IEEE 952-1997 en Specification Format Guide and Test Procedure for Single-Axis Interferometric Fiber Optic Gyros《单轴干涉仪式纤维光学旋转罗盘的标准格式指南和试验程序》.pdf

《IEEE 952-1997 en Specification Format Guide and Test Procedure for Single-Axis Interferometric Fiber Optic Gyros《单轴干涉仪式纤维光学旋转罗盘的标准格式指南和试验程序》.pdf》由会员分享，可在线阅读，更多相关《IEEE 952-1997 en Specification Format Guide and Test Procedure for Single-Axis Interferometric Fiber Optic Gyros《单轴干涉仪式纤维光学旋转罗盘的标准格式指南和试验程序》.pdf（83页珍藏版）》请在麦多课文档分享上搜索。

1、The Institute of Electrical and Electronics Engineers, Inc.345 East 47th, New York, NY 10017-2394, USACopyright 1998 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 1998. Printed in the United States of America.ISBN 1-55937-961-8No part of this publicatio

2、n may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.IEEE Std 952-1997 (R2008)IEEE Standard Specification Format Guide and Test Procedure for Single- Axis Interferometric Fiber OpticGyrosSponsorGyro and Accelerometer P

3、anelof theIEEE Aerospace and Electronic Systems SocietyReaffirmed 10 December 2008Approved 16 September 1997IEEE-SA Standards BoardAbstract: Specification and test requirements for a single-axis interferometric fiber optic gyro (IFOG)for use as a sensor in attitude control systems, angular displacem

4、ent measuring systems, and angular ratemeasuring systems are defined. A standard specification format guide for the preparation of a single-axis IFOGis provided. A compilation of recommended procedures for testing a fiber optic gyro, derived from those pres-ently used in the industry, is also provid

5、ed.Keywords: fiber gyro, fiber optic gyro, gyro, gyroscope, IFOG, inertial instrument, inertial sensor,interferometric fiber optic gyro, optical gyro, Sagnac effect, Sagnac gyroIEEE Standardsdocuments are developed within the IEEE Societies and the Standards Coordinat-ing Committees of the IEEE Stan

6、dards Board. Members of the committees serve voluntarily andwithout compensation. They are not necessarily members of the Institute. The standards developedwithin IEEE represent a consensus of the broad expertise on the subject within the Institute as wellas those activities outside of IEEE that hav

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13、ept in those cases where the matter has previously received formalconsideration. Comments on standards and requests for interpretations should be addressed to:Secretary, IEEE Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAAuthorization to photocopy portions of any individual st

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15、e, Danvers, MA 01923 USA;(508) 750-8400. Permission to photocopy portions of any individual standard for educational class-room use can also be obtained through the Copyright Clearance Center.Note: Attention is called to the possibility that implementation of this standard mayrequire use of subject

16、matter covered by patent rights. By publication of this standard,no position is taken with respect to the existence or validity of any patent rights inconnection therewith. The IEEE shall not be responsible for identifying patents forwhich a license may be required by an IEEE standard or for conduct

17、ing inquiries intothe legal validity or scope of those patents that are brought to its attention.Authorized licensed use limited to: IEEE Standards Staff. Downloaded on January 27, 2009 at 15:00 from IEEE Xplore. Restrictions apply.Copyright 1998 IEEE. All rights reserved.iiiIntroduction(This introd

18、uction is not a part of IEEE Std 952-1997, IEEE Standard Specication Format Guide and Test Procedure forSingle-Axis Interferometric Fiber Optic Gyros.)This standard was prepared by the Gyro and Accelerometer Panel of the IEEE Aerospace and ElectronicSystems Society and consists of two parts.Part I i

19、s a specication format guide for the preparation of a single-axis interferometric ber optic gyro(IFOG) specication. It provides a common meeting ground of terminology and practice for manufacturersand users. The user is cautioned not to over specify; only those parameters that are required to guaran

20、teeproper instrument performance in the specic application should be controlled. In general, the specicationshould contain only those requirements that can be veried by test or inspection. Parameters in addition tothose given in this standard are not precluded.Part II is a compilation of recommended

21、 procedures for testing a single-axis IFOG. These procedures,including test conditions to be considered, are derived from those currently in use. For a specic application,the test procedure should reect the requirements of the specications; therefore, not all tests outlined in thisstandard need to b

22、e included, nor are additional tests precluded. In some cases, alternative methods for mea-suring performance characteristics have been included or indicated.The intent is for the specication writer to extract the applicable test conditions and equipment requirementsfrom Clause 11 for inclusion in t

