, it had the following membership:Wallace S. Read, Chair Donald C. Lo

21、ughry, Vice Chair Andrew G. Salem, Secretary Satish K. AggarwalGilles A. BarilJames BeallJose A. Berrios de la PazClyde R. CampRichard B. EngelmanDonald C. FleckensteinJulian Forster*David F. FranklinRamiro GarciaDonald N. HeirmanJim IsaakBen C. JohnsonWalter J. KarplusLorraine C. KevraE.G. KienerIv

22、or N. KnightJoseph L. Koepfinger*Demetrois N. LogothetisDonald C. LoughryDonald T. Michael*Marco W. MigliaroL. John RankineArthur K. ReillyRonald H. ReimerGary S. RobinsonDavid E. SoffrinLeonard L. TrippStanley WarshawDonald W. Zipse*Member Emeritus1Information on references can be found in clause 2

23、.6.2To keep advised of FASTBUS developments, interested parties should request that they be placed on the FASTBUS mailing list. Such requests,as well as any inquiries, comments or suggestions, should be addressed to Louis Costrell, Chairman, NIM Committee, Physics Laboratory, NationalInstitute of St

24、andards and Technology, Gaithersburg, MD 20899, USA.ivThis standard was reviewed and balloted by the Nuclear Instruments and Detectors Committee of the IEEE Nuclearand Plasma Sciences Society and by the American National Standards Committee on Nuclear instruments, N42. It hasalso been endorsed by th

25、e ESONE Committee of European Laboratories.At the time this standard was approved, the Nuclear Instruments and Detectors Committee of the IEEE Nuclear andPlasma Sciences Society had the following membership:Sanford Wagner, Chair Louis Costrell, Secretary David J. AllardMartin L. BauerJoseph G. Belli

26、anWilliam M. BuggChristopher CoxLarry DarkenW. Kenneth DawsonJohn DetkoEdward FairsteinFrederick S. GouldingRonald M. KeyserFrederick A. KirstenGlenn F. KnollHobart W. KranerG. Laurie MillerDennis E. PersykPaul L. PhelpsDonald E. StilwellKenneth L. SwinthJames H. TrainorMichael UnterwegerJohn Walter

27、At the time this standard was approved the American National Standard Committee on Nuclear Instruments had thefollowing representatives:Louis Costrell, Chair Luigi Napoli, Secretary American Conference of Governmental Industrial Hygenists .Jesse LiebermanHealth Physics Society J.B. Homer KuperJack M

28、. Selby (Alt)Institute of Electrical and Electronics Engineers .Louis CostrellJulian Forster (Alt)Anthony J. Spurgin (Alt)Lawrence Berkeley Laboratory Edward J. LampoLawrence Livermore National Laboratory Paul L. PhelpsNuclear Suppliers Association .VacantOak Ridge National Laboratory.Hugh R. Brashe

29、arPacic Northwest Laboratories Kenneth L. SwinthU.S. Department of the Army Edward GroeberU.S. Department of Commerce, NIST.Louis CostrellMichael Unterweger (Alt)U.S. Department of Energy, OHER/PCSRD Gerald GoldsteinU.S. Federal Emergency Management Agency Carl R. SiebentrittU.S. Nuclear Regulatory

30、Commission Edward C. Wenzinger, Sr.Individual Members . Joseph G. BellianErnesto A. CorteJohn M. GallagherJames E. McLaughlihJack M. SelbyEdward J. VallarioLee J. WagnerSanford WagnerOrganization Represented Name of RepresentativeNIM Committee MembershipArgonne National Laboratory John W. DawsonFran

31、k R. LenkszusStanley J. RudnickBrookhaven National Laboratory. John J. GouldLeo PaffrathEdward D. PlattnerSeymour RankowitzWilliam P. SimsCEBAF (Continuous Electron Beam Accelerator Facility) R. Roy WhitneyCERN European Organization for Nuclear Research.Phillip J. PontingHenk VerweijDepartment of En

32、ergy Environmental Measurement LaboratoryNorman LatnerVincent C. NegroFermi National Accelerator Laboratory Edward J. BarsottiThomas E. DroegeCordon KernsKathleen J. TurnerIllinois, University of .Robert W. DowningEdward J. LampoA.E. LarshStewart C. LokenLawrence Livermore National Laboratory. Rober

33、t C. LucenaDennis W. OBrienLos Alamos National Laboratory.Allan GjovigFrank NaivarRonald O. NelsonMichigan, University of Carl AkerlofDonald E. StilwellJames H. TrainorNational Institute of Standards and Technology Louis Costrell (Chairman)Michael UnterwegerNational Laboratory for High Energy Physic

