IEEE 1671 6-2015 en Automatic Test Markup Language (ATML) Test Station Description《自动测试置标语言(ATML)测试站描述》.pdf

《IEEE 1671 6-2015 en Automatic Test Markup Language (ATML) Test Station Description《自动测试置标语言(ATML)测试站描述》.pdf》由会员分享，可在线阅读，更多相关《IEEE 1671 6-2015 en Automatic Test Markup Language (ATML) Test Station Description《自动测试置标语言(ATML)测试站描述》.pdf（38页珍藏版）》请在麦多课文档分享上搜索。

1、IEC 61671-6 Edition 1.0 2016-04 INTERNATIONAL STANDARD Standard for automatic test markup language (ATML) test station description IEC61671-6:2016-04(en)IEEEStd 1671.6-2015 IEEE Std 1671.6 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2015 IEEE All rights reserved. IEEE is a registered trademark

2、 in the U.S. Patent 35.060 IEC ISBN 978-2-8322-3268-2IEEE ISBN 978-1-5044-0868-4STD20903Warning! Make sure that you obtained this publication from an authorized distributor. IEEE Std 1671.6 Registered trademark of the International Electrotechnical Commission Contents 1. Overview 1 1.1 General 1 1.2

3、 Application of this documents annexes 2 1.3 Scope . 2 1.4 Application 2 1.5 Conventions used within this document 2 2. Normative references 3 3. Definitions, acronyms, and abbreviations 4 3.1 Definitions . 4 3.2 Acronyms and abbreviations . 5 4. SchemaTestStationDescription.xsd 6 4.1 General 6 4.2

4、Elements 6 4.3 Child elements . 8 4.4 Complex types . 9 5. SchemaTestStationInstance.xsd 10 5.1 General .10 5.2 Elements .10 5.3 Child elements 12 5.4 Complex types 12 6. ATML TestStationDescription XML schema names and locations 14 7. ATML XML schema extensibility 15 8. Conformance .16 8.1 Conforma

5、nce of a TestStationDescription instance document .16 8.2 Conformance of a TestStationInstance instance document 16 Annex A (informative) IEEE download website material associated with this document 17 Annex B (informative) Users information and examples .18 B.1 Partial automatic test station 18 Ann

6、ex C (informative) Glossary .21 Annex D (informative) Bibliography 22$QQH( LQIRUPDWLYH ,(/LVWRI3DUWLFLSDQWV,( any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC

7、 also participate in this preparation. IEEE Standards documents are developed within IEEE Societies and Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. IEEE develops its standards through a consensus development process, which brings together volunteers

8、 representing varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of IEEE and serve without compensation. While IEEE administers the process and establishes rules to promote fairness in the consensus development process, IEEE does not independently ev

9、aluate, test, or verify the accuracy of any of the information contained in its standards. Use of IEEE Standards documents is wholly voluntary. IEEE documents are made available for use subject to important notices and legal disclaimers (see http:/standards.ieee.org/IPR/disclaimers.html for more inf

10、ormation). IEC collaborates closely with IEEE in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical c

11、ommittee has representation from all interested IEC National Committees. The formal decisions of IEEE on technical matters, once consensus within IEEE Societies and Standards Coordinating Committees has been reached, is determined by a balanced ballot of materially interested parties who indicate in

12、terest in reviewing the proposed standard. Final approval of the IEEE standards document is given by the IEEE Standards Association (IEEE-SA) Standards Board. 3) IEC/IEEE Publications have the form of recommendations for international use and are accepted by IEC National Committees/IEEE Societies in

13、 that sense. While all reasonable efforts are made to ensure that the technical content of IEC/IEEE Publications is accurate, IEC or IEEE cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC N

14、ational Committees undertake to apply IEC Publications (including IEC/IEEE Publications) transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC/IEEE Publication and the corresponding national or regional publication shall be clearly i

15、ndicated in the latter. 5) IEC and IEEE do not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC and IEEE are not responsible for any services carried out by independent certificat

16、ion bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or IEEE or their directors, employees, servants or agents including individual experts and members of technical committees and IEC National Committees, or volunteers of I

17、EEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board, for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publ

18、ication, use of, or reliance upon, this IEC/IEEE Publication or any other IEC or IEEE Publications. 8) Attention is drawn to the normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn

19、to the possibility that implementation of this IEC/IEEE Publication may require use of material covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. IEC or IEEE shall not be held respon

20、sible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patent Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any li

21、censing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. LLIEC 61671-6:2016 IEEE Std 1671.6-2015 Published by IEC u