23、he appropriate subclauses listed under 6.5. Similarly, it is intended that thewriter extract the applicable test procedures from Clause 12 for inclusion in the appropriate subclauses listedunder 6.6. Part II can also be used as a guide in the preparation of a separate gyro test specication withappro

24、priate clause numbering. In general, the intent is for the Part II test procedure to refer to Part I require-ments for performance, mechanical, electrical, environmental, reliability, and quality assurance. To that end,a test should not be listed in Part II unless a related requirement exists in Par

25、t I.Blank spaces in the text of this standard permit the specication writer to insert specic information such asparameter values and their tolerances, clause numbers, etc. Brackets are to be used to enclose alternativechoices of dimensional units, signs, axes, etc. Boxed statements are included for

26、information only and arenot part of the specication or test procedures. The terminology used conforms to IEEE Std 100-1996 andIEEE Std 528-1994. The units used conform to ANSI 268-1992. The abbreviation of units conforms to IEEEStd 260.1-1993. The graphic symbols used conform to IEEE Std 315-1975.Th

27、is standard denes the requirements and test procedures for an IFOG in terms unique to that gyro. Therequirements contained in this standard cover application where the gyro is used as an angular motion sensorin navigation and control systems.The term interferometric ber optic gyro is accepted to inc

28、lude the electronics necessary to operate thegyro and to condition the output signal. Annex A lists various gyro design features for which this format is applicable. The table therein is notintended to make any suggestions regarding the selection of particular design features that might restrict the

29、free choice of manufacturers.Annex B is an overview of dynamic and stochastic modeling.Annex C is an overview of noise process variance analysis as a method for determination of the drift ratecoefcients and the quantization coefcient.Authorized licensed use limited to: IEEE Standards Staff. Download

30、ed on January 27, 2009 at 15:00 from IEEE Xplore. Restrictions apply.ivCopyright 1998 IEEE. All rights reserved.This standard represents a large scale, group effort. More than 116 individuals attended over 40 meetings ofthe Gyro and Accelerometer Panel during preparation of this standard. The follow

31、ing persons were on theGyro and Accelerometer Panel:S. Bennett,Chair*Former ChairThe following persons were on the balloting committee:When the IEEE Standards Board approved this standard on 16 September 1997, it had the followingmembership:Donald C. Loughry,ChairRichard J. Holleman,Vice ChairAndrew

32、 G. Salem,Secretary*Member EmeritusAlso included are the following nonvoting IEEE Standards Board liaisons:Satish K. AggarwalAlan H. CooksonKim BreitfelderIEEE Standards Project EditorD. AndersonM. AshC. BarkerJ. BeriS. BongiovanniP. BouniolJ. BrewerH. CalifanoA. Campbell*J. DAngeloG. EricksonJ. Fic

33、aloraS. FinkenT. FuhrmanF. GarciaB. KatzJ. KiefferM. KoningL. KumarK. LantzT. Lear*D. LynchR. MarquessH. MorrisG. Morrison*R. MorrowG. Murray*J. NeugroschiR. Peters*L. RichardsonG. ShawP. SimpsonT. StanleyC. SwansonL. ThielmanL. TrozpekB. Wimber*B. YoumansD. AndersonW. ArmstrongM. AshC. BarkerS. Ben

34、nettS. BongiovanniP. BouniolJ. BrewerH. CalifanoA. CampbellJ. DAngeloG. EricksonS. FinkenT. FuhrmanK. HombB. KatzJ. KiefferL. KumarJ. MackintoshE. MettlerH. MorrisG. MorrisonR. MorrowG. NeugebauerP. PalmerR. PetersF. PetriG. ShawC. SwansonM. TehraniL. ThielmanC. TrainorB. WimberD. WinkelB. YoumansCl

35、yde R. CampStephen L. DiamondHarold E. EpsteinDonald C. FleckensteinJay Forster*Thomas F. GarrityDonald N. HeirmanJim IsaakBen C. JohnsonLowell JohnsonRobert KennellyE. G. Al KienerJoseph L. Koepnger*Stephen R. LambertLawrence V. McCallL. Bruce McClungMarco W. MigliaroLouis-Franois PauGerald H. Pete

36、rsonJohn W. PopeJose R. RamosRonald H. ReimerIngo RschJohn S. RyanChee Kiow TanHoward L. WolfmanAuthorized licensed use limited to: IEEE Standards Staff. Downloaded on January 27, 2009 at 15:00 from IEEE Xplore. Restrictions apply.Copyright 1998 IEEE. All rights reserved.vContents1. Overview 11.1 Sc