34、s, Japan (KEK)Hirokazu IkedaNorthwestern University Bruno GobbiOak Ridge National Laboratory John A. BiggerstaffGerald K. SchulzeStanford Linear Accelerator Center . David B. GustavsonMichael HarmsDale HorelickPaul F. KunzHelmut V. WalzTRIUMF.W. Kenneth DawsonJohn V. CresswellYale University. Satish

35、 DhawanAt Large .Frederick A. KirstenDick A. MackLee J. WagnerLawrence Berkeley LaboratoryNational Aeronautics therefore the data may not be available for a retry. In order to assist inread error recovery a Protective Buffer may be implemented. The Protective Buffer always contains a copy of the dat

36、alast transferred to or from the SLAVE. Hence by accessing the optional Protective Buffer, a MASTER may reaccessdata after a Read error.1.2.2 Segment interconnectsA SEGMENT INTERCONNECT monitors the activity on the two SEGMENTS it connects, waiting for an address toappear which is in the set of addr

37、esses it has been programmed to recognize. It responds to a recognized addressasserted on one of the SEGMENTS (Near-side) by requesting use of the other SEGMENT (Far-side) and asserting thegiven address on that SEGMENT when it gains control. The two SEGMENTS remain locked together until theoperation

38、 is complete. The address asserted on the Far-side may, in turn, be recognized by another SEGMENTINTERCONNECT and may be passed to yet another SEGMENT. An arbitrary number of SEGMENTS can be linkedas needed for a given operation. The address contains all the information needed to direct the appropri

39、ate SIs to formthe correct connections.In order to use the address to provide the routing information in a practical way, the total address space available to thesystem is divided among the SEGMENTS in such a way that the most signicant bits of the address specify whichSEGMENT is addressed. This hig

40、h-order part of the address is called the GROUP ADDRESS (GP) eld. More thanone GROUP ADDRESS may be assigned to a SEGMENT to accommodate SEGMENTS containing DEVICES usinglarge amounts of address space. DEVICES on a SEGMENT are distinguished by the MODULE ADDRESS which isadjacent to the GP eld and ma

41、y include some of the low order GP eld bits. The combined GROUP and MODULEADDRESS elds form the DEVICE ADDRESS which serves to locate a DEVICE anywhere in the system. Theremaining (low-order) bits in the address, the INTERNAL ADDRESS FIELD, serve to specify a part or functionwithin the DEVICE. Becau

42、se of a special type of Data Cycle called the Secondary Address Cycle, the number ofdifferent parts or functions within a DEVICE that can be accessed is not limited to the number allowed by theINTERNAL ADDRESS FIELD.One simple implementation of the SI uses the high-order address bits to address an i

43、nternal memory that contains apattern indicating which addresses are to be passed. When the system is initialized, each SI memory is loaded with thepatterns needed to route all permitted operations correctly.8Copyright 1994 IEEE All Rights ReservedIEEE Std 960-1993 IEEE STANDARD FASTBUS MODULAR HIGH

44、-SPEEDWith this scheme, there are no restrictions on the kinds of interconnections that may be made between SEGMENTS.For example, they may be connected in a tree structure with a large computer at the trunk and data acquisitionDEVICES as the leaves. If a high trafc demand between two widely separate

45、d SEGMENTS causes excessive tie-upof the intermediate SEGMENTS, the two SEGMENTS can be directly linked by a SEGMENT INTERCONNECTthus bypassing the intermediate SEGMENTS. No DEVICE address changes are required because of this addition, andonce the route tables in the SIs are reinitialized to make us

46、e of the new route, the interfering trafc will disappear fromthe formerly intermediate SEGMENTS. Tree, star, and ring structures can all be accommodated by this scheme.When a MASTER initiates a FASTBUS operation it always starts an internal Response Timer set to time out at a timeappropriate for the

47、 SEGMENT on which it resides. If the operation has to pass through one or more SIs, the MASTERmust be made aware that additional delays will be encountered before a response is received. Any SI passing anoperation asserts WAIT (WT) on the SEGMENT from which the operation arrived and starts a timer s

48、uitable for theSEGMENT to which the operation is passed. The WT signal causes a MASTER (and the SI acts as a MASTER on theSEGMENT to which it passes an operation) to stop its timer. The timer is reinitialized when the WT signal is removed.In this way an operation can work its way through a system wi

49、thout causing timeouts to occur unless, of course, aSEGMENT is reached that neither gives a normal response nor asserts the WT signal. A Long Timer in each MASTERis used to detect deadlock situations that arise, for example, when conicting requests are placed upon resources. Aftera Long Timer timeout, a MASTER waits for a random Retry Period before again trying to complete the Operation.1.2.3 Control and status registersCertain registers and functions in DEVICES need to be separated in address space from the normal data registers in away that provide