IEEE 1413-2010 en Standard Framework for Reliability Prediction of Hardware《硬件可靠性预测的架构》.pdf

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3、2g90g3g60g82g85g78g15g3g49g60g3g20g19g19g20g25g16g24g28g28g26g15g3g56g54g36g3g3g28g3g36g83g85g76g79g3g21g19g20g19g20g23g20g22g55g48IEEE Std 1413-2010 (Revision of IEEE Std 1413-1998) IEEE Standard Framework for Reliability Prediction of Hardware Sponsor IEEE Reliability Standards Committee of the IE

4、EE Reliability Society Approved 25 March 2010 IEEE-SA Standards Board Acknowledgment The Reliability Prediction Standards Development Working Group is saddened at the loss of one of the driving forces behind this standards coordination committee. Jerry Cartwright, an IEEE member of the Minnesota Sec

5、tion who served on many IEEE Standards Working Groups, passed away in 2009. We acknowledge his contribution to the development of the first publication of IEEE Std 1413 and dedicate this revision to his memory. Abstract: The framework for the reliability prediction for electronic hardware is covered

6、 in this standard. This standard identifies required elements for an understandable and credible reliability prediction with information to evaluate the effective use of the prediction results. A reliability prediction generated according to this standard shall have sufficient information concerning

7、 inputs, assumptions, data sources, methodology(ies), and uncertainties so that the risk associated with using the prediction results can be considered. This document does not provide instructions for how to perform reliability prediction and does not judge methodologies. Keywords: assessment of rel

8、iability prediction, reliability, reliability prediction The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2010 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 9 April 2010. Printed in the U

9、nited States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Introduction This introduction is not part of IEEE Std 14

10、13-2010, IEEE Standard Framework for Reliability Prediction of Hardware. In May 1992, the U.S. Army Material Systems Acquisition Activity (AMSAA) and the Center for Advanced Life Cycle Engineering (CALCE)Electronic Products and System Consortium (EPSC), University of Maryland, briefed the Army Stand

11、ardization Executive, Mr. Darold Griffen, on the problems with the current reliability standards. The development of dual-use, nongovernment reliability standards, in lieu of revising Military Standards or Military Handbooks, was proposed as a means to satisfy industry and Department of Defense (DoD

12、) administration policy. Reducing reliance on military specifications and standards later became a priority of Secretary of Defense Dr. William J. Perry. In 1993, a Process Action Team (PAT) was chartered by Deputy Under Secretary of Defense (Acquisition Reform), Ms. Colleen Preston, to address the

13、transition of defense suppliers and contractors to commercial practices, processes, and products. The DoD PAT placed emphasis on participating with nongovernment standards bodies to jointly develop and use their standards. AMSAA and CALCE EPSC began working with the IEEE Reliability Society to initi

14、ate an IEEE reliability prediction standard. A Reliability Prediction Standards Development Working Group was formed, consisting of participants from various commercial and government agencies, both from within and outside the United States. Written approval for the Project Authorization Request (PA

15、R) from the IEEE Standards Board was obtained 13 December 1994. The Reliability Prediction Standards Development Working Group began coordinating with the IEEE Standards Review Committee (RevCom) on developing and formatting the draft. The Working Group has been gathering and maintaining current inf

16、ormation on the following areas: The best electronics reliability technologies and practices Recommendations from industry, government, and academia The dual-use nongovernment standards initiative The Reliability Prediction Standards Development Working Group had interacted with other organizations

17、that focus on reliability and produce nongovernment standards, including the Information Technology Association of America (ITAA) formerly the Electronic Industries Association (EIA), the Society of Automotive Engineers (SAE), the American Society for Quality Control (ASQC), Telcordia (formerly Bell

18、core), and the Institute for Environmental Sciences (IES). The Reliability Prediction Standards Development Working Group participated in meetings with these organizations and discussed the conversion of military standards to commercial national and international standards. The standardization organ

19、izations were supportive of the development of an IEEE reliability prediction standard, and participated in the development of this standard. Organizations outside the United States such as the British Telecom, Nippon Telephone and Telegraph, and CNET were also contacted and their opinions sought on

20、 the standard. In addition, personnel from these organizations participated in this development and reviewed the working documents. Their comments and contributions helped improve this standard. iv Copyright 2010 IEEE. All rights reserved. Notice to users Laws and regulations Users of these document

21、s should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not,

22、 by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These includ

23、e both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyri

24、ght to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any

25、point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the

26、 IEEE Standards Association Web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA Web site at http:/standards.ieee.org. Erra

27、ta Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: htt

28、p:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of an

29、y patent rights in connection therewith. The IEEE is not responsible for identifying v Copyright 2010 IEEE. All rights reserved. Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensi

30、ng terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of s

31、uch rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2010 IEEE. All rights reserved. vii Copyright 2010 IEEE. All rights reserved. Participants At the time this standard was submitted to the IEEE-SA Standards Board fo

32、r approval, the Reliability Prediction Standards Development Working Group had the following membership: Michael Pecht, Chair Louis J. Gullo, IEEE RS Standards Committee Chair and Liaison to IEEE-SA Diganta Das, IEEE RS Standards Committee Vice Chair and Final Editor Michael H. Azarian Lori Bechtold

33、 Joseph Childs Robert Deppe Jon Elerath Harold Hart Tyrone Jackson Aridaman Jain Fred Schenkelberg Jack Sherman Alan Wood Others contributors who aided in the development of this standard by providing direction and attending meetings were as follows: Michael Cushing Ken Dalton Dick Doyle Dennis Hoff

34、man Jim McLeish Paul ShedlockThe following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Ali Al Awazi Chris Bagge Bakul Banerjee Hugh Barrass Lori Bechtold H. Stephen Berger Chris Brooks Antonio Cardoso Juan C

35、arreon Joseph Childs Keith Chow Charles Cook Michael Cushing Thomas Dineen Carlo Donati Douglas Dorr Neal Dowling David Fuschi Ron Greenthaler Randall Groves Louis J. Gullo C. Guy Ajit Gwal John Harauz Michael Henry Werner Hoelzl Dennis Hoffman Robert Holibaugh Akio Iso Atsushi Ito Piotr Karocki Ram

36、eshchandra Ketharaju Yuri Khersonsky Marc Lacroix Susan Land William Lumpkins Edward Mccall Jerry Murphy Michael S. Newman William Petit Ulrich Pohl Iulian Profir Annette Reilly Robert Resuali Michael Roberts Robert Robinson Bartien Sayogo Fred Schenkelberg Stephen Schwarm Gil Shultz James E. Smith

37、Thomas Starai Walter Struppler Marcy Stutzman Thomas Tullia Sterling Vaden M. Karen Woolf Oren Yuen Janusz ZalewskiWhen the IEEE-SA Standards Board approved this standard on 25 March 2010, it had the following membership: Robert M. Grow, Chair Richard H. Hulett, Vice Chair Steve M. Mills, Past Chair

38、 Judith Gorman, Secretary Karen Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexander Gelman Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Hung Ling Oleg Logvinov Ted Olsen Ronald C. Petersen Thomas Prevost Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis S

39、iller Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Lorraine Patsco IEEE Standards Program Manager, Document Development Matthew J.

40、Ceglia IEEE Standards Program Manager, Technical Program Development viii Copyright 2010 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 2 1.3 Uses of a reliability prediction. 2 2. Normative references 2 3. Definitions 2 4. Required elements of a reliability prediction 3

41、 5. Item identification and description . 3 6. Intended uses of the prediction results 4 7. Identification of the methodology used 4 8. List of inputs. 5 9. Prediction metrics: definitions and values 6 10. Uncertainties and limitations in predictions . 6 11. Statistical confidence in predictions . 6

42、 12. Summary of reliability methodology and prediction considerations 6 Annex A (informative) Bibliography . 8 ix Copyright 2010 IEEE. All rights reserved. IEEE Standard Framework for Reliability Prediction of Hardware IMPORTANT NOTICE: This standard is not intended to ensure safety, security, healt

43、h, or environmental protection in all circumstances. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaim

44、ers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/ dis

45、claimers.html. 1. Overview The goal of this standard is to provide a framework for the reliability prediction of hardware for the disclosure of reliability analysis methods, and for all necessary information within a reliability prediction report. This standard can be used by the developer of the pr

46、ediction for planning (e.g., gathering input information) and performing predictions, and by the user of the prediction to assess the value of the predictions. The usefulness of a reliability prediction is dependent on the accuracy and completeness of the information utilized as input to the predict

47、ion, and the analysis method(s) used to create the prediction. This standard has a supporting document, IEEE Std 1413.11, which provides introductions to various methods of reliability prediction and offers guidance on how to assess a methodology as per this standard. 1.1 Scope This standard provide

48、s the framework for performing and reporting reliability predictions. It applies to hardware products including electronic, electrical, and mechanical devices and assemblies. 1Information on references can be found in Clause 2. 1 Copyright 2010 IEEE. All rights reserved. IEEE Std 1413-2010 IEEE Stan

49、dard Framework for Reliability Prediction of Hardware 1.2 Purpose The purpose of this standard is to identify the required elements for an understandable and useful reliability prediction. A reliability prediction made according to this standard shall have sufficient information concerning inputs, assumptions, and uncertainty so the risk associated with using the prediction results can be understood. 1.3 Uses of a reliability prediction Reliability predictions can be used for numerous purposes, including the following: a) Establishment of reliability requireme