37、ope 12. References 1Part ISpecification format 23. Definitions 24. Applicable documents 24.1 Specifications. 24.2 Standards 34.3 Drawings 34.4 Bulletins . 34.5 Other publications 35. Requirements . 45.1 Description. 45.2 General requirements. 45.3 Performance . 45.4 Mechanical requirements. 85.5 Ele

38、ctrical requirements 105.6 Environmental requirements 125.7 Reliability. 176. Quality assurance provisions . 186.1 Classification of tests . 186.2 Acceptance tests. 186.3 Qualification tests 196.4 Reliability tests. 196.5 Test conditions and equipment 206.6 Test methods 207. Preparation for delivery

39、 . 238. Notes 238.1 Intended use . 238.2 Ordering data . 238.3 Model equation 239. Test procedure overview 25Part IITest procedures 2510. Description. 25Authorized licensed use limited to: IEEE Standards Staff. Downloaded on January 27, 2009 at 15:00 from IEEE Xplore. Restrictions apply.viCopyright

40、1998 IEEE. All rights reserved.11. Test conditions and test equipment 2511.1 Standard test conditions . 2511.2 Standard operating and test equipment 2712. Test procedures 2712.1 Examination of productMechanical. 2712.2 Examination of productElectrical 2712.3 Leak test. 2912.4 Input power 3012.5 Turn

41、-on time 3012.6 Warm-up time 3112.7 Polarity. 3112.8 Operating temperature test series. 3212.9 Gyro scale factor test series . 3312.10 Input rate limits 3512.11 Drift rate test series 3612.12 IA alignment 3912.13 Generated fields . 4112.14 Environment test series 41Annex A (informative) Design featu

42、res of IFOGs 42Annex B (informative) Dynamic and stochastic modeling overview 43Annex C (informative) An overview of the Allan variance method of IFOG noise analysis . 62Annex D (informative) Compliance matrix. 74Authorized licensed use limited to: IEEE Standards Staff. Downloaded on January 27, 200

43、9 at 15:00 from IEEE Xplore. Restrictions apply.Copyright 1998 IEEE. All rights reserved.1IEEE Standard Specication Format Guide and Test Procedure for Single-Axis Interferometric Fiber Optic Gyros1. Overview1.1 ScopeThis standard denes requirements for a single-axis interferometric ber optic gyro (

44、IFOG), including anynecessary electronics, to be used in an attitude control system, an angular displacement measuring system,an angular rate measuring system, _.2. ReferencesThis standard shall be used in conjunction with the following publications. When the following standards aresuperseded by an

45、approved revision, the revision shall apply.ANSI 260.1-1993 American National Standard Letter Symbols for Units of Measurement (SI Units, Cus-tomary Inch-Pound Units, and Certain Other Units).1IEEE/ASTM SI 10-1997, Standard for Use if the International System of Units (SI): The Modern MetricSystem.2

46、IEEE Std 100-1996, IEEE Standard Dictionary of Electrical and Electronics Terms.IEEE Std 280-1985 (Reaff 1996) IEEE Standard Letter Symbols for Quantities Used in Electrical Scienceand Electrical Engineering (ANSI/DoD). 1ANSI publications are available from the Sales Department, American National St

47、andards Institute, 11 West 42nd Street, 13th Floor,New York, NY 10036, USA.2IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway,NJ 08855-1331, USA.Authorized licensed use limited to: IEEE Standards Staff. Downloaded on

48、January 27, 2009 at 15:00 from IEEE Xplore. Restrictions apply.IEEEStd 952-1997 IEEE STANDARD SPECIFICATION FORMAT GUIDE AND TEST PROCEDURE2Copyright 1998 IEEE. All rights reserved.IEEE Std 315-1975 (Reaff 1993), IEEE Graphic Symbols for Electrical and Electronics Diagrams (ANSI/DoD).IEEE Std 315A-1

49、986 (Reaff 1993), IEEE Supplement to Graphic Symbols for Electrical and ElectronicsDiagrams (ANSI/DoD). IEEE Std 528-1994, IEEE Standard for Inertial Sensor Terminology (ANSI).IEEE Std 812-1984, IEEE Standard Denitions of Terms Relating to Fiber Optics.3Part ISpecication format3. DenitionsExcept for the term dened below, IEEE Std 100-1996, IEEE Std 528-1994, and the model equation of 8.3dene terminology used in this standard.3.1 Shupe effect:A time-variant non-reciprocity due to temperature changes along the length of th