1、IEC 61671-6 Edition 1.0 2016-04 INTERNATIONAL STANDARD Standard for automatic test markup language (ATML) test station description IEC61671-6:2016-04(en)IEEEStd 1671.6-2015 IEEE Std 1671.6 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2015 IEEE All rights reserved. IEEE is a registered trademark
2、 in the U.S. Patent 35.060 IEC ISBN 978-2-8322-3268-2IEEE ISBN 978-1-5044-0868-4STD20903Warning! Make sure that you obtained this publication from an authorized distributor. IEEE Std 1671.6 Registered trademark of the International Electrotechnical Commission Contents 1. Overview 1 1.1 General 1 1.2
3、 Application of this documents annexes 2 1.3 Scope . 2 1.4 Application 2 1.5 Conventions used within this document 2 2. Normative references 3 3. Definitions, acronyms, and abbreviations 4 3.1 Definitions . 4 3.2 Acronyms and abbreviations . 5 4. SchemaTestStationDescription.xsd 6 4.1 General 6 4.2
4、Elements 6 4.3 Child elements . 8 4.4 Complex types . 9 5. SchemaTestStationInstance.xsd 10 5.1 General .10 5.2 Elements .10 5.3 Child elements 12 5.4 Complex types 12 6. ATML TestStationDescription XML schema names and locations 14 7. ATML XML schema extensibility 15 8. Conformance .16 8.1 Conforma
5、nce of a TestStationDescription instance document .16 8.2 Conformance of a TestStationInstance instance document 16 Annex A (informative) IEEE download website material associated with this document 17 Annex B (informative) Users information and examples .18 B.1 Partial automatic test station 18 Ann
6、ex C (informative) Glossary .21 Annex D (informative) Bibliography 22$QQH( LQIRUPDWLYH ,(/LVWRI3DUWLFLSDQWV,( any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC
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25、r Automatic Test Markup Language (ATML) Test Station Description Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Approved 26 March 2015 IEEE-SA Standards Board ,( both of which accompany this standard. These XML schemas provide for the identification and
26、 definition of a test station. ATMLs XML schemas define the basic information required within any test application and provide a vehicle for formally defining the test environment by defining a class hierarchy corresponding to these basic information entities and provide several methods within each
27、to enable basic operations to be performed on these entities. ATML component standards within the ATML framework define the particular requirements within the test environment. ,( fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of m
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35、 also be obtained through the Copyright Clearance Center. ,( explanatory information will be provided, along with examples, if additional clarification is needed. The explanatory information will include information on the intended use of the elements and/or attributes where the name of the entity d
36、oes not clearly indicate its intended use. For elements derived from another source type (e.g., an abstract type), only attributes that extend the source type will be listed; details regarding the base type will be listed along with the base type. When referring to an attribute of an XML element, th
37、e convention of elementattribute will be used. In cases where an attribute name is referred to with no associated element, the attribute name will be enclosed in single quotes. Element and type names will always be set in italics when appearing in text. This standard uses the vocabulary and definiti
38、ons of relevant IEEE standards. In case of conflict of definitions, except for those portions quoted from standards, the following precedence shall be observed: 1) Clause 3, and 2) The IEEE Standards Dictionary Online B2. 1.5.2 Precedence The TestStationDescription schema (TestStationDescription.xsd
39、) element, child element, and annotation information shall take precedence over the descriptive information contained in Clause 4. The TestStationDescription schema and the material contained in Clause 4 shall take precedence over the example information represented in Annex B. The TestStationInstan
40、ce schema (TestStationInstance.xsd) element, child element, and annotation information shall take precedence over the descriptive information contained in Clause 5. The TestStationInstance schema and the material contained in Clause 5 shall take precedence over the example information represented in
41、 Annex B. 1.5.3 Word usage In accordance with the IEEE Standards Style Manual B3, the word shall is used to indicate mandatory requirements strictly to be followed in order to conform to the standard and from which no deviation is permitted (shall equals is required to). The use of the word must is
42、used only to describe unavoidable situations. The use of the word will is only used in statements of fact. The word should is used to indicate that among several possibilities one is recommended as particularly suitable, without mentioning or excluding others (should equals is recommended that). The
43、 word may is used to indicate a course of action permissible within the limits of the standard (may equals is permitted to). The word can is used for statements of possibility and capability (can equals is able to) 2. Normative references The following referenced documents are indispensable for the
44、application of this document (i.e., they must be understood and used, so each referenced document is cited in text and its relationship to this document is ,(&,(6WGexplained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document
45、(including any amendments or corrigenda) applies. IEEE Std 1671, IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML.4,53. Definitions, acronyms, and abbreviations 3.1 Definitions For the purposes of this document, the followin
46、g terms and definitions apply. The IEEE Standards Dictionary Online should be consulted for terms not defined in this clause.6In the event a term is explicitly redefined, or further defined in an ATML component standard, the component standards definition shall take precedence for that ATML componen
47、t standard. abstract type: A declared type that can be used to define other types through derivation. Only non-abstract types derived from the declared type can be used in instance documents. When such a type is used, it shall be identified by the xsi:type attribute. automatic test information: The
48、complete set of information needed to describe a partial automatic test system (e.g., only rack 1 of the complete ATE). Automatic Test Markup Language (ATML) instance document: See: instance document. element: A bounded component of the logical structure of an eXtensible Markup Language (XML) document that has a type and that may have XML attributes and content adapted from eXtensible Markup Language (XML) 1.0 (Fifth Edition) entity: Something that has a distinct separate existence. eXtensible Mar
