IEEE 3006 9-2013 en Recommended Practice for Collecting Data for Use in Reliability Availability and Maintainability Assessments of Industrial and Commercial Po.pdf
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1、 IEEE 3006 STANDARDS: POWER SYSTEMS RELIABILITY IEEE Std 3006.9-2013 IEEE Recommended Practice for Collecting Data for Use in Reliability, Availability, and Maintainability Assessments of Industrial and Commercial Power Systems IEEE Std 3006.9-2013 IEEE Recommended Practice for Collecting Data for U
2、se in Reliability, Availability, and Maintainability Assessments of Industrial and Commercial Power Systems Sponsor Technical Books Coordinating Committee of the IEEE Industry Applications Society Approved 6 March 2013 IEEE-SA Standards Board Recognized as an American National StandardAbstract: Coll
3、ection of data for use in reliability, availability, and maintainability assessments of industrial and commercial power systems is described in this recommended practice. It is likely to be of greatest value to the power-oriented engineer with limited experience in the area of reliability. It can al
4、so be an aid to all engineers responsible for the electrical design of industrial and commercial power systems. Keywords: data collection forms, database analysis, database development, design reliable industrial and commercial power systems, equipment reliability, IEEE 3006.9TM, maintainability, re
5、liability analysis The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 22 April 2013. Printed in the United States of America. IEEE is a re
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16、sonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Copyright 2013 IEEE. All rights reserved. v Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is
17、 not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any,
18、 or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the
19、IEEE Standards Association. Copyright 2013 IEEE. All rights reserved. vi Participants At the time this IEEE recommended practice was completed, the Power Systems Reliability Working Group had the following membership: Robert G. Arno, Chair Peyton S. Hale, Vice Chair William Braun Bill Brown Timothy
20、Coyle Neal Dowling Masoud Pourali Robert J. Schuerger Michael Simon Christopher C. Thompson, Jr. Joseph Weber Joseph X. Yazbek The following members of the individual balloting committee voted on this recommended practice. Balloters may have voted for approval, disapproval, or abstention. William Ac
21、kerman John Bonner Frederick Brockhurst Chris Brooks Bill Brown William Byrd Paul Cardinal Larry Conrad Douglas Dorr Neal Dowling Doaa Galal Randall Groves Gael Kennedy Yuri Khersonsky Jim Kulchisky Saumen Kundu Benjamin Lanz Ed Larsen Wei-Jen Lee Ahmad Mahinfallah Wayne Manges John McAlhaney, Jr. W
22、illiam McBride T. David Mills David Mueller Daniel Neeser Dennis Neitzel Gearold O. H. Eidhin Lorraine Padden Mirko Palazzo Louie Powell Iulian Profir Daniel Leland Ransom Charles Rogers Bartien Sayogo Robert J. Schuerger Gil Shultz Michael Simon Eugene Stoudenmire Peter Sutherland David Tepen Marce
23、lo Valdes John Vergis When the IEEE-SA Standards Board approved this recommended practice on 6 March 2013, it had the following membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burs
24、e Wael William Diab Stephen Dukes Jean-Philippe Faure Alexander Gelman Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Logvinov Ron Petersen Gary Robinson Jon Walter Rosdahl Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus
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