IEEE 400-2012 en Guide for Field Testing and Evaluation of the Insulation of Shielded Power Cable Systems Rated 5 kV and Above《铠装电力电缆系统绝缘的实地测试和评定指南》.pdf
《IEEE 400-2012 en Guide for Field Testing and Evaluation of the Insulation of Shielded Power Cable Systems Rated 5 kV and Above《铠装电力电缆系统绝缘的实地测试和评定指南》.pdf》由会员分享,可在线阅读,更多相关《IEEE 400-2012 en Guide for Field Testing and Evaluation of the Insulation of Shielded Power Cable Systems Rated 5 kV and Above《铠装电力电缆系统绝缘的实地测试和评定指南》.pdf(54页珍藏版)》请在麦多课文档分享上搜索。
1、g3g3g3g3g3Sponsored by the Insulated Conductors Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 5 June 2012 IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv C
2、opyright 2012 IEEE. All rights reserved. Notice to users Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Imple
3、menters of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights Thi
4、s document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this d
5、ocument available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new edi
6、tions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a give
7、n document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/standards.ieee.org/index.html or contact the IEEE at the address listed previously. For more information about the IEEE Standards Associatio
8、n or the IEEE standards development process, visit the IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for
9、 errata periodically. v Copyright 2012 IEEE. All rights reserved. Patents Attention is called to the possibility that implementation of this guide may require use of subject matter covered by patent rights. By publication of this guide, no position is taken by the IEEE with respect to the existence
10、or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance m
11、ay indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Paten
12、t Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms o
13、r conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this guide are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, i
14、s entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2012 IEEE. All rights reserved. Participants This guide was prepared by Working Group WG F01 of the IEEE Insulated Conductors Committee. At the time this guide was submitted to
15、IEEE-SA Standards Board for approval, the F01 Working Group had the following membership: Yingli Wen,* Chair Jacques Ct,* Vice Chair Mohammad Eyad Al-Sibai Martin Baur Bruce Bernstein Arvid J. Braun Vern L. Buchholz Wayne Chatterton Frank de Vries John Densley Jean-Francois Drapeau Mark Fenger Steff
16、en Fuchs Craig Goodwin Edward Gulski Nigel Hampton John Hans Wolfgang Hauschild Leeman Hong* Grace Jiang Jerry Landers Benjamin Lanz Eberhard Lemke Henning Oetjen Bruce Olson Ralph Patterson Joshua M. Perkel Brent Richardson Nagu N. Srinivas Rick Stagi Dexter Tarampi William A. Thue Richard Vencus*
17、Martin von Herrmann Mark D. Walton Robert Wiehe* Walter Zenger*Writing group members The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Thomas Barnes Earle Bascom III Martin Baur Michael Bayer William Bl
18、oethe Kenneth Bow Arvid J. Braun Rudy Bright Andrew Brown Vern L. Buchholz William Byrd John Cancelosi Weijen Chen Robert Christman Kurt Clemente Jerry Corkran Jacques Ct Ray Davis John Densley Frank Di Guglielmo Gary Donner Donald Dunn Michael Edds Gary Engmann Michael Faulkenberry Rabiz Foda Steff
19、en Fuchs David Gilmer Steven Graham Randall Groves Edward Gulski Ajit Gwal Richard Harp Jeffrey Hartenberger Wolfgang Hauschild Lauri Hiivala Raymond Hill Werner Hoelzl David Horvath Dennis Johnson A. Jones John Kay Gael Kennedy Yuri Khersonsky Morteza Khodaie Joseph L. Koepfinger Robert Konnik Jim
20、Kulchisky Saumen Kundu Chung-Yiu Lam Benjamin Lanz William Larzelere Gerald Liskom Greg Luri Glenn Luzzi Arturo Maldonado John Mcalhaney, Jr William McDermid John Merando Gary Michel T. David Mills Daleep Mohla Rachel Mosier Adi Mulawarman Jerry Murphy Arthur Neubauer Michael S. Newman Charles Ngeth
21、e Joe Nims Stephen Norton Bruce Olson Lorraine Padden Dev Paul Serge Pelissou Howard Penrose Joshua M. Perkel Christopher Petrola Mark Pfeiffer Robert Resuali Johannes Rickmann Gary Savage Bartien Sayogo Dennis Schlender Suresh Shrimavle Gil Shultz Michael Smalley James Smith Jeremy Smith Jerry Smit
22、h Nagu N. Srinivas Gregory Stano Gary Stoedter Peter Tirinzoni John Vergis Martin von Herrmann Carl Wall Yingli Wen Ron Widup Richard Williamson Jonathan Woodworth Jian Yu Dawn Zhao Tiebin Zhao Hugh Zhu vii Copyright 2012 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this guid
23、e on 29 March 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past Chair Judith Gorman, Secretary Satish Aggarwal Masayuki Ariyoshi Peter Balma William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim
24、 Hughes Young Kyun Kim Joseph L. Koepfinger* David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosdahl Mike Seavey Yatin Trivedi Phil Winston Yu Yuan* Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Re
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