22、nder license from IEEE. 2015 IEEE. All rights reserved. International Standard IEC 61671-6/IEEE Std 1671.6-2015 has been processed through IEC technical committee 91: Electronics assembly technology, under the IEC/IEEE Dual Logo Agreement. The text of this standard is based on the following document

23、s: IEEE Std FDIS Report on voting IEEE Std 1671.6-2015 91/1316/FDIS 91/1340/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. The IEC Technical Committee and IEEE Technical Committee have decided that the contents

24、of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. LLLIEEE Standard fo

25、r Automatic Test Markup Language (ATML) Test Station Description Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Approved 26 March 2015 IEEE-SA Standards Board ,( both of which accompany this standard. These XML schemas provide for the identification and

26、 definition of a test station. ATMLs XML schemas define the basic information required within any test application and provide a vehicle for formally defining the test environment by defining a class hierarchy corresponding to these basic information entities and provide several methods within each

27、to enable basic operations to be performed on these entities. ATML component standards within the ATML framework define the particular requirements within the test environment. ,( fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of m

28、aterial. In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to

29、 produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments re

30、ceived from users of the standard. In publishing and making its standards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person uti

31、lizing any IEEE Standards document, should rely upon his or her own independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional in determining the appropriateness of a given IEEE standard. IN NO EVENT SHALL IEEE B

32、E LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT

33、 LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Translations The IEEE consensus development process invol

34、ves the review of documents in English only. In the event that an IEEE standard is translated, only the English version published by IEEE should be considered the approved IEEE standard. ,( +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can

35、 also be obtained through the Copyright Clearance Center. ,( explanatory information will be provided, along with examples, if additional clarification is needed. The explanatory information will include information on the intended use of the elements and/or attributes where the name of the entity d

36、oes not clearly indicate its intended use. For elements derived from another source type (e.g., an abstract type), only attributes that extend the source type will be listed; details regarding the base type will be listed along with the base type. When referring to an attribute of an XML element, th

37、e convention of elementattribute will be used. In cases where an attribute name is referred to with no associated element, the attribute name will be enclosed in single quotes. Element and type names will always be set in italics when appearing in text. This standard uses the vocabulary and definiti

38、ons of relevant IEEE standards. In case of conflict of definitions, except for those portions quoted from standards, the following precedence shall be observed: 1) Clause 3, and 2) The IEEE Standards Dictionary Online B2. 1.5.2 Precedence The TestStationDescription schema (TestStationDescription.xsd

39、) element, child element, and annotation information shall take precedence over the descriptive information contained in Clause 4. The TestStationDescription schema and the material contained in Clause 4 shall take precedence over the example information represented in Annex B. The TestStationInstan

40、ce schema (TestStationInstance.xsd) element, child element, and annotation information shall take precedence over the descriptive information contained in Clause 5. The TestStationInstance schema and the material contained in Clause 5 shall take precedence over the example information represented in

41、 Annex B. 1.5.3 Word usage In accordance with the IEEE Standards Style Manual B3, the word shall is used to indicate mandatory requirements strictly to be followed in order to conform to the standard and from which no deviation is permitted (shall equals is required to). The use of the word must is

42、used only to describe unavoidable situations. The use of the word will is only used in statements of fact. The word should is used to indicate that among several possibilities one is recommended as particularly suitable, without mentioning or excluding others (should equals is recommended that). The

43、 word may is used to indicate a course of action permissible within the limits of the standard (may equals is permitted to). The word can is used for statements of possibility and capability (can equals is able to) 2. Normative references The following referenced documents are indispensable for the

44、application of this document (i.e., they must be understood and used, so each referenced document is cited in text and its relationship to this document is ,(&,(6WGexplained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document

45、(including any amendments or corrigenda) applies. IEEE Std 1671, IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML.4,53. Definitions, acronyms, and abbreviations 3.1 Definitions For the purposes of this document, the followin

46、g terms and definitions apply. The IEEE Standards Dictionary Online should be consulted for terms not defined in this clause.6In the event a term is explicitly redefined, or further defined in an ATML component standard, the component standards definition shall take precedence for that ATML componen

47、t standard. abstract type: A declared type that can be used to define other types through derivation. Only non-abstract types derived from the declared type can be used in instance documents. When such a type is used, it shall be identified by the xsi:type attribute. automatic test information: The

48、complete set of information needed to describe a partial automatic test system (e.g., only rack 1 of the complete ATE). Automatic Test Markup Language (ATML) instance document: See: instance document. element: A bounded component of the logical structure of an eXtensible Markup Language (XML) document that has a type and that may have XML attributes and content adapted from eXtensible Markup Language (XML) 1.0 (Fifth Edition) entity: Something that has a distinct separate existence. eXtensible Mar