IEEE 1671 5-2015 en Automatic Test Markup Language (ATML) Test Adapter Description《自动试验标记语言(ATML)测试适配器的描述》.pdf

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1、 IEC 61671-5 Edition 1.0 2016-04 INTERNATIONAL STANDARD Standard for automatic test markup language (ATML) test adapter description IEC61671-5:2016-04(en)IEEEStd 1671.5-2015 IEEE Std 1671.5 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2015 IEEE All rights reserved. IEEE is a registered trademar

2、k in the U.S. Patent 35.060 IEC ISBN 978-2-8322-3267-5IEEE ISBN 978-1-5044-0866-0 STD20902Warning! Make sure that you obtained this publication from an authorized distributor. IEEE Std 1671.5 Registered trademark of the International Electrotechnical Commission Contents 1. Overview 1 1.1 General 1 1

3、.2 Application of this documents annexes 2 1.3 Scope . 2 1.4 Application 2 1.5 Conventions used within this document 2 2. Normative references 3 3. Definitions, acronyms, and abbreviations 4 3.1 Definitions . 4 3.2 Acronyms and abbreviations . 5 4. TestAdapterDescription Schema 5 4.1 General 5 4.2 E

4、lements 6 4.3 Simple types 7 5. SchemaTestAdapterInstance.xsd 7 5.1 General 7 5.2 Elements 8 5.3 Simple types 9 6. ATML TestAdapterDescription XML schema names and locations 9 7. ATML XML schema extensibility 11 8. Conformance .11 8.1 Conformance of a TestAdapterDescription instance document 11 8.2

5、Conformance of a TestAdapterInstance instance document .12 Annex A (informative) IEEE download website material associated with this document 13 Annex B (informative) Users information and examples 14 B.1 Interface test adapter 14 Annex C (informative) Glossary .16 Annex D (informative) Bibliography

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21、this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. LLIEC 61671-5:2016 IEEE Std 1671.5-2015 Published by IEC under license from IEEE. 2015 IEEE. All rights reserved. Internatio

22、nal Standard IEC 61671-5/IEEE Std 1671.5-2015 has been processed through IEC technical committee 91: Electronics assembly technology, under the IEC/IEEE Dual Logo Agreement. The text of this standard is based on the following documents: IEEE Std FDIS Report on voting IEEE Std 1671.5-2015 91/1316/FDI

23、S 91/1340/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. The IEC Technical Committee and IEEE Technical Committee have decided that the contents of this publication will remain unchanged until the stability date

24、 indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. LLLIEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description S

25、ponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Approved 26 March 2015 IEEE-SA Standards Board ,( both of which accompany this standard. These XML schemas provide for the identification and definition of a test adapter. ATMLs XML schemas define the basic

26、information required within any test application and provide a vehicle for formally defining the test environment by defining a class hierarchy corresponding to these basic information entities and provide several methods within each to enable basic operations to be performed on these entities. ATML

27、 component standards within the ATML framework define the particular requirements within the test environment. ,( fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relati

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34、IEEE standard is translated, only the English version published by IEEE should be considered the approved IEEE standard. ,( +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. ,( thus

35、they are provided strictly as information for users, implementers, and maintainers of this document. 1.3 Scope This standard defines an exchange format, utilizing XML, for both the static description of a test adapter by defining the interface between the UUT and the test station, and the specific d

36、escription of test adapter instance information. 1.4 Application This standard provides a clear definition of test adapter information that may be exchanged between conformant cooperating software components and applications. This standard provides a definition that accomplishes the following object

37、ives: a) Provide a means of describing the aspects of the test adapter, which is the interface between the test station and the UUT b) Provide a means of describing simple (e.g., cable only), passive, or active test adapters c) Provide a means of describing multiple or layered test adapters The info

38、rmation contained in XML documents conforming to this standard will be useful to: a) Test program set (TPS) developers b) TPS maintainers c) ATE system developers d) ATE system maintainers e) Developers of ATML-based tools and systems f) UUT developers and maintainers 1.5 Conventions used within thi

39、s document 1.5.1 General In accordance with the IEEE Standards Style Manual B3,3any schema examples will be shown in Courier font. In cases where instance document examples are necessary to depict the use of a schema type 3The numbers in brackets correspond to those of the bibliography in Annex D. ,

40、( explanatory information will be provided, along with examples, if additional clarification is needed. The explanatory information will include information on the intended use of the elements and/or attributes where the name of the entity does not clearly indicate its intended use. For elements der

41、ived from another source type (e.g., an abstract type), only attributes that extend the source type will be listed; details regarding the base type will be listed along with the base type. When referring to an attribute of an XML element, the convention of elementattribute will be used. In cases whe

42、re an attribute name is referred to with no associated element, the attribute name will be enclosed in single quotes. Element and type names will always be set in italics when appearing in text. This standard uses the vocabulary and definitions of relevant IEEE standards. In case of conflict of defi

43、nitions, except for those portions quoted from standards, the following precedence shall be observed: 1) Clause 3, and 2) The IEEE Standards Dictionary Online B2. 1.5.2 Precedence The TestAdapterDescription schema (TestAdapterDescription.xsd) element, child element, and annotation information shall

44、take precedence over the descriptive information contained in Clause 4. The TestAdapterDescription schema and the material contained in Clause 4 shall take precedence over the example information represented in Annex B. The TestAdapterInstance schema (TestAdapterInstance.xsd) element, child element,

45、 and annotation information shall take precedence over the descriptive information contained in Clause 5. The TestAdapterInstance schema and the material contained in Clause 5 shall take precedence over the example information represented in Annex B. 1.5.3 Word usage In accordance with the IEEE Stan

46、dards Style Manual B3, the word shall is used to indicate mandatory requirements strictly to be followed in order to conform to the standard and from which no deviation is permitted (shall equals is required to). The use of the word must is used only to describe unavoidable situations. The use of th

47、e word will is only used in statements of fact. The word should is used to indicate that among several possibilities one is recommended as particularly suitable, without mentioning or excluding others (should equals is recommended that). The word may is used to indicate a course of action permissibl

48、e within the limits of the standard (may equals is permitted to). The word can is used for statements of possibility and capability (can equals is able to). 2. Normative references The following referenced documents are indispensable for the application of this document (i.e., they must be understood and used, so each referenced document is cited in text and its relationship to this document is ,(&,(6WGexplained). For dated references, only the edition cited applies. For undated references, the